An electron gun with a diameter of 10mm obtains a LEED pattern image while minimizing the shadow area.
"LEED" is a device manufactured by OCI that can perform low-speed electron diffraction measurements. The electron gun of this product has a diameter of 10mm, providing a wide field of view on the screen, and minimizes the shadow area caused by the electron gun, allowing for the acquisition of LEED pattern images. Additionally, by using a cylindrical structure for the lens part, the outgassing within the electron gun is efficiently discharged through the side slits. Various options such as Auger electron spectroscopy measurement functionality, MCP attachment, linear drive mechanism, shutter, and image acquisition device can be selected according to measurement purposes. [Features] - Electron gun with a diameter of 10mm and a wide field of view on the screen - Use of μ-metal in a cylindrical shape to prevent magnetic field interference - Digital controlled power supply can provide the necessary voltage and current for the LEED device through digital control - Compatible flange types include ICF203, ICF152, and ICF114 *For more details, please refer to the PDF materials or feel free to contact us.
Inquire About This Product
basic information
【Lineup】 ■BDL450IR ■BDL600IR ■BDL800IR *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
On May 28, 2015, VG Scienta and Omicron NanoTechnology merged to start anew as Scienta Omicron. Scienta Omicron Co., Ltd. was established as the general agent in Japan with the aim of making a substantial contribution to research and development in the country. VG Scienta has recognized the importance of photoelectron spectroscopy since its early days and has developed and introduced many related devices to the market as a top global brand. Omicron NanoTechnology has continuously provided cutting-edge technology to the market through its outstanding product lineup, including scanning tunneling microscopes (STM), atomic force microscopes (AFM), and X-ray photoelectron spectroscopy (XPS) systems, all utilizing ultra-high vacuum technology. Moving forward, our mission is not only to provide state-of-the-art evaluation technology-related equipment but also to contribute to the development of science and industry in Japan by offering comprehensive services and technical support. We hope you look forward to our evaluation technologies.
![[Analysis Case] Distortion Analysis in the Field of Element Separation](https://image.mono.ipros.com/public/product/image/c00/2000026136/IPROS790141089793262793.jpg?w=280&h=280)
