シエンタ オミクロン List of Products and Services

Redefining Low-Temperature SPM: A Closed-Cycle System Equipped with High Magnetic Field and Optical System Experience a new type of low-temperature scanning probe microscope with precision, efficiency, and adaptability. The ARCTIC SPM Lab features continuous operation, a compact footprint, and modular expandability to meet evolving research needs. Closed-cycle cooling technology enables a sustainable and cost-effective approach, eliminating dependence on helium. The SPM maintains excellent mechanical stability while providing virtually unlimited measurement time.

• Other microscopes

The DA20 offers ARPES in addition to XPS and UPS while maintaining a compact footprint. It is equipped with groundbreaking deflection technology that was previously only available in the larger DA30-L analyzer model, enabling full cone ARPES measurements without rotating the sample. This allows for the mapping of the electronic band structure of the surface Brillouin zone without changing the measurement geometry, eliminating the influence of matrix elements and significantly simplifying the interpretation of results.

• Spectroscopic Analysis Equipment

This is a lab-type photoelectron spectroscopy system that uses hard X-rays as the excitation source. Hard X-ray Photoelectron Spectroscopy (HAXPES) is one of the next-generation photoelectron spectroscopy (XPS) techniques that many synchrotron facilities have already adopted. It is gaining attention as a method that can provide information about the substrate of films, buried interfaces, and deep inner shell orbitals that are not accessible with conventional XPS. By placing this system in your lab, you can enable next-generation photoelectron spectroscopy measurements that provide not only surface information but also bulk information, a technique that was previously only measurable at synchrotron facilities.

• Analytical Equipment and Devices

We offer an angle-resolved photoelectron spectroscopy analyzer at an affordable size and price. *For details, please download the PDF document (in English). *Feel free to contact us with any inquiries.

• Other physicochemical equipment
• Analytical Equipment and Devices

Since the dawn of photoelectron spectroscopy (PES), we have focused on its importance and developed many related devices as a top global brand, introducing them to the market. Additionally, we continue to provide an outstanding range of products, including scanning tunneling microscopes (STM) and atomic force microscopes (AFM) that utilize ultra-high vacuum technology. [Featured Products *Partial List] 1) HAXPES Lab Laboratory-type hard X-ray photoelectron spectroscopy analysis system (Hard X-ray photoelectron spectroscopy, previously only possible at synchrotron facilities, is now available in the lab!) 2) HiPP Lab Environmentally controlled X-ray photoelectron spectroscopy analysis system (XPS analysis device that enables measurements at atmospheric pressure levels) 3) ARPES Device used for XPS observation and measurement 4) MBE Systems Vacuum deposition equipment 5) STM/AFM Scanning tunneling microscope equipped with cooling and heating systems *For more details, please contact us or download the PDF.

• Analytical Equipment and Devices

"LEED" is a device manufactured by OCI that can perform low-speed electron diffraction measurements. The electron gun of this product has a diameter of 10mm, providing a wide field of view on the screen, and minimizes the shadow area caused by the electron gun, allowing for the acquisition of LEED pattern images. Additionally, by using a cylindrical structure for the lens part, the outgassing within the electron gun is efficiently discharged through the side slits. Various options such as Auger electron spectroscopy measurement functionality, MCP attachment, linear drive mechanism, shutter, and image acquisition device can be selected according to measurement purposes. [Features] - Electron gun with a diameter of 10mm and a wide field of view on the screen - Use of μ-metal in a cylindrical shape to prevent magnetic field interference - Digital controlled power supply can provide the necessary voltage and current for the LEED device through digital control - Compatible flange types include ICF203, ICF152, and ICF114 *For more details, please refer to the PDF materials or feel free to contact us.

• Analytical Equipment and Devices

Introducing a high-intensity ultraviolet light source (vacuum ultraviolet light source). 【Details】*In English The Scienta VUV5000 is a high intensity, narrow bandwidth extreme UV source. It provides radiation concentrated to He I (21 eV and 23 eV) and He II (41 eV). The flux density per unit wavelength interval is comparable to that obtainable from the best undulator beam lines. The photon flux emitted through a 2 mm aperture is about 500 times higher than that from conventional discharge VUV sources. *For more details, please contact us or download the PDF materials.

• Analytical Equipment and Devices

Introducing the ARPES analysis analyzer. 【Features】 ● 30° degrees full cone acceptance without sample rotation ● Spin-resolved MDC without sample rotation ● Patented (WO2013/133739) ● Improved ky accuracy (resolution better than 0.1º) ● Time saving (electronic deflection is faster than rotation) ● Matrix element effects are avoided by keeping sample fixed ● Manipulator requirements are reduced ● Ensures same spot for all k// For more details, please contact us or download the PDF materials.

• Analytical Equipment and Devices

The ARPES-Lab (ARPES photoelectron spectroscopy analysis system) is a device used for XPS observation and measurement. 【Purpose】 XPS observation and measurement using ARPES --- Below is an introduction in English. The ARPES-Lab brings together the world leading instrumentation for ARPES: ●Outstanding performance ARPES system with unchallenged energy and angular resolution ●Intelligent integration and automation ●Revolutionary DA30 deflection mode operation: - Improved ky accuracy - Matrix element effects are avoided by keeping the sample fixed - Ensures the same sample point for all k// *For more details, please contact us or download the PDF materials.

• Analytical Equipment and Devices

VT-STM/AFM (Variable Temperature Scanning Tunneling Microscope) refers to a scanning tunneling microscope equipped with a cooling and heating system. It enables STM measurements across a wide temperature range from low to high temperatures, making it suitable for STM observation and measurement in the nano domain (from low to high temperatures). *For more details, please contact us or download the PDF document.*

• Other microscopes
• Analytical Equipment and Devices

○FZ Juelich Cluster -Installed at the HNF (Helmholtz Nanofabrication Facility) Juelich, Germany ○IQC Cluster Tool -Installed at the Institute for Quantum Computing at the University of Waterloo, Canada ○EIT+ Cluster Tool -Installed at the Wroclaw Research Centre EIT+, Wroclaw, Poland ○UTD Cluster Tool -Installed at the University of Texas at Dallas, USA ○FW Dresden Cluster ○Materials Innovation Platform ※For details on each device, please contact us.

• Analytical Equipment and Devices

Virtually unlimited thin film growth techniques. ●Combined UHV SPM / XPS / UPS / MBE system ●Hybrid (PLD) Laser-MBE System (based on a LAB10 MBE System) ●UHV PLD and MULTIPROBE Compact ●Charge & spin transport in graphene layers on 2 inch substrates ●III-V MBE system for film growth on 4 inch wafers ●III-N MBE system for 3 inch substrates with additional in situ VT SPM ●MBE & Catalysis ※For details on each device, please contact us.

• Analytical Equipment and Devices

This is a next-generation XPS device that can analyze depths that conventional XPS has not been able to reach until now. It has become possible to use hard X-rays, which were previously only available at synchrotron facilities. High-resolution hard X-ray photoelectron spectroscopy has been achieved using a Ga Kα monochromatic X-ray source with 9.25 keV excitation. 【Applications】 XPS observation and measurement of samples in areas deeper than the surface. --- Below is an introduction in English. HAXPES-Lab is designed to allow hard X-ray photoelectron spectroscopy (HAXPES) measurements in standard lab environments. The instrument offers the unique possibility to investigate bulk properties of various materials, analyze buried interfaces, and access deep core levels. *For more details, please contact us.

• Analytical Equipment and Devices

The HiPP-Lab refers to an XPS analysis device that enables measurements at atmospheric pressure levels. By using a differential pumping system, it allows for sample measurements in an environment close to atmospheric pressure, making it a next-generation XPS device capable of measurements under environmental control that were previously unattainable. 【Applications】 XPS observation and measurement of samples under environmental control --- Below is an introduction in English. The HiPP-Lab brings together the world leading instrumentation for APPES: ●Outstanding performance APPES system with unchallenged energy, spatial and angular resolution ●Intelligent integration and automation ●State of the art HiPP-3 analyser: - Line mode imaging mode - Angular mode - Swift acceleration mode for increased intensity

• Analytical Equipment and Devices

LT STM (Low Temperature Scanning Tunneling Microscope) refers to a scanning tunneling microscope operating in a cryogenic environment. It is a device with a proven sales record, capable of STM measurements at temperatures below 5K. 【Applications】 STM observation and measurement in the nano region under low temperature conditions. 【Features】 ● Increased hold time to >65h at the same performance level ● High frequency wiring ● Increased spectroscopy resolution ● Record proven platform since 1996 with more than 200 devices installed ● Reliable design ensuring high up-time ● Independent tip and sample temperature ● Leading QPlus AFM technology

• Analytical Equipment and Devices

For more details, please check the catalog download.

• Other physicochemical equipment
• Analytical Equipment and Devices

For more details, please check the catalog download.

• Other physicochemical equipment
• Analytical Equipment and Devices

The Silicon Sublimation Source - SUSI - was developed for growing thin Si layers, short period Si/Ge superlattices, and Si/Sige heterostructures, but it is also an excellent Si dopant source. For more details, please check the catalog download.

• Other physicochemical equipment
• Analytical Equipment and Devices

This is product information for COMPACT EFFUSION CELLS FOR THIN FILM DEPOSITION OR MBE IN RESEARCH UHV SYSTEMS. For more details, please check the catalog download.

• Other physicochemical equipment
• Analytical Equipment and Devices

For more details, please check the catalog download.

• Other physicochemical equipment
• Analytical Equipment and Devices

A lineup of X-ray sources, monochromators, 5kV electron guns, low-speed electron guns, 12kV electron guns, UV sources, and more. For more details, please contact us or refer to the catalog.

• Other electronic parts
• Other physicochemical equipment

A lineup of small area evaporation sources, ion-assisted small area evaporation sources, large area evaporation sources, three-source evaporation sources, atomic hydrogen sources, power supplies for evaporation sources, large area evaporation power supplies, and crucibles for various evaporators. For more details, please contact us or refer to the catalog.

• Evaporation Equipment
• Other laboratory equipment and containers

We offer a variety of types of complex analytical devices, including ultra-high vacuum pumping systems for angle-resolved analysis, HREELS, MBE, and composite analytical applications, as well as UHV NANOPROBE. Additionally, as a large composite system, we provide a seamless and efficient experimental environment designed with a consistent concept that allows for the transport of everything from film deposition systems to analytical instruments in an ultra-high vacuum environment, covering sample preparation, evaluation, and analysis. Furthermore, we pay utmost attention to the connection with SPM devices, enabling the introduction of large equipment without compromising SPM performance. For more details, please contact us or refer to our catalog.

• Vacuum Equipment
• Analytical Equipment and Devices

A variety of ultra-high vacuum pumping systems for various types of SPM, including bolt-on ultra-high vacuum pumping systems for SPM (expandable for pre-treatment room / with sample pre-treatment room), ultra-high vacuum pumping systems for LT-SPM (expandable for sample pre-treatment room), and cryogenic ultra-high vacuum pumping systems for SPM, are available. For more details, please contact us or refer to the catalog.

• Other microscopes
• Vacuum Equipment

We offer a variety of accessories for Omicron's SPM (Scanning Probe Microscope). For more details, please contact us or refer to the catalog.

• Other microscopes

When selecting an Omicron microscope, please consider "temperature" and "function." "Temperature" refers to the temperature of the sample being observed. You need to determine whether the sample temperature can be at room temperature, or if it needs to be cooled or heated. Depending on these requirements, the microscopes come equipped with different basic options. "Function" refers to whether you only need a Scanning Tunneling Microscope (STM) or if you need to include an Atomic Force Microscope (AFM). This functionality cannot be upgraded (modified or altered) after delivery; you will have to maintain the initial functionality. While we offer a wide range of options, please note that we do not provide options that change the basic performance. For more details, please contact us or refer to the catalog.

• Other microscopes

We have prepared an X-ray photoelectron spectroscopy device. For more details, please contact us or refer to the catalog.

• Spectroscopic Analysis Equipment