List of Contract Analysis products
- classification:Contract Analysis
496~510 item / All 2066 items
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- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
Imaging SIMS allows for the visualization of concentration distributions of trace elements in micro-regions.
- Contract Analysis
Identification of failure locations using an emission microscope with a high voltage power supply.
- Contract Analysis
Announcement of the Launch of the EV-Related Analysis Case Study Page
We have opened a page for "EV-related Analysis Case Studies" on our organization's website. We introduce optimal methods and analysis cases by product category. Please check the "Related Links" for considerations regarding analysis related to electric vehicles (EVs). If you have any cases of interest, please feel free to contact us using the button below or through our organization's website.
Evaluation of local resistance distribution using scanning spreading resistance microscopy (SSRM) under vacuum.
- Contract Analysis
We will conduct analysis of various materials, including the disassembly of LEDs, phosphors, and LED chips.
- Contract Analysis
Preprocessing and depth direction analysis are possible under controlled atmosphere conditions.
- Contract Analysis
You can understand the positional relationship between the gate layer, source layer, and body layer.
- Contract Analysis
Molecular structure evaluation by TOF-SIMS and chemical state evaluation by XPS.
- Contract Analysis
Micron-order imaging measurement using TOF-SIMS.
- Contract Analysis
We evaluate by combining various methods such as structural understanding, material assessment, and identification of deterioration causes.
- Contract Analysis
Electron beam induced current method and crystal orientation analysis using SEM.
- Contract Analysis
Crystal orientation analysis using SEM.
- Contract Analysis
Using low acceleration voltage STEM, slight density differences in organic films can be observed.
- Contract Analysis
We will conduct an evaluation that combines various methods to solve the problem.
- Contract Analysis
Low-acceleration STEM observation allows for contrast even in low-density membranes.
- Contract Analysis
Wide-area observation of micro-specific locations is possible through cross-section preparation using ion polishing.
- Contract Analysis