List of Other microscopes products
- classification:Other microscopes
31~60 item / All 647 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
Equipped with a 5-inch display! It features two cameras that can switch between front-facing and 90-degree sideways, supporting high-resolution recording at 1920×1080.
- Other microscopes
Applying click reactions! Highly efficient labeling of nucleic acids and proteins, including cell proliferation and apoptosis analysis, as well as new RNA and protein analysis.
- Analytical Equipment and Devices
- Other microscopes
- Other physicochemical equipment
Correcting the optical axis shift of the microscope's front and back, variations in the objective lens magnification, and the camera's θ shift with images!
- Other microscopes
- Optical microscope
- Electron microscope
Supports time-lapse photography while cultivating! A compact digital microscope with a moisture-proof structure!
- Electron microscope
- Other microscopes
We will conduct morphological observations using optical microscopes such as CCD.
- Optical microscope
- Other microscopes
- Contract Inspection
We will conduct hardness measurements tailored to the material and structure of the sample using a hardness testing machine.
- Contract Inspection
- Impact Test
- Other microscopes
Comes with dedicated measurement software! Can be retrofitted regardless of the microscope manufacturer.
- Other microscopes
High repeatability of autofocus! Suitable for those who want to automate focus without individual differences.
- Other microscopes
- Other FA equipment
We measure the positional deviation of the front and back with a repeatability accuracy of ±0.3μm or less!
- Other microscopes
Equipped with an electric XY stage and autofocus function!
- Other microscopes
- Electron microscope
Achieving high-efficiency inspection through simultaneous observation of both sides. A microscope system that reliably captures scratches and misalignments on fine components such as lenses, LED chips...
- Other microscopes
Achieving high-efficiency inspection through simultaneous observation of both sides. A microscope system that reliably captures scratches and misalignments on fine components such as lenses, LED chips...
- Other microscopes
A low-magnification wide-field microscope that can simultaneously observe both sides of electronic components and printed circuit boards. Ideal for scratch inspection and measuring misalignment of ali...
- Other microscopes
Dual-sided wide-angle shooting is possible with a 1x shooting field of view! (Field of view 9mm x 7mm)
- Other microscopes
Safe and secure made in Japan! Observe the blood flow in capillaries at your fingertips and throughout your body more clearly and easily.
- Microscope
- Other microscopes
Entity, phase difference, fluorescence microscope, microscope camera (eyepiece camera) that can be attached to various microscopes and display real-time images.
- Other microscopes
We will propose solutions in the semiconductor field, which we specialize in, tailored to our customers' needs!
- Other microscopes
- Resist Device
- Semiconductor inspection/test equipment
This year, we are introducing new additions! We will introduce the features of the three basic measurement methods.
- Other microscopes
Analysis of organic-inorganic composite materials using FT-IR and EDX.
We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.