List of Contract Inspection products
- classification：Contract Inspection
421～435 item / All 1798 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
Measurement of weight change, differential thermal analysis, heat quantity, and mass of volatile components resulting from heating the sample.
- Contract Analysis
- Contract measurement
- Contract Inspection
[MST Homepage] Analysis Case "Investigation of Curing Temperature and Glass Transition Temperature of Epoxy Resin" has been published.
We have published analysis cases on the MST homepage. ◆Title Investigation of Curing Temperature and Glass Transition Temperature of Epoxy Resin ~Thermal Property Evaluation by DSC (Differential Scanning Calorimetry) Measurement~ ◆Measurement Method / Processing Method DSC ◆Product Field Electronic Components / Daily Necessities ◆Analysis Purpose Product Investigation / Thermal Property Evaluation ◆Overview Using DSC (Differential Scanning Calorimetry), we investigated the curing temperature and the glass transition temperature (Tg), which is an indicator of heat resistance, for a two-component epoxy resin. The DSC measurement of the uncured resin confirmed that a rapid exothermic reaction began around 103°C (Figure 1). This was due to the polymerization (curing) of the resin caused by the temperature increase. Furthermore, after air cooling the cured resin to room temperature, a second DSC measurement showed a shift of the baseline towards the endothermic side due to the glass transition of the resin, with Tg being approximately 116°C (Figure 2). ★★For detailed data, please see the linked page★★
This is a course for those who want to learn inorganic analysis from the basics. It explains the principles and measurement examples of X-ray fluorescence analysis, ICP-OES/ICP-MS, and IC.
- Contract Inspection
- Technical Seminar
We will conduct diagnostics for wire rope strand breaks and shape changes, as well as inspections of overhead crane running rails, safely, quickly, and accurately!
- Contract Inspection
Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
![[TOF-SIMS] Time-of-Flight Secondary...](https://image.mono.ipros.com/public/product/image/cf8/387108015/IPROS364447109984113922.jpg?w=280&h=280){kind=small}
This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the v...
- Contract Analysis
- Contract measurement
- Contract Inspection
Announcement of the new TOF-SIMS service starting from October 2016.
In October 2016, MST will introduce the latest high-resolution TOF-SIMS and begin analysis services. We will provide analysis services across a wide range of fields, including pharmaceuticals, biotechnology, medical devices, and product development and quality control related to electronics. Building on our proven TOF-SIMS analysis technology, we will further support our customers' research and development with high-quality data. For more details, please visit the URL below. http://www.mst.or.jp/corporate/tabid/1211/Default.aspx Introduction of analysis examples: • Introduction of new TOF-SIMS services [for pharmaceuticals, biotechnology, and medical devices] http://www.mst.or.jp/special/tabid/1194/Default.aspx • Introduction of new TOF-SIMS services [for the electronics field] http://www.mst.or.jp/special/tabid/1210/Default.aspx
XRR：X-ray Reflectivity
- Contract Analysis
- Contract measurement
- Contract Inspection
![[FIB] Focused Ion Beam Processing](https://image.mono.ipros.com/public/product/image/b01/387108030/IPROS7900017760392336423.jpg?w=280&h=280){kind=small}
FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas...
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.
- Contract Analysis
- Contract measurement
- Contract Inspection
Obtain information about the molecular structure and crystal structure of the sample.
- Contract Analysis
- Contract measurement
- Contract Inspection
[MST Homepage] Analysis Case "Evaluation of Bone Condition Before and After HF Treatment" has been published.
We have published analysis cases on the MST homepage. ◆Title Evaluation of Bone Condition Before and After HF Treatment ~Evaluation of Condition Before and After Chemical Treatment Using Raman Analysis~ ◆Measurement Method / Processing Method Raman / Chemical Treatment ◆Product Field Pharmaceuticals / Biotechnology ◆Analysis Purpose Evaluation of Chemical Bonding State ◆Overview HF (hydrofluoric acid) is widely used in processes such as wet etching of SiO2 and plays a very important role in semiconductor manufacturing. However, it is also a very dangerous chemical that can penetrate the skin and damage bones, requiring careful handling. The erosion of bones caused by HF occurs due to the reaction between Ca, which exists in bones as apatite, and HF, resulting in the formation of CaF2. This case introduces an evaluation of the changes in this reaction using Raman analysis. ★★For detailed data, please see the link★★
![[EBSD] Electron Backscatter Diffrac...](https://image.mono.ipros.com/public/product/image/bef/387108007/IPROS4688397342881936146.jpg?w=280&h=280){kind=small}
It is possible to easily obtain crystal information over a wide area.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[EBIC] Electron Beam Induced Curren...](https://image.mono.ipros.com/public/product/image/03a/387108025/IPROS8986659968992890200.jpg?w=280&h=280){kind=small}
A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TEM-EELS] Electron Energy Loss Spe...](https://image.mono.ipros.com/public/product/image/d11/387108027/IPROS1835117444880261851.jpg?w=280&h=280){kind=small}
By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.
- Contract Analysis
- Contract measurement
- Contract Inspection
Ion chromatography is a method for detecting ionic components in liquid samples.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[GDMS] Glow Discharge Mass Spectrom...](https://image.mono.ipros.com/public/product/image/569/2000240719/IPROS13633680634984708159.jpeg?w=280&h=280){kind=small}
Dissociate and fragment specific mass ions, and detect them with a mass spectrometer.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TEM-EDX] Energy Dispersive X-ray S...](https://image.mono.ipros.com/public/product/image/eea/2000240814/IPROS3960834512466909797.jpg?w=280&h=280){kind=small}
EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional...
- Contract Analysis
- Contract measurement
- Contract Inspection