アイテス Product Lineup

The Solar Panel Checker Solamente-iS SI-200 is an inspection device that detects cluster failures* by placing a sensor on the surface of panels during power generation. It senses the generated current flowing through the interconnector and displays it in musical notes and LED levels, allowing for instant identification of clusters that are not generating power. (*Cluster failures can occur due to initial defects, aging deterioration, lightning damage, etc.) With just a press of a button, the built-in illuminance sensor automatically adjusts the sensitivity. The measurement speed is approximately 5 seconds per panel, making it high-speed. With the super long extension pole (optional), it can reach panels up to 3.6 meters away.

A new feature of Solamente that detects faulty panels during pre-power transmission inspections and power outage inspections. A new inspection method that links SZ-200 and SI-200. Inspection Method By linking Solamente-Z (SZ-200) and Solamente-iS (SI-200), sensors (SR-200) check the panels along the string circuit. Faulty panels are located where the sensor's response is interrupted.

The hassle of removing PV cables for inspection of CIS thin-film panels has been eliminated. With high-speed checks from the panel surface during power generation, the efficiency of CIS inspections has dramatically improved. By simply replacing the sensor unit of the Solamente-iS SI-200, the Solamente CiS Adapter (optional) SC-200 allows for high-speed inspection of CIS thin-film panels when attached to the already widely used Solamente-iS (SI-200) in solar panel inspection sites. By utilizing the iS panel checker function, which detects power generation current from the panel surface, for CIS panels, economical CIS panel inspections have become possible. Without removing the PV cables, it is now easy to efficiently identify failures in CIS thin-film panels (such as bypass diode shorts) in a short amount of time.

The String Checker Solamente-Z SZ-200 is an inspection device that probes each string P/N terminal of the connection box to detect strings with fault panels. It applies a special detection signal to the string circuit, measures the open circuit voltage and series resistance (impedance), and identifies strings with abnormalities. The SZ-200 achieves fast inspections, is resistant to changes in sunlight, and offers high operability, ensuring reliable results and significantly improving the efficiency of inspection work.

24 million pixel high-definition camera Auto focus Automatic power control Supports bulk measurement of large modules Easy yet high-performance image processing software Achieves a low price of one-third that of conventional models Free sample evaluation demo available.

Free sample evaluation demo now available. POPLI is an advanced PL imaging device that adds a PL imaging unit as an option to the EL image inspection device PVX, achieving clear PL imaging and cost-effectiveness by utilizing the detection capabilities and software of the PVX.

The PVX1000+POPLI-μ allows for photoluminescence observation of the fine structure of wafers during the solar cell manufacturing process using a microscope. In the case of PERC, it is possible to evaluate individual Local-BSFs based on PL intensity and assess the damage to the passivation layer around the laser contact holes. Additionally, defect location identification is possible through EL observation of the module using a DC power supply.

The PVX1000+POPLI-Octa can evaluate wafers during the solar cell manufacturing process using photoluminescence. It is capable of assessing the passivation effects of the PN junction layer after thermal diffusion, the AR layer deposition, surface contamination, as well as the protective effects of the rear insulation layer and the evaluation of Local-BSF. Additionally, by using a DC power supply for EL observation of the module, it is possible to pinpoint the locations of defects. By applying reverse bias to the module and observing LEAK points, defects that have caused PID can be easily identified.

The String Checker Solamente-Z SZ-1000 can identify solar panel failures on a string-by-string basis. The SZ-1000 is an inspection device that probes each string P/N terminal in the junction box to detect the string with the faulty panel. It applies a special detection signal to the string circuit and measures the open circuit voltage and series resistance (impedance) to determine the string with abnormalities. The SZ-1000 supports DC voltages up to 1500V for high voltage and extra high voltage applications. Its user-friendly operability has been inherited from the SZ-200, and it has become even easier to read with a large LCD display.

The "eSoraMente" series is a 750V compatible device for residential and small-scale solar power generation systems. It includes the eSoraMente-Z eZ-10 and the current sensor eA-10. The eZ-10 is an inspection device that probes the P/N terminals of each string in the junction box to detect strings with faulty panels. It applies a special detection signal to the string circuit, measures the open-circuit voltage and series resistance (impedance), and identifies strings with abnormalities. If an abnormal string is detected during the string measurement with the eZ-10, the current sensor eA-10 is connected to the eZ-10 to identify the faulty panel. The eA-10 is an inspection device that places a sensor on the surface of the panels while they are generating power to detect cluster failures*. It senses the power generation current flowing through the interconnector and alerts you with sound if there are clusters that are not generating power. (*Cluster failures occur due to initial defects, aging deterioration, lightning damage, etc.) The eSoraMente is designed to be compact and simple, pursuing further ease of use.

●Calibration This is a service to check whether the measurement values of the measuring instrument are appropriate. Regular calibration is necessary to maintain the reliability of the measurement values. ●Inspection You can check the health status of the measuring instrument. By quickly identifying the source of any malfunctions, it also helps to prevent troubles.

● Evaluation/Analysis of Solar Cell Modules We conduct failure analysis and performance evaluation of solar cell modules. - Non-destructive testing: We reveal failure conditions through EL measurements and output measurements equivalent to product shipment inspections. - Destructive testing: We identify the causes of failure through cross-sectional component analysis of the defective parts. ● On-site Investigation We investigate the damage to solar panels caused by natural disasters and the causes of power generation decline. - We propose appropriate methods, starting with measurements using Solament, to investigate failure conditions and causes. - Based on the investigation results, we provide a survey report for insurance companies.

The "Reuse Checker RUC-100" is a simple diagnostic device designed to allow individuals without electrical expertise to determine defective solar panels. It automatically assesses five measurement items comprehensively and displays the results as pass/fail on an LCD screen, making it easy to sort and judge. Measurement items can be saved in the device's built-in memory for each panel, and CSV data can be output. 【Features】 ■ Displays pass/fail results on an LCD screen ■ Easy sorting and judgment ■ Five measurement items can be saved in the device's built-in memory for each panel ■ CSV data can be output *For more details, please refer to the PDF document or feel free to contact us.

The PVX1000+POPLI-μ allows for photoluminescence observation of the fine structure of wafers during the solar cell manufacturing process using a microscope. In the case of PERC, it is possible to evaluate individual Local-BSFs based on PL intensity and assess damage to the passivation layer around laser contact holes. Additionally, defect location identification is possible through EL observation of modules using a DC power supply.

The PVX1000+POPLI-Octa can evaluate wafers during the solar cell manufacturing process using photoluminescence. It is capable of assessing the passivation effects of the PN junction layer after thermal diffusion, the AR layer deposition, surface contamination, as well as the protective effects of the rear insulation layer and the evaluation of Local-BSF. Additionally, by using a DC power supply for EL observation of the module, it is possible to pinpoint the locations of defects. By applying reverse bias to the module and observing LEAK points, defects causing PID can be easily identified.

Free sample evaluation demo now available. POPLI is an advanced PL imaging device that adds a PL imaging unit as an option to the EL image inspection device PVX, achieving clear PL imaging and cost-effectiveness by utilizing the detection capabilities and software of the PVX.

24 million pixel high-definition camera Auto focus Automatic power control Supports bulk measurement of large modules Easy yet high-performance image processing software Achieves a low price of one-third of conventional models Free sample evaluation demo now available.

I would like to introduce "TEM observation of PL emission sites in SiC." The basal plane dislocations (BPD) present in SiC substrates are known to amplify defects during forward bias, degrading device characteristics. In this study, we identified small BPDs using photoluminescence (PL) and observed the emission sites with TEM. By identifying defect locations and obtaining an overall view through PL, detailed observation of the defect areas with TEM becomes possible. For more details, please refer to the materials provided. 【Device Overview (Partial)】 ■ PL (Photoluminescence) ■ Equipment used: In-house PL imaging device ■ Excitation light: Ultra-high pressure mercury lamp UV light source (285–350nm) ■ The observation wavelength can be selected based on the type of defects to be captured. *For more information, please download the PDF or feel free to contact us.