List of probe products
- classification：probe
361～405 item / All 443 items
Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!
- probe
From narrow pitch measurements of 0.05 mm to high current power semiconductors.
- probe
As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.
- probe
Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!
- probe
We are currently offering a guide that clearly explains the method for selecting probes with illustrations.
- probe
- Inspection fixture
- Processing Jig
A wide variety of probes in stock! Leave the selection of probes to us!
- probe
- Inspection fixture
- Processing Jig
It is possible to reduce high-frequency loss and direct current resistance values!
- probe
For partial electrode support such as probe cards!
- probe
Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!
- probe
Needle probes suitable for continuity testing fixtures for substrates (printed circuit boards and semiconductor packages)! Precision machining with a focus on quality!
- probe
Standard products have a minimum pitch of 0.15 mm and a minimum product length of 1 mm. We also accommodate requests for sizes and shapes other than standard products!
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Introducing contact probes compatible with a 2.54mm pitch, highly regarded worldwide!
- Processing Jig
- probe
A wide variety of highly rated contact probes from around the world! Over 3,000 types available!
- Processing Jig
- probe
Probes for bare board testers that can accommodate fine pitches! Achieves excellent durability due to its simple mechanism!
- Processing Jig
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Design and manufacture centered on ultra-low temperature experimental equipment and vacuum application devices.
- Other physicochemical equipment
- Testing Equipment and Devices
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We will assist you in the development of new products and the rationalization of production!
- Other machine elements
- Other molds
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Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
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Introducing contact probes compatible with a 1.91mm pitch, highly rated worldwide!
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Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
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Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
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Introducing contact probes compatible with a 1mm pitch! Highly rated worldwide.
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Introducing contact probes compatible with a 0.7mm pitch, highly regarded worldwide!
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Introducing contact probes compatible with a 0.6mm pitch, highly regarded worldwide!
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Introducing contact probes compatible with a 0.5mm pitch, highly regarded worldwide!
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A new shape that securely holds small chip components from size 0603!
- Other measurement, recording and measuring instruments
- Other electronic measuring instruments
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Various materials, shapes, dimensions, etc., are available considering electrical characteristics.
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Completely non-magnetic (permeability < 1.01μ). Minimum pitch 0.35mm or more.
- probe
Multi-contact connection recruitment! A connector that can be pressed against the supply terminal for use.
- Other Connectors
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The quality assurance department has been waiting! Voltage probes for oscilloscopes that can be used in a temperature range of -55°C to +155°C within a temperature-controlled chamber.
- oscilloscope
- probe
- Thermostatic chamber
Electrodes for trace sample applications in chemical analysis, scientific research, and pharmaceuticals.
- Other physicochemical equipment
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A must-see for electronic component designers! A probe capable of probing waveforms in a constant temperature chamber with a temperature range of -55℃ to 155℃.
- oscilloscope
- probe
- Thermostatic chamber
Direct probing of the current waveform of the IC leads mounted on the substrate. Probing the current waveform flowing through a wide bus bar.
- oscilloscope
- Ammeter
- probe
We will be exhibiting at Measurement Exhibition 2015 TOKYO!
We are pleased to announce that our company will be exhibiting at Measurement Expo 2015 TOKYO. We sincerely invite you to visit us. ■ Dates: December 2 (Wed) - 4 (Fri), 2015 ■ Venue: Tokyo Big Sight, Booth No. M4-34 ■ Products to be exhibited: - Semiconductor Curve Tracer CS Series - 400MHz Wideband Differential Probe BumbleBee - Japanese-made Rogowski Coil Current Probe - SE-6000 Series Isolation Probe - PSM3750 Frequency Response & Impedance Analyzer (manufactured by Newtons4th, UK) - Small Signal Amplifier - and more.
Compatible with various precious metals! Probe pins that meet your needs.
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Small-sized wideband high-voltage probe for 1kV to 6kV.
- Other cable related products
- oscilloscope
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It enables high speed and high precision in all directional orientations.
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Complex work, free-form surfaces, and contour measurement times will be extremely shortened.
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Quickly and reliably detect processing defects through analog scanning of the work surface.
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It is used for quick and accurate automatic tool setting and work measurement.
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It is a probe that integrates all the advantages of the Shark 360 measurement mechanism.
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Enables high-speed, high-precision automatic tool setting and breakage detection within composite processing machines.
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Automatic centering of workpieces with high speed and high precision, as well as measurement of workpiece dimensions, is possible.
- probe