Semi Next Product Lineup

The 200Gbps per lane data rate not only achieves higher bandwidth but also significantly contributes to power consumption reduction. On the other hand, evaluating such high-speed signals requires extremely advanced measurement techniques. Semight has developed the "DCA1065," a wideband sampling oscilloscope that employs a newly designed ASIC compatible with 200Gbps per lane, addressing the challenges of high-speed signal measurement. With the System Impulse Response Correction (SIRC) function, it can flexibly respond to signal measurement requirements under various data rate conditions. Additionally, it supports up to 64 taps in the feedforward equalizer (FFE) for TDECQ, effectively reducing inter-symbol interference (ISI).

The Semight PBT3058 is a high-performance bit error rate tester designed for error testing of high-speed serial signals. It is used for physical layer characterization and compliance testing, supporting both PAM4 and NRZ signals. It can handle symbol rates of up to 106.25 GBaud, providing an optimal solution for evaluating next-generation high-speed communication standards.

The Semight CR3302 is a compact, high cost-performance, and high-efficiency tabletop high-speed clock recovery unit. It supports clock recovery for NRZ (Non-Return-to-Zero) and PAM4 (4-level Pulse Amplitude Modulation) signals ranging from 25 to 120 GBaud. This product is widely used in 1.6T optical transceivers and high-speed interface evaluations, and it can stably extract clocks even from signals in a closed-eye state due to its high sensitivity, low jitter, and excellent measurement accuracy.

With the increase in demand for communication data, optical communication transmission systems are required to have greater capacity. As a result, manufacturers of optical devices and network equipment are adopting coherent communication modules that use wavelength-variable lasers in transmission backbone networks. Currently, wavelength-variable lasers and coherent modules are also beginning to be used in metropolitan area networks (MAN) and access networks. For wavelength-variable lasers, accurate wavelength measurement and calibration are extremely important. The number of communication channels has increased from the initial 40 wavelengths to a maximum of 800 wavelengths, and the efficiency and accuracy of wavelength measurement are being demanded like never before.

We will be exhibiting at 'SEMICON JAPAN 2025' held at Tokyo Big Sight. This exhibition covers manufacturing technologies, equipment, and materials in the semiconductor industry, as well as SMART applications such as vehicles and IoT devices, making it an international exhibition for electronics manufacturing. Highlights of our booth products include "Test Solutions for CPO," "Semiconductor WAT/Reliability Evaluation Solutions," and "KGD/Wafer Aging Tests for Power Semiconductors." We sincerely look forward to your visit. 【Event Overview】 ■ Date: December 17 (Wed) to 19 (Fri), 2025, 10:00 AM to 5:00 PM ■ Venue: Tokyo Big Sight ■ Address: 3-11-1 Ariake, Koto-ku, Tokyo 135-0063 ■ Booth Number: W3232, West Hall 3rd Floor ■ Pre-registration for attendance is required. *For more details, please feel free to contact us.