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microscope - メーカー・企業177社の製品一覧とランキング

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microscopeのメーカー・企業ランキング

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  1. スリーアールソリューション Fukuoka//Trading company/Wholesale
  2. null/null
  3. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  4. 4 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  5. 5 アイテス Shiga//Electronic Components and Semiconductors
企業ランキングへ

microscopeの製品ランキング

更新日： 集計期間:Nov 19, 2025～Dec 16, 2025
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  1. Portable Microscope "Magic Loupe R" / 15x Magnification, Photo and Save Capability スリーアールソリューション
  2. White interference microscope equipped with laser 'VK-X4000 series'
  3. White interference microscope equipped with laser microscope 'VK-X3000'
  4. 4 All-in-one fluorescence microscope 'BZ-X1000 Series'
  5. 5 All-in-one fluorescence microscope 'BZ-X800'

microscopeの製品一覧

451～465 件を表示 ／ 全 663 件

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FT-IR imaging microscope "LUMOS II"

FT-IR imaging microscope "LUMOS II"

It is possible to conduct a chemical evaluation of non-uniform samples easily and accurately.

"LUMOS II" makes it possible to conduct micro-infrared spectroscopy and imaging analysis more easily, quickly, and comfortably. It demonstrates high performance in all measurement modes: transmission, reflection, and ATR (attenuated total reflectance). One of its features is the ease of access provided by the long working distance objective lens, along with an automated sample stage where all operations are electric. 【Features】 ■ Outstanding imaging performance with advanced FPA ■ High-quality spectral and image data ■ High-speed imaging and mapping capabilities: covering large areas in a short time ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF document or feel free to contact us.

  • Optical microscope

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FT-IR imaging microscope "LUMOS II"

FT-IR imaging microscope "LUMOS II"

Are you having trouble with micro-particle analysis? 'LUMOS II' will solve it!

Are you having trouble with micro-sample analysis? - Can't prepare liquid nitrogen, it's a hassle The 'LUMOS II' features an electronic cooling MCT detector that does not require liquid nitrogen. - I want a micro-IR that is easy to use even for beginners The 'LUMOS II' offers fully automated operation, making it accessible for beginners. Additionally... - Is there a micro-IR with better image quality? - I would like to try high-speed imaging functions, etc. The 'LUMOS II' makes micro-infrared spectroscopy and imaging analysis easier, faster, and more comfortable. With a long working distance objective lens for easy access, it also features an automated sample stage where all operations are motorized. **Features** - Achieves high-sensitivity measurements without liquid nitrogen - Outstanding imaging performance with advanced FPA - High-quality spectral and image data - High-speed imaging and mapping functions: covers large areas in a short time - FTIR imaging that supports transmission, reflection, and ATR measurement modes

  • Optical microscope

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【NEW!!】FT-IR Imaging Microscope 'LUMOS II'

【NEW!!】FT-IR Imaging Microscope 'LUMOS II'

【Equipped with high-speed imaging and high-speed mapping capabilities】FTIR imaging is now faster, more comfortable, and more accurate than ever!

"LUMOS II" is a high-speed imaging compatible FPA detector. With a guide function that can be used by anyone, from beginners to advanced users, regardless of their analytical skill level, it allows all users to utilize it quickly, comfortably, and accurately. Additionally, imaging can be performed in all measurement modes, enabling easy and accurate chemical evaluation of heterogeneous samples such as tablets, polymer materials, and the dispersion state of contaminants. 【Features】 ■ High-speed imaging and high-speed mapping function: covers wide areas in a short time ■ Excellent imaging performance with advanced FPA ■ High-quality spectral and image data ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF materials or feel free to contact us.

  • Optical microscope

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Technical Data: Microplastic Analysis Solution

Technical Data: Microplastic Analysis Solution

Providing a new analysis method based on high-speed imaging and machine learning!

Bruker Japan can provide spectroscopic analysis solutions specialized in microplastics due to many years of experience. Our FT-IR and Raman microscopes are used daily by leading microplastic scientists around the world. This document clearly explains: ▶ The effectiveness of micro-infrared and Raman spectroscopy ▶ Why Bruker products are suitable for microplastic analysis *For more details, please refer to the PDF document or feel free to contact us. ◆Exhibiting at JASIS2023◆ Please check the basic information below for details about the exhibition.

  • Other environmental analysis equipment

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Technical Data: Infrared Emission Spectroscopy Measurement of Microscopic Samples

Technical Data: Infrared Emission Spectroscopy Measurement of Microscopic Samples

Micro-infrared emission spectroscopic measurements utilizing spatial resolution are possible! Introducing solutions using infrared microscopy.

Analyzing the infrared emission spectrum of materials provides important insights in many research fields. In particular, measurements of emission spectra using FT-IR allow for simultaneous analysis across a wide range of wavenumbers, addressing both thermal radiation associated with the sample's heat and radiation resulting from quantum mechanisms. When the sample is large and emits strong infrared radiation, measuring the emission spectrum is relatively straightforward; however, in the case of small samples that are less than 1mm, detecting the emitted infrared light becomes challenging. This document introduces solutions using Bruker's unique infrared microscope to overcome these hurdles. [Contents] ■ Introduction ■ Measurement Examples ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Data DL available: AFM Case Studies in Scanning Probe Microscopy

Data DL available: AFM Case Studies in Scanning Probe Microscopy

We will introduce numerous analysis cases using AFM scanning probe microscopy, such as structural analysis, elastic modulus measurement, and conductivity measurement.

In this case study collection, we will introduce analysis examples using "AFM: Scanning Probe Microscopy." [Contents] ● Method and results of "Structural analysis and elastic modulus measurement of food (somen)" ● Features and analysis examples of "Conductive measurements of AFM in a vacuum" ● Features and analysis examples of "Conductivity evaluation of material surfaces using AFM" ● "AFM observation of polymer materials (smoothing by microtome)" We conduct various analyses using AFM, which is one of our strengths. We hope you will take a look. There are many other examples not included here. *For more details, please refer to our other PDF materials or feel free to contact us.

  • Other microscopes
  • Contract Analysis
  • Surface treatment contract service

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Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

We will introduce various cases of micro-section machining and analysis, residual stress measurement, and more using ion milling, FE-SEM, EBSD, etc. The materials are available for download.

In this case study collection, we will introduce examples related to "cross-sectional observation and structural analysis." Starting with the analysis case of "Evaluation of aluminum sputter films using EBSD," we also include numerous examples such as the purpose, methods, samples, and results of "Cross-sectional processing of micro areas by ion milling," and the purpose, methods, and results of "Residual stress measurement of solder cross-sections." Additionally, we present orientation evaluations, cross-sectional observation results, and measurements. We encourage you to read through it. 【Contents】 ■ Evaluation of aluminum sputter films using EBSD ■ Cross-sectional processing of micro areas by ion milling ■ Residual stress measurement of solder cross-sections ■ Residual stress measurement of wire ■ Cooling (cryo) ion milling cross-sectional processing *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Other polymer materials
  • Other metal materials

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[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

High-resolution observation of soft polymer materials is possible with a cryo-microtome and AFM.

AFM scanning probe microscopy is a device that detects various physical interactions occurring between a probe and the sample surface, allowing for the observation of surface morphology in small areas and the measurement of electrical and mechanical properties. These physical interactions include atomic force, frictional force, and electrostatic force. It can perform measurements in various environments, including atmospheric and vacuum conditions, and is capable of observing sample surfaces regardless of whether they are conductive or insulating. Additionally, by using a cryo-microtome, it is possible to produce ultra-thin sections of soft polymer materials such as resins under frozen conditions. We are observing polyisoprene rubber from various angles using this AFM and cryo-microtome. Please take a moment to read the PDF materials. This technology can be applied not only to rubber but also to resins, plastics, and various polymer materials. Furthermore, our company conducts various surface analyses, including XPS, AES, and GD-OES, in addition to this analytical device. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

  • Other polymer materials
  • Contract Analysis
  • Rubber

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Freeze-Dry Microscope System FD-301 Series

Freeze-Dry Microscope System FD-301 Series

We will determine the maximum allowable product temperature (critical temperature) in the freeze-drying process of formulations and food products to improve the efficiency of the production process.

Freeze-drying technology, which has many advantages such as long-term preservation, is becoming increasingly important in the manufacturing of pharmaceuticals and food products. Freeze-drying requires expensive equipment and long processing times, so to improve the efficiency of the freeze-drying process, it is considered effective to raise the temperature of the frozen product to shorten the sublimation time. However, exceeding the critical temperature can lead to the collapse of the physical structure, resulting in incomplete drying and degradation of the product, such as a decrease in solubility. Therefore, it is necessary to determine the collapse temperature (Tc) and eutectic melting temperature (Teu) to establish the maximum allowable product temperature (critical temperature). The freeze-drying microscopy system is a device that can quickly determine the collapse temperature (Tc) and eutectic melting temperature (Teu) using small samples.

  • Analytical Equipment and Devices
  • Other microscopes
  • Other physicochemical equipment

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3D Measurement Laser Microscope 'LEXT OLS5500'

3D Measurement Laser Microscope 'LEXT OLS5500'

Bringing surface analysis to a new dimension. Analyzing various surfaces with trusted measurement technology.

The "LEXT OLS5500" is a 3D measurement laser microscope equipped with a white light interferometer. With high-precision measurement capabilities of laser scanning microscopy (LSM), white light interferometry (WLI), and focus variation microscopy (FVM), along with smart automation features and intuitive operability, it can be confidently used for various applications. Please feel free to contact us when you need assistance. 【Features】 ■ A seamless 3-in-1 solution that accommodates measurements from nm to mm with a single device ■ High optical performance due to in-house developed and designed optics ■ Visualization of invisible structures, from fine details to transparent objects ■ Guaranteed measurement accuracy under measurement conditions ■ Noise guarantee for height measurements using both LSM and WLI *For more details, please download the PDF or feel free to contact us.

  • 3D測定レーザー顕微鏡『LEXT OLS5500』2.png
  • 3D測定レーザー顕微鏡『LEXT OLS5500』3.png
  • 3D測定レーザー顕微鏡『LEXT OLS5500』4.png
  • 3D測定レーザー顕微鏡『LEXT OLS5500』5.png
  • Laser microscope
  • Other microscopes and optical inspection equipment

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Material and Defect Analysis: Confocal Microscope

Material and Defect Analysis: Confocal Microscope

A measuring microscope with high resolution! It is used for surface roughness measurement and shape measurement/comparison.

At Mitsuba Environmental Solutions, we conduct "confocal microscope measurements" using a confocal microscope. The laser microscope "OPTELICS HYBRID" manufactured by Lasertec can obtain high-resolution images with a sharp focus across the entire field of view on samples with uneven surfaces. It enables non-destructive, non-contact three-dimensional shape measurement. High magnification and high-resolution observation with a 405nm laser beam allows for clear visualization of ultra-fine structures. 【Measurement Range】 ■ Width Measurement - Minimum measurement unit: 0.001μm, measurement reproducibility: 3σ < 10nm ■ Height Measurement - Scale resolution: 0.4nm, measurement reproducibility: σ < 10nm, measurement range: 7mm *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis

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Meridian Trade TouchScope

Meridian Trade TouchScope

The "Touch Scope" is a revolutionary biological microscope system that allows direct contact between the lens tip and the object being observed.

Due to a special lighting method, the conical lens surface at the tip itself emits light, allowing for the normally dark lens contact surface to be observed very brightly and clearly at high magnification.

  • Other microscopes

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