List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
It excels in high sensitivity detection, quantification, and portability, making it suitable for quality inspection and research and development settings. It contributes to the detection of minute for...
- Semiconductor inspection/test equipment
- Other Sanitation Inspections
- Other appearance and image inspection equipment
We will exhibit a particle visualization system at the "25th International Nanotechnology Exhibition and Conference, nano tech 2026" (January 28 (Wed) - January 30 (Fri), 2026 / Tokyo Big Sight, West Hall Conference Building, West Hall 1, 1st Floor, 1W-Z34).
We will solve the issues related to the deterioration of defect rates caused by fine particles and the cleaning process in manufacturing sites. The fine particle visualization system developed by Shin Nippon Air Technologies, under the ViEST brand, combines an ultra-high-sensitivity camera and light source to visualize fine particles in clean rooms and equipment. It can capture their behavior in real-time while also quantifying particle information, making it a world-class visualization system. Currently, we are expanding the sale of systems and tools, as well as contract technical services utilizing them, both domestically and internationally. We have particularly rich experience in the semiconductor industry and clean rooms. Below are some examples of applications, but by using our technology, we can strongly promote solutions to various issues such as the deterioration of defect rates due to fine foreign substances, visualization of clean airflow, and concerns regarding site cleanliness. - Visualization investigation of fine particles and airflow in the manufacturing line and environmental improvement - Promotion of cleanliness in manufacturing equipment and environments - Cleanliness evaluation of various equipment performance - Improvement of yield and quality degradation caused by contamination issues - Support for research and development requiring visualization of fine particles and airflow - Evaluation of particle generation from products.
Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo unit...
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
- Defect Inspection Equipment
We will exhibit a particle visualization system at the "25th International Nanotechnology Exhibition and Conference, nano tech 2026" (January 28 (Wed) - January 30 (Fri), 2026 / Tokyo Big Sight, West Hall Conference Building, West Hall 1, 1st Floor, 1W-Z34).
We will solve the issues related to the deterioration of defect rates caused by fine particles and the cleaning process in manufacturing sites. The fine particle visualization system developed by Shin Nippon Air Technologies, under the ViEST brand, combines an ultra-high-sensitivity camera and light source to visualize fine particles in clean rooms and equipment. It can capture their behavior in real-time while also quantifying particle information, making it a world-class visualization system. Currently, we are expanding the sale of systems and tools, as well as contract technical services utilizing them, both domestically and internationally. We have particularly rich experience in the semiconductor industry and clean rooms. Below are some examples of applications, but by using our technology, we can strongly promote solutions to various issues such as the deterioration of defect rates due to fine foreign substances, visualization of clean airflow, and concerns regarding site cleanliness. - Visualization investigation of fine particles and airflow in the manufacturing line and environmental improvement - Promotion of cleanliness in manufacturing equipment and environments - Cleanliness evaluation of various equipment performance - Improvement of yield and quality degradation caused by contamination issues - Support for research and development requiring visualization of fine particles and airflow - Evaluation of particle generation from products.
Pellet and powder foreign matter inspection device *Compatible with clean rooms and can be installed in factories, capable of detecting 9µm!
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
It is possible to inspect appearance defects occurring in the wafer process and dicing process quickly and with high precision.
- Semiconductor inspection/test equipment
- Visual Inspection Equipment
Detect foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
Detecting foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
Thanks to our unique technology, we can cancel out polycrystalline patterns and detect fine defects!
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
This is an image inspection machine using a 2D CCD camera that performs high-speed six-sided inspection of chip components.
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
High-precision inspection of output line misalignment, pitch between cells, and cell chips and cracks.
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
Ideal for testing resin and plastic raw materials! Our uniquely developed inspection mechanism detects foreign substances and discoloration in pellets and powders! *Detection of 9μm is possible.
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
Ideal for microfabrication! Achieving high-precision cutting processes.
- Semiconductor inspection/test equipment
Test solution that does not damage solder balls or measurement substrates with soft contact!
- Semiconductor inspection/test equipment
- Printed Circuit Board
A sheet socket that enables stable inspection in semiconductor back-end process inspection! What is "PCR" that allows high-speed and high-density measurements? Technical materials on operating princip...
- Other electronic parts
- socket
- Semiconductor inspection/test equipment
This product is specifically developed for a Peltier temperature controller that can be easily set up.
- Semiconductor inspection/test equipment
- Viscometer
- Analytical Equipment
Cam and gear software
- Other machine tools
- gear
- Semiconductor inspection/test equipment
For the semiconductor industry! Process analyzer / Online analyzer for monitoring tetramethylammonium hydroxide (TMAH) in developer solutions!
- Analytical Equipment and Devices
- Wafer
- Semiconductor inspection/test equipment
Measurement of hydrogen peroxide trimethylamine and standard cations for semiconductor manufacturing using ion chromatography.
- Ion Chromatography
- Semiconductor inspection/test equipment
- Analytical Equipment and Devices
Semiconductor test solutions that support event management.
- Semiconductor inspection/test equipment
- Printed Circuit Board
A semiconductor test solution that does not damage the measurement substrate with soft contacts!
- Semiconductor inspection/test equipment
- Printed Circuit Board
By using heat reflection and laser technology, LIT narrows down the heat generation points beneath the metal layer, which were difficult to detect, to as small as 2μm, breaking through the limits of h...
- Semiconductor inspection/test equipment
- Defect Inspection Equipment