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Evaluation Equipment Product List and Ranking from 100 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

Evaluation Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

  1. null/null
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  3. ヘッドアコースティクスジャパン Kanagawa//Testing, Analysis and Measurement
  4. 4 アフロディ 本社 Tokyo//Optical Instruments
  5. 5 同仁グローカル Kumamoto//others
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Evaluation Equipment Product ranking

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

  1. Case Studies of Utilizing Analysis Machines | Food Products such as Beverages, Seasonings, and Additives
  2. In-vehicle Active Noise Cancellation 'HQS-ANC-Car' ヘッドアコースティクスジャパン
  3. Nanoparticle Physical Property Evaluation Device "NANOTRAC WAVE II Series"
  4. 4 Display Glare Measurement Device 10th Anniversary Special Price Campaign アフロディ 本社
  5. 5 Catalyst Evaluation Series "BELCAT II/BELMASS II"

Evaluation Equipment Product List

31～45 item / All 217 items

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Semiconductor probe evaluation device

Semiconductor probe evaluation device

Compact yet enhanced for work efficiency! Introducing devices capable of electrical measurements and optical measurements!

We would like to introduce our "Semiconductor Probe Evaluation Equipment." The "Organic Semiconductor EL Evaluation Equipment" allows for electrical measurements and optical measurements while heating a substrate that is in contact with probes in a high vacuum to atmospheric pressure environment. Additionally, we also offer "High Vacuum High Temperature Probe Equipment" aimed at power devices such as SiC, as well as "Environmental Control Evaluation Testing Equipment." 【Product Lineup】 ■ Organic Semiconductor EL Evaluation Equipment ■ High Vacuum High Temperature Probe Equipment ■ Environmental Control Evaluation Testing Equipment *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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LIFE&IVL Time-Dependent Change Measurement Device "Model ELS-100LV"

LIFE&IVL Time-Dependent Change Measurement Device "Model ELS-100LV"

It is a device for measuring and evaluating the lifespan and IVL characteristics over time of a large number of organic EL devices.

The LIFE & IVL aging change measurement device "Model ELS-100LV" is a device for measuring and evaluating the lifespan and IVL characteristics over time of numerous organic EL devices. It automatically switches between lifespan evaluation measurement and IVL measurement for testing. 【Features】 ○ Capable of acquiring images of the light-emitting element's lighting state ○ Lifespan measurement drive power: constant current / constant voltage / constant current pulse For more details, please contact us or download the catalog.

  • Other electronic measuring instruments

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Organic EL evaluation device IVL characteristic evaluation device "ELS-100V"

Organic EL evaluation device IVL characteristic evaluation device "ELS-100V"

This is a basic system for observing the lighting images of multiple organic EL devices and evaluating their IVL characteristics.

The multi-channel IVL characteristic evaluation system "Model ELS-100V" is a device that automatically measures and evaluates the IVL characteristics of numerous organic EL elements. The measurement conditions are displayed in real-time as graphs on a monitor. 【Features】 ○ Capable of capturing images of the light-emitting element's illumination state ○ Driving method → Step-up sweep with high-precision current/voltage application using KEITHLEY 2400 → Current range: 1nA to (1A) → Voltage range: 1μV to (200V) For more details, please contact us or download the catalog.

  • Other electronic measuring instruments

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Organic Film Bending Test Evaluation Device 'ELS-100FM'

Organic Film Bending Test Evaluation Device 'ELS-100FM'

We will evaluate the electrical/optical characteristics when a bending load is applied to a flexible device.

The ELS-100FM is a device that allows for the evaluation of electrical and optical characteristics when bending loads are applied to flexible devices. The bending load is driven by a robotic cylinder and a dedicated controller (which allows for stroke and speed adjustments), and the bending load is applied through the up and down motion of the robotic cylinder. The IV measurement device is the Keithley Instruments Source Meter 2400. The spectral radiance meter is the Konica Minolta CS-2000. 【Features】 ○ Capable of evaluating electrical and optical characteristics → When bending loads are applied to flexible devices ○ Bending loads are applied through the up and down motion of the robotic cylinder ○ Measurement items → Number of bends - Current (mA) - Voltage (V) - Luminance (cd/m²) - Spectrum *For more details, please contact us or download the catalog.

  • Other measurement, recording and measuring instruments

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Evaluation device for ultra-high temperature insulation characteristic evaluation (for gas atmosphere)

Evaluation device for ultra-high temperature insulation characteristic evaluation (for gas atmosphere)

Evaluation of ceramic materials!

This is a notice from Nishiyama Manufacturing Co., Ltd. regarding the "Ultra High Temperature Insulation Property Evaluation Device (for Gas Atmosphere)."

  • Other pumps

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Scientific and physical equipment for fuel cell evaluation device

Scientific and physical equipment for fuel cell evaluation device

In the era of integration and consolidation, we aim to become a needs-creation company.

Nishiyama Manufacturing Co., Ltd. continues to provide scientific, physical, environmental, and medical devices that are active in various fields such as research and development, quality inspection, quality control, and environmental management. Our product lineup includes devices for sending humidified gas, such as the SOFC evaluation device and the gas atmosphere furnace, the "Humidifier (Bubbler) Unit," the "Atmosphere Control High-Temperature Electric Furnace PART 5" which uses a two-layer molybdenum heater and high-quality alumina board insulation, the "Ultra-High Temperature Insulation Characteristic Evaluation Device (for Gas Atmosphere)" for measuring the high resistance of ceramic materials at high temperatures, and the "SOFC Type Button Cell Durability Test Device" which has improved the collection efficiency due to enhancements in the collection part, among various other devices. For more details, please contact us or refer to our catalog.

  • Testing Equipment and Devices
  • Other measurement, recording and measuring instruments
  • Electric furnace

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Nishiyama Manufacturing Co., Ltd. "SOFC Power Generation Evaluation Device" Product Catalog

Nishiyama Manufacturing Co., Ltd. "SOFC Power Generation Evaluation Device" Product Catalog

Introducing a power generation evaluation device with load adjustment function for tube cells!

The product catalog for the "SOFC Power Generation Evaluation Device" is from Nishiyama Seisakusho Co., Ltd., which primarily manufactures and sells scientific analysis instruments, environmental testing equipment, medical-related devices, OEM development, custom development equipment, and automation equipment. It includes detailed specifications for the "SOFC Power Generation Evaluation Device" with load adjustment functionality and for tube cells. [Featured Products] ■ "SOFC Power Generation Evaluation Device" with load adjustment functionality ■ "SOFC Power Generation Evaluation Device" for tube cells *For more details, please refer to the catalog or feel free to contact us.

  • Electric furnace

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[Analysis Case] Evaluation of Crystal Grains and Resistance in CIGS Thin-Film Solar Cells

[Analysis Case] Evaluation of Crystal Grains and Resistance in CIGS Thin-Film Solar Cells

Resistance distribution and evaluation of crystal grains and grain boundaries at the same location.

In SSRM, we can obtain insights into local resistance, while in EBSD, we can gain knowledge about crystal grains and grain boundaries. By conducting SSRM measurements at the same location as the EBSD measurements, we measured the local resistance in areas that include crystal grain boundaries, which we would like to introduce.

  • Other contract services

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[Analysis Case] Evaluation of Lithium-Ion Secondary Battery Separators

[Analysis Case] Evaluation of Lithium-Ion Secondary Battery Separators

Cool the sample and evaluate the shape of the separator more accurately.

The separator, which is a key component material of batteries, significantly influences the characteristics and safety of the battery due to its porosity, shape, and other factors. Currently, mainstream polymer materials such as polyethylene (PE), polypropylene (PP), or their composites have low softening points, with PE around 125°C and PP around 155°C. This report presents a case study where the cooling of a low softening point PP separator was conducted to suppress degradation and evaluate its structure.

  • 室温FIB.png
  • Contract Analysis
  • Contract measurement

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Analysis case: Evaluation of the oxide film on the surface of solder balls.

Analysis case: Evaluation of the oxide film on the surface of solder balls.

Evaluation case of spherical shape samples

In AES analysis, the SEM observation function is included, allowing for the measurement of specific areas on the sample surface. Additionally, since measurements can be taken in sub-micrometer micro-regions, it is possible to target specific areas for measurement not only on flat samples like substrates but also on samples with spherical or curved shapes, which are less affected by curvature. Below is an example of evaluating the oxide film thickness on solder ball surfaces with different surface shapes.

  • Contract Analysis
  • Solder

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[Analysis Case] Damage Assessment of Single Crystal Si Surface

[Analysis Case] Damage Assessment of Single Crystal Si Surface

Quantitative analysis of c-Si and a-Si by state is possible using high-resolution measurement and waveform analysis.

In the semiconductor manufacturing process, ion irradiation is sometimes performed for the purpose of surface modification. It is known that irradiating the surface of single-crystal Si with ions of inert elements can cause structural damage and lead to the formation of an amorphous layer. Utilizing the fact that high-resolution XPS spectra detect c (single-crystal) Si and a (amorphous) Si with different peak shapes, we will introduce a case where this damage-derived a-Si was separated from c-Si and quantitatively evaluated.

  • Contract Analysis

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[AFM-MA・DMA] Mechanical Property Evaluation (Elastic Modulus and Dynamic Viscoelasticity)

[AFM-MA・DMA] Mechanical Property Evaluation (Elastic Modulus and Dynamic Viscoelasticity)

AFM-MA and AFM-DMA are analyses that can provide insights into hardness.

Fitting is performed using various computational models on the force curve, which is an AFM measurement technique, to obtain elastic and viscoelastic data. ? Data can be measured in micro-regions that are consistent with DMA testing machines and nanoindenters. ? Applicable to materials with various hardness ranging from 10 kPa to 100 GPa. ? Fitting is possible using elastic models (DMT, Hertz, JKR) and viscoelastic models. ? Elastic modulus and viscoelastic modulus mapping can be performed using the above models. ? Frequency dependence (0.1 to 20 kHz) can be evaluated at each analysis point. ? Measurements can be conducted with temperature changes (room temperature to 250°C).

  • Contract Analysis
  • Contract measurement

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