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Observation equipment Product List and Ranking from 43 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

Observation equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. 米倉製作所 Osaka//Testing, Analysis and Measurement
  2. アイビット Kanagawa//Testing, Analysis and Measurement
  3. アイテス Shiga//Electronic Components and Semiconductors
  4. 4 GOKO映像機器 本社 Kanagawa//Optical Instruments
  5. 5 家田貿易 札幌、仙台、東京、大阪、熊本、沖縄 Tokyo//Educational and Research Institutions
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Observation equipment Product ranking

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. Heating and Cooling Observation Device MHO-300-2: Compact, Placeable, Easy to Use 米倉製作所
  2. High Temperature Observation Device IR-QP1-4, QP2-4 米倉製作所
  3. Fluorescence excitation observation device "Handheld Excitation Light Source Ex Flashlight" 家田貿易 札幌、仙台、東京、大阪、熊本、沖縄
  4. PR of the effectiveness of our product through blood flow visualization - GOKO Bscan-ZD GOKO映像機器 本社
  5. 4 3D X-ray observation device that supports X-ray inspection and chip component counting with one unit. アイビット

Observation equipment Product List

1～30 item / All 82 items

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High-Temperature Observation Device SMTScope Custom Specifications for Dew Point and Oxygen Concentration Control Heating

High-Temperature Observation Device SMTScope Custom Specifications for Dew Point and Oxygen Concentration Control Heating

Heating observation by adjusting the dew point and oxygen concentration!! Development and evaluation of flux-free brazing!!

The "SMTScope Dew Point and Oxygen Concentration Control Heating Custom Specification" is a high-temperature observation device used for the development and evaluation of fluxless brazing. In recent years, fluxless brazing has gained attention as an alternative to conventional no-clean brazing for aluminum alloys used in heat exchangers, from the perspectives of environmental protection, cost reduction, and residue minimization. 【Features】 ■ Dew Point Control: Adjustable from -70°C to -10°C ■ Oxygen Concentration Control: Adjustable from below 1ppm to 100ppm ■ Simultaneous adjustment of dew point and oxygen concentration is possible *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Observation equipment

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[Analysis Case] Investigation of Defects on Plastic Grill Surface

[Analysis Case] Investigation of Defects on Plastic Grill Surface

For some reason, the Cu plating has grown abnormally! It is assumed that Ni plating has been applied on top of it!

We would like to introduce the defect investigation conducted on the plastic grill surface at our company. In the surface observation, it was noted that some defects extend from the surface, and there are traces that appear to be where the protruding parts have broken off. The center of these traces is Cu, with Ni detected around it. In the cross-sectional observation, the voids within the Cu area were large, and there were gaps in the Cu/plastic just below the defect and in the immediate vicinity of the defect, from which C (Mg, Si) was detected. As a result, we concluded that the defects likely occurred after the Cu plating experienced abnormal growth due to some cause (such as plastic depressions or impurities) and subsequently collapsed, with Ni plating applied on top. [Case Overview] ■ Surface Observation - Some defects extend from the surface. - Traces were observed where the protruding parts seem to have broken off. - The center of these traces is Cu, with Ni detected around it (according to EDX analysis). *For more details, please refer to the related links or feel free to contact us.

  • Analytical Equipment and Devices
  • Other environmental analysis equipment
  • Contract Analysis
  • Observation equipment

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Compound microscope with dual-sided observation device.

Compound microscope with dual-sided observation device.

This device can be easily attached to appearance inspection equipment!

This is an optical device that allows visual inspection of three-dimensional images of various objects, starting with double-sided inspection of tab films. By turning the rotary knob of the double-sided observation device, the surface and back images can be switched optically, enabling stereoscopic viewing of dirt, scratches, bends, and warps, making accurate appearance inspections easy and quick.

  • Optical microscope
  • Observation equipment

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Educational experimental device: Sanitary equipment and trap drainage ventilation observation.

Educational experimental device: Sanitary equipment and trap drainage ventilation observation.

Educational experimental device: Sanitary equipment and trap drainage ventilation observation

We have designed the sanitary equipment and trap drainage ventilation observation device compactly within a single frame.

  • Analytical Equipment and Devices
  • Observation equipment

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Multi-layer flask observation device "VAS-002"

Multi-layer flask observation device "VAS-002"

Observation device dedicated to the multi-layer culture incubator inversion device "WAS-113".

The "VAS-002" is an observation device for multi-layer flasks that allows for observation at magnifications of 50 to 400 times using a side multi-stage observation camera. It enables observation at magnifications of 140 to 1400 times using a top observation camera, achieving observation of each stage of the multi-layer flask. Additionally, major operations can be easily performed on a large monitor, and the observation images are displayed on the large monitor, with image data saved to the built-in PC. 【Features】 ■ Achieves observation of each stage of the multi-layer flask ■ Allows for observation at magnifications of 50 to 400 times using a side multi-stage observation camera ■ Allows for observation at magnifications of 140 to 1400 times using a top observation camera *For more details, please download the PDF or feel free to contact us.

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  • Other Culture
  • Other microscopes and optical inspection equipment
  • flask
  • Observation equipment

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3DX Line Stereo Observation Device FX-400tRX/FX-500tRX

3DX Line Stereo Observation Device FX-400tRX/FX-500tRX

3D X-ray stereo method! The two-layer solder separation inspection of power devices has been realized!

The product has the capability to separately inspect the solder under the chip and the solder under the insulating substrate using the "X-ray stereo method." When using the X-ray transmission principle in the X-ray stereo method, the solder joint under the chip and the solder joint under the insulating substrate appear in the same position, causing the front and back to overlap, which prevents accurate inspection. The X-ray stereo method is a groundbreaking inspection device that allows for the separation and individual inspection of each solder joint. 【Features】 ■ High-output X-ray capable of penetrating a 5mm copper plate with 130kV, 0.5mA, and 39W (FX-500tRX) ■ Achieves high resolution with high output of 110kV, 0.2mA, 20W and spatial resolution of 2μm (FX-400tRX) ■ Enables two-layer separation inspection using 3D X-ray stereo method ■ Reduction in running costs due to the adoption of a long-life, 1.3 million pixel, 14-bit (16384 gradation) X-ray flat panel ■ Compact inspection machine body with traceability support through QR code recognition *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment
  • Observation equipment

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3D X-ray observation device 'FX-300tRX2 with CT'

3D X-ray observation device 'FX-300tRX2 with CT'

A compact sealed tube X-ray device that achieves a geometric magnification of 1,000 times! You can reduce inspection costs.

In conventional X-ray inspections, the chip components on the backside became noise components, making accurate inspections difficult. By using the "X-ray stereo method" developed by I-BIT, it has become possible to cancel out chip components mounted on the backside, such as BGA, LGA, and QFN. In this product, unlike conventional X-ray CT methods, it does not require tomographic images, allowing for high-speed processing. 【Features】 ■ Adoption of X-ray stereo method (our proprietary technology) ■ Achieved geometric magnification of 1,000 times ■ Equipped with chip counter function ■ High-magnification oblique shooting possible with wide-angle X-ray irradiation ■ Measurement of solder rise (solder filling rate) in through-holes is possible *New feature ■ Automatic BGA inspection function (optional) ■ VCT (Vertical CT) and PCT (Oblique CT) functions (optional) *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment
  • Observation equipment

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X-ray observation device 'FX-300tR2'

X-ray observation device 'FX-300tR2'

Compact yet achieving a geometric magnification of 900 times! A cost-effective X-ray observation device!

This product is a cost-effective X-ray observation device that achieves a geometric magnification of 900 times while being compact. You can register good quality images and compare them with current images, and it is possible to observe with the flat panel tilted at 60°. Target to sample distance is 0.5mm, target to X-ray camera distance is 450mm: 450/0.5=900. The L-size device is compatible with substrates of 600×600mm. 【Features】 ■ Equipped with various measurement functions ■ Ability to register good quality images and compare them with current images ■ Flat panel can be tilted at 60° for observation ■ Automatic tracking of observation position for diagonal observation (points do not shift even if the camera is tilted) ■ Inspection functions can be added as an option ■ CT function and L-size compatibility can be added as options *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment
  • Observation equipment

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X-ray observation device 'FX-500tRX/LL'

X-ray observation device 'FX-500tRX/LL'

High output 130kV, 300uA can also penetrate metal substrates! Suitable for solder inspection machines for 3-layer and 4-layer power devices.

The "FX-500tRX" is an X-ray observation device that uses the "X-ray stereo CT method" to individually inspect the solder joints under the bus bar, under the power chip, and under the insulating substrate of power devices. When using the conventional principle of X-ray transmission, the solder joints under the chip and under the insulating substrate appear in the same position, causing the front and back to overlap, which prevents accurate inspection. The X-ray stereo method is a groundbreaking inspection device that allows for the separation and individual inspection of each solder joint. 【Features】 ■ High-output X-ray source of 130kV and 300uA capable of penetrating 5mm copper plates ■ Ultra-long life 1.3 million pixel X-ray flat panel significantly reduces running costs ■ Separation of the front and back surfaces of the mounted board using the X-ray stereo method (approximately 4 seconds) ■ Acquisition of 300 layers of horizontal cross-sections of the mounted board using the X-ray stereo CT method (approximately 50 seconds) ■ Automatic inspection using CT functionality (OK/NG judgment) *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment
  • Observation equipment

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High magnification X-ray observation device 'FX-300tR2' + reel observation function

High magnification X-ray observation device 'FX-300tR2' + reel observation function

Both sample inspection on the inspection tray and reel-to-reel inspection are supported!

We would like to introduce our high-magnification X-ray observation device, the 'FX-300tR2', along with its reel observation function. This product is a device that inspects electronic components and semiconductor components on a reel, one by one as they are unwound. With a single X-ray device, it is now possible to conduct inspections both by arranging ICs on a conventional inspection table and by unwinding the reel. Please feel free to contact us if you have any inquiries. 【Features】 ■ Geometric magnification: 900x ■ Monitor magnification: 5,400x ■ X-ray output: 90kV ■ X-ray focal diameter: 5μ, 15μ (switchable) *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment
  • Observation equipment

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Sanyack Interferometer Vibration Observation Device "MLD-101 Series"

Sanyack Interferometer Vibration Observation Device "MLD-101 Series"

Visualizing the vibration distribution in the GHz band! We have prepared a general-purpose type and a compact desktop type.

The "MLD-101 Series" is a vibration observation device that visualizes the vibration distribution of high-frequency devices in the GHz band (such as piezoelectric thin films, SAW filters, FBAR, etc.) using a Sagnac interferometer. By irradiating the sample with a laser (light) through the Sagnac interferometer, interference signals are obtained. Vibration observation can be performed non-contact. Additionally, the interference signals and sample drive signals are processed with a lock-in amplifier to record amplitude, phase, and positional information, which can then be converted into a video to visualize the vibration distribution. 【Features】 ■ High-frequency vibration distribution information in the GHz band can be obtained in a short time ■ Visualization of vibration distribution ■ Equipped with FFT filter ■ Focus correction function for sample tilt ■ Image display and CSV output of recorded amplitude and phase information *For more details, please download the PDF or feel free to contact us.

  • Vibration Monitoring
  • Observation equipment

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Clinical trial support

Clinical trial support

Backing clinical trials related to capillary blood flow! We handle imaging, analysis, and evaluation.

In recent years, there has been a growing demand from users for evidence of blood flow improvement effects. Would you like to evaluate the blood flow of your products using the blood flow scope "TOKU Capillaro" and the vascular blood flow image analysis software "Capimetrics," which have been used in blood flow imaging and evaluation by many media outlets, including NHK and TV Tokyo? While laser Doppler devices and others are used for blood flow evaluation, we often hear that significant differences are difficult to obtain. Laser Doppler devices measure blood flow in a 1mm square area, but capillaries can measure blood flow speeds of 7/1000mm, allowing for significant differences to be displayed prominently. We accept consultations for various capillary blood flow analysis evaluations tailored to situations such as fingertips (nail bed), scalp, skin, and animals. We look forward to your contact. 【Features】 ■ Supports clinical trials related to capillary blood flow ■ Offers imaging, analysis, and evaluation at reasonable costs ■ Useful for the development of blood flow improvement products ■ Has received numerous requests from clinical trial companies in the past 【Track Record】 ■ Major food, cosmetics, and supplement manufacturers ■ Numerous universities, hospitals, research institutes, medical, beauty, and apparel sectors

  • Contract Analysis
  • Contract measurement
  • Other contract services
  • Observation equipment

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High Temperature Observation Device IR-QP1-4, QP2-4

High Temperature Observation Device IR-QP1-4, QP2-4

High-speed heating up to 1700℃ is possible, and it can also maintain that temperature!

The "IR-QP1-4" and "QP2-4" are high-temperature observation devices capable of heating up to 1700°C through focused heating of samples only. They achieve rapid heating of over 1000°C/min with a low power consumption of just 4kW (8kW) using a halogen heater. By incorporating an observation window, the state of the sample can be monitored during heating. With a compact size of 120W x 115H x 282 (382)L mm (excluding protrusions), it can heat without taking up much space. The sealed structure of the furnace allows for vacuum and gas replacement, enabling heating in a clean environment due to lamp heating. For more details, please contact us or download the catalog.

  • Analytical Equipment and Devices
  • Observation equipment

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"Soldering, circuit board, melting, brazing" suitable for on-site observation during heating [IR-HP]

"Soldering, circuit board, melting, brazing" suitable for on-site observation during heating [IR-HP]

We will achieve on-site observation of micro-mount components such as chip components, melting of solids and powders, and soldering on substrates (□100mm)!

■Features of the Large Heating Observation Device "IR-HP Series" It enables on-site observation of small mounted components such as chip parts, substrates (up to 100mm), melting of solids and powders, and brazing! ▼Features▼ - Infrared concentration on the sample allows for uniform high-temperature heating of substrates and other materials at a speed of one meter per second. - Clean heating and clear heating observation with a simple structure that is maintenance-free. ■Applications On-site observation can be performed from the top or side of various materials. The videos saved during on-site observation display elapsed time and temperature, and also include a measurement function. The standard closed structure of the furnace body makes it easy to perform vacuum pumping and introduce various gases for rapid cooling. ■Basic Configuration of the Large Heating Observation Device "IR-HP Series" - Stage furnace body - Sample holder (100mm quartz holder with one R thermocouple) - Temperature controller - Cooling water circulation device - CCD camera and zoom lens - PC and image capture software If you have any questions or requests regarding the microscope stage, please feel free to contact us. We also conduct heating observation tests of samples and demonstrations for consideration of installation at our Yokohama office, so please contact us if you are interested.

  • Soldering Equipment
  • Solder
  • Circuit board design and manufacturing
  • Observation equipment

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Droplet Observation Stroboscope "JetScope"

Droplet Observation Stroboscope "JetScope"

The first step of the inkjet experiment begins with the observation of droplets.

Inkjet droplet observation device Droplet observation stroboscope

  • Optical Measuring Instruments
  • Image Processing Equipment
  • Other measurement, recording and measuring instruments
  • Observation equipment

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Fluorescence excitation observation device "Handheld Excitation Light Source Ex Flashlight"

Fluorescence excitation observation device "Handheld Excitation Light Source Ex Flashlight"

Increased excitation wavelengths to accommodate many fluorescent substances! Introducing a fluorescence unit for microscopes!

The "Handheld Excitation Light Source Ex Flashlight" is a portable fluorescent excitation observation device that can be easily used anywhere. You can choose from five different excitation wavelengths, making it compatible with many fluorescent substances. Fluorescent observation can be conducted on-site, whether in a darkroom or in the field. Additionally, we offer a microscope fluorescence unit that can quickly transform your existing stereo microscope into a fluorescence stereo microscope simply by attaching it. 【Features】 - Powerful illumination despite its small size, now renewed for increased uniformity - Built-in Low Pass filter to enhance contrast - Increased excitation wavelengths to accommodate more fluorescent substances - Observation of infrared and near-infrared fluorescence with the 660nm excitation light source - Fluorescent observation possible on-site, whether in a darkroom or in the field *For more details, please refer to the PDF document or feel free to contact us.

  • Fluorescent lamp
  • Other optical parts
  • Observation equipment

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Inkjet Ejection Observation Device "DotView"

Inkjet Ejection Observation Device "DotView"

Measuring ejection speed with a dedicated camera! An inkjet ejection observation device that can also perform automatic measurements.

"DotView" is a device that observes the droplets ejected from an inkjet head and measures the ejection speed. It monitors the nozzle surface of the head from the side using a dedicated camera. It is capable of automatic measurement by changing parameters such as voltage and temperature for each item. By incorporating a simple printing mechanism, it allows for basic printing simulations. 【Features】 ■ Equipped with a dedicated observation camera ■ Automatic measurement is possible by changing parameters automatically ■ Can accommodate two types of heads ■ High-precision LED strobe adopted ■ Initial observation is possible *For more details, please refer to the PDF materials or feel free to contact us.

  • Printing Machinery
  • Observation equipment

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Observation of diffusion layers in semiconductors using FIB-SEM.

Observation of diffusion layers in semiconductors using FIB-SEM.

Shorter delivery time than his method! Both shape observation using FIB-SEM and diffusion layer observation can be performed!

We are conducting "Observation of the diffusion layer of semiconductors using FIB-SEM." By creating cross-sections using the FIB method and observing them with SEM, we visualized the diffusion layer of semiconductors and evaluated their shapes. In a case where the difference in built-in potential was visualized using the Inlens detector of the SEM, a difference in the energy of secondary electrons generated in the N-type and P-type regions occurred due to the built-in potential. This difference in trajectories is detected by the SEM detector. 【Features】 - Both shape observation and diffusion layer observation can be performed using FIB-SEM. - Shorter delivery times compared to other methods. - Concentrations can be detected up to 10E16. - While the PN interface can be visualized, the concentration differences of N+/N- and P+/P- cannot be detected. *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis
  • Observation equipment

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Observation of the coating layer of eyeglass lenses using a microtome.

Observation of the coating layer of eyeglass lenses using a microtome.

Section preparation using a microtome! Introducing examples of observing lens coating layers and multilayer films.

Lenses for glasses, cameras, and other devices are coated with various layers. In the case of glasses, multiple coating layers are applied, including a hard coat to protect plastic lenses, an anti-reflective coat to reduce light reflection, and a UV coat to block ultraviolet rays. These layers are applied as extremely thin films, so we observed their structure in cross-section. When observed with a scanning electron microscope (SEM), it was noted that a hard coat/multilayer film is applied on top of the lens substrate, and in the multilayer film, SiO and Nb films are alternately stacked. [Overview] ■ Cross-section preparation method - Prepared with a microtome - The lens removed from the frame was cut into small pieces and embedded in resin - Subsequently, a cross-section was prepared using a microtome, followed by optical microscopy observation, SEM observation, and EDX analysis. *For more details, please refer to the PDF document or feel free to contact us.

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  • Observation equipment

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Oblique CT observation of the laminated substrate.

Oblique CT observation of the laminated substrate.

In a multilayer substrate, it is possible to obtain information for each layer! By using a length measurement tool, you can measure the length.

The biggest advantage of angled CT is that it allows for non-destructive CT observation. It is suitable for obtaining planar information and can provide information for each layer in a multilayer substrate. Additionally, by using a length measurement tool, it is also possible to measure lengths. In our measurements, we observed a difference of about 7-14% compared to the results from optical microscope images, but it seems effective for those who want to understand internal structures non-destructively. Please feel free to contact us when needed. 【Features】 ■ Non-destructive CT observation ■ Suitable for obtaining planar information ■ Capable of obtaining information for each layer in multilayer substrates *For more details, please refer to the PDF document or feel free to contact us.

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  • Other contract services
  • Observation equipment

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Surface observation of IC chips implemented on LCD panels.

Surface observation of IC chips implemented on LCD panels.

The observation target is an IC chip connected to the LCD panel using the COG mounting method! The circuit surface was clearly visible.

We will introduce a case where precision planar grinding was applied to remove glass substrate wiring and conductive particles, allowing for the observation of IC chip circuits with minimal damage. Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. There are many samples, like the one in this case, where detailed observation has become possible through planar grinding, as well as samples that can be processed using FIB or CP techniques. If you have any samples you are struggling with, please consult us. We accept requests for planar grinding only, as well as requests that include observation and analysis. [Overview] <Planar Grinding and Optical Observation> ■ Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. ■ The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Inspection
  • Other contract services
  • Observation equipment

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Examples of observing intermetallic compounds through etching treatment.

Examples of observing intermetallic compounds through etching treatment.

Observe the state of the compound from the direction of the back and the surface! We will consider and propose processing, pretreatment, observation methods, and combinations.

The method of processing observation samples can result in different information being obtained. You may have observed the solder joint from a cross-section in two dimensions, but have you ever wondered how the compound grows in three dimensions? In this document, we present examples of observations of the Cu pad and solder joint. We include both "cross-sectional observation" and "planar observation." [Contents] ■ Cross-sectional observation - Before etching treatment - After etching treatment ■ Planar observation *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Analytical Equipment and Devices
  • Observation equipment

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Fixed-type X-ray inspection device for bags and parcels

Fixed-type X-ray inspection device for bags and parcels

Simple operation with just a push of a button.

Inspection device for bundles of letters, packages, and luggage.

  • Other measurement, recording and measuring instruments
  • Observation equipment

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Space and bio-related aquatic animal observation device

Space and bio-related aquatic animal observation device

Before thinking of reasons why you can't do it, think of ways you can do it.

Equipment List Model Quantity Wire EDM 3 NC Die-sinking EDM 1 Machining Center 2 Milling Machine 4 Jig Borer 1 Precision Surface Grinder 3 Precision Universal Grinder 1 Ultra-precision External Grinder 2 External Grinder 1 Ultra-precision Internal Grinder 1 Internal Grinder 1 NC Lathe 1 Lathe 1 Tool Grinder 3 Others 8 2D/CAD 2 3D/CAD 1

  • Other physicochemical equipment
  • Observation equipment

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Tohoku Univ. Technology : Device to measure nanoparticle distribution : T24-030

Tohoku Univ. Technology : Device to measure nanoparticle distribution : T24-030

Providing measurement technique that enables real-time observation of nanomaterial behavior

　Recently, nanomaterials with innovative functionalities, such as nanofluids (nanoparticle/solvent mixture) and polymer nanocomposite materials (nanoparticle/polymer mixture), have been extensively investigated. These nanomaterials find diverse applications in fields including conductive nano-inks, solar cells, and sensors, and are frequently utilized as thin films. During the coating and thin-film formation processes of nanomaterials on substrates, a technique capable of precisely observing the liquid film shape and the behavior of the contained nanoparticles is essential. 　The present invention enables the simultaneous measurement of the liquid film shape, including nanofluids (nanoparticle/solvent mixture) and polymer nanocomposite coating solutions (nanoparticle/polymer/solvent mixture), as well as the distribution and concentration of nanoparticles within the liquid film. By integrating this device into a manufacturing line, process monitoring becomes feasible. Furthermore, a mathematical model has been successfully developed to comprehend the behavior of nanofluid droplets on a substrate. (See T24-027).

  • others
  • Observation equipment

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Introduction of Analytical Equipment Owned by Ueda Plating Co., Ltd.

Introduction of Analytical Equipment Owned by Ueda Plating Co., Ltd.

Introducing various analytical instruments owned by Ueda Plating Co., Ltd.!

This catalog introduces the analytical equipment owned by Ueda Plating Co., Ltd. In advancing research and development, various testing and analytical devices are essential for accurately verifying the results. Our company manufactures all the equipment for every process from prototype to mass production line installation in-house. Additionally, we also introduce various factories and facilities. 【Contents】 ■ List of Analytical Equipment *For more details, please refer to the catalog or feel free to contact us.*

  • Electron microscope
  • UV/visible spectrophotometer
  • Fluorescence spectrophotometer
  • Observation equipment

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Macro and Micro Organizational Observation

Macro and Micro Organizational Observation

Macrostructure testing to examine defects in the weld cross-section! Microstructure testing to observe fine structures.

Metallic microstructure testing, such as "macro and micro organizational observation," includes macrostructure testing using the naked eye or low magnification magnifiers (up to about 20 times) and microstructure testing that observes fine structures not discernible to the naked eye (up to about 1000 times). Macrostructure testing examines relatively broad areas for homogeneity or defects, while microstructure testing is a method that investigates a narrow range in detail at high magnification. 【Examples of Application (Excerpt)】 ■ Determining the suitability of welding construction by measuring leg length and observing the fusion state of welds ■ Observing inclusions and segregation in metallic materials ■ Investigating the presence of notches or defects in the cross-section of mechanical structures or damaged areas ■ Investigating erosion depth and corrosion patterns by observing the cross-section of corroded areas ■ Observing plating thickness, carburizing layer, and decarburization layer depth *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices
  • Observation equipment

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Smart Echo (MX Series)

Smart Echo (MX Series)

Real-time observation of the inside of living organisms and objects!

Using ultrasound echo images, you can observe the interior of the object. ★ Confirm growth without harming the organism. Plan efficient feeding and shipping based on data collection and accumulation. ★ Inspect contents without opening. Achieve stable quality and ensure safe and secure product shipping.

  • Image Processing Equipment
  • Observation equipment

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Film Observation Record (Showcase) "FM2000"

Film Observation Record (Showcase) "FM2000"

Maximum brightness of 150,000 cd/m² or more, with 280 LEDs arranged to create a uniform and beautiful luminous surface without light unevenness.

The "FM2000" is a high-brightness film viewer (showcase) that meets D30 and D35 standards, with a maximum brightness of over 150,000 cd/m² and adjustable brightness between 10,000 and 150,000 cd/m². By placing 280 high-performance LEDs inside a luminous area of 220×75mm (9×3"), it achieves overwhelming brightness and a beautifully uniform luminous surface without light unevenness. Additionally, it does not become hot like conventional products, allowing for comfortable inspections even in summer. The use of a quiet fan also keeps unpleasant noise to a minimum. ■ Features - Achieves high brightness of over 150,000 cd/m² with 280 LEDs - Adjustable brightness from 10,000 to 150,000 cd/m² - Foot switch included as standard - Convenient film slot for observation *For more details, please refer to the PDF materials or feel free to contact us.

  • LED lighting
  • Flaw detection testing
  • X-ray inspection equipment
  • Observation equipment

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Automated Observation Device "CellShot"

Automated Observation Device "CellShot"

It is also possible to observe at different magnifications! An automatic observation device equipped with a phase contrast microscope.

"CellShot" is an observation device that can automatically capture and record microscope images of cell cultures using various labware such as dishes and multi-well plates. It is equipped with a tiling function, allowing for the observation of the entire area within the target well as a composite image. Additionally, it is easy to program the observation positions, enabling observation at different magnifications for each individual position. [Features] ■ Equipped with a phase contrast microscope ■ Can automatically capture and record microscope images of cell cultures ■ Equipped with a tiling function ■ Allows for observation of the entire area as a composite image ■ Easy to program observation positions *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Observation equipment

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