アナリティクイエナジャパン Product Lineup

This device, optimized for routine measurements such as quality control, achieves high versatility and reliability with advanced automation through various options. 【Features】 ■ Improved sample processing capability with an 8-lamp changer ■ Switchable between single and double beam ■ D2 background correction ■ Equipped with RFID tool for coded lamps ■ Super lamp power supply for the best analytical performance ■ Built-in camera (optional) to observe sample injection and drying in the graphite tube

This is a new atomic absorption analysis device that overturns the conventional concept of atomic absorption analysis equipment, developed for the first time in the world by Analytik Jena using the xenon continuous light source background correction method. It covers all wavelength ranges used in atomic absorption analysis with a single light source, and in frame measurements, it allows for a reduction in measurement time through sequential measurements. The high-resolution optical system enables visual confirmation and separation of nearby lines. The high-precision background correction function, unaffected by nearby line interference, has significantly improved the accuracy of measurement results. 【Features】 ■ Equipped with a high-resolution echelle spectrometer (0.002nm/200nm) ■ Multi-element sequential rapid measurement with xenon continuous light source/CCD detection ■ Expansion of the measurement concentration linear range through multi-wavelength measurement of the same element and dynamic mode ■ Enhanced analytical capabilities by utilizing not only atomic absorption lines but also molecular absorption lines ■ Detailed data analysis through 2D and 3D data display ■ Direct analysis of solid samples is possible (optional: solid sampler) ■ High reliability of data and excellent automation efficiency with an auto-sampler ■ Analytik Jena offers a unique 10-year warranty on the optical system.

The magnetic field strength can be variably set up to a maximum of 1.0 Tesla to perform optimal corrections. In addition to the conventional Zeeman correction (2-field mode; on, off), a 3-field mode (off, medium, high magnetic field) is now possible, expanding the measurement concentration range to the mg/L order and significantly broadening the application areas. 【Features】 ■ Improved sample processing capability with an 8-lamp changer ■ Switchable between single and double beam ■ D2 background correction, third-generation Zeeman background correction ■ Equipped with RFID tool for coded lamps ■ Direct measurement of solid samples as well as liquid samples is possible ■ Unique cross-heating graphite furnace achieves ideal atomization ■ Optimal atomization and ashing temperatures, 2-field/3-field background correction enable ideal measurements ■ Unique variable magnetic field 3-field mode extends the linearity range of the calibration curve ■ Built-in camera allows observation of sample injection and drying within the graphite tube ■ Automatic burner height adjustment function ensures optimal frame measurement

It is possible to directly measure solid samples in a furnace without pre-treatment, which takes time and can cause contamination. 【Features】 ■ Automatic direct measurement of solid samples ■ Automatic introduction of samples into the furnace ■ Automatic weighing with an integrated microbalance ■ Automatic measurement of up to 42 samples 【Advantages of Direct Solid Measurement】 ■ Samples can be measured directly as they are ■ No need for solution preparation through decomposition or dissolution ■ No risk of contamination ■ High sensitivity ■ Only a small amount of sample is required (μg, mg) ● For other functions and details, please contact us.