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X-ray CT scanner Product List and Ranking from 29 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

X-ray CT scanner Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. アールエフ Nagano//Medical Devices
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. コムスキャンテクノ Kanagawa//Other manufacturing
  4. null/null
  5. 5 日本ビジュアルサイエンス Tokyo//software
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X-ray CT scanner Product ranking

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. Equipped with a newly developed nano-focus X-ray tube! 【Industrial X-ray CT】 Comet Technologies Japan K.K. Comet Yxlon
  2. Pure domestic industrial X-ray CT "NAOMi-CT" series アールエフ
  3. Surprising "Straightforward Price" Industrial X-ray CT 'NAOMi-CT' Series アールエフ
  4. High-Speed X-Ray Inspection System ‘TXMotion’ 東芝ユニファイドテクノロジーズ 東京事業所　検査システム営業部
  5. 4 High-Power X-ray CT "CT Compact"

X-ray CT scanner Product List

16～30 item / All 97 items

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Surprising "Straightforward Price" Industrial X-ray CT 'NAOMi-CT' Series

Surprising "Straightforward Price" Industrial X-ray CT 'NAOMi-CT' Series

Making X-ray CT more accessible! With an affordable price and ease of use, it can be utilized for the inspection of various parts and products.

The "NAOMi-CT" is a non-destructive inspection device that allows for 3D cross-sectional observation of objects with various shapes and materials from different angles without cutting them. CT inspections, which were previously requested from industrial testing facilities and inspection agencies, are now more accessible and convenient. 【Features of NAOMi-CT】 ■ Imaging speed of approximately 16 seconds/display in 45 seconds (for the 2.8 million yen CT model) ■ No qualification required for X-ray operators ■ Compact size suitable for use on a desk (no X-ray room needed) ■ Easy three-step process of "Place, Shoot, View" for imaging and analysis 【Use Cases】 Industrial parts such as aluminum, engine components, monitor cables, food items like frozen foods and fruits, cosmetics such as powder compacts and eyeliners, and inspection of 100 yen shop products. *Some materials may not be suitable for imaging. Please inquire for details. *All prices are excluding tax. For more information, please refer to the PDF document or feel free to contact us. We also offer the 900,000 yen "NAOMi-2D" (industrial X-ray 2D). Additionally, we are accepting reservations for the rail slide-type non-destructive inspection device "NAOMi-CT 3D-Slide L" designed for long object imaging (made to order). Please feel free to consult with us.

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[Sample shooting now accepting] Industrial X-ray CT 'NAOMi-CT' series

[Sample shooting now accepting] Industrial X-ray CT 'NAOMi-CT' series

Easy 2-step simple inspection! A "straightforward" price and usability that breaks the common sense of industrial X-ray CT.

The "NAOMi-CT" is a non-destructive testing device that allows for 3D cross-sectional observation of objects with various shapes and materials from different angles without cutting them. CT inspections, which were previously requested from industrial testing facilities and inspection agencies, are now more accessible. Inspections can be easily performed in just two simple steps: "Capture" and "View." 【Features of NAOMi-CT】 ■ Shooting speed of approximately 16 seconds / Display time of 45 seconds (for the 2.8 million yen CT model) ■ No qualification as an X-ray operator required ■ Compact size suitable for use on a desk (no X-ray room needed) Additionally, we offer the "NAOMi-CT L Size" (3.8 million yen) suitable for larger items and the "NAOMi-CT 3D-Slide L" (5.8 million yen) designed for long objects. 【Use Cases】 Industrial parts such as aluminum, engine components, and monitor cables; food items like sweets and fruits; resin products such as compacts, eyeliners, and toys; canned goods, fossils, shoes, etc. *Some materials may not be suitable for imaging. Please inquire for details. *All prices are excluding tax. For more information, please refer to the PDF document or feel free to contact us.

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Nodson DAGE X-ray inspection device / X-ray CT device

Nodson DAGE X-ray inspection device / X-ray CT device

Class-leading resolution, maintenance-free vacuum tube.

As a market leader in semiconductor and substrate inspection with X-ray inspection equipment, we contribute to quality improvement by making defect detection easy. Nordson DAGE, based in Aylesbury, UK, designs and manufactures key components such as X-ray generators, power supplies, and detectors in-house. We provide inspection solutions at the highest level in the world.

  • X-ray inspection equipment
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Analysis of Powder and Bulk Material Behavior

Analysis of Powder and Bulk Material Behavior

Consideration of the behavior and flow of the mechanism! Performance improvement of construction machinery and heavy equipment systems is possible.

Through the collaboration of our various solvers, we enable high-precision analysis of "powder and bulk material behavior." It is possible to explore performance improvements for construction machinery and heavy equipment systems. We can also consider the interactions between mechanisms, powder, structural deformation, and system control. Additionally, by using various Altair solvers, we can accurately analyze powder processes that include thermal fluid phenomena (such as transportation by air, particle cooling by wind, and drying processes). 【Performance Improvement of Construction Machinery and Heavy Equipment Systems】 ■ Mechanisms ■ Powder Motion ■ Consideration of Deformation and Stress ■ Integration of System Control Mechanisms ■ Interaction between EDEM soil models and elastic deformation tire models *For more details, please download the PDF or feel free to contact us.

  • Other information systems

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[Analysis Case] Quality Evaluation of SiC Substrates

[Analysis Case] Quality Evaluation of SiC Substrates

Evaluation of crystal orientation, in-plane defect distribution, surface roughness, and impurities.

SiC power devices are expected to reduce power loss and handle high power in a compact form as power conversion elements. The quality evaluation of SiC substrates, which is necessary for manufacturing these devices, has become a challenge. We propose a method to evaluate and quantify the crystal orientation, in-plane defect distribution, surface roughness, and impurities of SiC substrates, as well as to visualize these factors. Measurement methods: XRD, AFM, PL, SIMS Product fields: Power devices, lighting Analysis purposes: Trace concentration evaluation, structural evaluation, shape evaluation, failure analysis, defect analysis For more details, please download the materials or contact us.

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X-ray CT method

X-ray CT method

X-ray Computed Tomography

By irradiating the sample with X-rays, a two-dimensional transmission image of the internal structure of the sample is obtained. Additionally, X-ray CT (Computed Tomography) images are constructed from continuous imaging data obtained by rotating the sample. - Non-destructive, allowing for the examination of the internal structure and defect shapes of the sample. - Capable of constructing 3D images and cross-sectional images at arbitrary locations. - The X-ray energy can be set between 30 kV and 160 kV, making it suitable for a wide range of materials from organic substances to electronic components. - With a dedicated stage, X-ray CT measurements of the sample can be performed under tensile/compressive or cooling/heating conditions. This document introduces application examples, principles, and data examples. For more details, please download the document or contact us.

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  • Contract Analysis
  • Other contract services

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[Analysis Case] Artifact Reduction in CT Images Using AI Technology

[Analysis Case] Artifact Reduction in CT Images Using AI Technology

Reduce metal artifacts in CT images with AI technology to improve image analysis accuracy!

X-ray CT measurements allow for the non-destructive observation of the three-dimensional structure of samples. However, due to the nature of using X-ray beams, measurements of samples containing a large amount of metal may produce dark line-like artifacts known as metal artifacts, which can hinder the measurement of internal structures and image analysis. This document presents a case study on optimizing CT image reconstruction based on material information and physical models of the sample. This technology can reduce artifacts, enabling clearer evaluation of internal structures. Measurement method: X-ray CT, computational science, and data analysis Product fields: Electronic components, manufacturing equipment and parts, LSI and memory, daily goods Analysis objectives: Shape evaluation, structural evaluation 【Features】 ■ Clear observation of structures obscured by metal artifacts ■ Useful for CT observation of both resin and metal For more details, please download the document or contact us.

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  • Other image-related equipment
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[Analysis Case] High-Resolution X-ray CT Observation of Lithium-Ion Batteries

[Analysis Case] High-Resolution X-ray CT Observation of Lithium-Ion Batteries

You can non-destructively check the internal layered structure and abnormal areas of the battery.

Lithium-ion polymer batteries are widely used in everyday products such as mobile batteries and electronic devices. This document presents a case study of analyzing a laminated lithium-ion polymer battery using X-ray CT. By using X-ray CT, it is possible to observe the internal structure of a 20mm x 40mm battery without destruction and to check for the presence and location of foreign objects or voids measuring a few micrometers. For more details, please download the document or contact us.

  • Contract Analysis
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Stitching imaging using X-ray CT - Balancing wide-field observation and high-resolution observation.

Stitching imaging using X-ray CT - Balancing wide-field observation and high-resolution observation.

It is possible to capture multiple CT images by connecting them vertically.

Generally, the field size and resolution of X-ray CT are in a trade-off relationship, where increasing the resolution results in a smaller field size. Therefore, X-ray CT has a imaging method called "stitching," which allows multiple CT images to be vertically connected. With the stitching imaging method, it is possible to observe a wide field size even under high-resolution conditions.

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[Analysis Case] Evaluation of the Internal Structure of Cylindrical Lithium-Ion Batteries Using X-ray CT

[Analysis Case] Evaluation of the Internal Structure of Cylindrical Lithium-Ion Batteries Using X-ray CT

Non-destructive measurement of the distance between electrodes inside batteries and defect investigation is possible.

X-ray CT allows for non-destructive observation of internal structures and dimensional measurements of products. This document presents a case study of a cylindrical lithium-ion battery (φ14mm×H50mm). X-rays were sufficiently transmitted from the outer casing to the interior electrodes, and initially, a wide-area observation was conducted to confirm the three-dimensional structure of the entire battery. Subsequently, by performing magnified observations on specific areas, we identified voids within the positive electrode, foreign substances between the positive and negative electrodes, and disturbances in the electrode layers. Additionally, measurements of the inter-electrode distance were conducted from the obtained cross-sectional images. Measurement method: X-ray CT Product field: Secondary batteries Analysis purpose: Shape evaluation, failure analysis, defect analysis, product investigation For more details, please download the document or contact us.

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[Analysis Case] Three-Dimensional Structure Observation and Numerical Analysis of Porous Ceramics

[Analysis Case] Three-Dimensional Structure Observation and Numerical Analysis of Porous Ceramics

Evaluation and analysis of porous structures is possible using X-ray CT.

Porous ceramics are lightweight and have low thermal conductivity due to their numerous pores, making them useful as insulation materials and filters. The structure of the pores directly affects the fluids passing through the porous ceramics, so capturing three-dimensional images and understanding numerical values such as porosity and specific surface area is important. This document presents a case study comparing the differences in porosity, specific surface area, and pore size distribution by conducting 3D structural observations using X-ray CT on two types of samples and analyzing the images.

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  • Ceramics
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Three-dimensional measurement X-ray CT device

Three-dimensional measurement X-ray CT device

Achieving high resolution and high contrast in non-destructive testing. Three-dimensional X-ray CT device.

This is an X-ray CT device that is highly equipped with the necessary conditions for scientific measurement, analysis, and quality control. It is a next-generation system that integrates image processing software with extensive and diverse functions. It provides high-resolution and high-contrast images for non-destructive internal inspections. 【Features】 - High contrast resolution Achieves innovative evolution in the separation of adjacent elements and visualization of light materials. - High dimensional accuracy Reliable images calibrated with high-precision standards. - High efficiency The fastest collection of target image data through standard, high-speed, and high-precision mode scans. - High functionality Continuous magnification settings, advanced correction software, and high-precision image data output capabilities. - Multi-functionality Realizes rich measurement and analysis functions through compatibility with general-purpose software. - Excellent operability Simple and clear operation software developed by practical operators. - Compact A compact system that integrates high performance and high functionality into a rational design.

  • Testing Equipment and Devices
  • Analytical Equipment and Devices
  • X-ray inspection equipment

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[Application Example] Microfocus X-ray CT Device

[Application Example] Microfocus X-ray CT Device

Applicable to the observation of fiber material orientation such as CFRP and the mixing state of resin materials!

We would like to introduce a product that applies "smart X-ray" technology. The 'FLEX-M345CT', a micro-focus X-ray CT device, utilizes high-precision X-ray CCD sensor technology and a compact micro-focus X-ray source to capture micron-level detailed X-ray CT images with the world's smallest dimensions, thereby expanding the applications of X-ray CT. Additionally, it can now be applied to observe the orientation of fiber materials such as CFRP and the mixing state of resin materials. 【Applicable Uses】 - Observation of voids in wire bonds and sealing materials of LSI - Observation and measurement of internal structures and shapes of small components such as LEDs and batteries - Internal observation and measurement of resin materials that easily transmit X-rays - Observation and measurement of the internal structures of solder joints and voids in printed circuit boards - Observation and measurement of the internal structures of various sensors *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment
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【Application Example】X-ray and Optical Coaxial Imaging Unit

【Application Example】X-ray and Optical Coaxial Imaging Unit

It can expand the new possibilities of X-ray fluoroscopy devices.

This unit can be attached to the X-ray source section of the micro-focus X-ray fluoroscopy devices "FLEX-M863" and "M345," allowing for the capture of optical images in video or still format along the same optical axis as the X-ray, with a field of view that is the same as or larger than that of the X-ray imaging. By reading the optical images of the parts being X-rayed, it becomes possible to read the part numbers, part names, or the manufacturing numbers of the target substrates. The collaboration between visible images and invisible X-ray images can expand the new possibilities of X-ray fluoroscopy devices. 【Applications of FLEX-BSU-OPC】 ■ Confirmation of optical images in X-ray imaging ■ Reading of part numbers and part names of X-ray imaged components ■ Realization of X-ray and optical hybrid automatic inspection devices ■ Simultaneous recording of dynamic changes in heating units using X-ray and optical methods *For more details, please refer to the PDF materials or feel free to contact us.

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