We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Measurement System.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

Measurement System Product List and Ranking from 207 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Mar 25, 2026～Apr 21, 2026
This ranking is based on the number of page views on our site.

Measurement System Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Mar 25, 2026～Apr 21, 2026
This ranking is based on the number of page views on our site.

  1. マーポス Tokyo//Testing, Analysis and Measurement
  2. テクノ大西 Osaka//Electronic Components and Semiconductors
  3. COSEL Toyama//Electronic Components and Semiconductors
  4. 4 ピーテック Osaka//Medical Devices
  5. 5 日東精工アナリテック Kanagawa//Industrial Machinery
Go to Company Ranking

Measurement System Product ranking

Last Updated： Aggregation Period:Mar 25, 2026～Apr 21, 2026
This ranking is based on the number of page views on our site.

  1. Explanatory Material "Basic Information on Noise and First Steps for Countermeasures" <Currently Available for Free> COSEL
  2. Vascular Age Measurement System "Medical Analyzer" ピーテック
  3. Non-contact measurement solutions that contribute to the realization of flexible lines. マーポス
  4. 4 Surface pressure distribution measurement system "I-SCAN" テクノ大西
  5. 5 Multi-measurement system 'FISCHERSCOPE MMS PC2'

Measurement System Product List

271～300 item / All 431 items

Displayed results
Cargo Transport Measurement System L_SCOPE

Cargo Transport Measurement System L_SCOPE

Instantaneous and accurate measurement conveyor scale type weight measurement system.

A conveyor scale type weight measurement system that instantly and accurately measures cargo at a logistics center being transported at high speed. 【Features】 ○ Instant and accurate measurement ○ Conveyor scale type ○ Even for cargo that is not aligned, it measures instantly and accurately with automatic correction. ● For other functions and details, please download the catalog.

  • Weight related measuring instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Device for measuring the opening and closing time of vacuum gate valves.

Device for measuring the opening and closing time of vacuum gate valves.

This device is a system for measuring the opening and closing time of vacuum gate valves.

This device is a system for measuring the opening and closing time of vacuum gate valves. It consists of a measurement control box that has gate valve opening and closing signal output, valve opening and closing contact input signals, as well as time measurement and control functions, and measurement software that transfers, displays, and saves the measurement data to a Windows computer.

  • Other process controls
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Inkjet Droplet Automatic Measurement System 'JetMeasure'

Inkjet Droplet Automatic Measurement System 'JetMeasure'

Droplet speed measurement with a multi-nozzle head is accurate and quick.

Inkjet Droplet Automatic Measurement System

  • Image Processing Equipment
  • Image Processing Software
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Integrating Sphere LED Measurement System 'LL8'

Integrating Sphere LED Measurement System 'LL8'

Work that takes several days can be automatically measured in just a few hours! We support the development and evaluation of LED devices.

The "LL8" is an LED integrating sphere measurement system that can automatically evaluate optical, temperature, and electrical characteristics, with real-time display capabilities. It uses a standard calibration light source compliant with U.S. NIST, and the calculations adhere to JIS standards. With comprehensive software that includes features like graph overlay and statistical processing, it supports the development and evaluation of LED devices. 【Features】 ■ Automatic evaluation of optical, temperature, and electrical characteristics ■ Real-time display capability ■ Uses a standard calibration light source compliant with U.S. NIST ■ Calculations adhere to JIS standards ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
LED Lighting and Quantity Measurement System 'SR10-LT'

LED Lighting and Quantity Measurement System 'SR10-LT'

A system for LED lighting and quantity measurement that allows for automatic measurement inline, capable of registering the shapes of various types!

The "SR10-LT" is an LED lighting and quantity measurement system that can evaluate the number of LEDs and their brightness on a circuit board, with real-time display capabilities. In addition to measuring the number of LEDs on the circuit board without lighting them, it also allows for automatic measurement inline. It supports various options and custom specifications, including LED position detection and shape detection through image recognition, as well as determining the presence of parts such as connectors. 【Features】 ■ Real-time display capability ■ Ability to measure the number of LEDs on the circuit board without lighting them ■ Automatic measurement inline ■ Ability to register shapes of various types through teaching ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Automatic measurement of ultra-weak light without a darkroom! Absorbance measurement system 'DD8-N'

Automatic measurement of ultra-weak light without a darkroom! Absorbance measurement system 'DD8-N'

Can cancel external light and noise, allowing for inline measurements without the need for a dark room. Measures not only transmittance but also dark reflectance. [Free demo measurement available]

The "DD8-N" is an absorbance measurement system that can evaluate absorbance (OD) and transmittance without the need for a darkroom, and it also allows for real-time display. It calculates optical density from the transmittance of the sample relative to a reference. It supports various options and custom specifications, including multi-point measurements, polarization degree measurements with a polarizing prism, and reflectance measurements. 【Features】 ■ Measures ultra-weak light from 8OD to 12OD without a darkroom ■ Can cancel external light and noise ■ Calculates optical density from the transmittance of the sample relative to a reference ■ Continuous measurement at arbitrary intervals is possible ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Integrating Sphere Measurement System 'LL8-UV-VIS-NIR'

Integrating Sphere Measurement System 'LL8-UV-VIS-NIR'

Achieving high-precision light measurement for LED optical characteristic evaluation! Calibration with the customer's standard light source is also possible.

The "LL8-UV-VIS-NIR" is a system that automatically controls an integrating sphere, spectrometer, power supply, etc., to efficiently develop and evaluate LEDs, measuring their optical, electrical, and thermal characteristics. The standard calibration light source complies with the U.S. NIST, and the calculations adhere to JIS standards. Calibration with the customer's standard light source is also possible. Additionally, the system supports the development and evaluation of LED devices with comprehensive software that includes features such as graph overlay and statistical processing. 【Features】 ■ Achieves high-precision optical measurement for LED optical characteristic evaluation ■ Automatically controls integrating sphere, spectrometer, power supply, etc., for efficient LED development and evaluation ■ Capable of measuring the optical, electrical, and thermal characteristics of LEDs ■ Supports the development and evaluation of LED devices with comprehensive software ■ Accommodates various options and custom specifications *For more details, please refer to the PDF materials or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Integral sphere quantum efficiency measurement system 'LL8-UV-VIS-NIR'

Integral sphere quantum efficiency measurement system 'LL8-UV-VIS-NIR'

Achieving high-precision optical measurements such as quantum efficiency measurement and LED optical characteristic evaluation! Supports various options and custom specifications.

The "LL8-UV-VIS-NIR" is an integrating sphere quantum efficiency measurement system that uses an excitation light source to measure external quantum efficiency, internal quantum efficiency, excitation wavelength dependence, excitation spectrum, and emission spectrum. To efficiently conduct LED development and evaluation, it automatically controls the integrating sphere, spectrometer, power supply, and other components. It measures the optical, electrical, and thermal characteristics of LEDs. Furthermore, the standard calibration light source complies with US NIST standards, and the calculations adhere to JIS standards. 【Features】 ■ Achieves high-precision optical measurements for quantum efficiency measurement and LED optical characteristic evaluation. ■ Automatically controls the integrating sphere, spectrometer, power supply, and other components for efficient LED development and evaluation. ■ Measures the optical, electrical, and thermal characteristics of LEDs. ■ Calibration is also possible with the customer's standard light source. ■ Supports the development and evaluation of LED devices with comprehensive software. *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Temperature Characteristic Measurement System "LL8-HC"

Temperature Characteristic Measurement System "LL8-HC"

Using a constant temperature bath for temperature control! It is possible to measure a wide range of temperature characteristics from -60℃ to +150℃.

The "LL8-HC" is a temperature characteristic measurement system that can measure optical, temperature, and electrical characteristics with a single unit by automatically controlling the spectrometer, power supply, and constant temperature bath. It can automatically change current, voltage, and temperature while measuring optical and electrical characteristics in real-time under those conditions. Additionally, it is capable of performing time variation measurements at fixed intervals and repeated measurements for a specified number of times. 【Features】 ■ Current and voltage can be driven in DC and pulse modes ■ Reverse bias measurements are also possible ■ Measurement results can be saved, and various analyses can be performed using the analysis processing function ■ Analyzed results can be printed, saved as CSV, or copied to the clipboard ■ The software features a user-friendly display entirely in Japanese *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
"Custom specifications available" Non-contact film thickness measurement system 'FF8'

"Custom specifications available" Non-contact film thickness measurement system 'FF8'

The measurement data can be saved to a file, and re-analysis is possible later with a non-contact film thickness measurement system!

The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveforms) and analyzes film thickness values using FFT (Fast Fourier Transform) and other methods. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass. With optional features, it is capable of multi-layer film analysis, curve fitting, microscopy, mapping measurements, color measurement, and component concentration analysis. It is also possible to manufacture continuous measurement functions, traverse mechanisms, and data communication functions, allowing it to be used for inline film thickness measurement. 【Features】 ■ Measures the reflectance of samples and analyzes film thickness values using FFT and other methods ■ Can measure the thickness and refractive index of films and glass in addition to film thickness ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can be used for inline film thickness measurement ■ Custom specifications can also be accommodated *For more details, please refer to the PDF document or feel free to contact us.

  • Optical Measuring Instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Crystal Oscillator Measurement System 'QCM922A'

Crystal Oscillator Measurement System 'QCM922A'

High-speed, high-sensitivity QCM device for analyzing structural changes through the measurement of admittance frequency characteristics!

The "QCM922A" is a quartz oscillator measurement system that also supports the measurement of admittance frequency characteristics. It is a successor to the proven "QCA922" and can simultaneously measure minute mass changes as resonance frequency and viscoelastic changes as resonance resistance. Additionally, it is capable of measuring interactions between biomacromolecules such as proteins. 【Features】 ■ Successor to the proven QCA922 ■ Simultaneous measurement of minute mass changes as resonance frequency and viscoelastic changes as resonance resistance ■ Supports measurement of admittance frequency characteristics ■ Enables high-speed and high-sensitivity measurements up to 30MHz in addition to conventional 9MHz quartz oscillators *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
3D Measurement System "SPACE PROBE"

3D Measurement System "SPACE PROBE"

It is a tool that integrates the model space and physical space in real-time in both directions.

The measurement system "SPACE PROBE" instantly captures measurement results in a 3D CAD space. In addition to conventional measurements, it allows for executing CAD commands during measurement and utilizing measurement points for 3D modeling, enabling the capture of three-dimensional shapes. This tool uniquely integrates the model space (CAD screen) and physical space (measurement space) in a bidirectional and real-time manner, revolutionizing the world of measurement. Since 3D measurement data can be directly used while measuring within modeling commands, it bridges the gap that previously existed between measurement and modeling, allowing for the completion of attractive designs in a short time. For more details, please download the catalog.

  • Other CAD
  • Other CAD related software
  • Modeler
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
[Case Study] Multi-Device System in the Incoming Inspection Department for Various Outsourced Products

[Case Study] Multi-Device System in the Incoming Inspection Department for Various Outsourced Products

By being able to make accurate suggestions to the outsourcing partner, we have improved the quality of the parts!

We would like to introduce a case study of implementing a multi-terminal system at an automotive parts manufacturer. The system was introduced in the acceptance inspection area for hundreds of outsourced products, where automation of measurements was challenging. By maximizing the mobility of laptops, we successfully created a database. In particular, it has become possible to immediately compare with data from several years ago, which was difficult for irregular items, significantly increasing the validity of acceptance decisions. Additionally, this has enabled precise feedback to be provided to suppliers, leading to improved part quality. [Overview] ■ Implementation site: Automotive parts manufacturer (Acceptance inspection department for various outsourced products) ■ Implemented system: Major Tracer (multi-terminal system) ■ Reason for implementation: Automation of measurements was challenging *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
12-inch wafer compatible type CVmap3093 A/B

12-inch wafer compatible type CVmap3093 A/B

12-inch wafer compatible type

This is a CV/IV measurement system using a mercury probe method that excels in reproducibility and safety. It can measure the characteristics of various types of wafers, including Si, compounds, SOI, SiC, and bulk wafers. Users can specify up to 49 measurement sites, enabling mapping measurements of C-V, I-V characteristics, TDDB, Vbd, Qbd oxide breakdown evaluation, Dit, doping concentration, oxide film thickness, Low-k, High-k, and more.

  • Other environmental analysis equipment
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Flat panel compatible type CVmap FP-1

Flat panel compatible type CVmap FP-1

Flat panel compatible type

This is a CV/IV measurement system using a mercury probe method that exhibits excellent reproducibility and safety.

  • Other environmental analysis equipment
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Wireless pressure-sensitive sensor measurement system

Wireless pressure-sensitive sensor measurement system

High-speed wireless transmission of a large amount of sensor information.

We will propose the optimal system while discussing specifications with our customers. We will determine the appropriate hardware and firmware specifications and processing while confirming the timing of sensor value acquisition and the accuracy of the values. Additionally, we will provide applications that can wirelessly transmit the sensor values acquired by the firmware to a PC application, which can utilize CPU power to perform various calculations and display original results. We will introduce a system developed in collaboration with our customers that uses multiple pressure sensors to measure balance ability, an element of locomotive syndrome, in a PDF document. *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Other embedded systems (software and hardware)
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Soil thermal resistance measurement system

Soil thermal resistance measurement system

Soil thermal resistance measurement system

The soil thermal resistance measurement calculation management system developed by Yanamoto Engineering is a soil thermal resistance measurement system using thermal probes, completed with the cooperation of engineering companies affiliated with power companies. Since the components other than the thermal probes consist of commercially available standard equipment, we can offer it at a reasonable price with low design and manufacturing costs. The feature of this system is that it can automatically calculate the thermal resistance g-values at three points: 80 cm, 120 cm, and 160 cm from the surface by reading data from the data logger and manipulating the asymptote. Additionally, the results are accompanied by software that automatically generates reports compliant with ISO 9001, allowing anyone to calculate the soil-specific thermal resistance values without any tedious calculations. The calculated results can be printed in a format that complies with ISO 9001 under the user's company name, enabling direct submission to clients as measurement data in investigation reports. Furthermore, we have adopted manufacturers that can provide traceability certification and calibration compliant with ISO 9001 for all components. For more details, please refer to the materials on our website.

  • Temperature and humidity measuring instruments
  • Other measurement, recording and measuring instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Comprehensive catalog

Comprehensive catalog

Improving productivity with Bloom's onboard measurement device.

Towards the Future: LC50-DIGILOG On-machine measurement has become a standard practice in CNC machining centers over the past 30 years. Since then, the accuracy of the BLUM laser system and its reliability in the machining process have set the benchmark for everything. We have advanced new developments, expanding DIGILOG technology from touch probes to laser measurement systems, achieving even faster, higher precision, and more reliable tool measurement. Additionally, the hardware is equipped with numerous outstanding technological innovations.

  • Other measurement, recording and measuring instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Flexible Platform: EMCenter

Flexible Platform: EMCenter

Achieve space-saving! The plugin card module can be easily installed!

The "EMCenter" is a flexible platform that simplifies complex measurement systems and centrally manages RF measurements. It is modular, allowing for the selection of plug-in card modules in a plug-and-play manner, with up to 7 slots available per unit to accommodate various RF measurement applications. Key measurement equipment such as power meters, RF switches, positioner controllers, and electric field probes can all fit into one unit, achieving simplification and space-saving for the measurement system. 【Features】 ■ Plug-in card modules are easy to install, simplifying complex cable wiring. ■ With all major equipment housed in one unit, space-saving for emission and immunity measurement systems is achieved. ■ Control can be done via Ethernet, RS-232, USB, or GP-IB (optional). *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • EMC/Static electricity measuring equipment
  • controller
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Sensor Spectral Sensitivity Measurement System "VC-250"

Sensor Spectral Sensitivity Measurement System "VC-250"

Real-time feedback mechanism for light quantity eliminates the need for basic reference measurements!

The "VC-250" is a device used to measure the spectral characteristics (spectral sensitivity and spectral response) of photoelectric conversion elements such as photodiodes and CCD/CMOS image sensors. It monitors the light intensity at each wavelength in real-time and, through our unique control mechanism, allows for the irradiation of monochromatic light at a constant energy (W/cm²) and photon count (photon/cm²) for each wavelength. It has a proven track record under the name of spectral response measurement device and is recognized as an industry standard. 【Features】 ■ Well-suited for evaluating the spectral characteristics of photodiodes and CCD/CMOS image sensors ■ Capable of varying the intensity of monochromatic light by up to three digits ■ Easily measure spectral characteristics (spectral sensitivity and spectral response) by simply selecting the set energy or photon count through software ■ Supports external control mode *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Optical Measuring Instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
New TM21 Wireless Remote Measurement System for Real-Time Measurement

New TM21 Wireless Remote Measurement System for Real-Time Measurement

You can check the temperature data during heat treatment in real time.

The new TM21 wireless remote measurement system manufactured by Fluke Process Instruments (Data Pack) transmits temperature data from the data logger in real-time using the latest wireless technology. Even while the system is passing through the process, it is possible to instantly display, analyze, and report temperature data for products and the environment. This technology allows for easy temperature measurement of critical heat treatment processes in the majority of industrial heating fields.

  • Temperature and Humidity Control
  • Other process controls
  • Data Logger
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
DC Current Superposition Measurement System Model 11300

DC Current Superposition Measurement System Model 11300

A DC current superposition measurement system ideal for measuring between magnetic chokes of various power adapters capable of a maximum of 300A superposition.

The 11300 is a system product that combines an LCR meter and a DC superimposed current source, utilizing the automatic component analyzers from the 3252/3302 series and the DC superimposed current sources from the 1320 series. The automatic component analyzers from the 3252/3302 series can control the output of the DC superimposed current sources from the 1320 series, enabling DC superimposition of up to 100A in a wide range of measurement environments (customizable up to 300A). Combinations tailored to customer requirements are possible in various measurement environments such as research and development, quality inspection, and quality control. This system can handle currents of up to DC 300A, and by using low ESR (<10m ohm) for the connections between DC superimposed current sources, it reduces the generation of thermal energy while improving the accuracy of measurement results. Additionally, by combining a multifunctional four-terminal test fixture, it can measure a variety of loads, including SMD and DIP ring cores.

  • Inductor Coil
  • Other electronic measuring instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Remote monitoring measurement system

Remote monitoring measurement system

By using existing measuring instruments, software development is unnecessary! It is possible to shorten delivery times.

We would like to introduce the "Remote Monitoring Measurement System." Since it uses existing measuring instruments, software development is not required. Additionally, administrators and end users can implement it as long as they have an existing internet communication environment, which helps reduce implementation costs. By uploading data to the cloud, remote data analysis is made possible, and in the event of an anomaly, it is possible to send anomaly detection emails and issue alarms from the local PC. 【Features】 - No software development is required as it uses existing measuring instruments, which shortens delivery time. - Administrators and end users can implement it with an existing internet communication environment. - Remote data analysis is achieved by uploading data to the cloud. - In the event of an anomaly, anomaly detection emails can be sent and alarms can be issued from the local PC. *For more details, please refer to the PDF document or feel free to contact us.

  • Other security and surveillance systems
  • Other information systems
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Dew Point Measurement System

Dew Point Measurement System

Capable of measuring dew points above the external ambient temperature! Suitable for calibration work of constant temperature and humidity chambers.

We offer a portable system designed for easy moisture measurement using the MultiDew mirror-cooling dew point meter. By simply connecting a sampling hose to the measurement space (chamber), dew point measurement can be achieved over a wide range. The internal sampling circuit is designed to prevent condensation, allowing for dew point measurements above the external environmental temperature, making it suitable for calibration work in constant temperature and humidity chambers. 【Specifications (partial)】 ■External dimensions: W490 x D490 x H620 mm (including front and back covers; excluding casters) ■Weight: Approximately 27 kg ■Power supply: AC100V (2m) ■Sampling hose: 2m long (1/4) ■Maximum sampling gas temperature: 90℃ ■Sampling gas flow rate: MAX 2L/min (1L/min recommended) *For more details, please refer to the related links or feel free to contact us.

  • 2a.png
  • Other measurement, recording and measuring instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Non-contact film thickness measurement system for powder coating

Non-contact film thickness measurement system for powder coating

【Reduction of Defective Products】 A non-contact film thickness measurement system specialized for powder coating! It accurately detects the film thickness of coatings with simple operation by selecting from three measurement conditions.

The "PaintCheckermobile (PACmobile) LED-B" is a non-contact coating thickness measurement system that complies with the European standard DIN EN 15042-2, allowing for non-contact and non-destructive measurement of coating thickness. It is a product specialized for measuring the thickness of "powder coatings," detecting the thickness of coatings applied to various substrates such as metal plates, ceramics, and glass, both in dry and wet states ("immediately after application" and "after drying"). The operation does not require selecting complex measurement conditions; it features simple operation by choosing from the "three standard conditions" that are pre-installed. By detecting painting errors before baking or curing on-site, it contributes to improving production efficiency, enhancing the quality of final products, and reducing defective products (cost reduction). *Calibration is required according to the type of coating and the combination of substrates. 【Features】 ■ Non-contact and non-destructive ■ High-speed measurement (within approximately 2 seconds) ■ Capable of measuring both dry and wet ■ Able to measure uneven surfaces, curved surfaces, and inner surfaces ■ Approximately 10 hours of continuous use ■ Uses eye-safe LEDs *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • others
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Curve Tracer Automatic Measurement System

Curve Tracer Automatic Measurement System

Automatically measure products that previously required the use of different curve tracers for measurement all at once!

WTI is a design contracting company for devices and information communication equipment. In the "Curve Tracer Automatic Measurement System," we manufacture relay boxes that connect and distribute signals for the Curve Tracers (Model 370 and Model 370A). We have a track record of building environments for automatic measurement by controlling the Curve Tracer and relay box. Using the constructed environment, we provide contracted evaluation services. 【Features】 ■ Automatic measurement of products that previously required the use of two separate Curve Tracers. ■ Capable of measuring leakage currents in the range of a few nA to large currents in the 300A class using high-voltage relays and large current relays. *For more details, please feel free to contact us.

  • Other contract services
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
3D Measurement System MONMOS NET1AX Rental

3D Measurement System MONMOS NET1AX Rental

Further refined precision three-dimensional measurement 3D Station NET1AX

MONMOS NET1AX is a three-dimensional measurement system that has added features to automate the initial data acquisition process and enable high-speed automatic measurement. Additionally, it has improved performance through the latest technology, including high-precision automatic alignment with prisms and sheets, long-distance non-prism measurement (NET1AX), and enhanced motor rotation speed. For more details, please contact us.

  • 3D measuring device
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Rental of the Body Surface Temperature & Mask Measurement System Facelook X1

Rental of the Body Surface Temperature & Mask Measurement System Facelook X1

Non-contact measurement of surface body temperature. Alerts with sound and messages if above the set value.

Quickly measures temperature without touching the body. Equipped with an alert function. It allows for smooth checks even in situations where many people are moving. *When connecting to a computer, the IP address of the computer you own will be required. *For more details, please refer to the catalog available for download below under "PDF Download." You can also request a quote from "Contact Us." Feel free to do so.

  • Other measurement, recording and measuring instruments
  • Measurement System

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
COPYRIGHT © 2001-2026 IPROS CORPORATION ALL RIGHTS RESERVED.