Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.
61～75 item / All 80 items
It is possible to observe cross-sections while observing FIB processing in real time.
A new method for structural analysis of electronics products manufactured with nanoscale precision, such as semiconductor devices, MEMS, and TFTs: We propose cross-beam FIB for cross-sectional observation.
![[Data] Cross-sectional observation of solar cell modules](https://image.mono.ipros.com/public/product/image/cc1/2000561879/IPROS02201267418243097889.png?w=280&h=280)
We have published cross-sectional observations of the fracture surface and elemental maps of the fracture area!
This document introduces the cross-sectional observation of solar cell modules. An inspection was conducted on a solar cell module that underwent thermal shock testing, and upon performing a cross-sectional observation of the identified abnormal areas, it was confirmed that the interconnector solder joint had fractured. [Contents] - Cross-sectional observation of the fracture - Element map of the fracture *For more details, please refer to the PDF document or feel free to contact us.
![[Information] Whisker Observation - Tips for Observing Flat Whiskers](https://image.mono.ipros.com/public/product/image/784/2000615150/IPROS7015404738526344873.png?w=280&h=280)
Introducing the differences in appearance due to the device, the differences in appearance based on sample angles, and the light sources!
Whiskers are often thought to occur at solder joints or component lead areas, but they can also arise from the plated surfaces of flat components. Observing them requires a bit of technique. This document covers differences in appearance based on the equipment used, as well as differences in appearance due to sample angles and the angles of light sources and lenses. [Contents] ■ Differences in appearance based on equipment ■ Differences in appearance based on sample angles ■ Differences in appearance based on light sources and lens angles *For more details, please refer to the PDF document or feel free to contact us.
Due to the advantages and disadvantages, it is necessary to choose according to the sample form, observation range, purpose, etc.!
At our company, we created a cross-section of the CMOS image sensor component associated with VR goggles manufactured by Company A through mechanical polishing while keeping the component in its original state, and we conducted structural observations of the CMOS sensor component. During the observation of the sensor component structure and sensor surface, we removed the glass filter and observed the surface of the CMOS sensor, where it was noted that the arrangement of the color filters was in a configuration known as a Bayer filter. In addition to mechanical polishing, methods for creating cross-sections include processing with ion beams such as FIB and CP, as well as microtome methods. Consultations are free, so please feel free to contact us if you are unsure about the method for creating cross-sections. [Overview] ■ Observation of sensor component structure and sensor surface ■ Cross-section creation by mechanical polishing ■ SEM observation of the sensor chip surface layer *For more details, please download the PDF or feel free to contact us.
![[Analysis Case] Failure Analysis of SiC Transistor using Slice & View](https://image.mono.ipros.com/public/product/image/3df/2001211099/IPROS78039083306307985293.jpeg?w=280&h=280)
Check the leak path by 3D visualization of SEM images.
For the SiC transistor, where the leak location was identified using a backside emission microscope, cross-sectional SEM observation was conducted using Slice & View. With Slice & View, it is possible to capture images of the leak location without missing it by performing cross-sectional observations at a pitch of several tens of nanometers around the leak area. By converting the SEM images into 3D, the leak path can be confirmed. Measurement method: Slice & View, EMS Product area: Power devices Analysis purpose: Failure analysis, defect analysis, product investigation For more details, please download the materials or contact us.
Equipped with a wide zoom function! High-performance tabletop and handheld dual-use blood flow observation device.
The blood flow observation device "Bscan-Pro" is a microscope-type blood flow scope with a wide range of zoom functions and a "non-contact" method. It allows for blood flow observation at the fingertips, and can also be detached from its dedicated stand for handheld operation. This versatile microscope can observe all parts of the body, including skin, scalp, and hair, making it suitable for both tabletop and handheld use. 【Features】 ■ Safe check without blood sampling ■ Wide range of applications supported by zoom ■ Lightweight and compact, weighing under 450g ■ Maintenance-free ■ High-quality images for observing all areas of the body For more details, please feel free to contact us.
You can feel the effect more because you can see the blood flow! No complicated operations or blood draws required.
We would like to introduce our product, the "Blood Flow Scope Salameel." By simply placing your finger, you can easily observe blood flow without the need for blood sampling, allowing you to visually experience the improvement in circulation, not just through sensation. Seeing the results increases trust in the effectiveness, making it useful for confirming the effects of products you use daily or for substantiating the effectiveness of your own products and services. 【Features】 ■ No blood sampling required & real-time observation ■ Easy operation ■ Comes with a sturdy dedicated case ■ Convenient X-Y stage ■ High-quality dedicated monitor ■ High quality at a low price *For more details, please download the PDF or feel free to contact us.
Patent obtained! The latest ultra-compact device that allows real-time observation of the high-pressure world in the laboratory.
The "High-Pressure Micro Hot Stage KM-3-A-2" is a super compact device that allows for direct observation of changes in substances under high pressure through a microscope. It is ideal for observing and measuring the processes of creation and annihilation under high pressure in fields such as liquid crystals, polymers, materials chemistry, biochemistry, analytical chemistry, reaction chemistry, and environmental chemistry. 【Features】 ■ Allows for on-site observation of the high-pressure world (up to 300 MPa - 200°C) in the laboratory ■ Patent obtained For more details, please refer to the catalog or feel free to contact us.
Design your own waveform profile according to the properties of the ink! Ink ejection observation device.
The "Ink Ejection Observation Device" is a device that confirms the measurement of droplets and the stability of ejection by observing the flight state of the ink. It designs the waveform profile according to the characteristics of the ink. The flight time is 100 to 200 μs, and the droplet speed is 30 to 40 km/hr. 【Features】 ■ Short pulse emission with LED light elements ■ Captured with a CCD camera (over 2 million pixels) ■ Continuous ejection output through linked emission timing ■ Free design of waveform profiles *For more details, please refer to the PDF document or feel free to contact us.
We manufacture custom-made experimental equipment for research institutions.
We will achieve labor-saving in the experimental process. By entrusting simple tasks to our machines, customers can focus on creative work. After immersing the test specimen at a certain temperature for a specific period, it is lifted out, and the condition of the specimen is observed. Once the test specimen is set, it operates automatically. ↓↓ Please take a look at the introduction images and videos ↓↓
Achieved a guaranteed resolution of 1.6 nm at a low acceleration voltage of 1 kV.
The Japan Electronics Corporation JIB-4700F composite beam processing observation device meets the high resolution and precision needs for evaluation techniques such as morphological observation, elemental analysis, and crystallographic analysis. Combined with the "in-lens Schottky electron gun," it enables high-resolution observation and high-speed analysis. 〇 Features - High-resolution SEM observation - High-speed analysis - High-speed processing - Enhanced detection system - Three-dimensional observation and analysis *For more details, please download the PDF or feel free to contact us.
All-in-one display standalone type! 11 hours of battery operation.
The "FIP-500" is a high-grade model of an end face inspection device (fiber scope) that supports fully automated inspection (detection, brightness adjustment, focus, centering, imaging, pass/fail judgment, and data storage) for various optical connector end faces, from single-core to multi-core (MPO). It is a standalone type with an integrated display, and it has a battery life of 11 hours. Additionally, it can transfer data to smartphones and PCs via Bluetooth and USB. 【Features】 ■ Automation of all processes in end face inspection (detection, brightness adjustment, focus, centering, imaging, pass/fail judgment, data storage) ■ Compatible with various optical connectors including single-core (LC, SC, FC, etc.) and multi-core (MPO) ■ Standalone type with an integrated display ■ 11-hour battery life ■ Data transfer to smartphones and PCs via Bluetooth and USB *For more details, please download the PDF (English version) or feel free to contact us.
Real-time observation of the tablet's water absorption and disintegration initiation state is possible with high-brightness X-rays!
Orally disintegrating tablets are desired to disintegrate with a small amount of water. To design and manufacture tablets with such properties, it is important to elucidate the mechanism of water absorption and disintegration. By using high-brightness X-rays from synchrotron radiation facilities, it is possible to observe the water absorption and disintegration process of the tablets in real-time through X-ray transmission. 【Real-time X-ray Transmission Observation Overview】 ■4s: Water droplet spreads and gradually absorbs water ■182s: Partial disintegration of the tablet's interior *For more details, please refer to the PDF document or feel free to contact us.
![[Data] Contracted Analysis Service - Non-destructive Observation](https://image.mono.ipros.com/public/product/image/9eb/2001073044/IPROS96030161848663458997.png?w=280&h=280)
Effective for identifying defects in semiconductors and electronic components, as well as measuring current distribution in new materials!
This document provides a detailed explanation of the "Contract Analysis Service Non-destructive Observation" conducted by Toshiba Nanoanalysis Corporation. It includes numerous examples such as observing current paths within printed circuit board wiring patterns using a magnetic field microscope, and examining the adhesion of wafer bonding using an ultrasonic microscope (reflection method). Please feel free to consult us when needed. [Contents] ■ Magnetic Field Microscope ■ Ultrasonic Microscope (SAM) ■ 3D X-ray Microscope (X-ray CT) ■ Flow of Contract Analysis Services *For more details, please refer to the PDF document or feel free to contact us.
