List of Analytical Equipment and Devices products

Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

• Other conveying machines

Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!

• Cooling system

It is a device for measuring mass, volume, and density.

• Analytical Equipment and Devices

We support the efficiency of development and the creation of sustainable innovation.

• Business Intelligence and Data Analysis
• Analytical Equipment and Devices
• Other operation management software

Gas-specific monitoring device based on the principle of FT-IR.

• Analytical Equipment and Devices
• Gas recovery/treatment equipment

Infrared Spectroscopic Ellipsometry

• Optical Measuring Instruments
• Analytical Equipment and Devices
• Other environmental analysis equipment

Silicon block internal foreign matter inspection device

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Thin-film solar cell panel measurement device

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Crystal Defect Measurement Device (Light Scattering Tomography)

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Inline wafer measurement module

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

The world's only spectroscopic ellipsometer technology for measuring pore rate and pore distribution using an EP (optical porosimeter).

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

The PN determination of silicon wafers/blocks can be performed instantly.

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Instantly measure the resistance of silicon ingots/blocks non-contact and non-destructively using eddy current technology.

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Mapping measurements using the u-PCD method are possible, and there are numerous achievements in the solar cell and semiconductor markets.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Lifetime measurement device for single crystal silicon blocks

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Crystal defect analysis device (non-contact, non-destructive)

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

A rheometer that allows for the measurement of true elongation strain by applying uniform uniaxial deformation!

• Analytical Equipment and Devices