List of Contract Analysis products
- classification：Contract Analysis
1051～1065 item / All 2052 items
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
You can download a free booklet that introduces the uses, structures, and examples of various types of frames.
- Other machine tools
- Solar power generator
- Other energy equipment
This is a course for those who want to learn the fundamentals of material properties. It explains the principles and measurement methods of material properties, mechanical property evaluation, materia...
- Distance learning/E-learning
- Contract Analysis
This is a course for those who want to learn surface analysis from the basics. It explains the principles and spectrum examples of TOF-SIMS, RBS, and XPS.
- Contract Analysis
- Distance learning/E-learning
Beginner's Online Course (e-learning) [Surface Analysis]
This is a course designed for those who want to learn about surface analysis from the basics. It provides easy and compact explanations on the following topics: - Surface analysis - TOF-SIMS: Time-of-flight secondary ion mass spectrometry (principles, spectrum examples) - RBS: Rutherford backscattering spectrometry (principles, spectrum examples) - XPS: X-ray photoelectron spectroscopy (principles, spectrum examples) - Measurement case: Organic EL devices As a benefit of taking the course, there is a "question and answer service regarding the course content." If you want to deepen your understanding of the principles of analytical methods or if you have unclear points about measurement cases that are difficult to convey in video lectures, an analysis expert will provide answers. ◎ For details on how to apply, please visit here: https://www.toray-research.co.jp/service/seminar/online/
This is a course for those who want to learn organic composition analysis from the basics. It explains the analysis results and interpretation of infrared spectroscopy, mass spectrometry, and nuclear ...
- Contract Analysis
- Other polymer materials
- Distance learning/E-learning
![[TEM ED-Map] TEM Electron Diffracti...](https://image.mono.ipros.com/public/product/image/371/2000823132/IPROS13976815575557580837.jpg?w=280&h=280){kind=small}
This is a method for analyzing the orientation distribution of crystalline samples using electron diffraction in a transmission electron microscope (TEM).
- Contract measurement
- Contract Analysis
Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
![[TOF-SIMS] Time-of-Flight Secondary...](https://image.mono.ipros.com/public/product/image/cf8/387108015/IPROS364447109984113922.jpg?w=280&h=280){kind=small}
This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the v...
- Contract Analysis
- Contract measurement
- Contract Inspection
Announcement of the new TOF-SIMS service starting from October 2016.
In October 2016, MST will introduce the latest high-resolution TOF-SIMS and begin analysis services. We will provide analysis services across a wide range of fields, including pharmaceuticals, biotechnology, medical devices, and product development and quality control related to electronics. Building on our proven TOF-SIMS analysis technology, we will further support our customers' research and development with high-quality data. For more details, please visit the URL below. http://www.mst.or.jp/corporate/tabid/1211/Default.aspx Introduction of analysis examples: • Introduction of new TOF-SIMS services [for pharmaceuticals, biotechnology, and medical devices] http://www.mst.or.jp/special/tabid/1194/Default.aspx • Introduction of new TOF-SIMS services [for the electronics field] http://www.mst.or.jp/special/tabid/1210/Default.aspx
XRR：X-ray Reflectivity
- Contract Analysis
- Contract measurement
- Contract Inspection
![[FIB] Focused Ion Beam Processing](https://image.mono.ipros.com/public/product/image/b01/387108030/IPROS7900017760392336423.jpg?w=280&h=280){kind=small}
FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas...
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.
- Contract Analysis
- Contract measurement
- Contract Inspection
Obtain information about the molecular structure and crystal structure of the sample.
- Contract Analysis
- Contract measurement
- Contract Inspection
[MST Homepage] Analysis Case "Evaluation of Bone Condition Before and After HF Treatment" has been published.
We have published analysis cases on the MST homepage. ◆Title Evaluation of Bone Condition Before and After HF Treatment ~Evaluation of Condition Before and After Chemical Treatment Using Raman Analysis~ ◆Measurement Method / Processing Method Raman / Chemical Treatment ◆Product Field Pharmaceuticals / Biotechnology ◆Analysis Purpose Evaluation of Chemical Bonding State ◆Overview HF (hydrofluoric acid) is widely used in processes such as wet etching of SiO2 and plays a very important role in semiconductor manufacturing. However, it is also a very dangerous chemical that can penetrate the skin and damage bones, requiring careful handling. The erosion of bones caused by HF occurs due to the reaction between Ca, which exists in bones as apatite, and HF, resulting in the formation of CaF2. This case introduces an evaluation of the changes in this reaction using Raman analysis. ★★For detailed data, please see the link★★
![[EBSD] Electron Backscatter Diffrac...](https://image.mono.ipros.com/public/product/image/bef/387108007/IPROS4688397342881936146.jpg?w=280&h=280){kind=small}
It is possible to easily obtain crystal information over a wide area.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[EBIC] Electron Beam Induced Curren...](https://image.mono.ipros.com/public/product/image/03a/387108025/IPROS8986659968992890200.jpg?w=280&h=280){kind=small}
A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TEM-EELS] Electron Energy Loss Spe...](https://image.mono.ipros.com/public/product/image/d11/387108027/IPROS1835117444880261851.jpg?w=280&h=280){kind=small}
By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TDS] Thermal Desorption Gas Analys...](https://image.mono.ipros.com/public/product/image/2fd/2000038326/IPROS11345817645571470646.jpg?w=280&h=280){kind=small}
A mass spectrometry method that allows monitoring of gases generated by vacuum heating/warming at different temperatures, with high sensitivity for detecting hydrogen and water.
- Contract Analysis
- Other contract services
- Circuit board design and manufacturing
PL：PhotoLuminescence
- Contract Analysis
- Other contract services
- Circuit board design and manufacturing
Added PL analysis (photoluminescence method).
We have added PL analysis (photoluminescence method) to the list of handled products. PL analysis is a method that observes the light emitted when excited electrons transition to the ground state after being illuminated by light. For more detailed information, please refer to the catalog.