Analysis(lsi) - List of Manufacturers, Suppliers, Companies and Products

[Analysis Case] Simulation of Impurity Diffusion in Silicon Crystals

It is possible to determine the diffusion pathways and barriers through simulation.

The electrical, optical, and magnetic properties of semiconductors are strongly influenced by defects and impurities present in the system. Therefore, to achieve the desired material properties, it is necessary to understand and control the behavior of defects and impurities. However, evaluating atomic-level microscopic behavior through experimental methods is challenging, making approaches using computational simulations effective. This document presents a case study using first-principles calculations with the NEB (Nudged Elastic Band) method to evaluate the diffusion pathways and barriers of metal impurities (Fe) in silicon crystals.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement

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[Analysis Case] Evaluation of Crystal Structure by Micro XRD Analysis

XRD measurements in micro areas are possible.

We will introduce a case where XRD measurements were conducted by narrowing the X-ray beam to Φ400μm, allowing us to obtain crystal information targeting a specific area rather than the entire surface. In the XRD measurement results of the printed circuit board sample, Cu and BaSO4 were detected at all measurement points (1) to (3), and a peak from Au was detected at the measurement point (1), which is the electrode. This aligns well with the results from XRF measurements. Thus, it is possible to identify crystal structures by targeting regions of several hundred micrometers with different compositions and crystallinities. Measurement methods: XRD, XRF Product fields: LSI, memory, electronic components Analysis purposes: Composition evaluation, identification, structural evaluation For more details, please download the materials or contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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Analysis of crystal grains below 30nm using the EBSD method.

EBSD: Electron Backscatter Diffraction

By conducting EBSD analysis on thinned samples, higher spatial resolution can be achieved compared to conventional bulk samples.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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Extreme point measurement

XRD: X-ray diffraction method

Pole figure measurement is a method that focuses on specific crystal planes and evaluates the distribution of crystal orientations by directing X-rays from various directions onto the sample. The detector is fixed at the diffraction angle (2θ) of the crystal plane of interest, and the two parameters, α (the tilt angle of the sample) and β (the in-plane rotation angle of the sample), are varied to measure crystal planes tilted in all directions. This indicates that the crystal orientations are concentrated in the directions where high diffraction intensity is observed. Additionally, the measurement results are represented in a pole figure as shown in the diagram at the bottom right.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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Structural analysis using Xe-plasma FIB.

Precision processing/structural evaluation is possible over a wide area of several hundred micrometers.

It achieves high positional accuracy and wide-area cross-section production, making it usable as a new large-capacity analysis application. Even small structures within a large area can be targeted for processing, enabling wide-area structural analysis.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[Analysis Case] Analysis of H termination on Si surface

Qualitative and relative comparison of SiH and states on the Si surface due to differences in processing.

We compared the states of the Si surface after HF treatment and after ozone treatment. In the positive ion spectrum, the peak intensity of Si was different. The weaker Si intensity after HF treatment is due to Si being metallic, while the stronger Si intensity after UV-ozone cleaning and in the As Received state is due to Si being oxide-based. From the negative ion spectrum, fragment ions reflecting the surface state were detected: SiF, SiH, and Six series after HF treatment, and SiO2 series after UV-ozone cleaning and in the As Received state.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations

Microscopic structural analysis of amorphous films is possible through simulation.

Amorphous SiNx (a-SiNx) films exhibit significant changes in physical properties from semiconductors to insulators due to compositional variations such as the N/Si ratio, making them suitable for a wide range of applications, including gate insulating films for transistors. On the other hand, experimental methods capable of atomic-level microscopic structural analysis for materials with non-crystalline amorphous structures are limited. Therefore, creating and analyzing amorphous structures with various compositions and densities through simulation becomes an effective tool. This document presents examples of structural analysis of a-SiNx films using molecular dynamics calculations.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Memory

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Analysis of electronic components and materials using TEM.

TEM (Transmission Electron Microscope) meets a wide range of requirements for observing failure sites of electronic components, length measurements, elemental analysis, crystal structure analysis, and material evaluation.

TEM can perform not only high-magnification observation but also elemental analysis using EDS and EELS, as well as analysis of crystal structure, surface orientation, lattice constants, and more through electron diffraction.

Company：アイテス
Price：Other

Contract Analysis
Other semiconductors
Other contract services

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Power product electrical analysis services

Design and development support considering the transmission line characteristics of power products.

Our company provides design support based on a wide range of experience in semiconductor application products, from LSI to power electronics. In the field of power electronics, represented by inverters, which has gained attention in recent years, solving challenges during switching is a key point. We can offer comprehensive design support, from transmission line analysis using electromagnetic field analysis simulators to product evaluation, and further to analysis and verification of circuit simulations.

Company：Wave Technology
Price：Other

Calibration and repair

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Extrusion Resin Analysis (CAE)

The entire process from design to the creation of a 3D flow model, flow analysis, and molding is testable!

At Axmolding, specialists handle the process, and we can take on everything from consulting for development and design to execution as a whole. Our company can test a complete flow from design to creating 3D models of flow paths, flow analysis, and actual molding. We are capable of creating 3D models of extrusion flow paths that are complex and have many curved surfaces. Additionally, we use Japanese-made software from HASL for analysis. 【Analysis Software】 ■ Materialfi - Resin calculation formula definition ■ FLATSimulator - For T-die analysis ■ SpiralSimulator - For round die analysis ■ SingleSrewSimulator - For single screw analysis ■ FlowSimulator3D - For 3D, irregular shapes, and multilayer analysis For more details, please refer to our catalog or feel free to contact us.

Company：アクスモールディング
Price：Other

Extrusion Machine
Contract Analysis
Other analyses

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Numerical analysis solution

Supporting your product development and problem-solving with fluid analysis and structural analysis using 3D CAE!

Our company supports model-based development, which is increasingly in demand in the automotive industry, by providing necessary CAE for requirement analysis, control design (control target models), and verification tools (MILS, HILS). Leveraging this know-how, we conduct analysis work that concretizes the physical phenomena required for products in the upstream stages of product development using 1D CAE. In model-based development, we advance the development while verifying based on the "model" created on the computer. We assist in addressing challenges (efficiency, quality assurance) in the development process by developing tools tailored to our customers' needs. 【Features】 - Development of tools for 1D simulation used in the requirement analysis stage of products and conducting analysis work using 1D simulation. - Conducting model-based development, including the creation of control target models (plant models) using MATLAB/Simulink. - Development and verification of necessary verification tools (MILS, HILS) in the downstream part of model-based development. *For more details, please refer to the PDF materials or feel free to contact us.

Company：デジタルソリューション
Price：Other

Contract Analysis
Other analyses

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Surface and thin film analysis of semiconductors

Detailed investigation of surface chemical composition, bonding states, and impurity distribution!

We would like to introduce our "Surface and Thin Film Analysis of Semiconductors." We propose effective analyses for material evaluation and failure mode identification in the process development, process management, and failure analysis of semiconductor devices. We provide detailed information that is useful for research and development, manufacturing processes, and failure analysis by examining the chemical composition, bonding states, and impurity distribution of surfaces. Please feel free to contact us when you need our services. 【Top Surface】 ■Composition: XPS ■Bonding State: XPS ■Contamination: TOF-SIMS, ICP-MS ■Roughness: AFM, SEM *For more details, please download the PDF or feel free to contact us.

Company：東芝ナノアナリシス
Price：Other

Contract Analysis

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Migration service "VB Quick Shift"

Are there any Visual Basic systems struggling with obsolescence? Windows 10 will end support in October 2025!

Revitalize your aging Visual Basic system with low cost and short delivery time while keeping operations the same! If you continue to use it as is... The security risks and failure risks will remain very high. Do you have any of these concerns? - Not prepared for the upgrade to Windows 11 - Unable to refresh the old VB system due to a lack of personnel - Using the same computer and server for years - Not taking measures against information leaks or unauthorized access - System processing speed has slowed down, reducing work efficiency We will solve these issues with our "VB Quick Shift"! 【Service Features】 1. Free consultation! 2. We can accommodate even from one function 3. We achieve high quality with our accumulated know-how 4. We support the latest OS *For more details, please check the related links or feel free to contact us.

Company：日本デジコム
Price：Other

Other information systems

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Power semiconductor analysis service

We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis regarding the malfunctioning part!

At Aites Co., Ltd., we offer analysis services for power semiconductors. Since our separation and independence from the Quality Assurance Department of IBM Japan's Yasu office in 1993, we have cultivated our own unique analysis and evaluation techniques. We can handle not only Si semiconductors but also the trending wide bandgap semiconductors. 【Features】 ■ OBIRCH analysis supports not only Si but also SiC and GaN devices ■ FIB processing is possible from either side ■ Visualization of the depletion layer formed at the PN junction ■ Elemental analysis such as EDS and EELS is also supported *For more details, please refer to the PDF document or feel free to contact us.