List of probe products
- classification：probe
361～405 item / All 454 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!
- probe
We are introducing a comparison of contact resistance values between our products and overseas products from other companies.
- probe
Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.
- probe
Introducing a high current probe compatible with a 2.54mm pitch and rated for a current of 12A.
- Processing Jig
- probe
We offer a wide range of options to meet various demands from low temperatures to high temperatures.
- Semiconductor inspection/test equipment
- probe
- Other physicochemical equipment
We offer a wide range of options to meet various demands from low temperatures to high temperatures.
- Semiconductor inspection/test equipment
- probe
- Other physicochemical equipment
- Optimal for measuring the Seebeck coefficient - Enabled measurement of the sample surface temperature based on a vacuum prober system.
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- probe
- Equipped with a temperature gradient generation unit that directly applies heat to the sample - Equipped with a micro-infrared camera unit
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- probe
Providing precision probes, precision parts, and precision models (such as desktopZERO).
- probe
IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!
- Contract manufacturing
- probe
A unique structure of a sensitive probe that supports high-precision measurement!
- Contract manufacturing
- probe
Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!
- probe
From narrow pitch measurements of 0.05 mm to high current power semiconductors.
- probe
As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.
- probe
Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!
- probe
We are currently offering a guide that clearly explains the method for selecting probes with illustrations.
- probe
- Inspection fixture
- Processing Jig
A wide variety of probes in stock! Leave the selection of probes to us!
- probe
- Inspection fixture
- Processing Jig
It is possible to reduce high-frequency loss and direct current resistance values!
- probe
For partial electrode support such as probe cards!
- probe
Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!
- probe
Needle probes suitable for continuity testing fixtures for substrates (printed circuit boards and semiconductor packages)! Precision machining with a focus on quality!
- probe
Standard products have a minimum pitch of 0.15 mm and a minimum product length of 1 mm. We also accommodate requests for sizes and shapes other than standard products!
- probe
Introducing contact probes compatible with a 2.54mm pitch, highly regarded worldwide!
- Processing Jig
- probe
A wide variety of highly rated contact probes from around the world! Over 3,000 types available!
- Processing Jig
- probe
Probes for bare board testers that can accommodate fine pitches! Achieves excellent durability due to its simple mechanism!
- Processing Jig
- probe
Design and manufacture centered on ultra-low temperature experimental equipment and vacuum application devices.
- Other physicochemical equipment
- Testing Equipment and Devices
- probe
We will assist you in the development of new products and the rationalization of production!
- Other machine elements
- Other molds
- probe
Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 1.91mm pitch, highly rated worldwide!
- probe
Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 1mm pitch! Highly rated worldwide.
- probe
Introducing contact probes compatible with a 0.7mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 0.6mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 0.5mm pitch, highly regarded worldwide!
- probe
Introducing probe and electrode settings available for grand feed-through!
- Sealing
- probe
- Other electronic parts
A new shape that securely holds small chip components from size 0603!
- Other measurement, recording and measuring instruments
- Other electronic measuring instruments
- probe
Various materials, shapes, dimensions, etc., are available considering electrical characteristics.
- probe
Completely non-magnetic (permeability < 1.01μ). Minimum pitch 0.35mm or more.
- probe
Multi-contact connection recruitment! A connector that can be pressed against the supply terminal for use.
- Other Connectors
- probe
The quality assurance department has been waiting! Voltage probes for oscilloscopes that can be used in a temperature range of -55°C to +155°C within a temperature-controlled chamber.
- oscilloscope
- probe
- Thermostatic chamber
Electrodes for trace sample applications in chemical analysis, scientific research, and pharmaceuticals.
- Other physicochemical equipment
- probe
A must-see for electronic component designers! A probe capable of probing waveforms in a constant temperature chamber with a temperature range of -55℃ to 155℃.
- oscilloscope
- probe
- Thermostatic chamber