List of Contract Analysis products

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It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...

  • Sensors

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We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!

  • Other semiconductors
  • Processing Contract
  • Wafer

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Imaging SIMS allows for the visualization of concentration distributions of trace elements in micro-regions.

  • Contract Analysis

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Identification of failure locations using an emission microscope with a high voltage power supply.

  • Contract Analysis

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EV車特設ページ_イプロス用.jpg

Announcement of the Launch of the EV-Related Analysis Case Study Page

We have opened a page for "EV-related Analysis Case Studies" on our organization's website. We introduce optimal methods and analysis cases by product category. Please check the "Related Links" for considerations regarding analysis related to electric vehicles (EVs). If you have any cases of interest, please feel free to contact us using the button below or through our organization's website.

Evaluation of local resistance distribution using scanning spreading resistance microscopy (SSRM) under vacuum.

  • Contract Analysis

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We will conduct analysis of various materials, including the disassembly of LEDs, phosphors, and LED chips.

  • Contract Analysis

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Preprocessing and depth direction analysis are possible under controlled atmosphere conditions.

  • Contract Analysis

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You can understand the positional relationship between the gate layer, source layer, and body layer.

  • Contract Analysis

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Molecular structure evaluation by TOF-SIMS and chemical state evaluation by XPS.

  • Contract Analysis

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We evaluate by combining various methods such as structural understanding, material assessment, and identification of deterioration causes.

  • Contract Analysis

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Electron beam induced current method and crystal orientation analysis using SEM.

  • SEM.png
  • EBIC.png
  • Contract Analysis

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Using low acceleration voltage STEM, slight density differences in organic films can be observed.

  • 高加速電圧.png
  • 試料構造図つき.png
  • Contract Analysis

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We will conduct an evaluation that combines various methods to solve the problem.

  • Contract Analysis

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Low-acceleration STEM observation allows for contrast even in low-density membranes.

  • Contract Analysis

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Wide-area observation of micro-specific locations is possible through cross-section preparation using ion polishing.

  • Contract Analysis

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