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probe Product List and Ranking from 155 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Oct 01, 2025~Oct 28, 2025
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Oct 01, 2025~Oct 28, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 日本オートマティック・コントロール 電子システム部 Tokyo//Industrial Electrical Equipment
  3. TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
  4. 4 精研 本社 Tokyo//Electronic Components and Semiconductors
  5. 5 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement

probe Product ranking

Last Updated: Aggregation Period:Oct 01, 2025~Oct 28, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. AC Current Probe "CWT Mini50HF" 日本オートマティック・コントロール 電子システム部
  3. Connection terminal TA series サンケイエンジニアリング 本社
  4. 4 Flexible wire サンケイエンジニアリング 本社
  5. 5 Examples of probes for electromagnetic and eddy current thickness gauges.

probe Product List

196~210 item / All 659 items

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LF-B 3 (H field magnetic field probe)

You can approach difficult-to-access printed circuit boards, etc., that are sandwiched between components from above!

The "LF-B 3 Magnetic Field Probe" is a passive near-field probe, with the internal coil arranged perpendicular to the shaft. When the probe head is used vertically against the assembly or device being measured, accurate measurements can be obtained. This product detects magnetic field lines radiating at a 90° angle from the object being measured and does not detect magnetic field lines entering from the side. Langer's near-field probes are compact and very easy to use, and they are electrically well-shielded by a current-damping sheath. 【Specifications】 ■ Type: Near-field Probe ■ Size: Φ4mm Probe Head ■ Frequency Range: 100kHz to 50MHz ■ Connector: SMB male, Jack ■ Resolution: 2mm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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LF-K 7 (H field magnetic field probe)

Half-circular magnetic field lines are generated along the edges of linear, rod-shaped components, cable connectors, and flat structural parts.

The "LF-K 7 Magnetic Field Probe" is a passive near-field probe that detects semicircular magnetic field lines using two coils. The probe functions like a coupling clamp. Unlike the "LF-U 5" probe, it does not detect magnetic field lines entering from the side. The magnetic field enters through the first coil, curves in a circular shape within the probe head, and detects the uneven magnetic field exiting through the second coil. It does not detect overlapping uniform magnetic fields. 【Specifications】 ■ Type: Near-field probe ■ Size: 6×10mm probe head ■ Frequency range: 100kHz to 50MHz ■ Connector: SMB male, Jack ■ Resolution: 5mm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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CM-SHP Custom Probe

Langer Corporation also manufactures special-shaped near-field probes according to customer requirements!

At Teess Japan Co., Ltd., we handle the "CM-SHP Custom Probe." Langer manufactures special-shaped near-field probes according to customer requirements. Please feel free to contact us when you need assistance. 【Specifications】 ■ Type: Near-field Probe *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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OCT probe

A wide variety of probes are available, including handheld types and microscope types!

We offer "probes" that can be used as custom options for the SS-OCT system and OEM products. We have a variety of probes in our lineup, including the "handheld type," which is used by pressing it against the sample, and the "microscope type," which allows for measurements while confirming the measurement position. 【Features】 ■ Handheld Type - Measures by pressing against the sample held in hand - Distance to the measurement object can be changed with attachments, enabling 3D measurements ■ Microscope Type - High-precision sample positioning using an XYZ stage - Allows for measurements while confirming the measurement position *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Rental of diver-held cathodic protection probes

Start measuring immediately with one button!

Active in the investigation of underwater structures such as bridge pillars! Useful for regular inspections of sacrificial anodes that protect the base material. *For more details, please refer to the catalog available for download below under "PDF Download." You can also request a quote through "Contact Us." Feel free to reach out.

  • probe
  • Rental/lease

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Nano probe for SEM-FIB, micro probe for optical microscope

The self-driving nano-probe robot 'miBot', which is different from conventional manipulators!

This innovative nano-probing system can control up to eight miBot nano-probers and can be offered with various configurations and options. Customization is possible to meet application-specific requirements and installation conditions for the equipment. The compact and lightweight platform for miBot can be adapted to various electron microscopes and can be mounted on sample stages such as SEM or introduced into the sample chamber via a load lock. It also supports high-resolution imaging using semi-in-lens objective lenses, enabling nano-probing tests under high-resolution imaging at low acceleration voltages below 0.5 kV using the new FE-SEM. Additionally, it is possible to tilt the entire nano-probing system using the tilt mechanism of the SEM sample stage. This allows for circuit modification with FIB and nano-probing to be performed in the same environment, resulting in faster and more accurate failure analysis results. *For more details, please refer to the PDF document or feel free to contact us.*

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  • probe

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IN271F 製薬工業のプロセス用FT-NIR透過反射プローブ

ブルカー社で開発した透過反射プローブによりスラリーやエマルジョンの測定が可能で、発酵/培養プロセスのモニタリングが可能です。

ブルカー社で開発した透過反射プローブによりスラリー、エマルジョン、乳製品、クリームの測定や、発酵槽中の反応モニタリングが可能です。お客様のご指定の各種フランジを溶接してご提供可能です。高温タイプもご提供可能です。

  • Other inspection equipment and devices

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Verification of power integrity for DDR memory

Perform low-noise measurements and provide an offset function that zooms in on the DC voltage.

Accurate ripple and noise measurements of power rails require a wideband oscilloscope and dedicated probes, providing an offset function to perform low-noise measurements and zoom in on DC voltage. The R&S RT-ZPR20 power rail probe, R&S RTE, and R&S RTO digital oscilloscopes are suitable tools for this measurement. [Challenges] ■ Direct impact on data transfer performance - Stability of the power distribution network reduces to just 60 mV (Vpp) for DDR4 memory - May decrease further in the future - Ripple and noise adversely affect clock and data jitter *For more details, please refer to the PDF document or feel free to contact us.*

  • Other measurement, recording and measuring instruments
  • oscilloscope
  • probe

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Spring Test Probe

Standard products have a minimum pitch of 0.15 mm and a minimum product length of 1 mm. We also accommodate requests for sizes and shapes other than standard products!

We have prepared spring test probes, backed by the precision machining technology that we have cultivated since our founding and the analytical capabilities accumulated through research and development, as standard products for each pitch size to meet our customers' needs. *We also accept requests for products other than standard items. 【Features】 ■ Long lifespan: 1 million cycles durability → stable resistance value ■ High load: 35gf @ 0.5mm (0.4mm pitch) ■ Low resistance: from 50mΩ ■ Other varieties: minimum diameter of 0.08mm, shortest length of 1.0mm ■ Various surface treatments *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF probe and calibration board [Wide frequency range, pitch, excellent durability!]

An RF probe and calibration board with a wide frequency range, pitch, and excellent durability!

Our company offers RF probes and calibration substrates with a wide frequency range, pitch, excellent durability, all at a low price. Thanks to our unique tip shape, stable contact can be achieved with minimal skating during contact, reducing damage to devices and ensuring high reproducibility. The calibration assist software already has product data for the "Allstron TITAN Probe Series" registered, allowing you to use it immediately by simply selecting a probe. 【Product List】 ■Allstron RF Probe "TITAN" ■Allstron RF Probe "TITAN-RC" ■RF Calibration Substrates "AC" ■Calibration software "QAlibria" *For more details, please request materials or view the PDF data available for download.

  • probe

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SK Probe "Attacker AT-001" (Inspection Jig)

Easy to use anywhere, lightweight, and doesn't cause fatigue - a handy type.

■Features ● Handheld connector terminal insertion failure inspection tool ● Excellent portability with a user-friendly compact design ● Highly reliable design that quickly identifies good and defective products using LED and buzzer ● Simple operation by just pressing the plunger of the attacher against the connector terminal ● Easy replacement of probe pins to match the shape of the connector terminals ■Diagnostic Items ● Terminal disconnection ● Terminal misalignment ● Terminal absence ■Standard Products (Cartridge) Includes one each of S-302-20, S-303-20, and S-305-10. *For other shapes and spring pressures, please choose the 30 series with switch-equipped probes.

  • Circuit Board Inspection Equipment
  • Other inspection equipment and devices

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AC current probe "CWT"

Easy to use with a thin and soft material! Current probe for power electronics development.

High-frequency 50MHz compatible! Rogowski coil type current probe The 【CWT Mini50HF】 is a Rogowski coil type current probe compatible with high frequency 50MHz (-3dB), manufactured by PEM (Power Electronic Measurements). The tip is detachable and made of a soft material that is thin and easily bendable, making it user-friendly and capable of accurately reproducing fast current waveforms, including sine waves, quasi-sine waves, and pulse waveforms. It is suitable for the development and analysis of power converters. 【Features】 ■ Detachable tip ■ Usable with digital voltmeters and power recorders *For more details, please refer to the catalog. Feel free to contact us with any inquiries.

  • Ammeter
  • Analytical Equipment and Devices
  • probe

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AC Current Probe "CMC"

Common mode noise measurable current probe

Variable speed drives used for controlling AC motors can generate significant high-frequency PWM (Pulse Width Modulation) voltage on the machine's shaft, which may lead to arc currents flowing through the shaft. This current can potentially result in early failure of the motor drive, leading to overheating and melting. The common mode current that occurs in such motors and shafts can be measured using a new current probe called 'CMC.' CMC can also be used for various other applications.

  • EMC/Static electricity measuring equipment
  • AC Motor
  • Metal bearings

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AC Current Probe "CWT LF"

Low-frequency specialized current probe

This is a current probe specialized for low frequencies, with less droop compared to other CWT series. The tip is detachable and made of a thin, flexible material that can be easily bent, making it user-friendly and capable of accurately reproducing fast current waveforms, sine waves, quasi-sine waves, and pulse waveforms. It is battery-operated for easy handling, but can also be powered by an AC adapter. Please feel free to contact us.

  • inverter
  • Other semiconductors

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