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Evaluation Equipment Product List and Ranking from 41 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Evaluation Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. 東洋精機製作所 Tokyo//Testing, Analysis and Measurement
  3. 東和電気 Tokyo//Electronic Components and Semiconductors
  4. 4 Nippon Kernel System CO., LTD. Osaka//Industrial Electrical Equipment
  5. 5 ヘッドアコースティクスジャパン Kanagawa//Testing, Analysis and Measurement
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Evaluation Equipment Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Dispersion Stability Evaluation Device "TURBISCAN Series"
  2. 0666 Laboplast Mill Micro 4N100 東洋精機製作所
  3. Is your company's component "compatible with immersion cooling"? Check it with a tabletop evaluation POC device! 東和電気
  4. 4 PV Simulator 'PVU01403' -for solar inverter / hybrid inverter ーpower supply for PV inverter development Nippon Kernel System CO., LTD.
  5. 5 In-vehicle Active Noise Cancellation 'HQS-ANC-Car' ヘッドアコースティクスジャパン

Evaluation Equipment Product List

136～150 item / All 213 items

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OLED Constant Temperature and Humidity Environment Evaluation Device ELS-100A

OLED Constant Temperature and Humidity Environment Evaluation Device ELS-100A

This is an evaluation device that allows organic EL display devices to emit light under constant temperature and humidity conditions, conducting accelerated tests on brightness and emitted screen images, with the capability of CSV output.

The ELS-100A is a device that efficiently conducts environmental testing and evaluation of organic EL devices. An OLED device's light-emitting unit is installed inside a constant temperature and humidity chamber, and automatic measurements are taken through the high-transparency glass on the top of the environmental control unit. The standard specification is 4 channels, and the fixture is compatible with both bottom-emission and top-emission OLED devices. With a proven constant current control system and a reliable luminance meter, it performs accelerated testing for temperature and humidity, as well as recording the light-emitting state, with CSV file output.

  • Other semiconductor manufacturing equipment

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Evaluation device SOFC-type fuel cell evaluation device

Evaluation device SOFC-type fuel cell evaluation device

Measuring solid oxide fuel cells!

This is an announcement from Nishiyama Manufacturing Co., Ltd. regarding the "SOFC-type fuel cell evaluation device."

  • others

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SOFC power generation evaluation device with load adjustment function / for tube cells

SOFC power generation evaluation device with load adjustment function / for tube cells

Easy collection of current with the electrode loading mechanism / Tube cell size can be changed arbitrarily.

The SOFC power generation evaluation device with load adjustment function has made current collection easier with its electrode load mechanism. It features a tapered guide link for easy centering. The load can be adjusted by turning the handle at the bottom, with an adjustment range of up to 50N. The SOFC power generation evaluation device for tube cells is designed to flow fuel inside the cell holding tube, allowing it to react with air on the outside of the cell. The tube cell size can be changed arbitrarily with a conversion adapter. For more details, please contact us or refer to the catalog.

  • Testing Equipment and Devices
  • Other measurement, recording and measuring instruments

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[Analysis Case] Evaluation of Layer Structure of Organic EL Devices

[Analysis Case] Evaluation of Layer Structure of Organic EL Devices

By performing preprocessing under controlled atmosphere conditions, it is possible to analyze while preventing oxidative degradation.

This shows the results of extracting the qualitative spectra of each layer by performing cutting processing of organic EL devices under controlled atmosphere. By conducting the cutting process of the organic EL devices under atmosphere control, we were able to obtain spectra of each layer that are closer to the true state.

  • Contract Analysis

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[Analysis Case] Evaluation of the Diffusion Layer in Crystalline Si Solar Cells

[Analysis Case] Evaluation of the Diffusion Layer in Crystalline Si Solar Cells

Quantitative evaluation of dopants and evaluation of carrier distribution.

This is an example of quantitatively evaluating the dopant concentration distribution directly beneath the electrode in back contact type crystalline silicon solar cells. Additionally, by evaluating the carrier distribution, it is possible to determine the polarity of p/n and visualize the depletion layer in the cross-sectional direction.

  • Contract Analysis

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[Analysis Case] Evaluation of Carrier Distribution in Crystalline Si Solar Cells

[Analysis Case] Evaluation of Carrier Distribution in Crystalline Si Solar Cells

Evaluation of carrier diffusion layer uniformity in samples with surface roughness.

This is an introduction to a case where the carrier diffusion layer distribution of the surface textured part and the back surface field (BSF) part of BSF-type crystalline silicon solar cells was evaluated using SCM. In the textured part, the pn junction is formed along the surface irregularities, while in the BSF part, it can be confirmed that the carrier distribution is interrupted and uneven.

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  • Contract Analysis

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[Analysis Case] Investigation of the Causes of Wettability Changes Due to Plasma Treatment

[Analysis Case] Investigation of the Causes of Wettability Changes Due to Plasma Treatment

Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.

On the surface of cell culture dishes, treatments are performed to convert hydrophobic plastic surfaces to hydrophilic ones in order to enhance cell adhesion. In this study, the surfaces of dishes that underwent hydrophilic treatment were evaluated using XPS and TOF-SIMS, revealing an increase in OH and CHO groups. By conducting quantitative evaluations with XPS and qualitative evaluations with TOF-SIMS, it is possible to capture how the surface has changed.

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  • Contract Analysis

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[Analysis Case] Evaluation of Carrier Density Distribution in Power Devices

[Analysis Case] Evaluation of Carrier Density Distribution in Power Devices

Evaluation of the activation rate of the Dopant is possible.

SRA (Spreading Resistance Analysis) is a method that involves polishing a sample at an angle, making contact with two probes on the polished surface, and measuring the spreading resistance (Figure 1). By evaluating the carrier concentration distribution, it is possible to gain insights into the activation status of dopants. As an example, we present a case of SRA conducted on the central and outer regions of a diode chip surface after package opening (Figure 2).

  • Contract Analysis

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[Analysis Case] Evaluation of GaN Crystal Growth by XRD and EBSD

[Analysis Case] Evaluation of GaN Crystal Growth by XRD and EBSD

Cross-sectional mapping allows for the evaluation of the crystal growth of GaN.

Gallium nitride (GaN) is used as a material for LEDs and power devices due to its high thermal conductivity and high breakdown voltage characteristics. In the manufacturing process of these products, it is essential to produce high-quality GaN crystals without crystal defects that can affect device characteristics. This document presents a case study evaluating the crystal state of samples in which c-GaN crystals were grown at high speed on c-plane GaN substrates (c-GaN substrates).

  • Contract Analysis

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[Analysis Case] Electronic State Evaluation of Wide Bandgap Semiconductor Dopant Site Identification

[Analysis Case] Electronic State Evaluation of Wide Bandgap Semiconductor Dopant Site Identification

Evaluation of microscopic atomic structures is possible through computational simulation.

β-Ga2O3 has a wide band gap and is expected to be a promising material for next-generation power devices and oxide semiconductors in terms of excellent power transmission efficiency and cost reduction. In recent years, it has been reported that β-Ga2O3 can be n-doped with Si or Sn. In this study, we conducted structural optimization calculations for models of β-Ga2O3 doped with Si or Sn and evaluated which sites each dopant is more likely to occupy in the crystal. Subsequently, we calculated the density of states from the obtained structural models and investigated the changes in electronic states due to doping.

  • Contract Analysis
  • Other semiconductors

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[Analysis Case] Evaluation of Stainless Steel Passive Films Compliant with SEMI Standards

[Analysis Case] Evaluation of Stainless Steel Passive Films Compliant with SEMI Standards

Evaluation indicators regarding passive film properties can be obtained through standardized testing!

We offer the evaluation of stainless steel passive films in accordance with SEMI standards (C0612). Stainless steel exhibits excellent corrosion resistance due to the formation of a very thin, dense, and stable chromium oxide film (passive film) on its surface. The composition and film thickness of this passive film can be effectively evaluated using surface-sensitive techniques such as XPS and AES. [Measurement and Processing Methods] ■ [AES] Auger Electron Spectroscopy ■ [XPS] X-ray Photoelectron Spectroscopy ■ Others *For more details, please download the PDF or feel free to contact us.

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Multi-Channel Communication Reliability Evaluation Device "RTm-100 Series"

Multi-Channel Communication Reliability Evaluation Device "RTm-100 Series"

Measure the conduction resistance of circuit patterns, solder joints, etc., quickly and accurately!

The "RTm-100 Series" is a multi-channel conductive communication reliability evaluation device manufactured by J-RAS Corporation. It measures contact resistance in circuit patterns, solder joints, and more with high speed and precision. With a scan processing time of 50 milliseconds per channel, it can keep up with high-speed cycle testing even for multi-channel measurements. It employs semiconductor relays for the four-terminal network switching in linked channel scans, significantly improving long-term reliability compared to mechanical relay systems. Additionally, the compact housing can be expanded to accommodate up to 240 channels, allowing for flexible installation and easy mobility. It can also connect thermocouples for temperature data display and recording (optional). 【Features】 ■ High precision and high-speed measurement ■ High-speed scanning at 50 msec/channel: follows high-speed heat shock chambers ■ High precision & low noise: reliable data output ■ Four-terminal measurement cables: twisted pair / color-coded by channel ■ High reliability: does not use mechanical relays *For more details, please refer to the PDF document or feel free to contact us.

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High Voltage Insulation Reliability Evaluation Device "HVUα Series"

High Voltage Insulation Reliability Evaluation Device "HVUα Series"

High-speed detection circuits with a few tens of nsec installed in all channels! Tester capable of low-noise measurement.

The "HVUα Series" is a high-voltage insulation reliability evaluation device manufactured by J-RAS Corporation. It is equipped with high-speed detection circuits capable of operating in the tens of nanoseconds across all channels, enabling more advanced reliability testing. It can detect partial discharge with a high-speed event measurement function of less than 100 nanoseconds. Each channel has its own power supply and individual control, allowing for different applied voltage settings across all channels. There are no mechanical relay scans, so there are no failures or troubles during continuous testing. Active guarding with triaxial cables enables low-noise measurements. 【Features】 ■ Detects partial discharge with a high-speed event measurement function of less than 100 nanoseconds ■ Each channel has its own power supply and individual feedback for stable voltage application to each sample ■ Individual short-circuit detection circuits for each channel can respond to instantaneous sample short circuits ■ Dedicated software allows for graph display and data recording ■ The system can be configured in units of five channels according to demand *For more details, please refer to the PDF document or feel free to contact us.

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0666 Laboplast Mill Micro 4N100

0666 Laboplast Mill Micro 4N100

The small processing characteristic evaluation machine has undergone a full model change and is now a tabletop type that can be installed on office desks and laboratory tables.

The Laboplast Mill Micro 4N100 is a tabletop mixing and extrusion evaluation device developed for the purpose of resin material screening and formulation assessment. While it is compatible with our Laboplast Mill S series, it is specialized for testing with smaller quantities, allowing for the evaluation of processing characteristics with sample amounts measured in grams. Additionally, by thoroughly reviewing the internal mechanisms from the conventional Laboplast Mill Micro, this new model achieves significant improvements in operability, torque detection accuracy, and safety. It enables accelerated development and high-precision evaluation in the field of material development, where small quantities and a variety of assessments are required.

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  • Testing Equipment and Devices
  • Extrusion Machine
  • Analytical Equipment and Devices

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Stress Load Testing Machine ISL-T300 + Birefringence Distribution Evaluation Device WPA-200

Stress Load Testing Machine ISL-T300 + Birefringence Distribution Evaluation Device WPA-200

Real-time observation of orientation changes during the stretching of polymer films! Quantitative evaluation is possible as an in-plane distribution.

We would like to introduce the combination of the stress loading testing machine 'ISL-T300' and the birefringence distribution evaluation device 'WPA-200'. The change in molecular orientation due to the stretching of polymer films can be optically evaluated by measuring birefringence. However, it has been difficult to evaluate birefringence while simultaneously applying tension, especially as surface distribution information. With the proposed combination of devices, it is possible to quantitatively evaluate the orientation changes as a surface distribution during the stretching process. 【Device Specifications】 ＜ISL-T300＞ ■ Maximum Load: 300N ■ Travel Distance: Up to 30mm ■ Testing Speed: 0.08 to 8mm/min ■ Chuck Spacing: 2 to 32mm ■ Sample Thickness: 1.5mm or less *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices

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