List of probe products

  • classification:probe

346~360 item / All 448 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

  • PRエリア.png
  • Other conveying machines

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Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

  • Satech - AdaptaGuard_Ipros_2023_JP_1.jpg
  • Satech - BlueGuard_Ipros_2023_JP_1.jpg
  • Satech - EasyGuard_Ipros_2023_JP_1.jpg
  • Satech - FastGuard_Ipros_2023_JP_2.jpg
  • Satech - ImpactGuard_Ipros_2023_JP_1.jpg
  • Satech - EasyGuard_Ipros_2023_JP_Media-gallery_1.jpg
  • Satech - ImpactGuard_Ipros_2023_JP_Media-gallery_2.jpg
  • Satech - AdaptaGuard_Ipros_2023_JP_Media-gallery_1.jpg
  • Satech - BlueGuard_Ipros_2023_JP_Media-gallery_2.jpg
  • Other safety and hygiene products

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Affordable pricing for measurements up to DC~26GHz!

  • probe

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Affordable pricing for measurements up to DC~50GHz!

  • probe

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Affordable pricing for measurements up to DC~67GHz!

  • probe

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Affordable pricing for measurements up to DC~110GHz!

  • probe

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Affordable pricing for RF high power measurements from DC to 26GHz!

  • probe

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Compared to conventional products, the chip is approximately 33% smaller, allowing for contact with a very small chip width of about 20μm.

  • probe

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Affordable differential measurements from DC to 26GHz!

  • probe

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The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]

  • probe

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A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!

  • probe

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With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!

  • probe

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We are introducing a comparison of contact resistance values between our products and overseas products from other companies.

  • probe

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Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.

  • probe

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Introducing a high current probe compatible with a 2.54mm pitch and rated for a current of 12A.

  • Processing Jig
  • probe

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We offer a wide range of options to meet various demands from low temperatures to high temperatures.

  • Semiconductor inspection/test equipment
  • probe
  • Other physicochemical equipment

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We offer a wide range of options to meet various demands from low temperatures to high temperatures.

  • Semiconductor inspection/test equipment
  • probe
  • Other physicochemical equipment

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