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Scanning electron microscope Product List and Ranking from 15 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Scanning electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. ジャスコインタナショナル 第二事業部 Tokyo//others
  2. アイテス Shiga//Electronic Components and Semiconductors
  3. インターテック販売 東京本社（拠点－関西営業所、熊本営業所） Tokyo//Electronic Components and Semiconductors
  4. 4 null/null
  5. 5 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
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Scanning electron microscope Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Tabletop Scanning Electron Microscope 'Phenom Pharos' ジャスコインタナショナル 第二事業部
  2. FE-SEM observation (Crystal grain observation of Al wire bonding section) アイテス
  3. CD-SEM インターテック販売 東京本社（拠点－関西営業所、熊本営業所）
  4. Tabletop Scanning Electron Microscope 'Phenom ProX' ジャスコインタナショナル 第二事業部
  5. 5 [Case Study] Achieving both High-Resolution Observation and Analysis Functionality with FE-SEM

Scanning electron microscope Product List

16～24 item / All 24 items

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[Analysis Case] Extraction of Active Material from Battery Cathode Material and Data Analysis

[Analysis Case] Extraction of Active Material from Battery Cathode Material and Data Analysis

We determined the particle size of active substances from SEM images using deep learning and data analysis.

Deep learning enables the extraction of target objects from images. Additionally, by analyzing the regions corresponding to the obtained targets, information can be obtained in numerical form. In this instance, we used deep learning to extract active material particles and detect cracks in cross-sectional SEM images of battery cathode materials. Extraction is also possible for 3D data, such as Slice&View data. We extracted particles with and without cracks from the 3D data and calculated their respective particle sizes. Measurement methods: SEM, Slice&View, computational science, AI, data analysis Product fields: Solar cells, secondary batteries, fuel cells Analysis purposes: Structural evaluation, shape evaluation, failure analysis, defect analysis For more details, please download the materials or contact us.

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  • Contract Analysis
  • Contract measurement

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[Analysis Case] Composition Analysis of Particles on a Wafer

[Analysis Case] Composition Analysis of Particles on a Wafer

Shape observation and simple quantitative analysis using SEM-EDX.

Control of particles in the semiconductor wafer manufacturing process is extremely important for ensuring wafer quality. In this case study, we estimated what the particles were on a Si wafer through SEM observation, EDX analysis, and simple quantification. The SEM equipment, which has high spatial resolution in the submicron range and can scan areas of several centimeters, allows for rapid inference of what the particles on the wafer are based on shape and composition information, enabling quick identification of the generation process. Analysis linked to coordinate data from defect inspection equipment is also possible.

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  • Contract Inspection
  • Wafer
  • Other semiconductor manufacturing equipment

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Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

We will introduce various cases of micro-section machining and analysis, residual stress measurement, and more using ion milling, FE-SEM, EBSD, etc. The materials are available for download.

In this case study collection, we will introduce examples related to "cross-sectional observation and structural analysis." Starting with the analysis case of "Evaluation of aluminum sputter films using EBSD," we also include numerous examples such as the purpose, methods, samples, and results of "Cross-sectional processing of micro areas by ion milling," and the purpose, methods, and results of "Residual stress measurement of solder cross-sections." Additionally, we present orientation evaluations, cross-sectional observation results, and measurements. We encourage you to read through it. 【Contents】 ■ Evaluation of aluminum sputter films using EBSD ■ Cross-sectional processing of micro areas by ion milling ■ Residual stress measurement of solder cross-sections ■ Residual stress measurement of wire ■ Cooling (cryo) ion milling cross-sectional processing *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Other polymer materials
  • Other metal materials

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Observation of the cutting edge surface of single crystal diamond chips.

Observation of the cutting edge surface of single crystal diamond chips.

Scanning Electron Microscope (SEM) ■Industry: Automotive (Prototype) / Semiconductor / Robotics

The cutting edge surface of single crystal diamond chips was observed using a scanning electron microscope (SEM). The cutting edge surface of PCD (polycrystalline diamond) was also observed and compared. The differences in the fine surface roughness were clearly confirmed. How this difference affects the machining process is yet to be determined. *For more details, please refer to the PDF document or feel free to contact us.*

  • Other machine elements
  • Processing Contract

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Scanning Electron Microscope (SEM) Observation

Scanning Electron Microscope (SEM) Observation

Observation of non-conductive samples without deposition is possible! Scanning electron microscopy is ideal for surface observation of fibers and similar materials.

A "Scanning Electron Microscope (SEM)" is a device that irradiates and scans a finely focused electron beam on a sample, detects secondary and backscattered electrons, and displays their intensity as an image on a monitor to obtain magnified images of the object. Although it is not suitable for high magnification observation due to reduced image quality, it can use low vacuum mode, allowing for non-coating observation of difficult-to-conduct samples. [Observation Items] ■ Surface observation at magnifications of 5 to 300,000 times ■ Elemental analysis (B to U) using an energy-dispersive X-ray spectrometer (EDS) as an accessory ■ Element identification in micro-regions (qualitative and semi-quantitative analysis) *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices

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Superior Corporation Business Introduction

Superior Corporation Business Introduction

We are striving for extreme business development in the fields of healthcare and information to meet the social needs of the 21st century!

Superior Co., Ltd. is a company that specializes in the manufacturing of special coils as a professional in precision winding, and also engages in the assembly of machinery, including the assembly of electron microscope units and ultra-precision assembly of semiconductor-related units. Additionally, we accept orders for integrated services from design to manufacturing of resin processing for cleaning tanks used in semiconductor manufacturing equipment and rationalization machinery and equipment. 【Business Activities】 ■ Special coil manufacturing ■ Machinery assembly ■ Resin processing related to industrial machinery ■ Precision parts processing *For more details, please refer to our catalog or feel free to contact us.

  • Inductor Coil
  • Electron microscope

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Tabletop scanning electron microscope

Tabletop scanning electron microscope

Far higher resolution than optical microscopes! Suitable for surface observation and checking surface irregularities at the micro level.

The "Tabletop Scanning Electron Microscope" is a microscope that scans the surface of a sample with a finely focused electron beam in a vacuum, detecting information that comes from the sample and displaying it in an enlarged form. It has a much higher resolution than optical microscopes, making it suitable for surface observation and checking surface irregularities at the micro level. In addition to surface observation, it is also possible to confirm what elements are present on the sample surface and in what quantities through EDS elemental analysis using an X-ray detector. 【Features】 ■ Effective for samples that are difficult to process or that need to be observed as they are ■ Can accommodate samples up to a maximum size of W100mm × D100mm × H40mm on the testing stage ■ By utilizing a user-centric holder, tilting and rotation of the sample is possible ■ Suitable for surface observation and checking surface irregularities at the micro level ■ EDS elemental analysis using an X-ray detector allows for confirmation of what elements are present on the sample surface and in what quantities *For more details, please refer to the PDF document or feel free to contact us.

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  • Electron microscope

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[Market Report] World Market for Scanning Electron Microscopes

[Market Report] World Market for Scanning Electron Microscopes

The global market for scanning electron microscopes is expected to drive scientific discoveries and experience significant growth.

The global market for scanning electron microscopes (SEM) is at the forefront of scientific exploration, achieving approximately $3.83 billion in revenue in 2022. Industry experts predict that this market will reach $7.84 billion in sales by 2031. This forecast implies a compound annual growth rate (CAGR) of 8.3% during the forecast period from 2023 to 2031. Scanning electron microscopes serve as a window into the microscopic world, revealing complex details of structures and materials that are not visible to the naked eye. From fundamental research to advanced industrial applications, SEMs are essential tools for scientists, engineers, and researchers to unravel minute mysteries. For application methods, please check the [PDF download] button or apply directly through the related links.

  • others

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