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Analysis Product List and Ranking from 376 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated: Aggregation Period:Jan 14, 2026~Feb 10, 2026
This ranking is based on the number of page views on our site.

Analysis Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Jan 14, 2026~Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. アイテス Shiga//Electronic Components and Semiconductors
  2. ヒューリンクス Tokyo//software
  3. 中電シーティーアイ 本社 Aichi//Service Industry
  4. 4 一般財団法人材料科学技術振興財団 MST Tokyo//Testing, Analysis and Measurement
  5. 5 null/null

Analysis Product ranking

Last Updated: Aggregation Period:Jan 14, 2026~Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. Graph Creation and Data Analysis for Researchers: KaleidaGraph ヒューリンクス
  2. DAXON Reaction Tank Impact Analysis Service *Introduction Materials Available 中電シーティーアイ 本社
  3. Specification verification and failure analysis through reliability testing. アイテス
  4. 4 Dad's factory DX solution promoting manufacturing.
  5. 5 Food-grade twin-screw extruder 'TEX-F'

Analysis Product List

121~150 item / All 1052 items

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Power product electrical analysis services

Design and development support considering the transmission line characteristics of power products.

Our company provides design support based on a wide range of experience in semiconductor application products, from LSI to power electronics. In the field of power electronics, represented by inverters, which has gained attention in recent years, solving challenges during switching is a key point. We can offer comprehensive design support, from transmission line analysis using electromagnetic field analysis simulators to product evaluation, and further to analysis and verification of circuit simulations.

  • Calibration and repair
  • Analysis

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WTI Heat and Stress Clinic - Heat and Stress Simulation - (Analysis)

If a product malfunctions, let's consult a specialist (expert) and take measures! Simulation, analysis.

"Troubles have occurred with development and mass-produced products. I want to quickly identify the cause and implement countermeasures." "I want to understand the necessity of heat dissipation measures and the methods for implementing them." By receiving diagnostic results and solutions for defects from experts in heat and stress, you can resolve issues in a short period of time. (Simulation, analysis) By utilizing this before product prototyping, it is possible to know in advance the "preventive measures" to prevent product troubles related to heat and stress. By conducting development in accordance with these "preventive measures," you can significantly avoid issues arising towards the end of the development period, design revisions, and the resulting time losses. [Features] ■ Understand actual products and provide analysis results ■ Provide solutions that combine various technologies ■ Possess a unique semiconductor thermal resistance measurement technology developed based on the structure and thermal characteristics of semiconductors *For more details, please refer to the PDF materials or feel free to contact us.

  • Circuit board design and manufacturing
  • Other contract services
  • Analysis

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Analysis of crystal grains below 30nm using the EBSD method.

EBSD: Electron Backscatter Diffraction

By conducting EBSD analysis on thinned samples, higher spatial resolution can be achieved compared to conventional bulk samples.

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[Analysis Case] Analysis of H termination on Si surface

Qualitative and relative comparison of SiH and states on the Si surface due to differences in processing.

We compared the states of the Si surface after HF treatment and after ozone treatment. In the positive ion spectrum, the peak intensity of Si was different. The weaker Si intensity after HF treatment is due to Si being metallic, while the stronger Si intensity after UV-ozone cleaning and in the As Received state is due to Si being oxide-based. From the negative ion spectrum, fragment ions reflecting the surface state were detected: SiF, SiH, and Six series after HF treatment, and SiO2 series after UV-ozone cleaning and in the As Received state.

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[Analysis Case] Structural Analysis of Epoxy Resin

Structural analysis of LED encapsulants using thermal decomposition GC/MS method.

Epoxy resin is excellent in heat resistance, chemical resistance, and insulation properties, and also has high mechanical strength, making it suitable for various applications such as insulation materials for electronic devices, adhesives, paints, and construction materials. However, due to the lack of solvent solubility, the analytical methods for structural determination are limited. This case presents an example of thermal decomposition GC/MS measurement of epoxy resin used as a sealing material for LEDs. The thermal decomposition products reflecting the structures of the main agent and curing agent were obtained, and this resin was estimated to be a bisphenol A/anhydride type epoxy resin.

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[Analysis Case] Peptide Sequence Analysis by LC/MS/MS

We will analyze the amino acid sequence of the peptide using LC/MS/MS analysis.

When peptides are measured using LC/MS/MS, characteristic fragment ions are obtained, allowing for the analysis of the amino acid sequence that makes up the peptide. Additionally, because peptides are separated and analyzed by LC, it is possible to analyze the sequences even in samples containing multiple peptides or impurities. Here, we present a case study where low molecular weight peptides were analyzed using LC/MS/MS, and the amino acid sequences were estimated.

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Shotgun analysis of proteins

LC/MS/MS: Liquid Chromatography-Mass Spectrometry

In protein composition analysis, there are methods to examine only the target protein after electrophoresis, but this document introduces "shotgun analysis," which comprehensively investigates proteins. In shotgun analysis, after separating proteins and obtaining mass information using LC/MS/MS measurements, a database search is conducted to comprehensively analyze the proteins present in the solution.

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[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations

Microscopic structural analysis of amorphous films is possible through simulation.

Amorphous SiNx (a-SiNx) films exhibit significant changes in physical properties from semiconductors to insulators due to compositional variations such as the N/Si ratio, making them suitable for a wide range of applications, including gate insulating films for transistors. On the other hand, experimental methods capable of atomic-level microscopic structural analysis for materials with non-crystalline amorphous structures are limited. Therefore, creating and analyzing amorphous structures with various compositions and densities through simulation becomes an effective tool. This document presents examples of structural analysis of a-SiNx films using molecular dynamics calculations.

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XPS spectrum data analysis service

I will take care of the analysis of your XPS spectral data and the creation of the report.

In recent years, advancements in measurement devices have made it possible to obtain high-quality and large amounts of XPS spectral data in a short period. However, analyzing the acquired spectral data requires not only time and effort for database research and mastering analytical techniques but also often demands judgments backed by past experience, which poses a barrier to the effective utilization of the devices and data held. MST offers a one-stop service for users facing such challenges, handling everything from analysis to report creation for your XPS spectral data.

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Defect level analysis in wide bandgap semiconductor GaN using first-principles calculations.

Various physical property information such as point defect formation energy, charge, and optical transitions can be obtained.

Gallium nitride (GaN), a wide bandgap semiconductor, is primarily used in the field of power devices, and in recent years, there has been an increasing demand for applications such as rapid chargers and 5G communication base stations. In the development of high-reliability GaN, it is important to understand the reduction of defects in the crystal and the impact of these defects on electrical and optical properties. This document presents a case study analyzing the defect levels formed by nitrogen vacancies (VN) in GaN using first-principles calculations. This analysis is applicable not only to vacancies but also to various point defects in crystalline materials, such as element substitutions. For more details, please download the document or contact us.

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[Analysis Case] Three-Dimensional Structure Analysis of Hair

Quantitative evaluation of hair is possible using X-ray CT and image analysis technology.

Hair that has been damaged by factors such as hair color, ultraviolet rays, and aging undergoes structural changes, and measuring these structural changes is important for the research and development of hair care products. In this case, we observed the structure of hair using X-ray CT. Furthermore, by performing image analysis on the obtained CT cross-sectional images, we created histograms of the void volume in the cortex and the spacing of the cuticles. By combining X-ray CT and image analysis in this way, it is possible to quantitatively evaluate the three-dimensional structure of hair. Measurement methods: X-ray CT, computational science, AI, data analysis Product fields: Biotechnology, pharmaceuticals, cosmetics Analysis objectives: Shape evaluation, structural evaluation For more details, please download the materials or contact us.

  • Contract Analysis
  • Contract measurement
  • Analysis

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[Analysis Case] Analysis of Organic EL (OLED) Emission Layer

Quantitative evaluation of the guest in the light-emitting layer and film thickness is possible.

Organic EL displays are advancing towards practical use by leveraging advantages such as high brightness, high-resolution color, and thinness due to their self-emission principle. In the emission layer, guest molecules are doped into host molecules to enhance the emission efficiency. In this study, we identified the emission layer materials for red pixels in organic EL display elements. Additionally, we conducted thickness evaluation of the emission layer using a newly developed step gauge and quantified the guest materials within the emission layer. This allows for qualitative and quantitative analysis of guest molecules in the emission layer, as well as evaluation of the thickness of the emission layer. Measurement methods: TOF-SIMS, TEM, XPS Product field: Displays Analysis purpose: Composition evaluation, identification, thickness evaluation For more details, please download the materials or contact us.

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[Analysis Case] Extraction, Chemical Decomposition, and Structural Analysis of Lignin

Various analyses targeting the wood biomass component "lignin" are possible.

Lignin is an aromatic polymer component that accounts for about 30% of wood biomass, and attention is being drawn to its potential as an alternative to petrochemical raw materials and its use in engineering plastics. This document presents a comprehensive evaluation of lignin, starting from extraction from wood to chemical structure analysis. Measurement methods: NMR, LC/MS, GC/MS Product fields: Environment, Biotechnology, Polymer Materials Analysis purposes: Composition evaluation, identification, chemical bonding state evaluation, structural evaluation For more details, please download the document or contact us.

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  • Contract Analysis
  • Contract measurement
  • Analysis

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What can be understood from first-principles calculations.

We will introduce the target of analysis, the physical property information obtained, and examples of analysis.

Analysis targets (Information such as composition and crystal structure is required for calculations) ? The main analysis targets are systems with periodicity, such as crystals. ? Calculations for systems with amorphous structures, surfaces, and interfaces are also possible. Obtained physical property information ? Crystal structure parameters (lattice constants, atomic arrangements, etc.) ? Electronic structure and spin states (charge distribution, band structure, Fermi surface, magnetic moments, etc.) ? Chemical bonding states such as covalent bonds and ionic bonds ? Stable structures and defect formation energies when lattice defects such as atomic substitutions and vacancies are present ? Formation energies and atomic arrangements of surfaces and interfaces ? Information related to chemical reactions, such as activation energies and structures of intermediates ? Electronic response characteristics such as dielectric functions, electrical resistivity, and Seebeck coefficients ? Thermodynamic quantities of solids, such as specific heat ? Various spectroscopic spectra (XPS, XAFS, etc.)

  • Contract measurement
  • Contract Analysis
  • Analysis

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Structural analysis using NMR (nuclear magnetic resonance) spectroscopy.

Measurement of the light solvent as is.

NMR is typically performed using the resonance signals of deuterium (2H or D) nuclei in deuterated solvents for reasons such as ensuring the stability of the magnetic field. However, by using the resonance signals of proton (1H) nuclei, measurements can also be conducted with light solvents (i.e., regular solvents) (No-D measurement method). The effective measurements for the No-D method are as follows: - Measurements to evaluate interactions with light solvents (e.g., degradation studies in light solvents) - Measurements of samples that cannot use deuterated solvents (e.g., samples in the biochemical field such as proteins) - Measurements of samples containing volatile components - Measurements of samples for which no dissolvable deuterated solvents are available.

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  • Contract Analysis
  • Contract measurement
  • Analysis

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[Analysis Case] Simulation of Impurity Diffusion in Silicon Crystals

It is possible to determine the diffusion pathways and barriers through simulation.

The electrical, optical, and magnetic properties of semiconductors are strongly influenced by defects and impurities present in the system. Therefore, to achieve the desired material properties, it is necessary to understand and control the behavior of defects and impurities. However, evaluating atomic-level microscopic behavior through experimental methods is challenging, making approaches using computational simulations effective. This document presents a case study using first-principles calculations with the NEB (Nudged Elastic Band) method to evaluate the diffusion pathways and barriers of metal impurities (Fe) in silicon crystals.

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  • Contract Analysis
  • Contract measurement
  • Analysis

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[Analysis Case] Analysis of Bacteria Using DNA Analysis

We will analyze the bacteria in the sample from DNA without isolation or culture.

Bacteria have various growth environments depending on their species, and there are many bacteria that are difficult to isolate and culture. Therefore, by extracting and analyzing DNA, which is the blueprint of life that all bacteria possess, it becomes possible to investigate the existing bacteria without isolation or culture. Here, we will introduce examples of analysis methods for sequencing bacterial DNA to infer the existing bacteria through microbiome analysis, as well as investigating bacterial numbers using real-time PCR methods.

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[Analysis Case] Three-Dimensional Structural Analysis of 3D Printed Objects

We will utilize the measurement and analysis of the product's three-dimensional structure for quality control!

Our organization offers three-dimensional structural analysis of 3D printed objects. Understanding the differences between the design drawings and the manufactured products is an important process in quality control. By conducting X-ray CT measurements, it becomes possible to compare the three-dimensional structural "discrepancies" between the printed objects and the design drawings, allowing for an evaluation of the quality. In this case study, we are evaluating molded products made from resin-based materials, but similar evaluations can also be conducted for molded products made from metal-based materials that allow X-rays to pass through. [Measurement Method / Processing Method] ■ X-ray CT Method *For more details, please download the PDF or feel free to contact us.

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Analysis case: Assignment of the Raman spectrum of copper phthalocyanine.

By combining actual measurements and simulations, detailed peak attribution is possible!

Our organization is conducting the assignment of the Raman spectrum of copper phthalocyanine through quantum chemical calculations. By comparing the measured results with the simulation results from quantum chemical calculations, we can perform spectral assignment, which allows for the analysis of vibrational modes. Here, we will introduce a case study of the analysis of "copper phthalocyanine," which is also expected to be utilized in organic thin-film transistors and other applications. 【Measurement and Processing Methods】 ■ [Raman] Raman Spectroscopy ■ Computational Science, AI, Data Analysis *For more details, please download the PDF or feel free to contact us.

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Transmission line analysis

Investigate and implement measures for causes that may lead to malfunction on the circuit board, such as SI analysis.

Printed circuit board design technology utilizing transmission line simulation and EMI suppression support tools.

  • Printed Circuit Board
  • EMC countermeasure products
  • Prototype Services
  • Analysis

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Simple Thermal Analysis Service

We can provide simple thermal analysis solutions for issues related to the substrate's "heat."

In terms of heat dissipation measures for the substrate, pre-simulation is crucial. Our company will confirm various heat dissipation conditions of the substrate during the estimation and provide "simple thermal analysis."

  • Circuit board design and manufacturing
  • Analysis

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Fluid and Solidification Analysis Service "Casting Simulation"

Significantly contributes to shortening delivery times and reducing production costs! Analysis service to optimize mold designs and casting conditions.

The fluid flow and solidification analysis service "Casting Simulation" is designed to perform flow and solidification analysis of molten materials within molds in order to establish the best mold design and casting conditions during the initial design phase. By utilizing the latest software for simulation, it minimizes the need for modifications after the first trial. This enables higher quality, shorter delivery times, and significantly reduced production costs. It allows for high precision, high airtightness, and high strength. 【Features】 ○ Flow analysis and solidification analysis ○ Minimization of modifications ○ Enables high quality ○ Shortened delivery times ○ Cost reduction For more details, please contact us or download the catalog.

  • Mold Design
  • Analysis

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Structural analysis of paint fragments using a micro-infrared spectroscopic imaging system.

[Free Gift] Technical Documentation Using a Cutting-Edge Micro Infrared Spectroscopy Imaging System

Automotive paint is composed of multiple layers of paint to enhance weather resistance and aesthetic quality, with the layer structure and types of paint varying by vehicle model. Therefore, the component analysis of each layer that makes up a paint chip provides valuable information for identifying the vehicle model. This document presents case studies on the analysis of automotive paint chips conducted using a state-of-the-art micro-infrared spectroscopic imaging system. [Contents] ■ Introduction ■ Samples and Analysis System ■ Data Analysis ■ Results ■ Conclusion ■ References *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Analysis

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Real-time analysis of photopolymerization reactions using rapid scan FT-IR.

Provides very useful information for elucidating reaction mechanisms! Essential for the development of functional materials.

We would like to introduce our "Real-time Analysis of Light Curing Reactions Using Rapid Scan FT-IR." By analyzing changes in molecular structure during polymerization reactions using infrared spectra, we can gain a detailed understanding of specific chemical changes and reaction rates, providing very useful information for elucidating reaction mechanisms. Furthermore, we can indicate pathways for practical application, such as optimizing material properties and manufacturing processes. [Features] ■ Provides very useful information for elucidating reaction mechanisms ■ Capable of indicating pathways for practical application, such as optimizing material properties and manufacturing processes *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices
  • Analysis

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Analysis of defective connector terminal contacts with Au plating【STEM/EDS】

It can be confirmed without loss by the "sampling method that protects the surface" of the adhered layer (approximately 20nm) on the surface of the connector terminal plated with STEM.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information about the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. The following features are also available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information about crystal defects (dislocations, twins, etc.) within the crystal In this case, we will introduce "Failure Analysis of Au-Plated Connector Terminal Contacts Using STEM." Please take a moment to read the PDF materials. Additionally, our company conducts various cross-sectional analyses using not only STEM but also TEM and SEM. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Plating Equipment
  • Contract Analysis
  • Other metal materials
  • Analysis

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Evaluation of semiconductor insulating films using STEM/EDS.

STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information regarding the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. Additionally, the following features are available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information on crystal defects (dislocations, twins, etc.) within the crystal In this case, we introduce "Evaluation of Semiconductor Insulating Films using STEM-EDS." This case yielded no issues, but abnormal detection is also possible. Please take a moment to read the PDF materials. Furthermore, in addition to this STEM, our company excels in identifying defective areas by performing 3D reconstruction on specific regions of the sample in combination with FIB. We would be happy to provide a demonstration, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Semiconductor inspection/test equipment
  • Contract Analysis
  • Other semiconductors
  • Analysis

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