[Development Case] Memory Evaluation Device Using HSDIO and LabVIEW
Development of a memory evaluation device using inexpensive HSDIO and LabVIEW.
Due to the significant reduction in exam time, we were able to test multiple exam patterns in a short period, which resulted in high satisfaction for the end users. In the retention test, we implemented a process that allows recording while saving files, enabling us to conduct tests even with long-duration waveform patterns. With the completion of this system, the testing time that previously took 3 days with other companies' logic analyzers has been reduced to 30 minutes. This development has confirmed that NI products (HSDIO) are very effective for building systems for memory evaluation. Our developed evaluation device is being utilized by end users. By selecting and combining the necessary NI product modules according to the required specifications, we were able to build a high-quality system in a short period, contributing to users in terms of performance, delivery time, and cost reduction. Automation, short delivery times, low costs, and high quality are common demands for IC evaluation devices, and systems utilizing NI products and LabVIEW are expected to be expanded to other product lines in the future.
- Company:ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
- Price:Other