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Observation equipment Product List and Ranking from 38 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Dec 17, 2025～Jan 13, 2026
This ranking is based on the number of page views on our site.

Observation equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Dec 17, 2025～Jan 13, 2026
This ranking is based on the number of page views on our site.

  1. アイビット Kanagawa//Testing, Analysis and Measurement
  2. 米倉製作所 Osaka//Testing, Analysis and Measurement
  3. アイテス Shiga//Electronic Components and Semiconductors
  4. 4 山陽精工 Yamanashi//Industrial Electrical Equipment
  5. 5 家田貿易 札幌、仙台、東京、大阪、熊本、沖縄 Tokyo//Educational and Research Institutions
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Observation equipment Product ranking

Last Updated： Aggregation Period:Dec 17, 2025～Jan 13, 2026
This ranking is based on the number of page views on our site.

  1. 3D X-ray observation device that supports X-ray inspection and chip component counting with one unit. アイビット
  2. High Temperature Observation Device IR-QP1-4, QP2-4 米倉製作所
  3. Heating and Cooling Observation Device MHO-300-2: Compact, Placeable, Easy to Use 米倉製作所
  4. 4 High-Temperature Observation Device SMTScope Custom Specifications for Dew Point and Oxygen Concentration Control Heating 山陽精工
  5. 5 Observation of diffusion layers in semiconductors using FIB-SEM. アイテス

Observation equipment Product List

16～30 item / All 77 items

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Inkjet Ejection Observation Device "DotView"

Inkjet Ejection Observation Device "DotView"

Measuring ejection speed with a dedicated camera! An inkjet ejection observation device that can also perform automatic measurements.

"DotView" is a device that observes the droplets ejected from an inkjet head and measures the ejection speed. It monitors the nozzle surface of the head from the side using a dedicated camera. It is capable of automatic measurement by changing parameters such as voltage and temperature for each item. By incorporating a simple printing mechanism, it allows for basic printing simulations. 【Features】 ■ Equipped with a dedicated observation camera ■ Automatic measurement is possible by changing parameters automatically ■ Can accommodate two types of heads ■ High-precision LED strobe adopted ■ Initial observation is possible *For more details, please refer to the PDF materials or feel free to contact us.

  • Printing Machinery

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Observation of diffusion layers in semiconductors using FIB-SEM.

Observation of diffusion layers in semiconductors using FIB-SEM.

Shorter delivery time than his method! Both shape observation using FIB-SEM and diffusion layer observation can be performed!

We are conducting "Observation of the diffusion layer of semiconductors using FIB-SEM." By creating cross-sections using the FIB method and observing them with SEM, we visualized the diffusion layer of semiconductors and evaluated their shapes. In a case where the difference in built-in potential was visualized using the Inlens detector of the SEM, a difference in the energy of secondary electrons generated in the N-type and P-type regions occurred due to the built-in potential. This difference in trajectories is detected by the SEM detector. 【Features】 - Both shape observation and diffusion layer observation can be performed using FIB-SEM. - Shorter delivery times compared to other methods. - Concentrations can be detected up to 10E16. - While the PN interface can be visualized, the concentration differences of N+/N- and P+/P- cannot be detected. *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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Observation of the coating layer of eyeglass lenses using a microtome.

Observation of the coating layer of eyeglass lenses using a microtome.

Section preparation using a microtome! Introducing examples of observing lens coating layers and multilayer films.

Lenses for glasses, cameras, and other devices are coated with various layers. In the case of glasses, multiple coating layers are applied, including a hard coat to protect plastic lenses, an anti-reflective coat to reduce light reflection, and a UV coat to block ultraviolet rays. These layers are applied as extremely thin films, so we observed their structure in cross-section. When observed with a scanning electron microscope (SEM), it was noted that a hard coat/multilayer film is applied on top of the lens substrate, and in the multilayer film, SiO and Nb films are alternately stacked. [Overview] ■ Cross-section preparation method - Prepared with a microtome - The lens removed from the frame was cut into small pieces and embedded in resin - Subsequently, a cross-section was prepared using a microtome, followed by optical microscopy observation, SEM observation, and EDX analysis. *For more details, please refer to the PDF document or feel free to contact us.

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  • Other contract services

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Oblique CT observation of the laminated substrate.

Oblique CT observation of the laminated substrate.

In a multilayer substrate, it is possible to obtain information for each layer! By using a length measurement tool, you can measure the length.

The biggest advantage of angled CT is that it allows for non-destructive CT observation. It is suitable for obtaining planar information and can provide information for each layer in a multilayer substrate. Additionally, by using a length measurement tool, it is also possible to measure lengths. In our measurements, we observed a difference of about 7-14% compared to the results from optical microscope images, but it seems effective for those who want to understand internal structures non-destructively. Please feel free to contact us when needed. 【Features】 ■ Non-destructive CT observation ■ Suitable for obtaining planar information ■ Capable of obtaining information for each layer in multilayer substrates *For more details, please refer to the PDF document or feel free to contact us.

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  • Other contract services

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Surface observation of IC chips implemented on LCD panels.

Surface observation of IC chips implemented on LCD panels.

The observation target is an IC chip connected to the LCD panel using the COG mounting method! The circuit surface was clearly visible.

We will introduce a case where precision planar grinding was applied to remove glass substrate wiring and conductive particles, allowing for the observation of IC chip circuits with minimal damage. Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. There are many samples, like the one in this case, where detailed observation has become possible through planar grinding, as well as samples that can be processed using FIB or CP techniques. If you have any samples you are struggling with, please consult us. We accept requests for planar grinding only, as well as requests that include observation and analysis. [Overview] <Planar Grinding and Optical Observation> ■ Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. ■ The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Inspection
  • Other contract services

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Examples of observing intermetallic compounds through etching treatment.

Examples of observing intermetallic compounds through etching treatment.

Observe the state of the compound from the direction of the back and the surface! We will consider and propose processing, pretreatment, observation methods, and combinations.

The method of processing observation samples can result in different information being obtained. You may have observed the solder joint from a cross-section in two dimensions, but have you ever wondered how the compound grows in three dimensions? In this document, we present examples of observations of the Cu pad and solder joint. We include both "cross-sectional observation" and "planar observation." [Contents] ■ Cross-sectional observation - Before etching treatment - After etching treatment ■ Planar observation *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Analytical Equipment and Devices

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Fixed-type X-ray inspection device for bags and parcels

Fixed-type X-ray inspection device for bags and parcels

Simple operation with just a push of a button.

Inspection device for bundles of letters, packages, and luggage.

  • Other measurement, recording and measuring instruments

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Space and bio-related aquatic animal observation device

Space and bio-related aquatic animal observation device

Before thinking of reasons why you can't do it, think of ways you can do it.

Equipment List Model Quantity Wire EDM 3 NC Die-sinking EDM 1 Machining Center 2 Milling Machine 4 Jig Borer 1 Precision Surface Grinder 3 Precision Universal Grinder 1 Ultra-precision External Grinder 2 External Grinder 1 Ultra-precision Internal Grinder 1 Internal Grinder 1 NC Lathe 1 Lathe 1 Tool Grinder 3 Others 8 2D/CAD 2 3D/CAD 1

  • Other physicochemical equipment

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Tohoku Univ. Technology : Device to measure nanoparticle distribution : T24-030

Tohoku Univ. Technology : Device to measure nanoparticle distribution : T24-030

Providing measurement technique that enables real-time observation of nanomaterial behavior

　Recently, nanomaterials with innovative functionalities, such as nanofluids (nanoparticle/solvent mixture) and polymer nanocomposite materials (nanoparticle/polymer mixture), have been extensively investigated. These nanomaterials find diverse applications in fields including conductive nano-inks, solar cells, and sensors, and are frequently utilized as thin films. During the coating and thin-film formation processes of nanomaterials on substrates, a technique capable of precisely observing the liquid film shape and the behavior of the contained nanoparticles is essential. 　The present invention enables the simultaneous measurement of the liquid film shape, including nanofluids (nanoparticle/solvent mixture) and polymer nanocomposite coating solutions (nanoparticle/polymer/solvent mixture), as well as the distribution and concentration of nanoparticles within the liquid film. By integrating this device into a manufacturing line, process monitoring becomes feasible. Furthermore, a mathematical model has been successfully developed to comprehend the behavior of nanofluid droplets on a substrate. (See T24-027).

  • others

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Introduction of Analytical Equipment Owned by Ueda Plating Co., Ltd.

Introduction of Analytical Equipment Owned by Ueda Plating Co., Ltd.

Introducing various analytical instruments owned by Ueda Plating Co., Ltd.!

This catalog introduces the analytical equipment owned by Ueda Plating Co., Ltd. In advancing research and development, various testing and analytical devices are essential for accurately verifying the results. Our company manufactures all the equipment for every process from prototype to mass production line installation in-house. Additionally, we also introduce various factories and facilities. 【Contents】 ■ List of Analytical Equipment *For more details, please refer to the catalog or feel free to contact us.*

  • Electron microscope
  • UV/visible spectrophotometer
  • Fluorescence spectrophotometer

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Macro and Micro Organizational Observation

Macro and Micro Organizational Observation

Macrostructure testing to examine defects in the weld cross-section! Microstructure testing to observe fine structures.

Metallic microstructure testing, such as "macro and micro organizational observation," includes macrostructure testing using the naked eye or low magnification magnifiers (up to about 20 times) and microstructure testing that observes fine structures not discernible to the naked eye (up to about 1000 times). Macrostructure testing examines relatively broad areas for homogeneity or defects, while microstructure testing is a method that investigates a narrow range in detail at high magnification. 【Examples of Application (Excerpt)】 ■ Determining the suitability of welding construction by measuring leg length and observing the fusion state of welds ■ Observing inclusions and segregation in metallic materials ■ Investigating the presence of notches or defects in the cross-section of mechanical structures or damaged areas ■ Investigating erosion depth and corrosion patterns by observing the cross-section of corroded areas ■ Observing plating thickness, carburizing layer, and decarburization layer depth *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices

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Smart Echo (MX Series)

Smart Echo (MX Series)

Real-time observation of the inside of living organisms and objects!

Using ultrasound echo images, you can observe the interior of the object. ★ Confirm growth without harming the organism. Plan efficient feeding and shipping based on data collection and accumulation. ★ Inspect contents without opening. Achieve stable quality and ensure safe and secure product shipping.

  • Image Processing Equipment

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Film Observation Record (Showcase) "FM2000"

Film Observation Record (Showcase) "FM2000"

Maximum brightness of 150,000 cd/m² or more, with 280 LEDs arranged to create a uniform and beautiful luminous surface without light unevenness.

The "FM2000" is a high-brightness film viewer (showcase) that meets D30 and D35 standards, with a maximum brightness of over 150,000 cd/m² and adjustable brightness between 10,000 and 150,000 cd/m². By placing 280 high-performance LEDs inside a luminous area of 220×75mm (9×3"), it achieves overwhelming brightness and a beautifully uniform luminous surface without light unevenness. Additionally, it does not become hot like conventional products, allowing for comfortable inspections even in summer. The use of a quiet fan also keeps unpleasant noise to a minimum. ■ Features - Achieves high brightness of over 150,000 cd/m² with 280 LEDs - Adjustable brightness from 10,000 to 150,000 cd/m² - Foot switch included as standard - Convenient film slot for observation *For more details, please refer to the PDF materials or feel free to contact us.

  • LED lighting
  • Flaw detection testing
  • X-ray inspection equipment

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Automated Observation Device "CellShot"

Automated Observation Device "CellShot"

It is also possible to observe at different magnifications! An automatic observation device equipped with a phase contrast microscope.

"CellShot" is an observation device that can automatically capture and record microscope images of cell cultures using various labware such as dishes and multi-well plates. It is equipped with a tiling function, allowing for the observation of the entire area within the target well as a composite image. Additionally, it is easy to program the observation positions, enabling observation at different magnifications for each individual position. [Features] ■ Equipped with a phase contrast microscope ■ Can automatically capture and record microscope images of cell cultures ■ Equipped with a tiling function ■ Allows for observation of the entire area as a composite image ■ Easy to program observation positions *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices

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Cosmetic development, observation of spots, wrinkles, and capillaries GOKO Bscan-ZD

Cosmetic development, observation of spots, wrinkles, and capillaries GOKO Bscan-ZD

■Easy observation of scalp and skin capillaries. ■Clear observation of capillaries at an astonishing 720 times magnification. ■Contributes to evidence acquisition with flow rate quantification software.

- Optical magnification of 720 times. Amazing clarity! - Our unique anti-reflective observation method (patent pending) - Autoclave compatible - Connects to a computer with a single USB bus power - Remote observation is also possible with the Zoom app - Over 3,000 units of the series introduced since 2006 - Contributing to clinical research with quantification and publication software - International academic papers available for both hardware and software - Clear observation in the same mode anywhere on the body - Integrated system for development, manufacturing, and sales all in-house

  • Microscope

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