List of Testing Equipment and Devices products
- classification：Testing Equipment and Devices
1381～1395 item / All 4532 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
The catalog has been updated! Compliant with 【JIS Z 2241】. Hydraulic universal testing machine 'AY-S5/D5' or 'YU-S5/D5' series.
- Testing Equipment and Devices
We support the automation of manual measurement and testing tasks!
- Testing Equipment and Devices
It enables the detection of solder defects and pattern defects that are difficult to identify with X-ray inspection, achieving a reduction in labor and an improvement in manufacturing quality!
- Testing Equipment and Devices
We will achieve the automation of your testing and verification tasks by switching a toggle (case studies available).
- Testing Equipment and Devices
We offer various hardware simulator modules!
- Testing Equipment and Devices
![[Case Study] Adoption of Boundary S...](https://image.mono.ipros.com/public/product/image/4ff/2000288695/IPROS1824301145676478746.jpg?w=280&h=280){kind=small}
Achieving inspection of automotive devices that require high safety standards through JTAG testing!
- Testing Equipment and Devices
![[Case Study] Adoption of JTAG Testi...](https://image.mono.ipros.com/public/product/image/22e/2000288763/IPROS1253844139049407389.jpg?w=280&h=280){kind=small}
High-performance, high-quality measurement supported by JTAG boundary scan testing!
- Testing Equipment and Devices
![[Case Study] Adoption of JTAG Testi...](https://image.mono.ipros.com/public/product/image/1d8/2000288805/IPROS2244287962099796902.jpg?w=280&h=280){kind=small}
JTAG boundary scan testing that improved reliability in the early stages of development!
- Testing Equipment and Devices
We are publishing case studies on the introduction of JTAG boundary scan testing!
- Testing Equipment and Devices
JPCA Show 2024 / We will exhibit at the 2024 Microelectronics Show.
Andor System Support will exhibit at the "JPCA Show 2024 / 2024 Microelectronics Show" held at Tokyo Big Sight from June 12 (Wednesday) to June 14 (Friday), 2024. [Exhibition Content] - JTAG testing/boundary scan testing for BGA and QFP mounted boards - PXI and LXI automatic test solutions for semiconductor testing and IoT device testing We will also conduct live demonstrations, so please stop by. [Exhibition Booth] - Exhibition Name: 2024 Microelectronics Show - Date and Time: June 12 (Wednesday) to June 14 (Friday), 2024, 10:00 AM to 5:00 PM - Venue: Tokyo Big Sight, East Exhibition Hall - Booth Number: 3B-35
No need for test jig development for each platform. Implementation board test tool.
- Testing Equipment and Devices
JTAG Test Introduction Seminar - 238th Session December 7, 2016, Wednesday
Recently, the circuit boards of embedded products have become more complex and advanced, leading to renewed attention on JTAG boundary scan testing, which will be explained in an easy-to-understand manner! 【Seminar Content】 1. Overview of JTAG Boundary Scan Testing Introduction to JTAG boundary scan architecture and its application fields 2. Background of JTAG Boundary Scan Testing Changes due to high-density packaging of LSI Issues related to BGA implementation defects and miniaturization/high density Overview of 3D LSI/2.5 LSI using embedded components and TSV technology 3. Inspection methods and characteristics of implemented circuit boards Types of faults detectable by each testing method Complementarity with in-circuit testing / functional testing / X-ray inspection / automated optical inspection (AOI) 4. JTAG ProVision Demonstration Introduction of the procedure for conducting board inspection with a live demonstration 5. Domestic companies implementing JTAG testing and case studies of problem-solving Utilization in development sites and shortening of development periods Utilization in manufacturing sites and reduction of inspection costs Utilization in service sites and reduction of repair costs
Detecting invisible and untouchable solder defects in pins! Compatible with embedded components and TSV technology!
- Testing Equipment and Devices
![[Case Study] Introduction of JTAG T...](https://image.mono.ipros.com/public/product/image/4d7/2000288721/IPROS3769620524753779412.jpg?w=280&h=280){kind=small}
Reduce untested areas in JTAG testing and provide "peace of mind" to our customers!
- Testing Equipment and Devices
![[Case Study] Achieving JTAG Testing...](https://image.mono.ipros.com/public/product/image/b72/2000288780/IPROS6425908109316452797.jpg?w=280&h=280){kind=small}
Establishing a consistent advanced inspection system for high-density implementations in JTAG testing!
- Testing Equipment and Devices
![[Case Study] Adoption of JTAG Testi...](https://image.mono.ipros.com/public/product/image/01f/2000288795/IPROS8349238019806438701.jpg?w=280&h=280){kind=small}
Identify defective areas of BGA-mounted boards at the pin level to improve manufacturing quality!
- Testing Equipment and Devices
![[Case Study] Achieving Quality Assu...](https://image.mono.ipros.com/public/product/image/ab4/2000288811/IPROS5374830012346098332.jpg?w=280&h=280){kind=small}
Feedback the statistical data of BGA defects to manufacturing!
- Testing Equipment and Devices