List of Contract Analysis products
- classification：Contract Analysis
136～150 item / All 2066 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
Using an ultra-short pulse laser with micron-level processing position accuracy, samples can be produced quickly and with low damage.
- Contract Analysis
- Contract measurement
A method for separating components by analyzing volatile components and utilizing differences in gas adsorption or distribution coefficients with respect to the stationary phase.
- Contract measurement
- Contract Analysis
We will introduce the target of analysis, the physical property information obtained, and examples of analysis.
- Contract measurement
- Contract Analysis
Here is an example of the semi-quantification of the eight catechin components contained in green tea.
- Contract Analysis
- Contract measurement
It is possible to visualize the phase separation structure of polymers from thermal conductivity information.
- Contract Analysis
- Contract measurement
Reliability Test
- Contract Analysis
- Contract measurement
Measurement of the light solvent as is.
- Contract Analysis
- Contract measurement
![[IP Method] Ar Ion Polishing Proces...](https://image.mono.ipros.com/public/product/image/3af/387108032/IPROS8821214265644794739.jpg?w=280&h=280){kind=small}
The IP method is a type of polishing technique that uses ion beams for processing.
- Contract Analysis
- Contract measurement
- Contract Inspection
Cooling and hardening the soft sample to make it machinable.
- Contract Analysis
- Contract measurement
- Contract Inspection
HAADF-STEM: High-Angle Annular Dark Field Scanning Transmission Electron Microscopy
- Contract Analysis
XPS: X-ray photoelectron spectroscopy, etc.
- Contract Analysis
TEM: Transmission Electron Microscopy
- Contract Analysis
EBSD: Electron Backscatter Diffraction
- Contract Analysis
Notice of publication of a written article in the May 2012 issue of Applied Physics.
In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.
This is a processing method for producing thin film samples for transmission electron microscopy with a thickness of less than 50 nm by performing mechanical polishing followed by finishing with a low...
- Contract Analysis
- Contract measurement
- Contract Inspection
Processing under atmosphere control, cryo-processing, cooling, TEM: transmission electron microscopy and others.
- Contract Analysis