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Prober Product List and Ranking from 19 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

Prober Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. 雄山 東京支店 Tokyo//others
  2. ベクターセミコン Tokyo//Electronic Components and Semiconductors
  3. 日本マイクロニクス Tokyo//Electronic Components and Semiconductors
  4. 4 MPI Corporation Taiwan//Electronic Components and Semiconductors
  5. 5 アポロウエーブ　 本社 Osaka//Testing, Analysis and Measurement
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Prober Product ranking

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. Temperature-controlled stage probe 'MTP-100' イーエッチシー
  2. Prober VX-3000SV ベクターセミコン
  3. Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober. ウイング
  4. 4 Prova 東栄科学産業 名取工場　磁気応用部
  5. 5 Prover "Full Auto System" ベクターセミコン

Prober Product List

16～30 item / All 58 items

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Manual Prober for Implementation Boards "Model 6200"

Manual Prober for Implementation Boards "Model 6200"

Prevents slight misalignment of devices, improving operability even when using high-magnification microscopes.

The "Model6200" is a manual prober designed for direct probing of devices on printed circuit boards. By using a push button to retract the probe base plate and microscope in the Z-axis upward direction, it prevents slight misalignment of the device and improves operability even when using a high-magnification microscope. As a result, it is capable of chucking large prototype wiring boards with many components and connections. 【Standard Configuration Example】 ○ Manual Prober: Model6200 ○ Microscope: FS-70Z ○ Vibration Isolation Table: TAPC-56 ○ Micromanipulator: XYZ-500 ○ X-Y Scanner: 5010B For more details, please contact us or download the catalog.

  • Semiconductor inspection/test equipment
  • Circuit Board Inspection Equipment
  • probe

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Temperature-controlled stage probe 'MTP-100'

Temperature-controlled stage probe 'MTP-100'

Rapid cooling with forced air cooling by a cooling fan! Uses a heat-resistant probe with a temperature resistance of 300°C for 30 minutes.

The "MTP-100" is a two-probe tester with a temperature control stage. It allows for electrical measurements while changing the temperature of the sample. The top of the safety cover is equipped with a heat-resistant glass window, enabling observation of the sample with a microscope or similar equipment. 【Features】 ■ Equipped with a temperature control stage ■ Allows for electrical measurements while changing the temperature of the sample ■ The top of the safety cover has a heat-resistant glass window ■ Enables sample observation with a microscope or similar equipment *For more details, please refer to the PDF document or feel free to contact us.

  • 1.jpg
  • 2.jpg
  • Testing Equipment and Devices

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Semi-Automatic Prober for Power Device Evaluation AX-2500

Semi-Automatic Prober for Power Device Evaluation AX-2500

A new semi-automatic prober focused on the electrical characteristic evaluation of vertical/horizontal structured power devices.

This is a high-precision semi-automatic prober capable of handling wafer sizes up to 8 inches. Its low-noise specifications allow it to accommodate various applications. It supports automatic measurement.

  • Analytical Equipment and Devices

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Chip size ~ 8-inch wafer compatible manual prober

Chip size ~ 8-inch wafer compatible manual prober

This is a Vector standard model that supports chip sizes up to 8-inch wafers.

This is the Vector standard model that supports chip sizes up to 8-inch wafers. It enables the construction of various measurement solutions, including high and low temperature DC measurements, high-frequency measurements, and high-speed IV/pulse IV measurements.

  • Analytical Equipment and Devices

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4-inch wafer compatible manual prober MX-400

4-inch wafer compatible manual prober MX-400

Supports wafers up to 4 inches.

Supports wafers up to 4 inches Equipped with a high-temperature chuck Can also accommodate power device evaluation

  • Analytical Equipment and Devices

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Semi-Automatic Prober "12-Inch Wafer Semi-Automatic System"

Semi-Automatic Prober "12-Inch Wafer Semi-Automatic System"

Supports up to 12-inch wafers! Low cost and can be installed in a very small area.

The product is a high-performance semi-automatic prober compatible with up to 12-inch wafers. The "TS3000-SE" is an innovative model that can be introduced at a low cost while supporting various measurements, including 1/f measurements, which were difficult with semi-automatic machines, as well as microcurrent measurements. It can be installed in a very small area, including the chiller unit. 【Features】 ■ "TS3000" - Simultaneous setup of probe card and positioner is possible - Suitable for failure analysis, reliability testing, RF measurements, load pull measurements, etc. - Supports measurements in low-temperature environments while maintaining a wide opening ■ "TS3000-SiPH" - Designed for the characterization of silicon photonics devices - High-precision fiber alignment system with high flexibility - Safe operation is possible *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Prover "Full Auto System"

Prover "Full Auto System"

Equipped with high measurement accuracy and automation features! A prober capable of precise calibration.

Our company offers the "Full Auto System." The "TS2500-RF" is a new full-auto probe system designed for on-wafer RF measurements. It supports wafer sizes up to 200mm and can perform low noise, low leakage measurements within a temperature range from room temperature to a maximum of 300°C. Additionally, we also offer the "TS3500/TS3500-SE" which is compatible with 12-inch wafers. 【Features】 ＜TS2500-RF＞ ■ Capable of mounting probes up to 67GHz with 4 ports ■ Supports various measurements such as DC-IV, DC-CV, and Pulsed-IV ■ Can handle wafers as small as 50um *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Dual-Sided Contact Prober 'PCP-102WS'

Dual-Sided Contact Prober 'PCP-102WS'

High current/high voltage probing is possible! Achieving contact on both sides of the wafer.

The "PCP-102WS" is a high-precision prober designed for contact on both sides of a wafer (double-sided). By adopting our unique XY position correction function and profiling function, effective position correction against wafer warpage is possible. By performing Kelvin connections on the drain side of the wafer's backside and aligning the drain sense position with the source sense position on the wafer's front side, accurate RDS (on) measurements can be achieved. 【Features】 ■ Probing of high current/high voltage is possible due to the wafer clamp method using ceramic blades. ■ Probing at multiple points within a single chip is possible. ■ A high-rigidity housing made of iron base and welded frame is adopted to achieve low vibration. ■ Low cost, high throughput. ■ Compact footprint and energy-saving design. *For more details, please refer to the PDF materials or feel free to contact us.

  • probe
  • Semiconductor inspection/test equipment

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Prova

Prova

From compact low-cost models for research and development to fully automatic models for production!

Our probes have enhanced their functionality considering the measurement purposes of devices as pioneers of non-magnetic probes designed for magnetic mounting. We offer a lineup of models suitable for various measurement devices and techniques, such as magnetic memory, magnetic sensors, and magnetic storage. The fully automated models achieve high functionality with features like automatic angle and alignment of the probe, auto alignment, C-to-C, automatic profiling, and automatic position correction for large-diameter wafers. Additionally, we manufacture testers in-house, providing a consistent measurement test system. 【Features】 ■ The basic structure is completely non-magnetic. ■ Wafer evaluation for electronic compasses is thoroughly non-magnetized and equipped with three-axis coils. ■ Temperature measurement is possible from -40°C to +200°C while maintaining non-magnetization. ■ Utilizes low residual magnetic field technology for in-plane magnetic field, vertical magnetic field, and omnidirectional magnetic field application. *For more details, please download the PDF or feel free to contact us.

  • Other inspection equipment and devices

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Constant temperature vacuum prober

Constant temperature vacuum prober

Equipped with a compact TMP exhaust set! It is a probing system that can be expanded to a maximum of 4 probes.

This product is a "Constant Temperature Vacuum Prober" that uses aluminum material for the base to reduce weight and features vacuum suction on both the top and bottom. The temperature control system has two cycle control systems. The stage section has temperature control functionality, allowing measurements to be taken in environments with vacuum, gas atmosphere, and variable temperature. 【Features】 ■ Expandable to a maximum of 4 probes ■ The stage section has temperature control functionality, allowing measurements in environments with vacuum, gas atmosphere, and variable temperature ■ Vacuum suction on both the top and bottom ■ The base is made of aluminum material to reduce weight ■ Temperature control has two cycle control systems *For more details, please refer to the external link page or feel free to contact us.

  • Vacuum Equipment
  • Other machine elements

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TS150-150mm Manual Prober

TS150-150mm Manual Prober

Highly versatile 150mm (6-inch) manual prober.

We support a wide range of applications including device evaluation, modeling, WLR, failure analysis, IC design, and MEMS.

  • Testing Equipment and Devices
  • Other inspection equipment and devices

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TS2000-HP High Power Auto Prober

TS2000-HP High Power Auto Prober

High precision, high reliability 200mm auto-prober for high power measurement.

A device developed for high voltage and high current (10kV/600A) applications.

  • Testing Equipment and Devices
  • Other inspection equipment and devices

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TS2000-SE-200mm Auto Prober

TS2000-SE-200mm Auto Prober

High precision, high reliability IV, CV, pulsed IV, 1/f, 200mm auto-prober for RF measurements.

200mm auto-prober compatible with various on-wafer applications such as device modeling, RF and millimeter-wave measurements, WLR, and failure analysis. Agent in Japan: Vector Semiconductor Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

  • Testing Equipment and Devices
  • Other inspection equipment and devices

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TS3000-SE-300mm Auto Prober

TS3000-SE-300mm Auto Prober

High precision, high reliability IV, CV, pulsed IV, 1/f, 300mm auto-prober for RF measurements.

300mm auto-prober compatible with various on-wafer applications such as device modeling, RF and millimeter-wave measurements, WLR, and failure analysis. Agent in Japan: Vector Semiconductor Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

  • Testing Equipment and Devices
  • Other inspection equipment and devices

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Semiconductor Prober CP12

Semiconductor Prober CP12

A significantly downsized and lower-priced ultra-low-cost prober compared to conventional probers.

This is a space-saving type of prober that has been downsized from the conventional size. It significantly improves throughput and utilizes optical technology for wafer alignment. Additionally, by efficiently accessing prober functions and testing functions through test applications, it greatly reduces the software development period.

  • Semiconductor inspection/test equipment
  • Tester
  • Other semiconductor manufacturing equipment

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