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SEM - メーカー・企業8社の製品一覧とランキング

更新日： 集計期間:Aug 13, 2025～Sep 09, 2025
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SEMのメーカー・企業ランキング

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  1. アイテス Shiga//Electronic Components and Semiconductors
  2. サイエンスラボラトリーズ Chiba//Testing, Analysis and Measurement
  3. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  4. 4 YG-1ジャパン Osaka//Machine elements and parts
  5. 4 ジャスコインタナショナル Tokyo//others 第二事業部
企業ランキングへ

SEMの製品ランキング

更新日： 集計期間:Aug 13, 2025～Sep 09, 2025
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  1. Tabletop SEM (Scanning Electron Microscope) 'TM3030Plus' アイテス
  2. Tabletop SEM (SNE-4500M Plus B) サイエンスラボラトリーズ
  3. About Cryo-SEM 一般財団法人材料科学技術振興財団　MST
  4. 4GMILLS Y Coating Ultra-Hard Solid End Mill SEME71 YG-1ジャパン
  5. 4 Tabletop Automatic Particle Analysis SEM/EDS 'PhenomParticleX' ジャスコインタナショナル 第二事業部

SEMの製品一覧

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Tabletop Automatic Particle Analysis SEM/EDS 'PhenomParticleX'

Tabletop Automatic Particle Analysis SEM/EDS 'PhenomParticleX'

Complete automation from particle detection to size and shape measurement, elemental analysis, and classification!

The "Phenom ParticleX" is a tabletop automatic particle analysis SEM/EDS equipped with a high-brightness, long-life CeB6 electron gun and a large sample chamber, capable of fully automated cleanliness inspections and particle evaluations. It also supports a wide range of observations and analyses as a standard SEM, demonstrating its effectiveness in various needs from quality control to research and development with just one unit. Detection to classification can be completed in just one second per particle, allowing for quick analysis. Additionally, stable measurements can be achieved with the CeB6 electron gun, and measurement recipes and reports can be freely customized. 【Features】 ■ High image quality ■ Speed ■ Reproducibility *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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ParticleX TC Automatic Foreign Object Analysis SEM

ParticleX TC Automatic Foreign Object Analysis SEM

We will fully automate the detection of foreign substances and impurities, size measurement, and elemental analysis.

For inquiries about this product, please visit our website below. https://www.kbk.co.jp/ja The Phenom ParticleX TC Automatic Contaminant Analysis SEM is a particle automatic analysis device that automatically detects, measures the size, and analyzes the elements of contaminants (contaminations) found in finished vehicles and parts in automotive manufacturing. While traditional weight analysis can determine the total weight of contaminants attached to components, it cannot identify their source. The Phenom ParticleX TC Automatic Contaminant Analysis SEM captures the source of each individual contaminant and impurity by obtaining size, shape, and composition data, thereby supporting the investigation of defects and improving product quality.

  • Electron microscope

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Tabletop SEM (Scanning Electron Microscope) 'TM3030Plus'

Tabletop SEM (Scanning Electron Microscope) 'TM3030Plus'

Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.

We handle the tabletop SEM (scanning electron microscope) 'TM3030Plus' manufactured by Hitachi High-Tech. It has been half a century since SEM observation became common, and it has become an important observation method in various fields. With the "charge reduction mode" of the tabletop SEM, it is possible to observe and analyze samples that cannot be observed with FE-SEM. This capability is applicable not only in the semiconductor and electronic components fields but also in life sciences and biological fields. 【Features】 - For conductive samples such as semiconductors and electronic components, SEM observation is mainly recommended in normal/conductive mode. - For non-conductive samples such as plastics, paper, rubber, ceramics, and biological samples containing moisture or oil, SEM observation in surface/normal/charge prevention mode is recommended. *For more details, please refer to the PDF document or feel free to contact us.

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  • Electron microscope

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About Cryo-SEM

About Cryo-SEM

Cryo-processing cooling SEM: Scanning Electron Microscopy method

To observe the structure of liquid samples, it is necessary to conduct a series of analyses while maintaining the original structure of the sample. In cryo-SEM, the sample can be observed by rapidly freezing it to create a cross-section. Furthermore, by combining this with cross-section fabrication techniques using FIB processing, it is possible to obtain more detailed information about the internal structure.

  • Contract Analysis

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My Business Services SEO/SEM

My Business Services SEO/SEM

Aim for higher search rankings, SEO optimization.

Even if tens of thousands of sites related to search keywords are listed in search engines, only about 10 to 20 of them actually catch the user's eye. In this era of mass content production, if a website that has been carefully created does not attract the user's attention, it loses its purpose of conveying information. Our company offers appropriate SEO measures to help you rank higher in search results.

  • Other contract services

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4GMILLS Y Coating Carbide Solid End Mill SEME36

4GMILLS Y Coating Carbide Solid End Mill SEME36

Ideal for machining mechanical parts! Achieves outstanding cutting performance and wear resistance with advanced blade design.

The "SEME36 Series" is a Y-coating ultra-hard solid end mill with a new premium coating and four blades. It achieves outstanding cutting performance and wear resistance through its advanced blade shape. End mills with a diameter of 3mm or more suppress cutting vibration and tool wear due to the unequal lead effect. 【Features】 ■ New premium coating ■ Outstanding cutting performance and wear resistance achieved through advanced blade shape ■ Suitable for machining pre-hardened steel (HRc 55 or lower), carbon steel, alloy steel, and other machine parts ■ End mills with a diameter of 3mm or more ■ Suppression of cutting vibration and tool wear due to the unequal lead effect *For more details, please refer to the PDF document or feel free to contact us.

  • End Mills

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CD-SEM for photomasks "Z Series"

CD-SEM for photomasks "Z Series"

CD-SEM for photomasks capable of high-speed and high-precision measurement of nano-patterns.

The "Z Series" is a CD-SEM developed for photomasks aimed at sub-10 nm advanced devices, further evolving the unique high-resolution technology and charge mitigation technology cultivated over many years in the photomask market. It supports various samples such as EUV masks, NIL Qz molds, PET film molds, and DSA films. Please feel free to contact us if you have any requests. 【Features】 ■ Further improved aberration correction technology for obtaining high SNR images ■ Charge-free SEM images obtained through low vacuum technology, enabling high-precision measurements ■ Diverse applications (multi-point measurement, contour extraction, 2D measurement, defect review, 3D display) *For more details, please download the PDF or contact us.

  • Semiconductor inspection/test equipment
  • Other machine elements

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Tabletop SEM (SNE-4500M Plus B)

Tabletop SEM (SNE-4500M Plus B)

High-end model tabletop SEM

This is a high-end model that has performance comparable to general-purpose SEMs, despite being a tabletop SEM. It is a high-performance compact SEM developed by minimizing the modules of general-purpose SEMs. It achieves the industry's highest resolution of 5nm (maximum magnification of 150,000x) for tungsten filament-type tabletop SEMs, with an acceleration voltage that can be used from 1kV to 30kV. It comes standard with features such as switching between low vacuum mode and high vacuum mode, obtaining secondary electron images and backscattered electron images, a 5-axis stage with motor control, and aperture size switching. Additionally, options for an EDS detector (elemental analysis) and a cooling stage are also available.

  • Electron microscope

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4GMILLS Y Coating Carbide Solid End Mill SEMD99

4GMILLS Y Coating Carbide Solid End Mill SEMD99

New premium coating! Standardized short, regular, and long shanks.

The "SEMD99 Series" is a Y-coating carbide solid end mill standardized for corner radii ranging from 0.02 to 5.0. With its advanced blade shape, it offers outstanding cutting performance and wear resistance. It is suitable for machining pre-hardened steel (HRc 55 or lower), carbon steel, alloy steel for molds, as well as for machining mechanical parts. 【Features】 ■ New premium coating ■ Outstanding cutting performance and wear resistance due to advanced blade shape ■ Ideal for machining pre-hardened steel (HRc 55 or lower), carbon steel, alloy steel for molds, and mechanical parts ■ Standardized short, regular, and long shanks ■ Standardized corner radii ranging from 0.02 to 5.0 *For more details, please refer to the PDF materials or feel free to contact us.

  • End Mills

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4GMILLS Y Coating Ultra-Hard Solid End Mill SEME71

4GMILLS Y Coating Ultra-Hard Solid End Mill SEME71

End mills with a diameter of 3mm or more have an unequal lead design, which helps suppress cutting vibrations and tool wear.

The "SEME71 series" is a Y-coated carbide solid end mill designed for heavy cutting, featuring a bottom blade with a gash land specification. It achieves outstanding cutting performance and wear resistance through advanced blade geometry. We offer a rich lineup including short, regular, and long blade lengths. 【Features】 ■ New premium coating ■ Outstanding cutting performance and wear resistance achieved through advanced blade geometry ■ Suitable for machining pre-hardened steel (HRc 55 or lower), carbon steel, alloy steel, and mechanical parts ■ End mills with a diameter of 3mm or more have an unequal lead design to suppress cutting vibration and tool wear ■ The bottom blade is designed with a gash land specification, enabling heavy cutting *For more details, please refer to the PDF document or feel free to contact us.

  • End Mills

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