List of Electron microscope products

  • classification:Electron microscope

31~45 item / All 144 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

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  • Other conveying machines

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Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!

  • Cooling system

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April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024

Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.

We will conduct surface morphology observation at high magnification using SEM/FE-SEM.

  • Electron microscope
  • Laser microscope
  • Contract Inspection

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Nano to angstrom resolution! Observation of fine morphology and composition analysis at the atomic level.

  • Electron microscope
  • Contract Analysis
  • Contract measurement

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Assisting with substrate recovery of continuous sections for SEM!

  • Other physicochemical equipment
  • Other laboratory equipment and containers
  • Electron microscope

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Exceptional usability: A digital version with USB connection of the "Standard Type EV-1" is available.

  • Microscope
  • Electron microscope

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Pursuing ease of use for skin observation and research! USB-type handheld micro viewer.

  • Microscope
  • Electron microscope

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Achieve everything from macro to distant views with a single device! Strongly supports a wide range of visual inspections with overwhelming clarity.

  • Microscope
  • Electron microscope

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We will perform operation confirmation of the machine tool from a distance. This microscope covers everything from distant views to macro observations with just one unit.

  • Microscope
  • Electron microscope

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Achieve everything from macro to distant views with a single device! A digital microscope that powerfully supports a wide range of visual inspections with overwhelming clarity. Ideal for remote observ...

  • Microscope
  • Electron microscope

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It is possible to observe cross-sections while observing FIB processing in real time.

  • Contract Analysis
  • Other contract services
  • Electron microscope

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Power device failure location / Slice & View three-dimensional reconstruction

I will introduce the three-dimensional reconstruction of failure locations using the Slice & View function of FIB-SEM. Continuous SEM images of the structure are obtained, and the resulting images are corrected for positional misalignment between the SEM images and visualized in three dimensions using 3D construction software (Avizo). By combining the position identification technique for cross-sectioning the failure location with the Slice & View function, it is possible to obtain continuous SEM images that retain the defective state and include information before and after the abnormal area.

Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.

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  • Electron microscope

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Analysis of organic-inorganic composite materials using FT-IR and EDX.

We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.

Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.

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  • Electron microscope
  • Contract Analysis
  • Contract Inspection

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We have published cross-sectional observations in clear vision mode and normal/standard mode!

  • Electron microscope
  • Contract Analysis
  • Contract Inspection

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4K camera, digital 3D microscope inspection platform "sinaSCOPE" with 3D display, manufactured by SOLECTRIX.

  • 3D measuring device
  • Electron microscope
  • Electron microscope

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Work in a clean room is possible! Since the stem is manufactured in-house, we can offer flexible designs.

  • Ceramics
  • Electron microscope

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We can provide consistent production of alumina-based products! Glass coating is also available.

  • Other processing machines
  • Electron microscope

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