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Probe Product List

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AFMSPM Cantilever "qp Series"

AFMSPM Cantilever "qp Series"

Significantly suppresses the variation of spring constant and resonance frequency! Can be used as an alternative to silicon nitride probes.

The "uniqprobe series" features probes that have smaller dimensional specifications and material-specific warping and bending compared to Si probes and SiN probes. The variation in the cantilever's resonance frequency and spring constant is significantly lower, making it very effective for repeated measurements that require high reproducibility. We offer "qp-CONT/qp-SCONT," which is suitable for contact mode measurements in atmospheric and liquid environments, and "qp-BioAC/qp-BioAC-CI," which is optimal for tapping mode (AC mode) measurements in liquid. 【Features】 ■Significantly suppresses variation in spring constant and resonance frequency ■Low drift, making it suitable for liquid measurements ■Cantilevers and deep probes are made from quartz-like materials ■Deep probes have a hyperbolic side profile ■Can be used as an alternative to silicon nitride probes *For more details, please refer to the PDF materials or feel free to contact us.

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AFM/SPM probes and cantilevers for roughness measurement of various industrial materials.

AFM/SPM probes and cantilevers for roughness measurement of various industrial materials.

Cost measures and wear prevention products! NanoWorld probes with a high track record for everyday measurements.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the roughness of various industrial materials. These products are suitable for customers using AFM/SPM for nano-level surface management of materials. Please use the NCH probes, which have a proven track record worldwide, the BudgetSensors probes, which are cost-effective, and the nanotools probes, which enhance tip wear resistance and allow for long-duration measurements. 【Features】 ■ For measuring the roughness of various industrial materials ■ Suitable for customers using AFM/SPM for nano-level surface management of materials ■ Enhanced tip wear resistance allows for long-duration measurements *For more details, please refer to the related link page or feel free to contact us.

  • Other microscopes
  • Other physicochemical equipment
  • 3D measuring device

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Colloidal Probe for Viscoelastic Measurement in the Polymer Industry

Colloidal Probe for Viscoelastic Measurement in the Polymer Industry

The colloidal probe with a rounded tip is used for measuring viscoelasticity and modulation.

We would like to introduce our viscoelasticity measurement SPMAFM probes and cantilevers for the polymer industry. Our lineup includes the calibrated "biosphere series," as well as the "NanoSensors SD-sphere series" and "sQube CP series." In recent years, there has been an increasing demand for local viscoelasticity measurements and friction force measurements. For these applications, please use our colloid probes with a rounded tip. 【Features】 〈biosphere series〉 ■ Controlled radius of curvature ■ Calibrated ■ HDC/DLC hardness ■ Gold-coated reflection *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device

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Data presentation! "Basics of AFM/SPM Probes"

Data presentation! "Basics of AFM/SPM Probes"

Introducing the probes used in scanning probe microscopy and atomic force microscopy! We will clearly explain the names of each part of the probe!

This document explains the probes used in scanning probe microscopy and atomic force microscopy. The probes used for measurements are consumables, and many types are available for different measurement needs. They are typically made of silicon or silicon nitride and are manufactured using semiconductor processes. Additionally, quartz material probes from the "qp series" are available from NanoSensors. 【Contents】 ■ Names of each part ■ Variations of tips (probes) ■ Variations of cantilevers (spring plates) ■ Variations of support tips ■ Variations of coatings *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Other physicochemical equipment

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[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

Stock products domestically to achieve short delivery times! We also respond to inquiries regarding probe selection.

This is a cantilever that can be used with commercially available scanning probe microscopes and atomic force microscopes. Products from "NanoWorld," the world's largest probe manufacturing group, are used for various applications such as routine measurements in manufacturing process management, solid surface observation, material analysis, research on polymer materials, and biomaterials. We supply high-quality cantilevers with sharp tips and low variability in characteristics, as well as cantilevers equipped with probes suitable for industrial applications with high durability. [Contents] - Probes for AC mode non-contact mode - Probes for contact mode force-distance measurements - Broad compatibility for various measurement modes such as electrical and magnetic measurements - Colloid probes suitable for soft measurement targets like polymers and biomaterials - Self-exciting, self-detecting type - AFM accessories such as metal disks for fixing mica and HOPG samples *For more details, please refer to the PDF document or feel free to contact us.

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  • Other measurement, recording and measuring instruments

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Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

High aspect ratio SPM/AFM probes that can fit into narrow groove structures!

This product is suitable for quantitative measurements in the depth direction, which are difficult to measure with laser microscopes, such as line & space and trenches. Are you struggling with low surface shape reproducibility with your current probe? Cases where the groove shape is not accurately measured due to the opening angle of the probe tip can be improved by using a probe with a high tip aspect ratio. 【Features】 ■ Well-suited for quantitative measurements in the height direction, which are difficult to measure with laser microscopes ■ Improves cases where the groove shape is not accurately measured due to the opening angle of the probe tip *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • 3D measuring device
  • Other microscopes

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AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

Suitable for high polymer materials with a slightly lower spring constant than conventional non-contact tapping mode probes.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for polymer material research and development. For tapping mode measurements of polymers with relatively soft surfaces, soft tapping probes are ideal. Additionally, we offer colloid probes suitable for localized viscoelastic measurements, friction force measurements, and modulation response measurements, which have been in high demand in recent years. 【Features】 The NanoWorld Pointprobe NCL is designed for non-contact mode and tapping mode. It combines a low spring constant, high measurement stability, excellent sensitivity, and high-speed measurement capabilities. The tip shape is a polygon close to a pyramid. *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device

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AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

Introducing a conductive film coat probe suitable for measuring the electrical properties of various materials.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the electrical properties of nanomaterials. For localized electrical property measurements, probes with metal film coatings are preferable. While platinum coating is the standard, you can also use platinum silicide or conductive diamond-coated types that enhance wear resistance during contact. 【Features】 ■ For measuring the electrical properties of nanomaterials ■ Probes with metal film coatings are suitable for localized electrical property measurements ■ Platinum silicide and conductive diamond-coated types are also available *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device

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AFM/SPM Probes and Cantilevers for Biomaterial Measurement

AFM/SPM Probes and Cantilevers for Biomaterial Measurement

A liquid probe equipped with a low spring constant cantilever suitable for measuring soft samples in liquid.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for bio-sample and biomaterial measurement. In recent years, there has been a growing demand from customers for the measurement of surface shapes and viscoelasticity of cells and biomolecules, which requires special cantilevers with extremely soft spring constants. 【Features】 ■ Versatile SPM/AFM probes suitable for a wide range of applications ■ Designed for both contact mode and dynamic mode ■ Compatible with almost all commercially available SPM/AFM systems <PNP Series> ■ Cantilevers and probes made of silicon nitride ■ Support tips made of Pyrex glass ■ Individually separated chips for easy handling <uniqprobe Series> Probes with smaller dimensional specifications and material-specific warping and bending compared to Si probes and SiN probes. *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • 3D measuring device
  • Other microscopes

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High-speed AFM: AFM/SPM probes and cantilevers

High-speed AFM: AFM/SPM probes and cantilevers

USC series with a maximum resonance frequency of 5 MHz for high-speed AFM measurements in air and liquid.

The "USC Cantilever" is a probe with a high resonance frequency that enables unprecedented high-speed response in both air and liquid environments. This product, which balances a high resonance frequency with a low spring constant, is widely used in high-speed AFM measurements that allow for dynamic observation of bio-samples and real-time observation of material surfaces. 【Features】 ■ Designed for high-speed scanning ■ The cantilever and probe are fixed to a single crystal silicon support chip ■ Straight cantilever with no inherent stress ■ Ribbon-shaped cantilever with rounded corners at the free end ■ Cantilever made of quartz-like material *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
  • 3D measuring device
  • Other physicochemical equipment

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Probe for Scanning Probe Microscopy (SPM)

Probe for Scanning Probe Microscopy (SPM)

A lineup of various probes, including high-resolution models and cost-effective models. We also offer surface stress sensors.

As a member of the global probe manufacturer NanoWorld Group, we offer a variety of probes for Scanning Probe Microscopes (SPM). We have a rich lineup including high-end models that excel in fields requiring high resolution, as well as mid-range probes for Atomic Force Microscopes (AFM). We stock products domestically and provide them at short lead times and reasonable prices. 【Product Lineup (Partial)】 ■ NanoSensors PPP Series, NanoSensors ATEC Series High-end models that excel when high-resolution data is required ■ OPUS160AC Series, BudgetSensors Tap Series, etc. High cost performance for standard routine measurements ■ USC Series, OPUS 55AC Series, etc. Supports high-speed scanning with resonance frequencies in the MHz range, achieving several images per second In addition, we can propose solutions tailored to measurement needs such as electrical property measurements, long-duration measurements, measurements of soft materials, and nano-scale viscoelasticity measurements. *For more details, please refer to the materials. Feel free to contact us as well.

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