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Observation equipment Product List and Ranking from 37 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Sep 17, 2025~Oct 14, 2025
This ranking is based on the number of page views on our site.

Observation equipment Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Sep 17, 2025~Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. アイビット Kanagawa//Testing, Analysis and Measurement
  2. 米倉製作所 Osaka//Testing, Analysis and Measurement
  3. 山陽精工 Yamanashi//Industrial Electrical Equipment
  4. 4 アイテス Shiga//Electronic Components and Semiconductors
  5. 4 四国計測工業 Kagawa//Industrial Machinery

Observation equipment Product ranking

Last Updated: Aggregation Period:Sep 17, 2025~Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. High-temperature heating, tensile compression, on-site observation, atmosphere control as well / CATY-T3H 米倉製作所
  2. 3D X-ray observation device 'FX-300tRX2 with CT' アイビット
  3. High-Temperature Observation Device SMTScope Custom Specifications for Dew Point and Oxygen Concentration Control Heating 山陽精工
  4. Heating and Cooling Observation Device MHO-300-2: Compact, Placeable, Easy to Use 米倉製作所
  5. 4 Multi-layer flask observation device "VAS-002" 四国計測工業

Observation equipment Product List

16~30 item / All 80 items

Displayed results

High-temperature heating, tensile compression, on-site observation, atmosphere control as well / CATY-T3H

Tests can be conducted while observing the condition of the material surface [using a dual-swing crosshead], keeping the sample position centered to capture any changes!

The "CATY-T3H SYSTEM" is a tabletop-sized high-temperature tensile observation device that allows for thermal fatigue testing while observing the state of the sample surface in real-time. It can be used with simple operations and supports high-temperature and high-speed heating. By adopting a dual-swing crosshead, it maintains the sample's position in the center even if the sample piece expands or contracts, thereby minimizing the displacement of the observation position. By combining with optional units, it can also accommodate tests such as bending observation. 【Features】 ■ Capable of high-temperature and high-speed heating up to 1500°C * However, this depends on the shape and thermal capacity of the sample. ■ Testing of not only metallic materials but also composite materials of surface-mounted components is possible. ■ Stress measurement, low-cycle fatigue testing, and creep testing can be conducted in gas flow or vacuum conditions. ■ Realization of combined testing for thermal fatigue under stress and real-time observation. * For more details, please refer to the documentation. Feel free to contact us with any inquiries.

  • Strength Testing Equipment

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"Soldering, circuit board, melting, brazing" suitable for on-site observation during heating [IR-HP]

We will achieve on-site observation of micro-mount components such as chip components, melting of solids and powders, and soldering on substrates (□100mm)!

■Features of the Large Heating Observation Device "IR-HP Series" It enables on-site observation of small mounted components such as chip parts, substrates (up to 100mm), melting of solids and powders, and brazing! ▼Features▼ - Infrared concentration on the sample allows for uniform high-temperature heating of substrates and other materials at a speed of one meter per second. - Clean heating and clear heating observation with a simple structure that is maintenance-free. ■Applications On-site observation can be performed from the top or side of various materials. The videos saved during on-site observation display elapsed time and temperature, and also include a measurement function. The standard closed structure of the furnace body makes it easy to perform vacuum pumping and introduce various gases for rapid cooling. ■Basic Configuration of the Large Heating Observation Device "IR-HP Series" - Stage furnace body - Sample holder (100mm quartz holder with one R thermocouple) - Temperature controller - Cooling water circulation device - CCD camera and zoom lens - PC and image capture software If you have any questions or requests regarding the microscope stage, please feel free to contact us. We also conduct heating observation tests of samples and demonstrations for consideration of installation at our Yokohama office, so please contact us if you are interested.

  • Soldering Equipment
  • Solder
  • Circuit board design and manufacturing

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Fluorescence excitation observation device "Handheld Excitation Light Source Ex Flashlight"

Increased excitation wavelengths to accommodate many fluorescent substances! Introducing a fluorescence unit for microscopes!

The "Handheld Excitation Light Source Ex Flashlight" is a portable fluorescent excitation observation device that can be easily used anywhere. You can choose from five different excitation wavelengths, making it compatible with many fluorescent substances. Fluorescent observation can be conducted on-site, whether in a darkroom or in the field. Additionally, we offer a microscope fluorescence unit that can quickly transform your existing stereo microscope into a fluorescence stereo microscope simply by attaching it. 【Features】 - Powerful illumination despite its small size, now renewed for increased uniformity - Built-in Low Pass filter to enhance contrast - Increased excitation wavelengths to accommodate more fluorescent substances - Observation of infrared and near-infrared fluorescence with the 660nm excitation light source - Fluorescent observation possible on-site, whether in a darkroom or in the field *For more details, please refer to the PDF document or feel free to contact us.

  • Fluorescent lamp
  • Other optical parts

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Inkjet Ejection Observation Device "DotView"

Measuring ejection speed with a dedicated camera! An inkjet ejection observation device that can also perform automatic measurements.

"DotView" is a device that observes the droplets ejected from an inkjet head and measures the ejection speed. It monitors the nozzle surface of the head from the side using a dedicated camera. It is capable of automatic measurement by changing parameters such as voltage and temperature for each item. By incorporating a simple printing mechanism, it allows for basic printing simulations. 【Features】 ■ Equipped with a dedicated observation camera ■ Automatic measurement is possible by changing parameters automatically ■ Can accommodate two types of heads ■ High-precision LED strobe adopted ■ Initial observation is possible *For more details, please refer to the PDF materials or feel free to contact us.

  • Printing Machinery

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Observation of diffusion layers in semiconductors using FIB-SEM.

Shorter delivery time than his method! Both shape observation using FIB-SEM and diffusion layer observation can be performed!

We are conducting "Observation of the diffusion layer of semiconductors using FIB-SEM." By creating cross-sections using the FIB method and observing them with SEM, we visualized the diffusion layer of semiconductors and evaluated their shapes. In a case where the difference in built-in potential was visualized using the Inlens detector of the SEM, a difference in the energy of secondary electrons generated in the N-type and P-type regions occurred due to the built-in potential. This difference in trajectories is detected by the SEM detector. 【Features】 - Both shape observation and diffusion layer observation can be performed using FIB-SEM. - Shorter delivery times compared to other methods. - Concentrations can be detected up to 10E16. - While the PN interface can be visualized, the concentration differences of N+/N- and P+/P- cannot be detected. *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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Observation of the coating layer of eyeglass lenses using a microtome.

Section preparation using a microtome! Introducing examples of observing lens coating layers and multilayer films.

Lenses for glasses, cameras, and other devices are coated with various layers. In the case of glasses, multiple coating layers are applied, including a hard coat to protect plastic lenses, an anti-reflective coat to reduce light reflection, and a UV coat to block ultraviolet rays. These layers are applied as extremely thin films, so we observed their structure in cross-section. When observed with a scanning electron microscope (SEM), it was noted that a hard coat/multilayer film is applied on top of the lens substrate, and in the multilayer film, SiO and Nb films are alternately stacked. [Overview] ■ Cross-section preparation method - Prepared with a microtome - The lens removed from the frame was cut into small pieces and embedded in resin - Subsequently, a cross-section was prepared using a microtome, followed by optical microscopy observation, SEM observation, and EDX analysis. *For more details, please refer to the PDF document or feel free to contact us.

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  • Other contract services

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Oblique CT observation of the laminated substrate.

In a multilayer substrate, it is possible to obtain information for each layer! By using a length measurement tool, you can measure the length.

The biggest advantage of angled CT is that it allows for non-destructive CT observation. It is suitable for obtaining planar information and can provide information for each layer in a multilayer substrate. Additionally, by using a length measurement tool, it is also possible to measure lengths. In our measurements, we observed a difference of about 7-14% compared to the results from optical microscope images, but it seems effective for those who want to understand internal structures non-destructively. Please feel free to contact us when needed. 【Features】 ■ Non-destructive CT observation ■ Suitable for obtaining planar information ■ Capable of obtaining information for each layer in multilayer substrates *For more details, please refer to the PDF document or feel free to contact us.

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  • Other contract services

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Surface observation of IC chips implemented on LCD panels.

The observation target is an IC chip connected to the LCD panel using the COG mounting method! The circuit surface was clearly visible.

We will introduce a case where precision planar grinding was applied to remove glass substrate wiring and conductive particles, allowing for the observation of IC chip circuits with minimal damage. Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. There are many samples, like the one in this case, where detailed observation has become possible through planar grinding, as well as samples that can be processed using FIB or CP techniques. If you have any samples you are struggling with, please consult us. We accept requests for planar grinding only, as well as requests that include observation and analysis. [Overview] <Planar Grinding and Optical Observation> ■ Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. ■ The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Inspection
  • Other contract services

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Examples of observing intermetallic compounds through etching treatment.

Observe the state of the compound from the direction of the back and the surface! We will consider and propose processing, pretreatment, observation methods, and combinations.

The method of processing observation samples can result in different information being obtained. You may have observed the solder joint from a cross-section in two dimensions, but have you ever wondered how the compound grows in three dimensions? In this document, we present examples of observations of the Cu pad and solder joint. We include both "cross-sectional observation" and "planar observation." [Contents] ■ Cross-sectional observation - Before etching treatment - After etching treatment ■ Planar observation *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Analytical Equipment and Devices

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Fixed-type X-ray inspection device for bags and parcels

Simple operation with just a push of a button.

Inspection device for bundles of letters, packages, and luggage.

  • Other measurement, recording and measuring instruments

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Space and bio-related aquatic animal observation device

Before thinking of reasons why you can't do it, think of ways you can do it.

Equipment List Model Quantity Wire EDM 3 NC Die-sinking EDM 1 Machining Center 2 Milling Machine 4 Jig Borer 1 Precision Surface Grinder 3 Precision Universal Grinder 1 Ultra-precision External Grinder 2 External Grinder 1 Ultra-precision Internal Grinder 1 Internal Grinder 1 NC Lathe 1 Lathe 1 Tool Grinder 3 Others 8 2D/CAD 2 3D/CAD 1

  • Other physicochemical equipment

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Introduction of Analytical Equipment Owned by Ueda Plating Co., Ltd.

Introducing various analytical instruments owned by Ueda Plating Co., Ltd.!

This catalog introduces the analytical equipment owned by Ueda Plating Co., Ltd. In advancing research and development, various testing and analytical devices are essential for accurately verifying the results. Our company manufactures all the equipment for every process from prototype to mass production line installation in-house. Additionally, we also introduce various factories and facilities. 【Contents】 ■ List of Analytical Equipment *For more details, please refer to the catalog or feel free to contact us.*

  • Electron microscope
  • UV/visible spectrophotometer
  • Fluorescence spectrophotometer

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Macro and Micro Organizational Observation

Macrostructure testing to examine defects in the weld cross-section! Microstructure testing to observe fine structures.

Metallic microstructure testing, such as "macro and micro organizational observation," includes macrostructure testing using the naked eye or low magnification magnifiers (up to about 20 times) and microstructure testing that observes fine structures not discernible to the naked eye (up to about 1000 times). Macrostructure testing examines relatively broad areas for homogeneity or defects, while microstructure testing is a method that investigates a narrow range in detail at high magnification. 【Examples of Application (Excerpt)】 ■ Determining the suitability of welding construction by measuring leg length and observing the fusion state of welds ■ Observing inclusions and segregation in metallic materials ■ Investigating the presence of notches or defects in the cross-section of mechanical structures or damaged areas ■ Investigating erosion depth and corrosion patterns by observing the cross-section of corroded areas ■ Observing plating thickness, carburizing layer, and decarburization layer depth *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices

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Smart Echo (MX Series)

Real-time observation of the inside of living organisms and objects!

Using ultrasound echo images, you can observe the interior of the object. ★ Confirm growth without harming the organism. Plan efficient feeding and shipping based on data collection and accumulation. ★ Inspect contents without opening. Achieve stable quality and ensure safe and secure product shipping.

  • Image Processing Equipment

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