List of probe products
- classification：probe
346～360 item / All 499 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
An industry-standard electrical inspection device for printed circuit boards that balances productivity and contact accuracy.
- Insulation Tester
- Circuit Board Inspection Equipment
- probe
High-frequency characteristics of high-speed transmission substrates such as LCP, MPI, and fluorine-based materials compatible with 5G and millimeter waves can be measured on production lines!
- Circuit Board Inspection Equipment
- Other measurement, recording and measuring instruments
- probe
![[Comprehensive Catalog] Probes and ...](https://image.mono.ipros.com/public/product/image/94a/2000521731/IPROS55241691776442279300.png?w=280&h=280){kind=small}
Stock products domestically to achieve short delivery times! We also respond to inquiries regarding probe selection.
- probe
- Other measurement, recording and measuring instruments
High-precision measurement of the thickness and refractive index of multilayer films without contact. Easy operation of the main unit and analysis tasks. *Demonstration available and technical materia...
- Optical Measuring Instruments
- Spectroscopic Analysis Equipment
- probe
[WEB Seminar Announcement!] Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometers [Nihon Semilab]
We will be holding a webinar. Details are as follows. If you are interested, please join us! --- **Theme: Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometers - Beginner Level** ■ Date and Time May 13 (Thursday) 16:00 - ■ Content Using a sample with a general structure as an example, we will explain the procedure for creating analysis models. As a beginner level, we plan to explain analyses using the effective medium approximation model, Cauchy model, and Tauc-Lorentz model. *If you wish to participate, please contact us through the Japan Semilab Co., Ltd. website (https://www.semilab-j.jp/seminar/).*
Evaluation of the barrier performance of packaging films
- Leak Testing Equipment
- probe
We were able to incorporate rare metals into the components of a probe that requires complex processing! Please consider the contact with the hard terminals.
- probe
- Other electronic parts
- Inspection fixture
We respond to the need to minimize the variability in resistance values specific to contact probes as much as possible.
- probe
- Other electronic parts
- Inspection fixture
A wide lineup! Custom manufacturing available for size, tip shape, material, load, and more.
- probe
Flexible high-frequency probe station! We have over 15 years of experience and achievements in the industry.
- probe
Manual handler capable of high-temperature measurement inspection for chip devices, temperature up to 250℃.
- Other inspection equipment and devices
- Testing Equipment and Devices
- probe
Introduction of A2LA accredited calibration! Featuring a field-replaceable battery-equipped electric field probe!
- EMC countermeasure products
- probe
- Sensors
High-precision measurement of electric and magnetic field noise.
- EMC Testing
- Magnetic field analysis/electromagnetic wave analysis
- probe
Low-cost tools useful for electrical wiring and cable creation.
- probe
- LCR Meter
- Other cable related products
By calibrating the coaxial cable connection, accurate measurements of the IC chip can be obtained.
- probe
- Semiconductor inspection/test equipment
- IC tag
Looking inside the cylindrical interior! A lineup of stationary and embedded types to suit your needs.
- Defect Inspection Equipment
- Visual Inspection Equipment
- probe