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microscope Product List and Ranking from 178 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 26, 2025～Dec 23, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 26, 2025～Dec 23, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. スリーアールソリューション Fukuoka//Trading company/Wholesale
  3. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  4. 4 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  5. 5 アイテス Shiga//Electronic Components and Semiconductors
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microscope Product ranking

Last Updated： Aggregation Period:Nov 26, 2025～Dec 23, 2025
This ranking is based on the number of page views on our site.

  1. Portable Microscope "Magic Loupe R" / 15x Magnification, Photo and Save Capability スリーアールソリューション
  2. White interference microscope equipped with laser 'VK-X4000 series'
  3. White interference microscope equipped with laser microscope 'VK-X3000'
  4. 4 All-in-one fluorescence microscope 'BZ-X1000 Series'
  5. 5 All-in-one fluorescence microscope 'BZ-X800'

microscope Product List

406～420 item / All 663 items

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[Video] Monocular Microscope "Major Scope" Setup for Applications

[Video] Monocular Microscope "Major Scope" Setup for Applications

Here are some smart ways to use the monocular microscope "Majorscope"!

1. As a setting gauge for machine tools, it allows for tool compensation while simultaneously checking the cutting edge and alignment. 2. As a tool presetter for small automatic lathes, it enables the installation of cutting tools outside the machine using a tool holder (the part that secures the cutting tool) and a tool presetter (a device that allows for precise installation of the cutting tool while viewing through a microscope).

  • Optical microscope

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[Video] Long-Focus Microscope

[Video] Long-Focus Microscope

You can observe from a distance! Long-focus microscope.

1. Ideal for applications that require a long working distance optical system. 2. Can be installed in a remote location when mounted on machinery or equipment. 3. Flexible arm allows for versatile setup. 4. The optical system can also be purchased separately. 5. The optical system is available in two types: visual observation type and C-mount type.

  • Optical microscope

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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.

The atomic force microscope "Handy AFM" can be used as a substitute for high-magnification optical microscopes. It features standard measurement modes, including static force mode, dynamic force mode, phase contrast, phase measurement, force modulation, spreading resistance, and external input capabilities. The scanning head is available in two types: high-resolution and wide-area, and they can be exchanged instantly. Probe replacement takes only a few seconds, and no adjustments are needed after replacement. Additionally, carbon nanotube probes can also be approached automatically. By using an electromagnetic scanner (patented) for scanning, there is no need to move the workpiece during the scan. Generally, it does not exhibit the non-linear creep or aging changes associated with piezo devices commonly used in AFMs. Optionally, it can be combined with a compact automatic stage. For more details, please download the catalog.

  • Electron microscope

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Atomic Force Microscope "AFM with Stage"

Atomic Force Microscope "AFM with Stage"

The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.

The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.

  • Electron microscope

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[Improvement without product] MEMS microscope (dual-side pattern misalignment inspection device)

[Improvement without product] MEMS microscope (dual-side pattern misalignment inspection device)

Monitor with a microscope camera to inspect for pattern misalignment and discrepancies!

At Arrows Engineering, we handle MEMS microscopes manufactured by IT Tech. The "TMIR-2000" can monitor MEMS wafers from both sides using microscope cameras, allowing for pattern misalignment and misregistration inspections. With newly developed software, the optical axes of the two cameras are aligned and synthesized in real-time, directly capturing any vertical overlap misalignment. Additionally, automatic line width measurement allows for sub-micron measurement of mark misalignment. 【Basic Configuration (Excerpt)】 ■ MEMS Microscope Main Unit ■ Triple Eyepiece Tube ■ 10x Eyepiece ■ XY Stage ■ Two Color Cameras ■ Inspection PC/19-inch Monitor/MEMS Inspection Software, etc. *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices

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Basic Analysis Methods for Things that are Similar Yet Different

Basic Analysis Methods for Things that are Similar Yet Different

Introducing the flow from optical microscope observation with a wide range of applications to SEM observation and EDX elemental analysis!

We will introduce the flow from basic and widely applicable optical microscope observation to SEM observation and EDX elemental analysis. Observation using an optical microscope is one of the fundamental observation techniques, allowing for quick examination of general shapes and other features. Its advantage lies in the ability to obtain color information, making it effective for observing abnormalities associated with corrosion and other changes. In this document, we also provide detailed explanations of "observation using SEM" and "elemental analysis using EDX" with the help of photos and graphs. We encourage you to read it. [Contents] ■ Observation using an optical microscope ■ Observation using SEM ■ Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

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[Information] Differentiating Between Optical Microscopes and SEM

[Information] Differentiating Between Optical Microscopes and SEM

Comparing optical microscopes and SEM with the same sample! I will explain the advantages and disadvantages.

Optical microscopes and SEM (scanning electron microscopes) are commonly used for sample observation, but each has its own characteristics, so it is important to choose the appropriate device according to the purpose. In this document, we compare optical microscopes and SEM using the same sample and introduce the generally mentioned advantages and disadvantages. Please take a moment to read it. 【Contents】 ■ Features of Optical Microscopes ・ Advantages / Disadvantages ・ Recommended for this type of observation ■ Features of SEM (Scanning Electron Microscope) ・ Advantages / Disadvantages ・ Recommended for this type of observation *For more details, please refer to the PDF document or feel free to contact us.

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Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM)

High magnification observation (up to about 300,000 times) is possible.

SEM is a technique that allows for obtaining contrast based on the information from electrons emitted from a sample when an electron beam is directed at it, revealing the sample's surface roughness and compositional differences. - High magnification observation (up to about 500,000 times) is possible with simple operation. - Observation of secondary electron (SE) images, backscattered electron (BSE) images, and transmitted electron (TE) images is possible. - Observation can be conducted within an acceleration voltage range of 0.1 to 30 kV. - Samples up to 6 inches can be loaded into the device (depending on the equipment). - By combining options with SEM, various types of information can be obtained: - Elemental analysis using an EDX detector is possible. - Measurement of electron beam induced current (EBIC) allows for evaluation of the junction position and shape in semiconductors. - Crystal information can be obtained using electron backscatter diffraction (EBSD) method. - Three-dimensional structural information can be acquired through repeated FIB processing and SEM observation (Slice & View). - Cooling observation and atmosphere-controlled observation are available.

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Atomic Force Microscopy (AFM) method

Atomic Force Microscopy (AFM) method

Three-dimensional measurement of nanoscale surface roughness.

AFM is a method that scans the surface of a sample with a fine probe and measures nanoscale surface topography in three dimensions. - It can measure a wide range of samples, from insulators to soft organic materials, including metals, semiconductors, and oxides. - By using tapping mode with low contact pressure, it is possible to minimize sample damage.

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[SSRM] Scanning Spreading Resistance Microscopy

[SSRM] Scanning Spreading Resistance Microscopy

Local resistance measurement at the nanometer level is possible.

SSRM is a method that visualizes the spreading resistance directly beneath the probe by scanning the surface of a sample with applied bias using a conductive probe and measuring the distribution of resistance values in two dimensions. When measuring silicon semiconductor devices, it is sensitive to carrier concentrations of 10^16 cm^-3 or higher, depending on spatial resolution. - Local resistance measurement at the nanometer level is possible - Effective for measuring the dopant concentration distribution in semiconductors - Cannot determine the polarity of semiconductors (p-type/n-type) - Quantitative evaluation is not possible

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[Analysis Case] Observation of the Buffer Layer Interface in CIGS Thin-Film Solar Cells

[Analysis Case] Observation of the Buffer Layer Interface in CIGS Thin-Film Solar Cells

Crystal structure evaluation of the Zn(S, O, OH)/CIGS junction interface using ultra-high resolution STEM.

By directly observing the junction interface using a Cs collector-equipped STEM device, it is possible to evaluate the crystal structure at the atomic level. In this study, we conducted HAADF-STEM imaging of the buffer layer/CIGS interface using Zn(S, O, OH) in the buffer layer of CIGS thin-film solar cells and evaluated the structure. As a result, it was suggested that the crystal structure at the junction is unclear compared to samples using CdS as the buffer layer, indicating that it is not an epitaxial junction.

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