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  2. Electronic Components and Semiconductors
  3. Semi Next 本社、三重事業所
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Electronic Components and Semiconductors
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Semi Next 本社、三重事業所

Establishment2017 year
number of employees1100
addressTokyo/Koto-ku/Ariake 3-7-18, Ariake Central Tower 6F
phone07044264493
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last updated:Jul 15, 2025
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Precision Electronic Measurement Precision Electronic Measurement
High-speed communication test solution High-speed communication test solution
Optical chip test Optical chip test
Power semiconductor testing Power semiconductor testing
High-speed

High-speed communication test solution

As markets such as big data, cloud computing, and 5G communication rapidly develop, high-speed communication testing plays an extremely important role. **Semight** provides a variety of measurement instruments that support testing of optical transceivers and optical components. The main products are as follows: - Wideband sampling oscilloscope - NRZ/PAM4 bit error rate tester (BERT) - Burst signal compatible bit error rate tester - High-speed wavelength meter - Optical spectrum analyzer (OSA) - High-precision source measure unit (SMU) - 400G network analyzer - Optical power meter - Variable optical attenuator (VOA) - Optical switch, etc. Semight offers customers a total solution for optical communication testing with excellent cost performance.

DCA1065 Sampling Oscilloscope

Semight DCA1065 Sampling Oscilloscope — Fully meets the testing needs of the 1.6T optical module!

The 200Gbps per lane data rate not only achieves higher bandwidth but also significantly contributes to power consumption reduction. On the other hand, evaluating such high-speed signals requires extremely advanced measurement techniques. Semight has developed the "DCA1065," a wideband sampling oscilloscope that employs a newly designed ASIC compatible with 200Gbps per lane, addressing the challenges of high-speed signal measurement. With the System Impulse Response Correction (SIRC) function, it can flexibly respond to signal measurement requirements under various data rate conditions. Additionally, it supports up to 64 taps in the feedforward equalizer (FFE) for TDECQ, effectively reducing inter-symbol interference (ISI).

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PBT3058 1.6T Bit Error Rate Tester

From 1.6T optical modules to CPO and SiPh, everything for BERT evaluation in one device.

The Semight PBT3058 is a high-performance bit error rate tester designed for error testing of high-speed serial signals. It is used for physical layer characterization and compliance testing, supporting both PAM4 and NRZ signals. It can handle symbol rates of up to 106.25 GBaud, providing an optimal solution for evaluating next-generation high-speed communication standards.

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CR3302 120GBd High-Speed Clock Recovery Unit

120GBd compatible clock extraction - An essential partner for next-generation PAM4/NRZ measurement.

The Semight CR3302 is a compact, high cost-performance, and high-efficiency tabletop high-speed clock recovery unit. It supports clock recovery for NRZ (Non-Return-to-Zero) and PAM4 (4-level Pulse Amplitude Modulation) signals ranging from 25 to 120 GBaud. This product is widely used in 1.6T optical transceivers and high-speed interface evaluations, and it can stably extract clocks even from signals in a closed-eye state due to its high sensitivity, low jitter, and excellent measurement accuracy.

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FWM8612 High-Speed Wavelength Meter

1kHz ultra-fast, real-time wavelength monitoring

With the increase in demand for communication data, optical communication transmission systems are required to have greater capacity. As a result, manufacturers of optical devices and network equipment are adopting coherent communication modules that use wavelength-variable lasers in transmission backbone networks. Currently, wavelength-variable lasers and coherent modules are also beginning to be used in metropolitan area networks (MAN) and access networks. For wavelength-variable lasers, accurate wavelength measurement and calibration are extremely important. The number of communication channels has increased from the initial 40 wavelengths to a maximum of 800 wavelengths, and the efficiency and accuracy of wavelength measurement are being demanded like never before.

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Announcement of Participation in "SEMICON JAPAN 2025"

Test solutions for CPO and semiconductor WAT/reliability evaluation solutions are the key points!

We will be exhibiting at 'SEMICON JAPAN 2025' held at Tokyo Big Sight. This exhibition covers manufacturing technologies, equipment, and materials in the semiconductor industry, as well as SMART applications such as vehicles and IoT devices, making it an international exhibition for electronics manufacturing. Highlights of our booth products include "Test Solutions for CPO," "Semiconductor WAT/Reliability Evaluation Solutions," and "KGD/Wafer Aging Tests for Power Semiconductors." We sincerely look forward to your visit. 【Event Overview】 ■ Date: December 17 (Wed) to 19 (Fri), 2025, 10:00 AM to 5:00 PM ■ Venue: Tokyo Big Sight ■ Address: 3-11-1 Ariake, Koto-ku, Tokyo 135-0063 ■ Booth Number: W3232, West Hall 3rd Floor ■ Pre-registration for attendance is required. *For more details, please feel free to contact us.

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