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Prober Product List and Ranking from 19 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

Prober Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. 雄山 東京支店 Tokyo//others
  2. ベクターセミコン Tokyo//Electronic Components and Semiconductors
  3. MPI Corporation Taiwan//Electronic Components and Semiconductors
  4. 4 日本マイクロニクス Tokyo//Electronic Components and Semiconductors
  5. 5 アポロウエーブ　 本社 Osaka//Testing, Analysis and Measurement
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Prober Product ranking

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. TS3000-SE-300mm Auto Prober MPI Corporation
  2. Chip size ~ 8-inch wafer compatible manual prober ベクターセミコン
  3. Semi-Automatic Prober AP200/AP300 アポロウエーブ　 本社
  4. Temperature-controlled stage probe 'MTP-100' イーエッチシー
  5. 4 Semi-Automatic Prober for Microcurrent Measurement 'AP-80A' 日本マイクロニクス

Prober Product List

31～58 item / All 58 items

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Evaluation and Analysis Manual Prober '705A-WG7'

Evaluation and Analysis Manual Prober '705A-WG7'

Wide contact area! Stage alignment can be achieved in a short time, improving measurement efficiency.

The "705A-WG7" is a manual prober for evaluation and analysis that can handle 12-inch wafers and FPD substrate defect analysis or TEG evaluation, thanks to its large stage. The adoption of a slide table ensures a wide probing area. Additionally, the air bearing stage allows for easy one-handed operation. Furthermore, it can be customized according to usage purposes, including the installation of various microscopes and laser cutter systems. 【Features】 ■ Compatible with large substrates ■ Supports defect analysis of 12-inch wafers and FPD substrates, as well as TEG evaluation ■ Ensures a wide probing area through the use of a slide table ■ Easy one-handed operation due to the air bearing stage ■ Equipped with a safety lock mechanism using a three-stage switching lever *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Prober

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Semi-Automatic Prober for Microcurrent Measurement 'AP-80A'

Semi-Automatic Prober for Microcurrent Measurement 'AP-80A'

Customization support! Both semi-automatic and manual operations are easy, contributing to improved measurement efficiency.

The "AP-80A" is a semi-automatic prober designed for measuring microcurrents, achieving low noise and high precision through a thorough guard structure. Thanks to its design utilizing guard potential technology, it enables measurement of microcurrents at the fA level. It supports external automatic control and manual operation via a joystick (with six movement modes). Additionally, it can accommodate power devices and can be customized according to usage purposes. 【Features】 ■ Achieves low noise and high precision measurement ■ Simple operation ■ Enables measurement of microcurrents at the fA level through a structure utilizing guard potential technology ■ Supports external automatic control and manual operation via a joystick (with six movement modes) ■ Standard compatibility with systems and software from major measurement instrument manufacturers *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Prober

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8-inch compatible manual prober MP-200A

8-inch compatible manual prober MP-200A

8-inch compatible manual prober MP-200A

Manual prober compatible with 8-inch wafers equipped with an X-Y stage 【Features】 ○ Equipped with an X-Y stage 　Simple remote control such as fast forward and jog feed is possible from the operation panel ○ Quickly moves to measurement points, offering excellent operability ○ A prober designed with user needs in mind, prioritizing low cost, high precision, and short delivery times ● For other functions and details, please download the catalog.

  • Image Processing Equipment
  • Prober

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Manual Prober "α Series"

Manual Prober "α Series"

A manual prober focused on comfortable operability! The optical system can be selected from three types!

The "α series" is a manual prober that meets a wide range of evaluation and analysis needs with comfortable operability. You can choose from multiple types of stages and optical systems. The wafer loading and unloading can be easily performed in an open-front configuration. The Z drive features a three-stage action operated by a lever. Alignment is performed approximately 300μm away from the wafer, allowing the stage to move without losing focus from the microscope. 【Features】 ■ Selectable stages/optical systems ■ Three-stage switching for Z ■ Easy stage movement ■ Reliable alignment *For more details, please refer to the catalog. Feel free to contact us with any inquiries.

  • Other physicochemical equipment
  • Prober

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Vacuum Prober MJ-8/MJ-10

Vacuum Prober MJ-8/MJ-10

Temperature characteristic evaluation at extreme low to ultra-high temperatures, measurements in vacuum and gas environments.

◎It is very compact, making it easy to measure on a desk. ◎It can be moved with an external operation-type positioner (probe) even in a vacuum. ◎It has excellent shielding effects, blocking light and noise. ◎The MJ-8 is slim, designed with Hall effect measurements in mind.

  • Other inspection equipment and devices
  • Prober

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Tabletop Compact Prober 'MBP-55'

Tabletop Compact Prober 'MBP-55'

Compact size, lightweight, and easy to carry! Please use it for micro-capacity CV measurements, high-frequency measurements, etc.

The "MBP-55" is a compact prober suitable for chip-level IV/CV measurements. It accommodates sample sizes up to 50mm square and is an integrated unit equipped with a shield box. Additionally, it supports microcurrent IV, micro-capacitance CV measurements, and high-frequency measurements. Its compact size and lightweight design make it easy to transport. 【Features】 ■ Ideal for chip-level IV/CV measurements ■ Supports sample sizes up to 50mm square ■ Integrated unit equipped with a shield box *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Prober

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Optical semiconductor prober

Optical semiconductor prober

Optical semiconductor prober

This is a device for probing and measuring/testing surface-emitting lasers (VCSEL) and photodiodes (PD/APD) in wafer form. ■ VCSEL - I-L-V measurement - V-I measurement - Wavelength measurement - High-frequency characteristics ■ PD/APD - V-I measurement (dark current, photocurrent) - High-frequency characteristics ■ Features - Peak search function for optical axis alignment - Back contact compatible with flip chips - Measurement items and content can be customized in the software to meet customer specifications.

  • Semiconductor inspection/test equipment
  • Prober

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XYZ 3-axis Nano Manipulator/Prober

XYZ 3-axis Nano Manipulator/Prober

Optimal for nano/micro manipulation and probing under SEM, FIB, and optical microscope observation.

The UP-100U is a manipulator/prober capable of operating on the nanometer level in the XYZ three axes and rotational axis. By combining it with commercially available SEM/FIB/optical microscopes, it can be used for various applications such as manipulation/probing at the micro/nanometer scale.

  • Microscope
  • Analytical Equipment and Devices
  • Prober

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Manual Prober

Manual Prober

OYM-401 is a manual prober compatible with optical microscopes. It is equipped with multiple positioners, allowing for easy probing.

The OYM-401 is a basic model with a simple operation panel that prioritizes ease of use. 【Features】 ◆ A model set up with a stereo microscope suitable for probing IC pads. ◆ Equipped with a standard 8-inch stroke X-Y stage. ◆ Optional installation of various equipment such as probe card holders and hot chucks is available. *For more details, please request the materials.

  • Semiconductor inspection/test equipment
  • Prober

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Simple Shield Box Prober TB Series

Simple Shield Box Prober TB Series

The initial installation cost is low! Just close the lid to create a shield, allowing for the measurement of microcurrents. It is a manual prober that can be equipped with a positioner and microscope.

This is an announcement from Yuzan Corporation regarding the "Simple Shield Box Prober."

  • Circuit Board Inspection Equipment
  • Prober

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Shielding Prober SP Series

Shielding Prober SP Series

This is a manual prober that can build a shielding environment on its own. It is equipped with a compact positioner, creating a space-saving and highly shielded measurement environment.

This is an announcement from Yuzan Corporation regarding the "Shielding Prober."

  • Circuit Board Inspection Equipment
  • Prober

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Vacuum prober, low-temperature prober

Vacuum prober, low-temperature prober

Measurement without condensation at low temperatures.

This is a notice from Yuzan Corporation regarding the "Low-Temperature Prober."

  • Other environmental analysis equipment
  • Prober

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Magnetic Pole Prober 4040MR

Magnetic Pole Prober 4040MR

Probe between magnetic poles, 360° compatible!

This is a notice from Yuzan Corporation regarding the "Magnetic Pole Prober 4040MR."

  • Other environmental analysis equipment
  • Prober

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Horizontal magnetic pole probe 41RFR

Horizontal magnetic pole probe 41RFR

Equipping the turntable with an electromagnet.

This is an announcement from Yuzan Corporation regarding the "Horizontal Magnetic Pole Prober 41RFR."

  • Other environmental analysis equipment
  • Prober

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Probe for glove boxes, GB series

Probe for glove boxes, GB series

Ideal for measurements in calm conditions!

This is a notice from Yuzan Corporation regarding the "Prober for Glove Boxes."

  • Other environmental analysis equipment
  • Prober

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Sheet resistance meter / four-probe tester

Sheet resistance meter / four-probe tester

It is a sheet resistance measurement system using the four-probe method.

The compactly formed four-point probe system quickly and accurately measures the resistivity and sheet resistance of diverse electronic materials in the research and development, inspection processes, and manufacturing lines of semiconductor/liquid crystal substrates, solar cell cells, and conductive thin films using the four-probe method.

  • Insulation Tester
  • Prober

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Manual Prober

Manual Prober

Manual Prober

This is a manual prober optimized for reliability testing and device characteristic evaluation, compatible with 8-inch wafers. We also offer manual probers compatible with 6-inch and 12-inch wafers.

  • Semiconductor inspection/test equipment
  • Prober

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Prober VX-3000SV

Prober VX-3000SV

We can easily accommodate any requests from users.

This is the first 12-inch wafer-compatible semi-automatic prober developed by a domestic manufacturer.

  • Analytical Equipment and Devices
  • Prober

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8-inch wafer semi-auto system

8-inch wafer semi-auto system

An innovative model that can be implemented at low cost! Compatible with a variety of applications.

The product is a semi-automatic prober that meets various measurement needs. The "TS2000-SE" is designed for high performance, ultra-low noise, and high precision while reducing testing costs. It delivers top-class performance in all areas, including microcurrent measurement, highly reliable DC/IV measurement, 1/f measurement, RF measurement, and power device measurement. 【Features】 ＜TS2000-SE＞ ■ Supports wafers up to 8 inches ■ Excellent design for EMI and RFI countermeasures and light shielding ■ Automatically performs wafer loading and unloading ■ Capable of temperature control from -60℃ to 300℃ *For more details, please refer to the PDF materials or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Prober

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Power device evaluation prober

Power device evaluation prober

A high-power measurement system that excels in cost performance and takes safety into consideration.

We handle "Power Device Evaluation Probers." The "TS150-HP/TS200-HP" is a manual prober specifically designed for power device measurements, including 10kV withstand voltage testing and 250A (pulse) current measurement. It can be equipped with a thermal chuck system capable of withstanding up to 10kV and operating at 300°C. In addition, we also offer the cost-effective "TS2000-DP" and the safety-equipped "TS2000-HP." 【Features】 ■ Manual prober specialized for power device measurements ■ Compatible with chip sizes up to a maximum of 6-inch wafer sizes (TS150-HP) ■ Compatible with chip sizes up to a maximum of 8-inch wafer sizes (TS200-HP) ■ Capable of creating a measurement environment that considers safety *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Prober

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Wafer Fully Automatic High-Speed LED Chip Prober NPB-600A

Wafer Fully Automatic High-Speed LED Chip Prober NPB-600A

We have successfully adopted a unique measurement method that significantly improves production efficiency.

The NPB-600A is a device that inspects the optical and electrical characteristics, as well as the appearance images, of diced LED chips (elements). It performs all measurements and appearance inspections automatically, including wafer replacement. By adopting a unique measurement method, it has successfully significantly improved production efficiency, achieving a cycle time of Max 0.07 seconds per unit. For more details, please contact us or refer to the catalog.

  • probe
  • Prober

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Simple room temperature prober (with temperature gradient function and micro-infrared camera included)

Simple room temperature prober (with temperature gradient function and micro-infrared camera included)

- Equipped with a temperature gradient generation unit that directly applies heat to the sample - Equipped with a micro-infrared camera unit

A custom system equipped with a unit that can apply heat to part of a sample to generate a temperature gradient, as well as a microscopic infrared camera unit for observation, designed for a simple room temperature prober.

  • Semiconductor inspection/test equipment
  • Other physicochemical equipment
  • probe
  • Prober

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High Vacuum Heating Micro Prober 'HMP-100' [Supports up to 500℃]

High Vacuum Heating Micro Prober 'HMP-100' [Supports up to 500℃]

High vacuum specification heating micro-prober! The heating temperature can reach up to 500°C, and it supports sample heating with a 10mm shape!

The "HMP-100" is a high vacuum heating micro-prober that can be used at <10^-4 Pa due to its exhaust system. It supports heating temperatures up to 500°C and is compatible with 10mm shaped samples. By adopting a TRIAX connector, it enables electrical measurements below 1 pA. 【Features】 ■ High vacuum specification Usable at <10^-4 Pa due to the exhaust system ■ Heating temperature Supports up to 500°C Compatible with heating 10mm shaped samples ■ Low current measurement Enables electrical measurements below 1 pA by adopting a TRIAX connector *For more details, please refer to the PDF document or feel free to contact us.

  • Heating device
  • Prober

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TS3500-SE-300mm Full Auto Option Prober

TS3500-SE-300mm Full Auto Option Prober

IV/CV, pulsed IV, 1/f noise, fully automated option for RF measurement, compatible with WaferWallet, 300mm auto prober.

300mm auto-prober for various on-wafer applications such as device modeling, RF and millimeter-wave measurements, WLR, and failure analysis. Models available with WaferWallet option that can be upgraded to a full auto-prober. Agent in Japan: Vector Semiconductor Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

  • Testing Equipment and Devices
  • Other inspection equipment and devices
  • Prober

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Semi-auto prober (for 8-inch microcurrent measurement)

Semi-auto prober (for 8-inch microcurrent measurement)

High-performance semi-automatic prober capable of measuring microcurrents at the fA level.

■Microcurrent Measurement - Enabled by a structure utilizing guard potential technology, capable of measuring microcurrents at the fA level. - Achieves low noise and high precision measurements. ■Easy Operation - External automatic control and manual operation via joystick (6 movement modes) are possible. * Both semi-automatic and manual operations are easy, contributing to improved measurement efficiency. ■Standard Compatibility with Major Measurement Instrument Manufacturers' Systems and Software - Keysight Technologies (B1500A Semiconductor Device Parameter Analyzer, EasyEXPERT) - Keithley Instruments (Systems and instruments equipped with ACS (measurement software)) * Custom support for other measurement instrument control and software is available. ■Diverse Options and Customization Support - Supports evaluation of temperature-dependent characteristics using a hot chuck (from +40°C to +200°C). - Allows for the installation of microcurrent probe cards using probe card adapters. - Customization is available according to the intended use.

  • Other physicochemical equipment
  • Semiconductor inspection/test equipment
  • Prober

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Manual Prober "LP-1"

Manual Prober "LP-1"

Compact and lightweight! Manual prober that can use a standard stand for optical microscopes.

The "LP-1" is a 1-inch type manual prober that allows for quick alignment. Depending on the options, it can also be equipped with a stereo microscope, triaxial chuck, and hot chuck. Please feel free to contact us if you have any requests. 【Features】 ■ 1-inch size wafer probing ■ Quick alignment capability ■ Adjustable overdriving amount of needle pressure ■ Compact size and weight for easy movement of the device * For more details, please download the PDF or feel free to contact us.

  • Other microscopes
  • Other laboratory equipment and containers
  • Prober

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