Semi Next List of Products and Services

A benchtop SMU (Source Measure Unit) series that balances precision measurement and high-performance output, ideal for research and development and reliability testing. Semight's high-resolution SMU products cover a wide range of voltage and current, from ±200V/±1A (DC) to ±3A (pulse), and even up to ±60V/±10A (pulse), achieving measurement resolutions from a maximum of 1fA/1μV to 10fA/100nV. Equipped with a maximum ADC sampling rate of 1MS/s and a self-developed high-precision, fast-response control system (Adaptive PFC), it supports a wide range of applications from accurate measurement of small signals to high-speed pulse testing.

The S3030F is a single-channel source measure unit (SMU) designed for high voltage and high power applications, capable of simultaneous output and measurement of voltage and current in a single unit. It supports a maximum power output of 180W, high voltage of ±3500V, high current of ±120mA (DC), and high resistance measurements of up to 10GΩ, featuring a compact and highly cost-effective design. This product is widely used in research and evaluation applications that require high voltage measurements, such as: ▶ Evaluation of power semiconductor characteristics like GaN / SiC ▶ Electrical testing of insulating materials and composite materials ▶ Measurement of high voltage leakage currents Additionally, the S3030F complies with SCPI commands, making it easy to operate through programming. It also supports synchronized operation of multiple units, allowing integration into evaluation systems such as production lines, contributing to improved measurement efficiency and reduced testing costs.

It is a single-channel high-voltage semiconductor pulse generation unit that can output adjustable high-precision, high-voltage pulse signals. - High Voltage Range It supports an output of ±40V, meeting the technical conditions for NVM (non-volatile memory) testing. - High Voltage with Fast Slew Rate A high-voltage pulse source that achieves a fast slew rate of 1000V/μs enables the generation of sharper edges. - PXIe Interface Based on PXIe interface design, it can be fitted into a standard PXIe chassis. Multi-channel expansion is easy, and it supports chassis sharing with other PXIe measurement instruments, allowing for the construction of a highly convenient semiconductor testing system. - Multi-Level Pulse Output It supports 2-level and 3-level pulse outputs, enabling combinations of multiple pulses to meet the needs for multi-stage pulses in semiconductor testing. - ALWG Function It supports user text editing based on CSV, allowing for the output of arbitrary linear waveform signals. - Software Features The GUI is designed to be very intuitive and concise, making it easy to configure the output voltage waveform settings for each channel.

▶ High Precision and High Reliability Current Source Performance Supports output up to 1.5A and achieves a minimum pulse width of 3μs. Optimal control according to load minimizes overshoot and waveform distortion. ▶ High-Speed Test Performance Supports a maximum ADC sampling rate of 100MS/s. NPLC (integration time) values can be user-defined, allowing for flexible test control. ▶ Versatile Cable Design for Multiple Applications Stable output even with output cables up to 2m in length. High layout flexibility makes it suitable for equipment integration. ▶ Real-Time Reading of Pulse Current and Voltage Real-time reading of pulse current and voltage drop on the DUT is possible. Simultaneous monitoring and feedback of test conditions and measurement results. ▶ Synchronized Measurement with Multi-Channel and Multi-Model Synchronized measurements are possible between multiple channels and different SMU modules. Supports the construction of large-scale automated measurement systems.

▶ Adaptive High Precision and High-Speed Control Achieves high-speed and high-precision output even under diverse load conditions with user-configurable APFC parameters. ▶ High-Performance DC Measurement Supports high voltage and high current measurements with 4-quadrant source & measure functionality. Capable of high-resolution measurements of 1fA and 100nV. Equipped with auto-range functionality. ▶ High-Speed Testing Maximum ADC sampling rate of 1MS/s. Supports programmable settings for NPLC values. ▶ Versatile Measurement Modes Supports both local and remote sensing. Features sweep mode with up to 8K points including linear, log, and list options. Allows measurements with user-defined source delay settings. Supports synchronized measurements with an 8-channel internal trigger bus and 2-channel external DIO. ▶ Intuitive UI and Remote Control Remote operation via GUI tools on a PC is possible. Compatible with standard SCPI programming. ▶ Built-in Protection Features Equipped with protection functions against overheating, overvoltage, and overcurrent.

The S2019C is a 4-channel PXIe Source Measure Unit (SMU) that combines high precision, compactness, and high cost performance. It supports both voltage and current output and measurement, with a maximum output of ±40V, ±500mA (DC), and ±1A (pulse). It is compatible with conventional SCPI commands, making programming easy. It widely supports standard PXIe chassis and also supports synchronized operation of multiple cards. The S2019C can be integrated into mass production test environments, contributing to improved test efficiency and cost reduction.

The WAT6600 is a highly efficient parallel parametric test system that supports DC measurements and capacitance measurements, as well as high-frequency characteristic evaluations such as ring oscillator testing and flash memory testing. It can measure multiple channels simultaneously, significantly improving throughput in wafer processes. With a balance of accuracy and speed, it is ideal for mass production lines and evaluation processes. Key features: - Accurate DC/CV measurements - Support for high-frequency applications (such as ring oscillator measurements) - Capability for functional evaluation of flash memory - Reduced test time due to high parallelism

The S2035H is a high-precision, compact, and cost-effective single-channel benchtop SMU (Source/Measure Unit) that supports a voltage output of ±200V and a current output of ±1A (DC) / ±3A (pulsed). It boasts a minimum measurement accuracy of 1fA / 100nV and supports a 6½ digit display. Equipped with a highly visible color LCD and an intuitive GUI, it is an ideal device for research and development, material property evaluation, and microcurrent measurement.