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  3. アイテス
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Electronic Components and Semiconductors
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アイテス

EstablishmentJanuary 1, 1993
capital3000Ten thousand
number of employees106
addressShiga/Otsu-shi/1-60 Kuribayashi Town
phone077-599-5015
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last updated:Nov 27, 2025
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Defects and Physical Analysis Defects and Physical Analysis
Processing observation Processing observation
Surface and chemical analysis Surface and chemical analysis
Reliability test Reliability test
Electrical equipment repair Electrical equipment repair
Wafer processing Wafer processing
Solar panel inspection and testing equipment Solar panel inspection and testing equipment
Equipment held Equipment held
Equipment

Equipment held

We would like to introduce the equipment owned by Aites.

Aites Device List

This is a list of devices used for analysis, evaluation, and testing services at AITES.

Aites is a solution-oriented company that sincerely addresses customer challenges in cutting-edge industrial fields. We utilize various owned devices to provide optimal solutions. ■ Product Analysis / Defect Analysis / Failure Analysis Morphological observation, electrical characteristic measurement, defect analysis, failure analysis, sample processing ■ Reliability Evaluation Testing Reliability evaluation testing, ESD/latch-up testing, strength testing, optical characteristics ■ Physical Analysis / Chemical Analysis Physical analysis, surface analysis, chemical analysis

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Tabletop SEM (Scanning Electron Microscope) 'TM3030Plus'

Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.

We handle the tabletop SEM (scanning electron microscope) 'TM3030Plus' manufactured by Hitachi High-Tech. It has been half a century since SEM observation became common, and it has become an important observation method in various fields. With the "charge reduction mode" of the tabletop SEM, it is possible to observe and analyze samples that cannot be observed with FE-SEM. This capability is applicable not only in the semiconductor and electronic components fields but also in life sciences and biological fields. 【Features】 - For conductive samples such as semiconductors and electronic components, SEM observation is mainly recommended in normal/conductive mode. - For non-conductive samples such as plastics, paper, rubber, ceramics, and biological samples containing moisture or oil, SEM observation in surface/normal/charge prevention mode is recommended. *For more details, please refer to the PDF document or feel free to contact us.

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Repeated decompression test

Repeatedly perform tests by reducing pressure and check the timing of leaks from the pressure data!

The "Decompression Repeated Test" is a test conducted on components that require airtightness, where the pressure is reduced to a specified level using a vacuum pump to check for any leaks. It is possible to perform a durability test that alternates between decompression and open state, and it can also be conducted in a heated/cooling state in combination with an environmental test chamber. In a state of reduced pressure at the specified pressure using a vacuum pump, the pressure is held for a specified time, and the results are checked to confirm that no leaks have occurred in the test item. 【Device Specifications】 ■ Decompression Pressure: Max -70kPa (gauge pressure) ■ Maximum Number of Cycles: Max 32,000 cycles ■ Pressure Holding Time: Max 3,000 seconds ■ Monitor: Recording of the pressure sensor values (gauge pressure) during the test ■ Connection with Test Item: Air tube (connection method will be adapted to the test item) *For more details, please download the PDF or feel free to contact us.

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