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microscope - メーカー・企業41社の製品一覧とランキング

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microscopeのメーカー・企業ランキング

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  1. null/null
  2. フローベル Kanagawa//Optical Instruments
  3. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  4. 4 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  5. 5 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
企業ランキングへ

microscopeの製品ランキング

更新日： 集計期間:Sep 24, 2025～Oct 21, 2025
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  1. White interference microscope equipped with laser microscope 'VK-X3000'
  2. All-in-one fluorescence microscope 'BZ-X1000 Series'
  3. Bilateral Microscope System "TOMOS Series" フローベル
  4. 4 All-in-one fluorescence microscope 'BZ-X800'
  5. 5 All-in-one fluorescence microscope BZ-X series

microscopeの製品一覧

391～405 件を表示 ／ 全 656 件

表示件数
200mm Large Sample Compatible AFM/SPM Jupiter XR

200mm Large Sample Compatible AFM/SPM Jupiter XR

A large sample-compatible stage-type AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope) with excellent resolution, speed, operability, and flexibility.

The Jupiter XR atomic force microscope is the industry's first large sample-compatible AFM/SPM that supports "ultra-high resolution," "high-speed imaging," and "wide-area scanning" with a single scanner without the need to change scanners. The sample stage allows access to the entire 200 mm sample area and inherits the excellent fundamental design and operability developed in the Cypher AFM (released in 2007), as well as the photothermal excitation 'blueDrive.' With its high level of balance, the Jupiter XR is the best choice for applications that require a variety of samples and applications in fields such as analytical science, industrial R&D, and academic research.

  • Microscope

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AFM/SPM for Polymers Cypher ES Polymer Edition

AFM/SPM for Polymers Cypher ES Polymer Edition

Standard-equipped with optimal measurement modes and options for polymer material research! Atomic force microscope for polymers based on ultra-high-performance environment-controlled AFM/SPM.

The Cypher ES Polymer Edition is based on the Cypher ES, which adds sophisticated environmental control to Asylum Research's ultra-high-performance AFM, and comes standard with measurement modes and options that are optimal for polymer materials research and polymer characterization (see "Basic Information" below). ● For other features and details, please refer to the catalog or contact us.

  • Other measurement, recording and measuring instruments
  • Microscope

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Benchtop Confocal Microscope "BC43"

Benchtop Confocal Microscope "BC43"

Space-saving and impressive performance. Ideal for live cell confocal imaging.

The "BC43" is a benchtop confocal microscope that can provide amazing images with just the push of a button. This plug-and-play confocal system is designed with cost, performance, and accessibility in mind, offering user-friendly high-quality 2D and 3D imaging capabilities that save valuable time for researchers. It also has many features and advantages, making it an ideal product for both those who are just starting their research and those who are already familiar with microscopy. 【Features】 ■ Benchtop multimodal imaging system ■ Easy confocal: sharp imaging without blur ■ Widefield imaging ■ Differential phase contrast and brightfield ■ Borealis uniform illumination *For more details, please refer to the PDF materials or feel free to contact us.

  • others

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[Document] Application Note: Battery Material Analysis Edition

[Document] Application Note: Battery Material Analysis Edition

Consolidated into a single application note! Introducing evaluation and analysis solutions that accelerate the development and quality control of battery materials.

This document introduces various application examples of how the evaluation of material properties with correlations can contribute to improving throughput across research, manufacturing, and the entire supply chain. It provides abundant information on topics such as "Measurement of grain size and microstructure of NCM cathode materials" and "Research on lithium-ion batteries using Raman correlation RISE microscopy." 【Contents (excerpt)】 ■ Introduction ■ Battery Applications ■ From Mines to Factories ■ ESM Measurement of Conductive Materials in Lithium-Ion Secondary Batteries ■ Desktop Multi-Nuclear NMR for Electrolyte Design *【Document】Application Note: Battery Material Analysis Edition is available for free! Please download the PDF to view it. Feel free to contact us.

  • Secondary Cells/Batteries

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[Data] Application Note: Life Sciences Edition

[Data] Application Note: Life Sciences Edition

Consolidated on page 24! Introducing solutions related to pharmaceuticals, cosmetics, and bioimaging.

In this document, we will introduce how it contributes to advanced research and development, such as the visualization of biological structures and the development and manufacturing of pharmaceuticals and cosmetics. [Contents (Excerpt)] ■ Introduction ■ Evaluation of the chemical properties of pharmaceuticals and correlation techniques using confocal Raman microscopy ■ Analysis examples in the cosmetics field using AFM ■ Measurement of fluoride content in toothpaste ■ Bioimaging *Application note: Life Sciences edition available for free! Please download the PDF to view it. Feel free to contact us.

  • Other microscopes

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Transmission electron microscope

Transmission electron microscope

The fine structure of the sample can be observed at the nanoscale using a transmission electron microscope (TEM)!

Our company is capable of producing high-precision thin film samples for TEM observation and achieving clear sub-nanometer order structural observations through advanced TEM observation techniques.

  • Contract Analysis

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Microscope "Major Scope" / Lens Camera "Digital Catch"

Microscope "Major Scope" / Lens Camera "Digital Catch"

A microscope with various combinations is possible! We also introduce a lens camera that can transmit wirelessly!

The "Major Scope" is an essential microscope for various industrial production, processing, and inspection processes. It is a highly valuable product as a peripheral device that optically supports positioning and setting of machine tools, measuring instruments, and various devices. Compact and easy to use, it can be utilized for a wide range of applications, from visual inspection to monitor observation, image measurement, and digital camera photography. 【Major Scope Features】 ■ The optical system provides a bright, wide field of view with a completely upright image microscope. ■ Designed with a long working distance and parfocality suitable for industrial use (objective lenses 2× to 10×). ■ By simply replacing the eyepiece micrometer, it can accommodate various applications such as measurement, inspection, centering, and positioning. ■ The objective lens has a gold frame mechanism that allows for easy fine magnification correction. Additionally, when attached to the Major Scope, the "Digital Catch" allows for measurement, inspection, and positioning while displaying the object and scale glass on a tablet device or similar screen. *For more details, please refer to the PDF document or feel free to contact us.

  • Microscope

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Design engineers provide individual support for the "Product Utilization Proposal and Verification Agency Service."

Design engineers provide individual support for the "Product Utilization Proposal and Verification Agency Service."

From product selection to combination proposals and even on-site verification, everything is free!

At Mirac Optical Co., Ltd., our product utilization proposal and verification agency service is handled individually by our design engineers, not sales representatives, to address various concerns and inquiries from our customers. We will provide the best proposals to solve your challenges by leveraging the know-how we have accumulated. 【Recommended for】 ○ Those who are unsure which Mirac product to choose from a wide range… ○ Those who want suggestions for the best combination of products that match their working conditions and target workpieces. ○ Those who would like to send in a physical workpiece for testing with an appropriate equipment configuration. *For more details, please contact us.

  • Other services

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[Case Study] Examples of Microscope Use

[Case Study] Examples of Microscope Use

We will introduce examples of use in pin shape inspections and burr inspections of rubber products.

Microscopes are essential for various industrial production, processing, and inspection processes, and we would like to introduce some examples of their use. They are highly valuable products that can also serve as optical support peripheral devices for positioning and setting of machine tools, measuring instruments, and various equipment. Compact and easy to use, they can be utilized for a wide range of applications, from visual inspection to monitor observation, image measurement, and digital camera photography. [Usage Examples] - Pushpin shape inspection - Burr inspection of rubber products - Gate removal residue inspection - Crack inspection equipment - Pin tip angle inspection *For more details, please download the PDF or contact us.

  • Other microscopes

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Measuring Tool Microscope "Measurer Scope"

Measuring Tool Microscope "Measurer Scope"

A microscope that is essential for various industrial production, processing, and inspection processes! Comprehensive catalog available for free!

The major scope is an essential microscope for various industrial production, processing, and inspection processes. It is also a highly valuable product as a peripheral device that optically supports positioning and setting of machine tools, measuring instruments, and various devices. Compact and easy to use, it can be utilized for a wide range of applications, from visual inspection to monitor observation, image measurement, and digital camera photography. We offer a wide variety of models and accessories in detail, responding to diverse needs at low prices. 【Features】 - The optical system provides a bright and wide actual field of view with a completely upright image microscope. - Designed with a long working distance and parfocality suitable for industrial use (objective lenses 2× to 10×). - By simply replacing the eyepiece micrometer, it can accommodate various measurements, inspections, centering, and positioning. - The objective lens has a gold frame mechanism that allows for easy fine magnification correction. *For more details, please download the PDF or contact us.

  • Microscope

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[Video] Monocular Microscope "Major Scope" Setup for Applications

[Video] Monocular Microscope "Major Scope" Setup for Applications

Here are some smart ways to use the monocular microscope "Majorscope"!

1. As a setting gauge for machine tools, it allows for tool compensation while simultaneously checking the cutting edge and alignment. 2. As a tool presetter for small automatic lathes, it enables the installation of cutting tools outside the machine using a tool holder (the part that secures the cutting tool) and a tool presetter (a device that allows for precise installation of the cutting tool while viewing through a microscope).

  • Optical microscope

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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.

The atomic force microscope "Handy AFM" can be used as a substitute for high-magnification optical microscopes. It features standard measurement modes, including static force mode, dynamic force mode, phase contrast, phase measurement, force modulation, spreading resistance, and external input capabilities. The scanning head is available in two types: high-resolution and wide-area, and they can be exchanged instantly. Probe replacement takes only a few seconds, and no adjustments are needed after replacement. Additionally, carbon nanotube probes can also be approached automatically. By using an electromagnetic scanner (patented) for scanning, there is no need to move the workpiece during the scan. Generally, it does not exhibit the non-linear creep or aging changes associated with piezo devices commonly used in AFMs. Optionally, it can be combined with a compact automatic stage. For more details, please download the catalog.

  • Electron microscope

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Atomic Force Microscope "AFM with Stage"

Atomic Force Microscope "AFM with Stage"

The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.

The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.

  • Electron microscope

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[Improvement without product] MEMS microscope (dual-side pattern misalignment inspection device)

[Improvement without product] MEMS microscope (dual-side pattern misalignment inspection device)

Monitor with a microscope camera to inspect for pattern misalignment and discrepancies!

At Arrows Engineering, we handle MEMS microscopes manufactured by IT Tech. The "TMIR-2000" can monitor MEMS wafers from both sides using microscope cameras, allowing for pattern misalignment and misregistration inspections. With newly developed software, the optical axes of the two cameras are aligned and synthesized in real-time, directly capturing any vertical overlap misalignment. Additionally, automatic line width measurement allows for sub-micron measurement of mark misalignment. 【Basic Configuration (Excerpt)】 ■ MEMS Microscope Main Unit ■ Triple Eyepiece Tube ■ 10x Eyepiece ■ XY Stage ■ Two Color Cameras ■ Inspection PC/19-inch Monitor/MEMS Inspection Software, etc. *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices

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