microscope Product List and Ranking from 41 Manufacturers, Suppliers and Companies

[Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA

Quantifying texture with mechanical property parameters.

Factors that determine texture include various elements such as hardness and adhesion. Generally, the texture of food is evaluated through stress assessment using tools like texture analyzers, but measuring in micro-regions or thin samples is challenging. AFM-MA can measure not only the shape of surface roughness but also the Young's modulus representing mechanical properties like hardness, adhesion parameters related to texture, and energy dissipation data in micro-regions. Therefore, it is effective for evaluating physical properties related to texture and similar characteristics in extremely small areas.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract measurement

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[Analysis Case] Extraction of Active Material from Battery Cathode Material and Data Analysis

We determined the particle size of active substances from SEM images using deep learning and data analysis.

Deep learning enables the extraction of target objects from images. Additionally, by analyzing the regions corresponding to the obtained targets, information can be obtained in numerical form. In this instance, we used deep learning to extract active material particles and detect cracks in cross-sectional SEM images of battery cathode materials. Extraction is also possible for 3D data, such as Slice&View data. We extracted particles with and without cracks from the 3D data and calculated their respective particle sizes. Measurement methods: SEM, Slice&View, computational science, AI, data analysis Product fields: Solar cells, secondary batteries, fuel cells Analysis purposes: Structural evaluation, shape evaluation, failure analysis, defect analysis For more details, please download the materials or contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement

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[Analysis Case] Surface Shape Analysis of GaN Substrates

Visualization of step-terrace structures by AFM.

Gallium nitride (GaN), a wide bandgap semiconductor, is used in a wide range of fields such as power devices and communication/optical devices. When fabricating devices, the shape and roughness of the wafer surface significantly impact device performance. During the growth of GaN wafers, a step-terrace structure is formed on the surface due to stress effects from lattice mismatch with the supporting substrate. This document introduces a case where the step-terrace structure of the GaN substrate surface was visualized using AFM, and the terrace width, step height, surface roughness, and off-angle were evaluated. Measurement method: AFM Product fields: Power devices, electronic components, lighting Analysis purpose: Shape evaluation, structural evaluation For more details, please download the document or contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[Analysis Case] Composition Analysis of Particles on a Wafer

Shape observation and simple quantitative analysis using SEM-EDX.

Control of particles in the semiconductor wafer manufacturing process is extremely important for ensuring wafer quality. In this case study, we estimated what the particles were on a Si wafer through SEM observation, EDX analysis, and simple quantification. The SEM equipment, which has high spatial resolution in the submicron range and can scan areas of several centimeters, allows for rapid inference of what the particles on the wafer are based on shape and composition information, enabling quick identification of the generation process. Analysis linked to coordinate data from defect inspection equipment is also possible.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Inspection
Wafer
Other semiconductor manufacturing equipment

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[Analysis Case] Composite Analysis of Specific Areas within Electronic Devices (C0572)

Non-destructive assessment of specific areas inside the device! Evaluation of detailed structure and composition information of specific areas through cross-sectional observation.

Our company offers technologies suitable for structural evaluation of electronic devices, and we propose analytical methods tailored to the observation field and objectives. In a case where we investigated specific areas of a device using X-ray CT and FIB-SEM, we first used X-ray CT to observe the internal structure of the entire sample and identify specific areas. Next, we used FIB-SEM to confirm the detailed structure of the specific structures identified on the vias. 【Measurement and Processing Methods】 ■[SEM] Scanning Electron Microscopy ■[SEM-EDX] Energy Dispersive X-ray Spectroscopy (SEM) ■X-ray CT Method ■[FIB] Focused Ion Beam Processing *For more details, please download the PDF or feel free to contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[Analysis Case] SEM Observation of Wide-Area Cross-Section Using Xe-PFIB

Observation of cross-sections with an accuracy of several tens of nanometers and a size of several hundred micrometers is possible!

We offer wide-area cross-sectional SEM observation (C0610) using Xe-PFIB. The metal bonding that electrically connects the electrodes of integrated circuits, electrodes, printed circuit boards, and semiconductor packages has a diameter of several tens of μm to several hundred μm. With Xe-PFIB (Xe-Plasma Focused Ion Beam), we can target processing positions on the order of several tens of nm and create cross-sections of several hundred μm square, allowing for a detailed understanding of the entire view at the center of the bonding. 【Measurement and Processing Methods】 ■ [SEM] Scanning Electron Microscopy ■ X-ray CT Method ■ [FIB] Focused Ion Beam Processing *For more details, please download the PDF or feel free to contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[Analysis Case] Evaluation of Mechanical Properties of Hair Cross-Sections Prepared by Microtome Method

It is possible to evaluate the elastic modulus of the internal structure of soft materials.

When evaluating the internal structure of materials, it is necessary to expose the internal structure while maintaining it through cross-sectional processing techniques such as cutting and polishing. This document introduces a case where the microtome method, which has a relatively small impact from processing damage, was used to create cross-sections of hair, followed by AFM observation of the internal structure and evaluation of elastic modulus. The microtome method is a cutting processing technique widely used in the field of soft materials, such as rubber materials and biological samples, and this approach has made it possible to evaluate the mechanical properties of the internal structure of these materials. [Measurement and Processing Methods] [AFM] Atomic Force Microscopy [AFM-MA・AFM-DMA] Mechanical Property Evaluation (Elastic Modulus Measurement, Dynamic Viscoelasticity Measurement) Ultra Microtome Processing *For more details, please download the PDF or feel free to contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract measurement
Contract Analysis

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[Analysis Case] (S)TEM Observation of Polymer Materials Using Electronic Staining

We will introduce examples of observing polymer materials using SEM-STEM and (S)TEM!

Our organization offers (S)TEM observation of polymer materials using electron staining. Since polymer materials are composed of light elements, it is difficult to obtain clear contrast in (S)TEM observations. Staining can enhance the contrast for such materials. This document introduces examples of staining and observation using a method called electron staining with ruthenium tetroxide (RuO4), osmium tetroxide (OsO4), and phosphotungstic acid (H3[P(W3O10)4]·xH2O, abbreviated as PTA). [Measurement and Processing Methods] ■ [(S)TEM] (Scanning) Transmission Electron Microscopy ■ Others *For more details, please download the PDF or feel free to contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[Analysis Case] Fine Structure of Hair Cross-Section (S)TEM Analysis

We will introduce examples of observations of hair cell membrane complexes (CMC)!

Our organization offers (S)TEM analysis of the fine structure of hair cross-sections. The hair cell membrane complex (CMC) serves as a pathway for chemicals during processes such as bleaching and dyeing hair. In particular, the CMC between the cuticle layers has a three-layer structure, which we have visualized. We present a case where osmium tetroxide (OsO4) was used for electron staining targeting unsaturated fatty acids in lipids, followed by TEM observation and STEM-EDX analysis. [Measurement and Processing Methods] ■ [(S)TEM] Scanning Transmission Electron Microscopy ■ [TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM) ■ Ultramicrotome processing ■ Others *For more details, please download the PDF or feel free to contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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FT-IR imaging microscope "LUMOS II"

It is possible to conduct a chemical evaluation of non-uniform samples easily and accurately.

"LUMOS II" makes it possible to conduct micro-infrared spectroscopy and imaging analysis more easily, quickly, and comfortably. It demonstrates high performance in all measurement modes: transmission, reflection, and ATR (attenuated total reflectance). One of its features is the ease of access provided by the long working distance objective lens, along with an automated sample stage where all operations are electric. 【Features】 ■ Outstanding imaging performance with advanced FPA ■ High-quality spectral and image data ■ High-speed imaging and mapping capabilities: covering large areas in a short time ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF document or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
Price：Other

Optical microscope

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FT-IR imaging microscope "LUMOS II"

Are you having trouble with micro-particle analysis? 'LUMOS II' will solve it!

Are you having trouble with micro-sample analysis? - Can't prepare liquid nitrogen, it's a hassle The 'LUMOS II' features an electronic cooling MCT detector that does not require liquid nitrogen. - I want a micro-IR that is easy to use even for beginners The 'LUMOS II' offers fully automated operation, making it accessible for beginners. Additionally... - Is there a micro-IR with better image quality? - I would like to try high-speed imaging functions, etc. The 'LUMOS II' makes micro-infrared spectroscopy and imaging analysis easier, faster, and more comfortable. With a long working distance objective lens for easy access, it also features an automated sample stage where all operations are motorized. **Features** - Achieves high-sensitivity measurements without liquid nitrogen - Outstanding imaging performance with advanced FPA - High-quality spectral and image data - High-speed imaging and mapping functions: covers large areas in a short time - FTIR imaging that supports transmission, reflection, and ATR measurement modes

Company：ブルカージャパンオプティクス事業部
Price：Other

Optical microscope

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【NEW!!】FT-IR Imaging Microscope 'LUMOS II'

【Equipped with high-speed imaging and high-speed mapping capabilities】FTIR imaging is now faster, more comfortable, and more accurate than ever!

"LUMOS II" is a high-speed imaging compatible FPA detector. With a guide function that can be used by anyone, from beginners to advanced users, regardless of their analytical skill level, it allows all users to utilize it quickly, comfortably, and accurately. Additionally, imaging can be performed in all measurement modes, enabling easy and accurate chemical evaluation of heterogeneous samples such as tablets, polymer materials, and the dispersion state of contaminants. 【Features】 ■ High-speed imaging and high-speed mapping function: covers wide areas in a short time ■ Excellent imaging performance with advanced FPA ■ High-quality spectral and image data ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF materials or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
Price：Other

Optical microscope

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Technical Data: Microplastic Analysis Solution

Providing a new analysis method based on high-speed imaging and machine learning!

Bruker Japan can provide spectroscopic analysis solutions specialized in microplastics due to many years of experience. Our FT-IR and Raman microscopes are used daily by leading microplastic scientists around the world. This document clearly explains: ▶ The effectiveness of micro-infrared and Raman spectroscopy ▶ Why Bruker products are suitable for microplastic analysis *For more details, please refer to the PDF document or feel free to contact us. ◆Exhibiting at JASIS2023◆ Please check the basic information below for details about the exhibition.

Company：ブルカージャパンオプティクス事業部
Price：Other

Other environmental analysis equipment

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Technical Data: Infrared Emission Spectroscopy Measurement of Microscopic Samples

Micro-infrared emission spectroscopic measurements utilizing spatial resolution are possible! Introducing solutions using infrared microscopy.

Analyzing the infrared emission spectrum of materials provides important insights in many research fields. In particular, measurements of emission spectra using FT-IR allow for simultaneous analysis across a wide range of wavenumbers, addressing both thermal radiation associated with the sample's heat and radiation resulting from quantum mechanisms. When the sample is large and emits strong infrared radiation, measuring the emission spectrum is relatively straightforward; however, in the case of small samples that are less than 1mm, detecting the emitted infrared light becomes challenging. This document introduces solutions using Bruker's unique infrared microscope to overcome these hurdles. [Contents] ■ Introduction ■ Measurement Examples ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
Price：Other

Other measurement, recording and measuring instruments

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Data DL available: AFM Case Studies in Scanning Probe Microscopy

We will introduce numerous analysis cases using AFM scanning probe microscopy, such as structural analysis, elastic modulus measurement, and conductivity measurement.

In this case study collection, we will introduce analysis examples using "AFM: Scanning Probe Microscopy." [Contents] ● Method and results of "Structural analysis and elastic modulus measurement of food (somen)" ● Features and analysis examples of "Conductive measurements of AFM in a vacuum" ● Features and analysis examples of "Conductivity evaluation of material surfaces using AFM" ● "AFM observation of polymer materials (smoothing by microtome)" We conduct various analyses using AFM, which is one of our strengths. We hope you will take a look. There are many other examples not included here. *For more details, please refer to our other PDF materials or feel free to contact us.

Company：セイコーフューチャークリエーション
Price：Other

Other microscopes
Contract Analysis
Surface treatment contract service

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microscope Product List and Ranking from 41 Manufacturers, Suppliers and Companies

microscope Manufacturer, Suppliers and Company Rankings

microscope Product ranking