List of Electron microscope products
- classification：Electron microscope
61～75 item / All 128 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
It can be utilized in various fields such as medicine, biology, metals, semiconductors, and ceramics.
- Electron microscope
Electron microscope related: UHV electron microscope static electric deflection type electron gun.
- Microscope
- Other laboratory equipment and containers
- Electron microscope
Electron microscope-related electron microscope sample holder storage device
- Microscope
- Other laboratory equipment and containers
- Electron microscope
Adjust the focus with the dial! You can observe the subject you want to check on the monitor without looking through the viewfinder.
- Electron microscope
- Other microscopes
One-stop service for detailed support!
- Contract measurement
- Electron microscope
High precision sample analysis is supported by a high-precision, ultra-thin grid.
- Electron microscope
- Contract Inspection
- Other microscopes
● It is a digital microscope with an integrated monitor and lighting. ● Observation images can be shared without the need for a separate monitor or PC.
- Electron microscope
High resolution that cannot be achieved with conventional zoom microscopes.
- Electron microscope
A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.
- Electron microscope
Inspection in one shot for 300mm wafers in 1 second.
- Electron microscope
The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.
- Electron microscope
Faithfully simulate TEM/STEM images! Capable of handling protein samples and viruses as well.
- simulator
- Software (middle, driver, security, etc.)
- Electron microscope
June 26-28, 2023: Announcement of the 79th Annual Meeting of the Japanese Society of Microscopy (Matsue City, Shimane Prefecture) for presentations and exhibitions.
■Conference Presentation Announcement■ We will be presenting on the STEM crystal orientation mapping software "DiffChecker." If you are interested, please join us. Date and Time: June 28 (Wednesday) 10:45–11:00, Venue A Title: Development of a Field Screening System Using Crystal Orientation Exploration and Its Application to Crystalline Polymers Speaker: Masataka Ohashi (Bionet Research Institute) Co-author: Koji Jin'nai (Tohoku University) and others Software to be introduced: STEM Crystal Orientation Mapping Software DiffChecker ■Exhibition Announcement Promoting DX in TEM/SEM Image Analysis! We will showcase software that streamlines tasks in electron microscope image processing. During the event, we will have demonstrations by technicians, providing detailed information on operation, features, system configuration, and advantages of the functions. Additionally, we have prepared affordable pricing for academic researchers. Please feel free to ask any questions. We would be delighted if you could stop by our booth during the conference.