日本レーザー List of Products and Services

This is an inline UV spectrophotometer for bioprocess applications. It enables stable real-time analysis through high-resolution continuous absorbance measurements. It is ideal for inline monitoring applications such as measuring the concentration and purity of nucleic acids (DNA, RNA) and proteins, as well as cell concentration and enzyme reactions. - Wavelength range: 190–440 nm - Long-lasting UV light source with up to 2 years of continuous operation - Durable and hygienic measurement cell - Equipped with traceable calibration and validation functions - Digital connections: PROFINET, EtherNet/IP, Modbus TCP/IP - Environmentally friendly: mercury-free, compliant with RoHS

• Spectroscopic Analysis Equipment

Moxtek's wire grid polarizing beam splitter (PBS) is an optical element that achieves high-efficiency polarization separation using nanowire technology. It accommodates a wide range of incident angles and low f/# optical systems, demonstrating excellent performance from visible light to near-infrared. It is a highly reliable polarization control solution suitable for various applications such as display devices, HMDs/HUDs, and analysis and inspection equipment.

• Other optical parts

Moxtek's meta-lenses/meta-surface optics are products that utilize nanostructure technology to achieve traditional thick and heavy lenses as flat and compact optical elements. They are compatible with wavelengths ranging from visible light to near-infrared and provide a consistent process from design and prototyping to wafer-level mass production, evaluation, and packaging. In addition to standard visible meta-lens plates, they also accommodate custom designs and mass production of nanostructured devices according to specific applications. With a minimum pillar structure of 70nm and flat optical elements compatible with Ø200mm wafers, they offer high optical performance while being thin and lightweight. They support wavelengths from visible light to near-infrared and enable highly flexible light control unique to meta-lenses. They can be used in a wide range of applications, including camera modules, AR/VR, sensing, imaging, and lighting optics. Custom designs and mass production of nanostructured devices are also available according to specific applications.

• lens

The K2-1000-mini is an ultra-low noise turnkey laser ideal for OEM integration. It can be used as a mode-locked femtosecond light source or as a dual-comb mode-locked light source that generates two pulse trains from a single cavity (optional). The K2-1000-mini is also perfect for optical frequency comb applications, high-precision distance measurement, gas sensing, pump-probe experiments, as well as traditional laser oscillator applications such as two-photon microscopy, amplifier seeding, and timing distribution.

• Spectroscopic Analysis Equipment

A dual-comb laser is a technology that simultaneously generates two optical frequency combs with slightly different repetition frequencies and utilizes their interference to enable high-speed and high-precision measurements. K2 Photonics' K2-ASOPS and K2-1000 adopt a rare "single cavity configuration," generating two mode-locked femtosecond optical combs from a single laser resonator. This structure allows the device to be compact and highly stable, with extremely low relative timing jitter and intensity noise (RIN). These characteristics are difficult to achieve with the conventional method of synchronizing two independent lasers. Both models are designed for easy use with turnkey operation and are capable of long-term, high-load operation in industrial applications.

• Spectroscopic Analysis Equipment

This is a wavelength meter for testing optical transceivers that achieves high precision, high speed, and low cost. It employs proven interferometer-based technology to accurately measure the wavelength of transceivers with a precision of up to ±0.3 pm. High-speed measurements enhance testing efficiency and improve production throughput. It covers a wide communication band while balancing speed and cost performance, making it ideal for WDM transmission systems, data centers, 3D sensing, and LIDAR applications.

• Optical Measuring Instruments

This is a high-speed scanning spectrometer that covers the visible light to mid-infrared range. With proprietary technology, it measures the light source spectrum with high precision, making it ideal for absorption, transmission, and reflection spectrum analysis. Despite its compact size, it covers a diverse range of wavelengths and can be widely used from research and development to quality control.

• Near-infrared spectrophotometer

HERA VIS-SWIR can capture hyperspectral images with 1.3 million pixels over an ultra-wideband spectral range (400-1700nm). It can simultaneously measure and combine information from the visible light range and the near-infrared range of short-wavelength infrared.

• Color camera

It has been developed to meet the needs for subsurface defect inspection and classification functions of silicon carbide (SiC) and gallium nitride (GaN) based wafers and compound semiconductor materials. A variety of wafer processing options are available, minimizing the cost per pass while providing best-in-class throughput and sensitivity, catering to both research and development and mass production.

• Circuit Board Inspection Equipment

High-speed laser defect scanner for substrates, PrimaScan series. It is a defect inspection imaging device that visualizes defects on substrates such as glass substrates, semiconductor substrates, and display substrates. It achieves high-speed measurements and high PSL particle sensitivity in the nanometer range. Compatible with transparent, translucent, and opaque substrates. The lineup includes PrimaScan, PrimaScan R&D, and PrimaScan P, catering to sample sizes up to 600mm x 600mm. It can be used for wafer incoming inspection, wafer chuck inspection, inspection of blanket films (wafer with film), inspection of internal stress and gaps in micro-lens arrays for AR/VR/MR applications, and inspection of coating defects in photoresists.

• Circuit Board Inspection Equipment

Resolution of ≦100nm. Super-resolution Microsphere Amplifying Lens (SMAL) can be used for non-contact and non-destructive inspection of silicon wafers in semiconductor manufacturing processes.

• lens

It is possible to observe beyond the diffraction limit with spatial resolution below 100nm, allowing for non-destructive, full-color observation of nanoscale structures. It can be used for semiconductor research and development, as well as advanced material imaging, or as an alternative to SEM and AFM. The objective lens can also be sold separately.

• Optical microscope

This is an all-fiber high-power femtosecond fiber laser. It is ideal for applications such as polymer cutting, laser micromachining, surface structuring, integrated photonics devices, display manufacturing, and consumer electronics manufacturing. It can operate even at 40G vibrations with a SESAM-free oscillator.

• Laser marker

Available with maximum outputs of 10W, 20W, 30W, and 60W. Achieves hands-free operation and long-term stability. Excellent robustness due to SESAM-free technology, making it suitable for use in harsh environments.

• Laser marker

Compact femtosecond laser. Maximum average output of 7W. This is an all-fiber laser that can also be integrated into OEM applications. It requires little maintenance and offers excellent cost-effectiveness.

• Laser marker

Combining flexibility, outstanding performance, and user-friendly operability, it achieves measurement quality comparable to high-end products from established AFM manufacturers. It is equipped with a wide range of functions for nanoscale imaging and characterization. It also enables electrical property measurements (KFM, C-AFM) and features a soft IC mode that can measure fragile samples.

• Other microscopes

Achieves spectral scanning with over 80% transmittance in the 400 to 1000 nm range for optimal sensitivity. Also realizes high temporal resolution without pulse width broadening using a diffraction grating.

• Other optical parts

This is a compact, standalone state-of-the-art gain-switched picosecond laser designed to meet the stringent demands of the life sciences and materials science fields. The Unico laser system is designed to deliver precise and high-quality pulses in the picosecond range, making it an ideal tool for time-resolved fluorescence spectroscopy and imaging.

• Laser marker

Comprehensively evaluate the image quality of the test device (DUT) for AR/XR glasses and subassemblies, measuring eye box, field of view (FOV), binocular disparity, contrast ratio, color, uniformity, and geometric distortion.

• Optical Measuring Instruments

Non-contact measurement of how the position of the virtual world changes based on the position of the robot. Consistent testing of tracking and latency is possible.

• Optical Measuring Instruments

Achieving consistent quality control throughout all processes of AR light guide plate manufacturing. Realizing high throughput. Equipped with automatic pass/fail judgment and motion control. Possesses an API that enables advanced analysis and high scalability.

• Optical Measuring Instruments

It is possible to reliably and automatically measure the image quality of all AR light guide plates, regardless of type or configuration. This is an R&D model ideal for prototype manufacturing and small-scale production.

• Optical Measuring Instruments

It is possible to measure all types of grating samples regardless of type or substrate, measure the pitch and direction of the diffraction grating, and detect defects in the grating structure with high precision on the picometer and arc-second scale. The uniformity of the grating structure can be evaluated over a wide area.

• Optical Measuring Instruments

A laser compatible with near-infrared to ultraviolet (NIR-UV), with a maximum output of 300µJ @ 1064nm. Suitable for LiDAR, MALDI-TOF mass spectrometry, and LIBS (laser-induced breakdown spectroscopy). Its compact design makes it easy to use for embedded applications.

• Laser marker

This is a wavelength-tunable nanosecond laser mainly used for photoacoustic imaging, laser spectroscopy, LiDAR, and biomedical applications. The excitation laser light source, OPO module, power supply, and cooling system are integrated into a movable cabinet, allowing for flexible use by customers.

• Laser marker

An imaging device for time-resolved micro-photoluminescence spectroscopy that integrates spatial, spectral, and lifetime measurements. It is capable of acquiring both high-resolution steady-state emission spectra and time-resolved emission spectra for specific areas or points of interest.

• Laser microscope

Selectable excitation wavelengths from 375 to 1060 nm. The lifetime detection range with picosecond timing resolution is from several ps to several ms. It is ideal for research on solar cell materials and perovskites, as well as for characterizing materials for displays and LEDs.

• Laser microscope

Compatible with 12 inches. AFM-IR device PiFM / PiF-IR. A cutting-edge nano-chemical measurement device ideal for research and development in nanofabrication and failure analysis. This AFM achieves top-class automation in the industry. *For more details, please contact us.

• Visual Inspection Equipment

The power supply for the He-Ne laser is designed for long life, low noise, and suitability for OEM integration. It also supports remote operation. With control by the latest microcontroller, it is compatible with various laser models.

• power supply

Multichannel desktop lasers for experimental and research purposes, such as PDT (Photodynamic Therapy), PIT (Photoimmunotherapy), and PTT (Photothermal Therapy). Up to 4 channels of lasers can be installed. Compatible with wavelengths from 375nm to 1550nm.

• Laser microscope

The "BrixX-PDT" series of high-output semiconductor lasers is an ideal light source for research and development in laser light cancer treatment and diagnosis, such as PDT (Photodynamic Therapy), PIT (Photoimmunotherapy), and PTT (Photothermal Therapy). It can provide a wide range of wavelengths, including 405nm, 635nm, 650nm, 665nm, 690nm, and 750nm, depending on the absorption wavelength of the photosensitive substances used.

• Laser microscope

● Equipped with micro-scan technology to achieve a maximum resolution of 3.1 megapixels ● Maximum temperature detection accuracy <±1% ● Maximum temperature resolution <0.02℃ ● Supports high-speed shooting with a maximum frame rate of 240Hz ● Compliant with IP67 housing for harsh environments and outdoor use ● Capable of shooting with external triggers ● A wide variety of lenses and analysis software available For more details, please contact us.

• Thermography

This is a digital sampling oscilloscope with a high-quality and high-precision time base, as well as a low jitter mode. It achieves ultra-low jitter performance. It is cost-efficient and scalable, with high expandability. It can perform high-precision measurements simultaneously, optimizing test throughput and reducing overall testing costs. Its compact design allows for easy integration into devices with remote control and API. The newly designed VISEYE visualization and analysis software provides powerful, intuitive, and user-friendly measurements.

• oscilloscope

Corresponding to shortwave infrared (900 – 2300 nm). The hyperspectral camera HERA Extended SWIR employs Fourier Transform (FT) detection technology, achieving excellent spatial spectral resolution and high sensitivity even under low illumination. It features a resolution of 320×256, a 4-stage TE cooler, and a 14-bit sensor, enabling high definition.

• Color camera

HERA SWIR is a compact and robust camera that corresponds to a spectral range of 900nm – 1700nm, enabling an innovative approach to spectral imaging. It utilizes a unique patented time-domain Fourier transform (FT) detection technology, allowing for excellent spatial spectral resolution and outstanding sensitivity even in low light conditions. Equipped with a cooled InGaAs (640×512) 14-bit sensor, it achieves high definition.

• Color camera

The hyperspectral camera HERA is compatible with visible light to near-infrared (400 – 1000 nm). Based on Fourier Transform (FT) detection technology, it achieves excellent spatial spectral resolution and outstanding sensitivity in low light conditions. It is equipped with a 1280 x 1024 CMOS sensor. With a compact and robust design, this camera features exceptional light transmission with a 1 cm clear aperture.

• Color camera

It is a highly integrated plug-and-play system best suited for wide-field laser illumination. Equipped with up to six lasers and six modulation inputs, it offers unparalleled flexibility. An optional built-in ND filter for switching is available.

• Laser microscope

This is an AFM-IR device that achieves sub-5 nm IR spatial resolution. It is a compact and self-contained system. The optical system allows for easy quick change and switching, and access to the sample is straightforward.

• Other microscopes

Achieve sub-10 nm PiFM chemical mapping. It is possible to obtain detailed nanoscale chemical mapping and point spectra that are more precise than FTIR and nano FTIR. PiF IR spectra can be scanned at the fastest speed of 100 milliseconds per point, allowing for measurements to be taken in a short time.

• Other microscopes

In addition to high spatial resolution chemical imaging, it also supports nanoscale IR spectroscopy for nano foreign substance analysis. It is compatible with the IR library as well. It supports not only 8-inch wafers but also 152mm photomask samples.

• Other microscopes

Wavelengths of 320, 349, 532, 640, and 780 nm, narrow line width (< 0.5 MHz), very low intensity noise (< 0.1% RMS), and diffraction-limited TEM00 beam. The unique optical architecture and hermetically sealed package ensure very stable operation and performance over long periods. It demonstrates high robustness and durability for demanding embedded applications. Additionally, it is ideal for advanced research applications requiring high precision, stability, and spectral purity, such as Raman spectroscopy, interference experiments, holography, and quantum technology development.

• Laser microscope

It has the flexibility to easily change the re-coating materials and fiber coating sizes. The silicone mold accommodates coating sizes from 80 to 900 μm, and custom sizes are also available (coating sizes over 900 μm can be accommodated as well). The re-coating length ranges from 34 to 100 mm. *For more details, please contact us.*

• Other processing machines

Completely removes acrylic coating through a fully automated process. It removes residues while maintaining the strength and integrity of the fibers. *For more details, please contact us.*

• Other processing machines

Fiber diameter 80 µm to 2500 µm, splice loss < 0.1 dB. Clean and contamination-free fusion through heating using a CO₂ laser is possible. Also compatible with glass processing solutions. *For more details, please contact us.

• Other processing machines

Clad diameter: 125 – 1200 µm, fiber coating: 250 – 1500 µm, models compatible with 3D image generation are also available. *For more details, please contact us.*

• Other inspection equipment and devices