List of probe products
- classification：probe
391～405 item / All 493 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
A new wireless communication method resistant to noise. A touch probe that can be used continuously for 180 hours on a single battery.
- Other machine elements
- probe
Affordable pricing for measurements up to DC～40GHz!
- probe
Affordable pricing for measurements up to DC～26GHz!
- probe
Affordable pricing for measurements up to DC～50GHz!
- probe
Affordable pricing for measurements up to DC～67GHz!
- probe
Affordable pricing for measurements up to DC～110GHz!
- probe
Affordable pricing for RF high power measurements from DC to 26GHz!
- probe
Compared to conventional products, the chip is approximately 33% smaller, allowing for contact with a very small chip width of about 20μm.
- probe
Affordable differential measurements from DC to 26GHz!
- probe
The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]
- probe
A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!
- probe
With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!
- probe
We are introducing a comparison of contact resistance values between our products and overseas products from other companies.
- probe
Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.
- probe
Introducing a high current probe compatible with a 2.54mm pitch and rated for a current of 12A.
- Processing Jig
- probe