List of Contract Analysis products
- classification：Contract Analysis
571～585 item / All 2030 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
![[Analysis Case] Foreign Substance A...](https://image.mono.ipros.com/public/product/image/c91/2000366812/IPROS9161118071248246579.jpg?w=280&h=280){kind=small}
Measurement targeting microdomains is possible.
- Contract Analysis
Technical information "Raman 3D mapping of organic multilayer films" and three other items have been released.
We have published the following three analysis case studies on the MST website: - Raman 3D mapping of organic multilayer films - Evaluation of metal and organic contamination on wafer surfaces - Foreign substance analysis on metal components using Raman For more details, please visit the MST website. http://www.mst.or.jp/
![[Analysis Case] Depth Direction Ana...](https://image.mono.ipros.com/public/product/image/d06/2000428831/IPROS14884968757516307941.jpg?w=280&h=280){kind=small}
Depth direction analysis will be conducted to a depth of several micrometers.
- Contract Analysis
- Contract manufacturing
![[Analysis Case] Investigation of Vo...](https://image.mono.ipros.com/public/product/image/690/2000464564/IPROS10710432090807869373.jpg?w=280&h=280){kind=small}
We will evaluate the internal structure of the device in a comprehensive manner.
- Contract Analysis
- Other electronic parts
![[Analysis Case] Evaluation of Glass...](https://image.mono.ipros.com/public/product/image/446/2001514915/IPROS12744388463667417428.jpg?w=280&h=280){kind=small}
Evaluation of GFRP is possible according to the purpose.
- Contract Analysis
- Contract measurement
![[Analysis Case] Mechanical Property...](https://image.mono.ipros.com/public/product/image/aa2/2001519445/IPROS8752482311047438055.jpg?w=280&h=280){kind=small}
It is possible to analyze the deformation behavior of nanomaterials in response to environmental changes (pressure and temperature).
- Contract Analysis
![[SIM] Scanning Ion Microscopy Metho...](https://image.mono.ipros.com/public/product/image/d09/387108028/IPROS2308410282720757772.jpg?w=280&h=280){kind=small}
Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).
- Contract Analysis
- Contract measurement
- Contract Inspection
![[Analysis Case] Analysis of Organic...](https://image.mono.ipros.com/public/product/image/e4e/2000026064/IPROS3983062967139622673.jpg?w=280&h=280){kind=small}
Reduce the impact of foreign object surrounding information with appropriate sampling.
- Contract Analysis
![[Analysis Case] Visualization of St...](https://image.mono.ipros.com/public/product/image/ff5/2000026070/IPROS8071022777044919217.jpg?w=280&h=280){kind=small}
Lattice image analysis using the FFTM method
- Contract Analysis
![[Analysis Case] Observation of the ...](https://image.mono.ipros.com/public/product/image/bb5/2000026074/IPROS4649337917118554439.jpg?w=280&h=280){kind=small}
Capable of observing large-area surface shapes.
- Contract Analysis
![[Analysis Case] Depth Profile Analy...](https://image.mono.ipros.com/public/product/image/385/2000026098/IPROS9135296930525135057.jpg?w=280&h=280){kind=small}
Evaluate organic EL elements with good depth direction resolution.
- Contract Analysis
![[Analysis Case] Measurement of Film...](https://image.mono.ipros.com/public/product/image/571/2000026128/IPROS7813148267828045388.jpg?w=280&h=280){kind=small}
X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.
- Contract Analysis
![[Analysis Case] Evaluation of SiON ...](https://image.mono.ipros.com/public/product/image/31b/2000026131/IPROS6262615311769425077.jpg?w=280&h=280){kind=small}
Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.
- Contract Analysis
![[Analysis Case] Evaluation of B Pen...](https://image.mono.ipros.com/public/product/image/2c5/2000026132/IPROS2446011000155267654.jpg?w=280&h=280){kind=small}
Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.
- Contract Analysis
![[Analysis Case] Evaluation of Ultra...](https://image.mono.ipros.com/public/product/image/e14/2000026138/IPROS1310354271873158325.jpg?w=280&h=280){kind=small}
Evaluation of dopant distribution and junctions is possible even in extremely shallow regions.
- Contract Analysis
![[Analysis Case] Evaluation of the D...](https://image.mono.ipros.com/public/product/image/a48/2000026144/IPROS4233872736396844348.jpg?w=280&h=280){kind=small}
Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.
- Contract Analysis