We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for microscope.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

microscope Product List and Ranking from 41 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. フローベル Kanagawa//Optical Instruments
  3. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  4. 4 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  5. 5 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
Go to Company Ranking

microscope Product ranking

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

  1. White interference microscope equipped with laser microscope 'VK-X3000'
  2. All-in-one fluorescence microscope 'BZ-X1000 Series'
  3. Bilateral Microscope System "TOMOS Series" フローベル
  4. 4 All-in-one fluorescence microscope 'BZ-X800'
  5. 5 All-in-one fluorescence microscope BZ-X series

microscope Product List

451～465 item / All 657 items

Displayed results
Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

We will introduce various cases of micro-section machining and analysis, residual stress measurement, and more using ion milling, FE-SEM, EBSD, etc. The materials are available for download.

In this case study collection, we will introduce examples related to "cross-sectional observation and structural analysis." Starting with the analysis case of "Evaluation of aluminum sputter films using EBSD," we also include numerous examples such as the purpose, methods, samples, and results of "Cross-sectional processing of micro areas by ion milling," and the purpose, methods, and results of "Residual stress measurement of solder cross-sections." Additionally, we present orientation evaluations, cross-sectional observation results, and measurements. We encourage you to read through it. 【Contents】 ■ Evaluation of aluminum sputter films using EBSD ■ Cross-sectional processing of micro areas by ion milling ■ Residual stress measurement of solder cross-sections ■ Residual stress measurement of wire ■ Cooling (cryo) ion milling cross-sectional processing *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Other polymer materials
  • Other metal materials

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

High-resolution observation of soft polymer materials is possible with a cryo-microtome and AFM.

AFM scanning probe microscopy is a device that detects various physical interactions occurring between a probe and the sample surface, allowing for the observation of surface morphology in small areas and the measurement of electrical and mechanical properties. These physical interactions include atomic force, frictional force, and electrostatic force. It can perform measurements in various environments, including atmospheric and vacuum conditions, and is capable of observing sample surfaces regardless of whether they are conductive or insulating. Additionally, by using a cryo-microtome, it is possible to produce ultra-thin sections of soft polymer materials such as resins under frozen conditions. We are observing polyisoprene rubber from various angles using this AFM and cryo-microtome. Please take a moment to read the PDF materials. This technology can be applied not only to rubber but also to resins, plastics, and various polymer materials. Furthermore, our company conducts various surface analyses, including XPS, AES, and GD-OES, in addition to this analytical device. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

  • Other polymer materials
  • Contract Analysis
  • Rubber

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Freeze-Dry Microscope System FD-301 Series

Freeze-Dry Microscope System FD-301 Series

We will determine the maximum allowable product temperature (critical temperature) in the freeze-drying process of formulations and food products to improve the efficiency of the production process.

Freeze-drying technology, which has many advantages such as long-term preservation, is becoming increasingly important in the manufacturing of pharmaceuticals and food products. Freeze-drying requires expensive equipment and long processing times, so to improve the efficiency of the freeze-drying process, it is considered effective to raise the temperature of the frozen product to shorten the sublimation time. However, exceeding the critical temperature can lead to the collapse of the physical structure, resulting in incomplete drying and degradation of the product, such as a decrease in solubility. Therefore, it is necessary to determine the collapse temperature (Tc) and eutectic melting temperature (Teu) to establish the maximum allowable product temperature (critical temperature). The freeze-drying microscopy system is a device that can quickly determine the collapse temperature (Tc) and eutectic melting temperature (Teu) using small samples.

  • Analytical Equipment and Devices
  • Other microscopes
  • Other physicochemical equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Material and Defect Analysis: Confocal Microscope

Material and Defect Analysis: Confocal Microscope

A measuring microscope with high resolution! It is used for surface roughness measurement and shape measurement/comparison.

At Mitsuba Environmental Solutions, we conduct "confocal microscope measurements" using a confocal microscope. The laser microscope "OPTELICS HYBRID" manufactured by Lasertec can obtain high-resolution images with a sharp focus across the entire field of view on samples with uneven surfaces. It enables non-destructive, non-contact three-dimensional shape measurement. High magnification and high-resolution observation with a 405nm laser beam allows for clear visualization of ultra-fine structures. 【Measurement Range】 ■ Width Measurement - Minimum measurement unit: 0.001μm, measurement reproducibility: 3σ < 10nm ■ Height Measurement - Scale resolution: 0.4nm, measurement reproducibility: σ < 10nm, measurement range: 7mm *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Meridian Trade TouchScope

Meridian Trade TouchScope

The "Touch Scope" is a revolutionary biological microscope system that allows direct contact between the lens tip and the object being observed.

Due to a special lighting method, the conical lens surface at the tip itself emits light, allowing for the normally dark lens contact surface to be observed very brightly and clearly at high magnification.

  • Other microscopes

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Observation of the cutting edge surface of single crystal diamond chips.

Observation of the cutting edge surface of single crystal diamond chips.

Scanning Electron Microscope (SEM) ■Industry: Automotive (Prototype) / Semiconductor / Robotics

The cutting edge surface of single crystal diamond chips was observed using a scanning electron microscope (SEM). The cutting edge surface of PCD (polycrystalline diamond) was also observed and compared. The differences in the fine surface roughness were clearly confirmed. How this difference affects the machining process is yet to be determined. *For more details, please refer to the PDF document or feel free to contact us.*

  • Other machine elements
  • Processing Contract

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
High-precision ultrasonic microscope "Gen6"

High-precision ultrasonic microscope "Gen6"

Supports analysis that makes it difficult to separate interface waveforms of each layer! Also compatible with multilingual display.

The "Gen6" is a high-precision ultrasonic microscope that can detect even weak signal waveform changes within the gate with higher sensitivity and is capable of imaging. It can simultaneously scan multiple depths and can measure up to 100 gates. Furthermore, with the inclusion of the "SonoSimulator," it supports the analysis of stack dies and thin-film multilayer samples, where it is difficult to separate the interface waveforms of each layer. 【Features】 ■ High-speed sampling rate ■ Water recirculation system ■ Equipped with PolyGate function ■ Standard scan and reference included ■ Compatible with Windows 7 (64bit) Company Name: Japan Burns Co., Ltd. *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
  • Other inspection equipment and devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Measuring Microscope LTM-150D

Measuring Microscope LTM-150D

Leave everything from product purchase to calibration, repair, and retrofit to us.

It is a measuring microscope with a tiltable column. "Tilt angle" ±12°

  • Distance measuring device

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Universal Measuring Microscope

Universal Measuring Microscope

Leave everything from product purchase to calibration, repair, and retrofit to us.

It is a versatile measuring microscope with a tiltable column. {Column tilt angle} ±15°

  • Distance measuring device

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Sienta Omicron Scanning Probe Microscope

Sienta Omicron Scanning Probe Microscope

We offer a wide variety of microscopes tailored to meet our customers' needs.

When selecting an Omicron microscope, please consider "temperature" and "function." "Temperature" refers to the temperature of the sample being observed. You need to determine whether the sample temperature can be at room temperature, or if it needs to be cooled or heated. Depending on these requirements, the microscopes come equipped with different basic options. "Function" refers to whether you only need a Scanning Tunneling Microscope (STM) or if you need to include an Atomic Force Microscope (AFM). This functionality cannot be upgraded (modified or altered) after delivery; you will have to maintain the initial functionality. While we offer a wide range of options, please note that we do not provide options that change the basic performance. For more details, please contact us or refer to the catalog.

  • Other microscopes

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
VT-STM/AFM (Variable Temperature Scanning Tunneling Microscope)

VT-STM/AFM (Variable Temperature Scanning Tunneling Microscope)

This is an introduction to a scanning tunneling microscope equipped with a cooling and heating system.

VT-STM/AFM (Variable Temperature Scanning Tunneling Microscope) refers to a scanning tunneling microscope equipped with a cooling and heating system. It enables STM measurements across a wide temperature range from low to high temperatures, making it suitable for STM observation and measurement in the nano domain (from low to high temperatures). *For more details, please contact us or download the PDF document.*

  • Other microscopes
  • Analytical Equipment and Devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
ARCTIC SPM Lab

ARCTIC SPM Lab

New type low-temperature scanning probe microscope

Redefining Low-Temperature SPM: A Closed-Cycle System Equipped with High Magnetic Field and Optical System Experience a new type of low-temperature scanning probe microscope with precision, efficiency, and adaptability. The ARCTIC SPM Lab features continuous operation, a compact footprint, and modular expandability to meet evolving research needs. Closed-cycle cooling technology enables a sustainable and cost-effective approach, eliminating dependence on helium. The SPM maintains excellent mechanical stability while providing virtually unlimited measurement time.

  • Other microscopes

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Search Keywords Related to microscope

COPYRIGHT © 2001-2025 IPROS CORPORATION ALL RIGHTS RESERVED.