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Phase analysis of duplex stainless steel using EBSD.

You can understand the performance comparison of metals and metal compounds in terms of hardness and brittleness, as well as why discoloration issues occur.

Electron Backscatter Diffraction Pattern (EBSD) allows for the following when combined with a Scanning Electron Microscope (SEM): - Separation of phases with different crystal systems - Distribution ratio and crystal orientation analysis for each separated phase In this case, we introduce phase analysis of a two-phase stainless steel using EBSD. With EBSD, the distribution ratio and crystal orientation of the α phase and γ phase in the two-phase stainless steel were confirmed. This measurement technique can be utilized to compare properties such as hardness and brittleness in the distribution of materials in metals and metal compounds, as well as to detect the degree of precipitation and understand its impact on color. We encourage you to give it a try. Additionally, our company conducts various cross-sectional analyses using TEM and surface analysis using XPS, allowing for multifaceted analytical assessments. Our engineers are available to assist directly, so please feel free to consult with us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/

  • Contract Analysis
  • Other metal materials
  • stainless

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Analysis of defective connector terminal contacts with Au plating【STEM/EDS】

It can be confirmed without loss by the "sampling method that protects the surface" of the adhered layer (approximately 20nm) on the surface of the connector terminal plated with STEM.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information about the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. The following features are also available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information about crystal defects (dislocations, twins, etc.) within the crystal In this case, we will introduce "Failure Analysis of Au-Plated Connector Terminal Contacts Using STEM." Please take a moment to read the PDF materials. Additionally, our company conducts various cross-sectional analyses using not only STEM but also TEM and SEM. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Plating Equipment
  • Contract Analysis
  • Other metal materials

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