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Microanalyzer Product List and Ranking from 6 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Microanalyzer Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. アイテス Shiga//Electronic Components and Semiconductors
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  4. 日本カタン 本社 Osaka//Industrial Electrical Equipment
  5. 5 コベルコ溶接テクノ Kanagawa//Ferrous/Non-ferrous metals
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Microanalyzer Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. [EPMA] Electron Probe Micro Analyzer 一般財団法人材料科学技術振興財団　MST
  2. Electron Probe Microanalyzer (EPMA) アズサイエンス 松本本社
  3. [Data] Example of EPMA Analysis アイテス
  4. Example of EPMA analysis using the guide network map method. アイテス
  5. 4 Scanning Electron Beam Microanalyzer for Fracture Surface Analysis 日本カタン 本社

Microanalyzer Product List

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[Data] Example of EPMA Analysis

[Data] Example of EPMA Analysis

By using LIF and LIFH spectroscopic crystals, peak separation of 22Ti and 56Ba becomes possible!

EPMA has superior detection resolution compared to EDX. Even in cases where the detection positions of elements are close in EDX, making peak separation difficult, it may be possible to achieve peak separation with EPMA. This document introduces the peak separation of 22Ti and 56Ba. It includes analysis examples of multilayer ceramic capacitors and X-ray spectra of barium titanate (BaTiO3). [Contents] - Peak separation of 22Ti and 56Ba - Analysis example: Multilayer ceramic capacitors - X-ray spectrum of barium titanate (BaTiO3) *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

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[EPMA] Electron Probe Micro Analyzer

[EPMA] Electron Probe Micro Analyzer

By analyzing the characteristic X-rays generated when a finely focused electron beam is irradiated onto the surface of a solid sample in a vacuum, insights can be gained regarding the identification of elements and quantitative values.

By analyzing characteristic X-rays using a wavelength dispersive X-ray spectrometer (WDX), measurements with higher sensitivity than those obtained with an energy dispersive X-ray spectrometer (EDX) can be achieved. Additionally, using soft X-ray emission spectroscopy (SXES) allows for the acquisition of information regarding local chemical bonding states.

  • Contract measurement

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Electron Probe Microanalyzer (EPMA)

Electron Probe Microanalyzer (EPMA)

You can obtain more detailed measurement results than those obtained with the energy-dispersive detector (EDS) used in a scanning electron microscope (SEM).

Japan Electronics Co., Ltd. JXA-iSP100 Electron Probe Micro Analyzer (EPMA) enables observation of surface structure and morphology as well as localized trace element analysis. It is an integrated EPMA that has evolved further to perform operations from observation to analysis more efficiently. We are the world's only manufacturer capable of offering soft X-ray spectrometers. 〇Features - Auto-loading ensures secure loading of the holder! Quickly discover the area you want to observe! - Leave all the troublesome settings to the easy EPMA for immediate element analysis. - Efficient calibration with 18 types of built-in calibration samples. *For more details, please download the PDF or feel free to contact us.

  • Other physicochemical equipment

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Example of EPMA analysis using the guide network map method.

Example of EPMA analysis using the guide network map method.

Comprehensive analysis is possible! Here are examples of analysis using the EPMA guide network map method.

One of the features of EPMA is the guide network map method. In SEM-EDX, the measurement range is narrow, and for curved samples, surface analysis may not be accurately measured. However, by using the guide network map method of EPMA, extensive analysis becomes possible. This method automatically measures adjacent continuous areas and displays them collectively, making it useful for measuring surfaces with uneven height differences or for measuring large surfaces. 【Features of the Guide Network Map Method】 - A method for automatically measuring adjacent continuous areas and displaying them collectively. - Used for measuring surfaces with uneven height differences or for measuring large surfaces. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

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Scanning Electron Beam Microanalyzer for Fracture Surface Analysis

Scanning Electron Beam Microanalyzer for Fracture Surface Analysis

A scanning electron microscope that visualizes the surface state of the sample in real time.

We introduce our commissioned testing and analysis services, including tensile testing machines. Are you facing issues related to material testing equipment or analytical instruments? "I want to know the breaking strength of a product, but I don't have a testing machine!" "I want to see the internal condition of a product without breaking it!" "I want to understand the corrosion resistance of a product, but I don't have a testing machine!" In such cases, Nippon Katan can help. We offer a variety of testing equipment and analytical instruments, including large horizontal tensile load testing machines, fatigue strength testing machines, metal element analysis instruments, the largest industrial X-ray CT scanning device in Japan, and metal wear testing machines. We provide commissioned testing and analysis services to cater to customers from various fields. [Introduction to Wideband Vibration Testing Machines] This testing machine is suitable for vibration characteristic testing of general structures. Please feel free to contact us for more details.

  • Contract Analysis
  • Contract measurement

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Electron Probe Microanalysis (EPMA) Analysis

Electron Probe Microanalysis (EPMA) Analysis

Detecting characteristic X-rays! Ideal microanalyzer analysis for qualitative and semi-quantitative analysis of corrosion products.

"Electron Probe Micro Analyzer (EPMA) analysis" involves directing a finely focused electron beam onto a sample and detecting the characteristic X-rays emitted from that area, allowing us to clarify which elements are present and their distribution state at the irradiated location (sample surface). It targets foreign substances such as general metal materials and corrosion products, observing the surface at magnifications ranging from 40 to 30,000 times. [Analysis Items] ■ Surface observation at 40 to 30,000 times magnification ■ Identification of constituent elements in micro-regions (qualitative and semi-quantitative analysis of elements from Be to U) ■ Line analysis ■ Area analysis, color map analysis *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices

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Technical Data - Foreign Matter Analysis - Analysis of Foreign Matter Contained in Inorganic Materials

Technical Data - Foreign Matter Analysis - Analysis of Foreign Matter Contained in Inorganic Materials

We will clearly introduce examples of exposing microscopic foreign substances in inorganic materials and analyzing them using EPMA.

This document includes information on "Foreign Substance Analysis - Analysis of Foreign Substances Encapsulated in Inorganic Materials." Among foreign substance analyses, analyzing foreign substances encapsulated within materials requires advanced sample preparation techniques. We will introduce a case where microscopic foreign substances in inorganic materials were exposed and analyzed using EPMA (Electron Probe Micro Analyzer), along with details about the sample, analysis methods, and photographs. [Contents] ■ Overview ■ Sample and Analysis Methods ■ Analytical Techniques ■ Analysis Results *For more details, please refer to the PDF document or feel free to contact us.

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Field Emission Electron Probe Microanalyzer

Field Emission Electron Probe Microanalyzer

Anyone can use the device "easily" and "quickly."

Nihon Denshi Co., Ltd.'s Electron Probe Microanalyzer is an evolved integration EPMA that allows for more efficient operations from observation to analysis. * EPMA stands for Electron Probe Microanalyzer. 〇 Features - Auto-loading ensures the holder is securely loaded! Quickly discover the area you want to observe! - High-grade SEM images accessible to anyone thanks to comprehensive auto functions - Hassle-free settings with easy EPMA for immediate elemental analysis - Efficient calibration with 18 types of built-in calibration samples * For more details, please download the PDF or feel free to contact us.

  • Other physicochemical equipment

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