Mapping measurements using the u-PCD method are possible, and there are numerous achievements in the solar cell and semiconductor markets.
Various electrical measurement mapping can be performed as an option. (Diffusion length, iron concentration, resistivity, sheet resistance, LBIC, reflectivity, IQE, PN determination)
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basic information
The lifetime measurement device WT-2000 is capable of mapping measurements using the u-PCD method and has a significant track record in the solar cell and semiconductor markets. It can measure the lifetime of silicon blocks/wafers and display mapping results. *There is also an inline fully automatic measurement device for silicon wafers/blocks.
Price information
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Delivery Time
※2 to 4 months
Applications/Examples of results
In the solar cell market, we are globally standardizing the industry, and our products are used in various development and manufacturing management processes, such as block/wafers manufacturing (inline) and cell processes.
Company information
Semilab is a comprehensive measurement device manufacturer that supports research and manufacturing of cutting-edge technologies worldwide. We handle non-contact CV measurement devices, lifetime measurement devices, spectroscopic ellipsometers, photoluminescence, DLTS systems, sheet resistance measurement devices, nanoindenters, AFM, and more for the inspection of semiconductor wafers and devices. Please feel free to contact us for specifications and pricing of our devices.
![[Measurement Example] Measurement of Thermal Conductivity Distribution of Alumina Filler [TM3]](https://image.mono.ipros.com/public/product/image/730/2001216776/IPROS72093582379933309477.jpeg?w=280&h=280)
