List of probe products
- classification:probe
361~405 item / All 463 items
Heat resistant up to 1200℃. We will custom-make high-performance insulation covers that ensure safety in the working environment!
- Glass
A new wireless communication method resistant to noise. A touch probe that can be used continuously for 180 hours on a single battery.
- Other machine elements
- probe
Affordable pricing for measurements up to DC~40GHz!
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Affordable pricing for measurements up to DC~26GHz!
- probe
Affordable pricing for measurements up to DC~50GHz!
- probe
Affordable pricing for measurements up to DC~67GHz!
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Affordable pricing for measurements up to DC~110GHz!
- probe
Affordable pricing for RF high power measurements from DC to 26GHz!
- probe
Compared to conventional products, the chip is approximately 33% smaller, allowing for contact with a very small chip width of about 20μm.
- probe
Affordable differential measurements from DC to 26GHz!
- probe
The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]
- probe
A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!
- probe
With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!
- probe
We are introducing a comparison of contact resistance values between our products and overseas products from other companies.
- probe
Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.
- probe
Introducing a high current probe compatible with a 2.54mm pitch and rated for a current of 12A.
- Processing Jig
- probe
We offer a wide range of options to meet various demands from low temperatures to high temperatures.
- Semiconductor inspection/test equipment
- probe
- Other physicochemical equipment
We offer a wide range of options to meet various demands from low temperatures to high temperatures.
- Semiconductor inspection/test equipment
- probe
- Other physicochemical equipment
- Optimal for measuring the Seebeck coefficient - Enabled measurement of the sample surface temperature based on a vacuum prober system.
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- probe
- Equipped with a temperature gradient generation unit that directly applies heat to the sample - Equipped with a micro-infrared camera unit
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- probe
Providing precision probes, precision parts, and precision models (such as desktopZERO).
- probe
IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!
- Contract manufacturing
- probe
A unique structure of a sensitive probe that supports high-precision measurement!
- Contract manufacturing
- probe
Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!
- probe
From narrow pitch measurements of 0.05 mm to high current power semiconductors.
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As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.
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Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!
- probe
We are currently offering a guide that clearly explains the method for selecting probes with illustrations.
- probe
- Inspection fixture
- Processing Jig
A wide variety of probes in stock! Leave the selection of probes to us!
- probe
- Inspection fixture
- Processing Jig
It is possible to reduce high-frequency loss and direct current resistance values!
- probe
For partial electrode support such as probe cards!
- probe
Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!
- probe
Needle probes suitable for continuity testing fixtures for substrates (printed circuit boards and semiconductor packages)! Precision machining with a focus on quality!
- probe
Standard products have a minimum pitch of 0.15 mm and a minimum product length of 1 mm. We also accommodate requests for sizes and shapes other than standard products!
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Introducing contact probes compatible with a 2.54mm pitch, highly regarded worldwide!
- Processing Jig
- probe
A wide variety of highly rated contact probes from around the world! Over 3,000 types available!
- Processing Jig
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Probes for bare board testers that can accommodate fine pitches! Achieves excellent durability due to its simple mechanism!
- Processing Jig
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Design and manufacture centered on ultra-low temperature experimental equipment and vacuum application devices.
- Other physicochemical equipment
- Testing Equipment and Devices
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We will assist you in the development of new products and the rationalization of production!
- Other machine elements
- Other molds
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Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
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Introducing contact probes compatible with a 1.91mm pitch, highly rated worldwide!
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Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
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Introducing contact probes compatible with a 1mm pitch! Highly rated worldwide.
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Introducing contact probes compatible with a 0.7mm pitch, highly regarded worldwide!
- probe