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Evaluation Equipment Product List and Ranking from 100 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

Evaluation Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. null/null
  3. ヘッドアコースティクスジャパン Kanagawa//Testing, Analysis and Measurement
  4. 4 アフロディ 本社 Tokyo//Optical Instruments
  5. 5 同仁グローカル Kumamoto//others
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Evaluation Equipment Product ranking

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

  1. Case Studies of Utilizing Analysis Machines | Food Products such as Beverages, Seasonings, and Additives
  2. In-vehicle Active Noise Cancellation 'HQS-ANC-Car' ヘッドアコースティクスジャパン
  3. Nanoparticle Physical Property Evaluation Device "NANOTRAC WAVE II Series"
  4. 4 Display Glare Measurement Device 10th Anniversary Special Price Campaign アフロディ 本社
  5. 5 Catalyst Evaluation Series "BELCAT II/BELMASS II"

Evaluation Equipment Product List

136～150 item / All 217 items

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Evaluation of TFT characteristics of liquid crystal panels

Evaluation of TFT characteristics of liquid crystal panels

We can perform good product characteristic measurements for performance verification, as well as defective characteristic measurements and reliability evaluations!

Our company can perform good product characteristic measurements, defective characteristic measurements, and reliability evaluations for specific TFTs in liquid crystal panels. In the "Electrical characteristic measurement of TFTs at various temperatures," we can disassemble the monitor in display mode and measure the electrical characteristics of the pixel TFTs within the panel. In the "DC bias stress test," we apply an arbitrary DC bias to the Gate and Drain and measure the Vth shift when stress is applied to the TFT, conducting reliability verification. 【Features】 - Electrical characteristic measurements can be performed on the pixel TFTs within the panel. - Measurements can be conducted before and after annealing, under light exposure, heating, or cooling conditions. - From the measurement results, indicators such as Ion, Ioff, Vth, and mobility can be calculated. - Verification of actual values in good product analysis and clarification of causes of defects can be performed. *For more details, please refer to the PDF document or feel free to contact us.

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EHC's new technology! Successfully expanded the gap range of evaluation cells!

EHC's new technology! Successfully expanded the gap range of evaluation cells!

A must-see for researchers! The gap range of the evaluation cell has been expanded to 0.7 to 100 μm! [Over 10,000 types]

It is ideal for research tools for liquid crystal materials and other advanced materials. Thanks to our technological advancements, we have successfully expanded the gap range of evaluation cells! Until now, measurements could only be made in the range of 2 to 50 μm, but we are now able to measure 0.7 to 2 μm and 50 to 100 μm, which were considered difficult in the industry. Additionally, specifications of ±0.2 μm are now possible, allowing us to meet detailed needs. Our product classification encompasses over 10,000 types, and we can customize according to your needs. 【Contents】 - Explanation of display examples and display symbols - Orientation diagrams by type - Price list - Glass substrates ● For more details, please contact us or download the catalog.

  • Other measurement, recording and measuring instruments

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OLED Constant Temperature and Humidity Environment Evaluation Device ELS-100A

OLED Constant Temperature and Humidity Environment Evaluation Device ELS-100A

This is an evaluation device that allows organic EL display devices to emit light under constant temperature and humidity conditions, conducting accelerated tests on brightness and emitted screen images, with the capability of CSV output.

The ELS-100A is a device that efficiently conducts environmental testing and evaluation of organic EL devices. An OLED device's light-emitting unit is installed inside a constant temperature and humidity chamber, and automatic measurements are taken through the high-transparency glass on the top of the environmental control unit. The standard specification is 4 channels, and the fixture is compatible with both bottom-emission and top-emission OLED devices. With a proven constant current control system and a reliable luminance meter, it performs accelerated testing for temperature and humidity, as well as recording the light-emitting state, with CSV file output.

  • Other semiconductor manufacturing equipment

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Evaluation device SOFC-type fuel cell evaluation device

Evaluation device SOFC-type fuel cell evaluation device

Measuring solid oxide fuel cells!

This is an announcement from Nishiyama Manufacturing Co., Ltd. regarding the "SOFC-type fuel cell evaluation device."

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SOFC power generation evaluation device with load adjustment function / for tube cells

SOFC power generation evaluation device with load adjustment function / for tube cells

Easy collection of current with the electrode loading mechanism / Tube cell size can be changed arbitrarily.

The SOFC power generation evaluation device with load adjustment function has made current collection easier with its electrode load mechanism. It features a tapered guide link for easy centering. The load can be adjusted by turning the handle at the bottom, with an adjustment range of up to 50N. The SOFC power generation evaluation device for tube cells is designed to flow fuel inside the cell holding tube, allowing it to react with air on the outside of the cell. The tube cell size can be changed arbitrarily with a conversion adapter. For more details, please contact us or refer to the catalog.

  • Testing Equipment and Devices
  • Other measurement, recording and measuring instruments

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[Analysis Case] Evaluation of Layer Structure of Organic EL Devices

[Analysis Case] Evaluation of Layer Structure of Organic EL Devices

By performing preprocessing under controlled atmosphere conditions, it is possible to analyze while preventing oxidative degradation.

This shows the results of extracting the qualitative spectra of each layer by performing cutting processing of organic EL devices under controlled atmosphere. By conducting the cutting process of the organic EL devices under atmosphere control, we were able to obtain spectra of each layer that are closer to the true state.

  • Contract Analysis

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[Analysis Case] Evaluation of the Diffusion Layer in Crystalline Si Solar Cells

[Analysis Case] Evaluation of the Diffusion Layer in Crystalline Si Solar Cells

Quantitative evaluation of dopants and evaluation of carrier distribution.

This is an example of quantitatively evaluating the dopant concentration distribution directly beneath the electrode in back contact type crystalline silicon solar cells. Additionally, by evaluating the carrier distribution, it is possible to determine the polarity of p/n and visualize the depletion layer in the cross-sectional direction.

  • Contract Analysis

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[Analysis Case] Evaluation of Carrier Distribution in Crystalline Si Solar Cells

[Analysis Case] Evaluation of Carrier Distribution in Crystalline Si Solar Cells

Evaluation of carrier diffusion layer uniformity in samples with surface roughness.

This is an introduction to a case where the carrier diffusion layer distribution of the surface textured part and the back surface field (BSF) part of BSF-type crystalline silicon solar cells was evaluated using SCM. In the textured part, the pn junction is formed along the surface irregularities, while in the BSF part, it can be confirmed that the carrier distribution is interrupted and uneven.

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  • Contract Analysis

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[Analysis Case] Evaluation of Carrier Density Distribution in Power Devices

[Analysis Case] Evaluation of Carrier Density Distribution in Power Devices

Evaluation of the activation rate of the Dopant is possible.

SRA (Spreading Resistance Analysis) is a method that involves polishing a sample at an angle, making contact with two probes on the polished surface, and measuring the spreading resistance (Figure 1). By evaluating the carrier concentration distribution, it is possible to gain insights into the activation status of dopants. As an example, we present a case of SRA conducted on the central and outer regions of a diode chip surface after package opening (Figure 2).

  • Contract Analysis

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[Analysis Case] Evaluation of GaN Crystal Growth by XRD and EBSD

[Analysis Case] Evaluation of GaN Crystal Growth by XRD and EBSD

Cross-sectional mapping allows for the evaluation of the crystal growth of GaN.

Gallium nitride (GaN) is used as a material for LEDs and power devices due to its high thermal conductivity and high breakdown voltage characteristics. In the manufacturing process of these products, it is essential to produce high-quality GaN crystals without crystal defects that can affect device characteristics. This document presents a case study evaluating the crystal state of samples in which c-GaN crystals were grown at high speed on c-plane GaN substrates (c-GaN substrates).

  • Contract Analysis

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[Analysis Case] Electronic State Evaluation of Wide Bandgap Semiconductor Dopant Site Identification

[Analysis Case] Electronic State Evaluation of Wide Bandgap Semiconductor Dopant Site Identification

Evaluation of microscopic atomic structures is possible through computational simulation.

β-Ga2O3 has a wide band gap and is expected to be a promising material for next-generation power devices and oxide semiconductors in terms of excellent power transmission efficiency and cost reduction. In recent years, it has been reported that β-Ga2O3 can be n-doped with Si or Sn. In this study, we conducted structural optimization calculations for models of β-Ga2O3 doped with Si or Sn and evaluated which sites each dopant is more likely to occupy in the crystal. Subsequently, we calculated the density of states from the obtained structural models and investigated the changes in electronic states due to doping.

  • Contract Analysis
  • Other semiconductors

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[Analysis Case] Evaluation of Stainless Steel Passive Films Compliant with SEMI Standards

[Analysis Case] Evaluation of Stainless Steel Passive Films Compliant with SEMI Standards

Evaluation indicators regarding passive film properties can be obtained through standardized testing!

We offer the evaluation of stainless steel passive films in accordance with SEMI standards (C0612). Stainless steel exhibits excellent corrosion resistance due to the formation of a very thin, dense, and stable chromium oxide film (passive film) on its surface. The composition and film thickness of this passive film can be effectively evaluated using surface-sensitive techniques such as XPS and AES. [Measurement and Processing Methods] ■ [AES] Auger Electron Spectroscopy ■ [XPS] X-ray Photoelectron Spectroscopy ■ Others *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis

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Multi-Channel Communication Reliability Evaluation Device "RTm-100 Series"

Multi-Channel Communication Reliability Evaluation Device "RTm-100 Series"

Measure the conduction resistance of circuit patterns, solder joints, etc., quickly and accurately!

The "RTm-100 Series" is a multi-channel conductive communication reliability evaluation device manufactured by J-RAS Corporation. It measures contact resistance in circuit patterns, solder joints, and more with high speed and precision. With a scan processing time of 50 milliseconds per channel, it can keep up with high-speed cycle testing even for multi-channel measurements. It employs semiconductor relays for the four-terminal network switching in linked channel scans, significantly improving long-term reliability compared to mechanical relay systems. Additionally, the compact housing can be expanded to accommodate up to 240 channels, allowing for flexible installation and easy mobility. It can also connect thermocouples for temperature data display and recording (optional). 【Features】 ■ High precision and high-speed measurement ■ High-speed scanning at 50 msec/channel: follows high-speed heat shock chambers ■ High precision & low noise: reliable data output ■ Four-terminal measurement cables: twisted pair / color-coded by channel ■ High reliability: does not use mechanical relays *For more details, please refer to the PDF document or feel free to contact us.

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High Voltage Insulation Reliability Evaluation Device "HVUα Series"

High Voltage Insulation Reliability Evaluation Device "HVUα Series"

High-speed detection circuits with a few tens of nsec installed in all channels! Tester capable of low-noise measurement.

The "HVUα Series" is a high-voltage insulation reliability evaluation device manufactured by J-RAS Corporation. It is equipped with high-speed detection circuits capable of operating in the tens of nanoseconds across all channels, enabling more advanced reliability testing. It can detect partial discharge with a high-speed event measurement function of less than 100 nanoseconds. Each channel has its own power supply and individual control, allowing for different applied voltage settings across all channels. There are no mechanical relay scans, so there are no failures or troubles during continuous testing. Active guarding with triaxial cables enables low-noise measurements. 【Features】 ■ Detects partial discharge with a high-speed event measurement function of less than 100 nanoseconds ■ Each channel has its own power supply and individual feedback for stable voltage application to each sample ■ Individual short-circuit detection circuits for each channel can respond to instantaneous sample short circuits ■ Dedicated software allows for graph display and data recording ■ The system can be configured in units of five channels according to demand *For more details, please refer to the PDF document or feel free to contact us.

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0666 Laboplast Mill Micro 4N100

0666 Laboplast Mill Micro 4N100

The small processing characteristic evaluation machine has undergone a full model change and is now a tabletop type that can be installed on office desks and laboratory tables.

The Laboplast Mill Micro 4N100 is a tabletop mixing and extrusion evaluation device developed for the purpose of resin material screening and formulation assessment. While it is compatible with our Laboplast Mill S series, it is specialized for testing with smaller quantities, allowing for the evaluation of processing characteristics with sample amounts measured in grams. Additionally, by thoroughly reviewing the internal mechanisms from the conventional Laboplast Mill Micro, this new model achieves significant improvements in operability, torque detection accuracy, and safety. It enables accelerated development and high-precision evaluation in the field of material development, where small quantities and a variety of assessments are required.

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  • Testing Equipment and Devices
  • Extrusion Machine
  • Analytical Equipment and Devices

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