ダイヤ電子応用 List of News Articles

Major manufacturers of inspection and testing equipment, such as appearance and X-ray inspection devices, testers, environmental and reliability testing equipment, and various analytical instruments, will exhibit at Nepcon Japan: The 34th Electro Test Japan - Electronics Inspection, Testing, and Measurement Exhibition, providing a venue for business discussions with domestic and international manufacturers of electronic devices, semiconductors, electronic components, and automotive and electrical equipment. Daiya Electronic Applications will showcase its expertise as a "specialist in non-destructive testing systems," displaying ultrasonic imaging diagnostic systems, the latest phased array devices, and X-ray automatic inspection equipment. 【Exhibited Products】 Demonstrations of various non-destructive testing equipment, including ultrasonic automatic inspection systems for automotive parts, power modules, and composite materials, will also be conducted. Tokyo Big Sight, West Building, Hall West 1, Booth No. W1-53 The following exhibitions are collectively referred to as "Nepcon Japan": • 34th Electro Test Japan • 34th InterNepcon Japan - Electronics Manufacturing and Assembly Exhibition • 21st Semiconductor and Sensor Packaging Technology Exhibition • 21st Electronic Components and Materials EXPO • 21st Printed Circuit Board EXPO • 10th Microfabrication EXPO • 12th LED and Semiconductor Laser Technology Exhibition

The railway technology exhibition is a comprehensive trade fair where technologies from all railway fields, including railway and transportation systems, infrastructure technology, facilities, power, transportation, operation management, vehicles, interiors, and passenger service-related areas, come together in a cross-sectional manner. Daiya Electronic Applications, as a "specialist in non-destructive testing systems," is engaged in the sale of various non-destructive testing equipment and the production of non-destructive testing systems in the fields of vehicles, track maintenance, power equipment, and signaling equipment. [Exhibited Products] ■ Overcurrent flaw detector for bogie frame inspection systems ■ Ultrasonic flaw detection system for railway axles Demonstrations of various non-destructive testing equipment will also be conducted. (Booth No. G-07)

The Railway Technology Exhibition is a comprehensive trade fair where technologies from all railway fields, including railway and transportation systems, infrastructure technology, facilities, power, transportation, operation management, vehicles, interiors, and passenger services, come together across various sectors. Daiya Electronic Application, as a "specialist in non-destructive testing systems," is engaged in the sale of various non-destructive testing equipment and the production of non-destructive testing systems in the fields of vehicles, track maintenance, power equipment, and signaling equipment. At the Railway Technology Exhibition, we will also demonstrate various non-destructive testing equipment, including our original "Bogies Frame Inspection System / Overcurrent Detector" and "Ultrasonic Testing System for Railway Axles," which have gained high reliability in deliveries to various companies. We look forward to your visit. (Booth No. G-07)

We will be exhibiting at the 6th High-Performance Metal Exhibition! Daiya Electronic Applications is engaged in the development of cutting-edge technology in the field of non-destructive testing, receiving requests from renowned companies. We make suitable proposals while considering customer needs and cost aspects. We will be exhibiting at the High-Performance Metal Exhibition, so please stop by if you are in the area. 【Exhibition Information】 Date: December 4 (Wednesday) - 6 (Friday), 2019 Venue: Makuhari Messe Booth Number: 13-1 Exhibited Products: - Phased Array Ultrasonic Flaw Detector - Ultrasonic Flaw Detection Image Drawing System 'HYPER SCAN III' - Portable X-ray Digital Detector 'Image Dr.K2923'

This time, Daiya Electronic Application exhibited at the "9th Comprehensive Non-Destructive Testing Exhibition," where information on non-destructive evaluation, held every two years, gathered from the manufacturing industry to social infrastructure. Approximately 40,000 visitors registered, and many products and services related to non-destructive testing for surface defect detection and internal defect detection were showcased. Our company also exhibited non-destructive testing equipment and devices suitable for inspection targets, with the aim of "supporting quality and safety." Thank you very much for your many visits. ■ Booth Number: W2K-36

This time, Daiya Electronic Applications will exhibit at the "9th Comprehensive Non-Destructive Testing Exhibition," where information on non-destructive evaluation, held every two years, will gather from the manufacturing industry to social infrastructure. With an expected attendance of 40,000 people, many products and services related to non-destructive testing for surface and internal defect detection will be showcased. Our company will also exhibit non-destructive testing equipment and devices suitable for inspection targets, aiming to "support quality and safety." We sincerely look forward to your visit. ■ Booth Number: W2K-36

This time, Daiya Electronics Application will exhibit at the "48th NEPCON Japan," one of the largest specialized exhibitions in Asia related to electronics development and implementation, featuring 2,640 prominent companies and attracting design and production engineers from around the world. We will showcase various products, including the high-frequency ultrasonic inspection device "High-Frequency Cscan Device," the wireless portable X-ray digital detector "ImageDrK2923," and the industrial endoscope "Mentor iQ HD." We invite you to visit us during this opportunity! We sincerely look forward to your visit. 【Exhibited Products】 ■ High-frequency ultrasonic inspection device "High-Frequency Cscan Device" ■ Conductive paste void X-ray automatic inspection device "ImageDr" ■ "Industrial Endoscope Mentor iQ HD" (GE Sensing & Inspection Technologies Co., Ltd.) ■ "TOPAZ Phased Array Flaw Detector" (G-Tech)