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Measuring Instrument(co) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
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Measuring Instrument Product List

106～120 item / All 241 items

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2D Blast Furnace Profile Measurement Device "MWS-45RF-P2D"

2D Blast Furnace Profile Measurement Device "MWS-45RF-P2D"

Measurements can be taken at high temperatures without a cooling device.

The 2D blast furnace profile measurement device "MWS-45RF-P2D" is an FM-CW millimeter-wave distance meter composed of an antenna and a controller. The controller can be installed away from the high-temperature area via guide pipes or waveguides. A reflector that is not affected by heat can be placed in the high-temperature area, while the controller can be installed in the ambient temperature area, allowing measurements to be taken at high temperatures without a cooling device. For more details, please download the catalog.

  • Distance measuring device

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Non-contact optical surface roughness measuring instrument nanoCam

Non-contact optical surface roughness measuring instrument nanoCam

A vibration-resistant 3D roughness measuring instrument that is not affected by the size of the measurement object or the environment/location!

It is a roughness measurement device with a resolution of 0.1 angstroms and a repeatability of 1/1000 angstroms. It is fully compatible with Mountain Map, the most commonly used software in the industry, and measurements can be taken using the dedicated software 4Sight, which allows direct reading and writing of data formats such as MetroPro, CodeV, and Zemax, making it easy to integrate into your current measurement system.

  • 3D measuring device
  • Optical microscope
  • Visual Inspection Equipment

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Fluorescence lifetime measurement device; fluorescence spectrum measurement device

Fluorescence lifetime measurement device; fluorescence spectrum measurement device

Customization of fluorescence lifetime measurement devices according to requests.

Our original fluorescence lifetime measurement device and fluorescence spectrum measurement device adopt TCSPC: Time Correlated Single Photon Counting, allowing for fluorescence lifetime measurements from nanoseconds to microseconds. By combining high-sensitivity CCD detectors for spectroscopy and high-performance spectrometers, we can accommodate PL spectrum measurements and PLE measurements. Additionally, we can also support integration with Raman measurements and other techniques, broadening the scope of evaluation. We can also accommodate the reuse of existing devices and gradual system expansions. From individual components to full systems, we offer a wide range of optimal solutions.

  • Other microscopes
  • Spectroscopic Analysis Equipment
  • Analytical Equipment and Devices

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Portable X-ray residual stress measurement device (new lineup μ-X360s)

Portable X-ray residual stress measurement device (new lineup μ-X360s)

The long-awaited compact version μ-X360s of the μ-X360 series has arrived! Capable of measuring [residual stress], [half-value width], and [residual austenite].

~ Achieving compactness, lightweight design, high-speed measurement, and excellent mobility! ~ The residual stress measurement device has evolved to this point! We have added the long-awaited compact version μ-X360s to the μ-X360 series. It non-destructively measures residual stress, residual austenite, and half-value width in metals and ceramics. It is an outstanding device in terms of portability, reliability, safety, operability, and price.

  • X-ray inspection equipment

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Carbon Dioxide Concentration Measuring Device 'OSK 50QFCMM8'

Carbon Dioxide Concentration Measuring Device 'OSK 50QFCMM8'

The brightness of the screen display can be adjusted as desired! It has a function that automatically dims at night.

The "OSK 50QFCMM8" is a carbon dioxide concentration measuring device that allows for intuitive operation through function-specific icon displays and touch panel controls. You can set alarms and their volume for any desired upper/lower limit values of carbon dioxide concentration, and the settings can be protected with a password. Additionally, it features two calibration modes: "Reset to factory settings (manufacturer calibration)" and "Automatic calibration." 【Features】 ■ Measures and displays carbon dioxide concentration up to 9999 ppm in 1 ppm increments ■ Indicates carbon dioxide concentration status with numerical values and background colors (green, yellow, red) ■ Simultaneously measures temperature and humidity, displaying numerical values below the carbon dioxide concentration ■ Graphically displays the historical trends of CO2 concentration, retaining records for the past 7 days ■ Powered by AC through a USB port, with data output to a computer also possible via the same port *For more details, please refer to the PDF document or feel free to contact us.

  • Other environmental analysis equipment

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Electromagnetic Field Meter SMP3 Wavecontrol

Electromagnetic Field Meter SMP3 Wavecontrol

High-precision measurement of electric and magnetic fields is possible with a single device! A world-class electromagnetic field measuring instrument capable of spectrum analysis (DC to 10MHz) is also available.

● 3-in-1 field meter: spectrum analysis (DC to 10MHz), wideband (DC to 90GHz), electrostatic field measurement ● Real-time FFT-based spectrum analysis through digital processing ● Weighted peak measurement (WPM) for automatic and real-time comparison with limit values ● Auto-gain function dedicated to peak detection ● Display results in RMS and peak values ● Time domain measurement function for specific frequencies ● Automatic field probe recognition ● Selection of E&H fields ● Total field value and values for each component (X, Y, Z) ● Frequency span selection ● High-pass filters at 1Hz, 10Hz, 25Hz, 100Hz ● Max hold function ● Display of maximum, minimum, and average values ● Measurement time adjustable from 1 second to 100 hours ● Programmable measurement starting at a specified time ● Graph display of wideband measurements changes over time ● Graph display adjustable from 1 second to 12 minutes ● Programmable alarm function ● Real-time digital output for external measurements ● USB-C and fiber optic connection ● Screenshot function for reporting ● PC software for control and reporting ● Multilingual support

  • Other electronic measuring instruments
  • EMC Testing
  • Environmental Test Equipment

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Optical system method for measuring insertion loss of ultrafine waveguides.

Optical system method for measuring insertion loss of ultrafine waveguides.

High-speed and high-precision measurement of insertion loss in microstructured waveguide devices such as silicon photonics waveguides is possible!

The "Optical System Method Ultra-Fine Waveguide Insertion Loss Measurement Device" is an automatic measurement device for insertion loss using our simplified optical measurement system, M-Scope type J. With the optical fiber measurement port and coaxial observation image detector, it allows for direct observation of the core end face images on both the incident and outgoing sides of the waveguide being measured, while simultaneously performing automatic power alignment using optical fibers. By combining coarse alignment through image processing with fine alignment using optical fibers (optical power alignment), it is possible to efficiently measure the insertion loss of ultra-fine waveguides with high speed and high reproducibility. 【Features】 ■ Equipped with our general-purpose polarization-resistant optical measurement system M-Scope type J/PF ■ Insertion loss measurement under conjugate conditions with optical fiber alignment method ■ Dedicated image processing and automatic alignment software provided ■ Combination with an electric positioning stage enables high-speed and highly reproducible automatic measurements through image processing and automatic alignment, among others. *For more details, please download the PDF or feel free to contact us.

  • Optical Measuring Instruments

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Fellstar Corporation portable measuring device

Fellstar Corporation portable measuring device

Quality control/research and development measurement instruments (conductivity/permeability/magnetic field strength/flaw detection/material differentiation/hardness testing) portable measuring devices.

■Conductivity Meter Portable conductivity meter using eddy current method ■Magnetic Field Strength / Permeability Meter Portable permeability and magnetic field strength meter using a uniquely developed magnetic sensor ■Compact Eddy Current Flaw Detector Suitable for all situations where mobile flaw detection is required

  • Other measurement, recording and measuring instruments

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