List of Contract measurement products
- classification：Contract measurement
211～225 item / All 2156 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
![[TEM-EDX] Energy Dispersive X-ray S...](https://image.mono.ipros.com/public/product/image/eea/2000240814/IPROS3960834512466909797.jpg?w=280&h=280){kind=small}
EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional...
- Contract Analysis
- Contract measurement
- Contract Inspection
![[ED] Electron Diffraction Method](https://image.mono.ipros.com/public/product/image/aa2/2000240821/IPROS81867168414493685965.jpeg?w=280&h=280){kind=small}
ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.
- Contract Analysis
- Contract measurement
- Contract Inspection
UV-Vis is a method that measures the intensity of light transmitted through a sample by irradiating the sample with light divided by wavelength, allowing for the determination of the sample's absorban...
- Contract Analysis
- Contract measurement
- Contract Inspection
Absolute PL quantum yield measurement is a method for determining the photoluminescence efficiency of materials.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[Analysis Case] Structural Evaluati...](https://image.mono.ipros.com/public/product/image/f93/2000745939/IPROS12667462697641529093.jpg?w=280&h=280){kind=small}
Evaluation of particle size and crystal orientation of living materials, atomic-level observation is possible.
- Charger
- Contract measurement
![[TEM ED-Map] TEM Electron Diffracti...](https://image.mono.ipros.com/public/product/image/371/2000823132/IPROS13976815575557580837.jpg?w=280&h=280){kind=small}
This is a method for analyzing the orientation distribution of crystalline samples using electron diffraction in a transmission electron microscope (TEM).
- Contract measurement
- Contract Analysis
By measuring the fluorescence lifetime of a substance, we can grasp the luminescent transient phenomena more dynamically.
- Contract measurement
Genetic analysis is a method that reads the nucleotide sequences of DNA to investigate gene mutations and functions.
- Contract Analysis
- Contract measurement
We will conduct qualitative evaluation of organic materials, focusing on hall transport materials, using LC/MS.
- Contract measurement
We evaluate the effects of vibrations and durability on electronic components, electronic devices, and other products during use or transportation.
- Contract measurement
Testing can be conducted using the solder pot balance method, solder ball balance method, and solder paste method.
- Contract measurement
By detecting the sound generated when tiny foreign objects inside the hollow structure collide with the wall, it is possible to prevent troubles such as shorts before they occur.
- Contract measurement
We evaluate the effects and destruction tolerance when semiconductors and electronic components are subjected to stress from static electricity.
- Contract measurement
![[Analysis Case] Component Analysis ...](https://image.mono.ipros.com/public/product/image/c2b/2001512432/IPROS10397238807307473945.jpg?w=280&h=280){kind=small}
We will conduct a comprehensive qualitative evaluation of vulcanization accelerators, aging inhibitors, lubricants, and other substances in rubber products.
- Contract measurement
- Contract Analysis
High magnification observation (up to about 300,000 times) is possible.
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of publication of a written article in the May 2012 issue of Applied Physics.
In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.