Semi Next List of Products and Services

This product is a full test inspection equipment for LD chips that can be tested from low to high temperatures. It has two inspection stages and can simultaneously test 2 pieces of LD chips under different temperature conditions. It is compatible with LD chips such as DFB, EML, and EML + SOA. When removing chips from the blue sheet, a special method is used to avoid damaging the chips. Please feel free to contact us if you have any inquiries. 【Features】 ■ Supports inspection from low to high temperatures ■ Has two inspection stages ■ Uses a special method to avoid damaging chips when removing them from the blue sheet ■ Supports separation of 4 blue sheets and 8 bins per blue sheet after inspection *For more details, please refer to the PDF document or feel free to contact us.

The "LD (Laser Diode) COC Burn-In Device" is not chamber-type, but rather allows for temperature and power conditions to be controlled for each jig, making it a user-friendly piece of equipment. It supports COCs such as EML and DFB. Up to 4224 pieces of COC can be burned in simultaneously, and burn-in conditions can be freely set for each jig. Additionally, monitoring of optical power during burn-in is possible, and LIV testing is available as an option. 【Features】 ■ Simultaneous burn-in of up to 4224 pieces of LD COC per system ■ Control of temperature and power conditions for each jig ■ Compatible with COCs such as EML and DFB ■ Jigs support wire bonding, loaders, burn-in, unloaders, and COC inspection *For more details, please refer to the PDF document or feel free to contact us.

We would like to introduce our "High-Power LD (Laser Diode) COC Tester," which is a fully automated COS inspection system that includes automatic jig pick-and-place, jig 2D code, and LIV spectrum inspection. In the multi-station inspection, the design of four inspection stations, parallel temperature control of the four stations, and serial LIV and spectrum testing improve the overall inspection efficiency of the machine. The COS jig enhances the stability of inspection parameters through excellent individual temperature control, temperature accuracy, and stability. 【Features】 ■ Fully automated COS inspection system including automatic jig pick-and-place, jig 2D code, and LIV spectrum inspection ■ Design of four inspection stations ■ Parallel temperature control of the four stations ■ Serial LIV and spectrum testing ■ Improved stability of inspection parameters through excellent individual temperature control, temperature accuracy, and stability *For more details, please refer to the PDF document or feel free to contact us.

The "LD (Laser Diode) COC Inspection Device" automatically automates operations and inspections, including fixture pickup, two-dimensional code reading, temperature management, and inspection. The inspection fixtures are shared with the burn-in system, and the COC fixtures do not separate the upper and lower fixtures throughout the entire process from inspection to burn-in, eliminating the need to exchange probe cards in between, significantly improving inspection direct rate and inspection stability. Additionally, depending on the type of fixture, up to 6 sets of fixtures can be placed simultaneously at once. Please feel free to contact us when needed. 【Features】 ■ Fully automates operations and inspections ■ COC fixtures do not separate the upper and lower fixtures throughout the entire process from inspection to burn-in ■ No need to exchange probe cards in between ■ Depending on the type of fixture, up to 6 sets of fixtures can be placed simultaneously *For more details, please refer to the PDF materials or feel free to contact us.

We would like to introduce our "High-Power LD Burn-In Equipment." The entire system accommodates 512 pieces of COS and allows for independent control for each layer. It supports different types of COS without interference between them. A water cooling system dissipates heat from the high-power laser. Additionally, monitoring of optical power is possible during the burn-in process. 【Features】 ■ The entire system accommodates 512 pieces of COS ■ Supports different types of COS without interference ■ Capable of monitoring optical power during burn-in *For more details, please refer to the PDF document or feel free to contact us.

We will be exhibiting at 'SEMICON JAPAN 2025' held at Tokyo Big Sight. This exhibition covers manufacturing technologies, equipment, and materials in the semiconductor industry, as well as SMART applications such as vehicles and IoT devices, making it an international exhibition for electronics manufacturing. Highlights of our booth products include "Test Solutions for CPO," "Semiconductor WAT/Reliability Evaluation Solutions," and "KGD/Wafer Aging Tests for Power Semiconductors." We sincerely look forward to your visit. 【Event Overview】 ■ Date: December 17 (Wed) to 19 (Fri), 2025, 10:00 AM to 5:00 PM ■ Venue: Tokyo Big Sight ■ Address: 3-11-1 Ariake, Koto-ku, Tokyo 135-0063 ■ Booth Number: W3232, West Hall 3rd Floor ■ Pre-registration for attendance is required. *For more details, please feel free to contact us.