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  3. 日本カンタム・デザイン
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Testing, Analysis and Measurement
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日本カンタム・デザイン

EstablishmentOctober 13, 2010 *Founded July 1, 1997
capital6000Ten thousand
number of employees30
addressTokyo/Toshima-ku/2nd Floor, Fujita Building, 1-11-16 Nishii Ikebukuro, Takamatsu
phone03-5964-6620
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last updated:Nov 07, 2023
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日本カンタム・デザイン List of Products and Services

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Nanotechnology Nanotechnology
Commissioned measurement Commissioned measurement
Life Science Life Science
Quality Management - Process Monitor Quality Management - Process Monitor
Semiconductors and Electronics Semiconductors and Electronics
Materials Science Business Materials Science Business
Magnetic properties and physical property measurement Magnetic properties and physical property measurement
Nanotechnology

Nanotechnology

Products related to nanotechnology, such as nanoparticle analysis and nanofabrication.

High-resolution Fourier-transform infrared spectrometer nano-FTIR

Infrared imaging and spectroscopic measurements are possible, achieving a spatial resolution of 10 nm.

The nano-FTIR【neaSCOPE】 manufactured by attocube systems is a Fourier-transform infrared spectrometer that performs spectral imaging and spectral measurements with a maximum resolution of 10nm. Using patented technology, it extracts only the infrared spectrum from scattered light, achieving a spatial resolution of 10nm. The excitation wavelengths range from visible to terahertz, supporting further exploration in material science. It is ideal for various fields that require higher spatial resolution, including scientific disciplines, semiconductor technology, polymer chemistry, and life sciences. 【Features】 ■ Patented background noise removal technology by attocube systems ■ Achieves imaging and spectral measurements with high spatial resolution of 10nm ■ Developed a dedicated AFM that enables high reproducibility and high-sensitivity detection ■ Allows measurement of bulk cross-sections with sample preparation suitable for AFM measurements ■ No need for sample thinning! For more details, please contact us.

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Compact LED Direct Drawing Device "Micro Writer ML Family"

Compact tabletop! A maskless LED direct drawing device that enables high-speed pattern prototyping.

The "Micro Writer ML Family" from Japan Quantum Design is a compact, desktop LED direct drawing device that enables high-speed pattern prototyping without the need for masks. It allows for quick prototyping of small patterns without the hassle of creating masks each time a pattern is made. It is capable of directly drawing on photoresist using LEDs. 【Features】 ■ Compact desktop size (base area 70cm x 60cm) ■ Enables high-speed pattern prototyping ■ Eliminates the need for mask creation each time ■ Capable of direct LED drawing on photoresist *For more details, please refer to the PDF materials or feel free to contact us.

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Atomic Force Microscope (AFM)

Introduction of atomic force microscopes (AFM) capable of proposing customized solutions for various systems, from research use to production sites.

Our company offers a user-friendly atomic force microscope (AFM) that allows for easy and quick measurement of surface shapes. We have a lineup of models including the "CoreAFM," which features an active vibration isolation mechanism and supports a variety of measurement modes, and the compactly designed "NaioAFM," which allows for smooth cantilever replacement using dedicated tools. Customization options are available, ranging from small models for research environments to large stage models for production sites, as well as automated systems for quality control. 【Lineup (excerpt)】 ◎ Desktop Atomic Force Microscope "CoreAFM"  ■ Equipped with active vibration isolation and wind protection  ■ Capable of supporting 32 types of measurement options ◎ Compact Atomic Force Microscope "NaioAFM"  ■ Integrates controller, XY stage, wind protection, and vibration isolation  ■ Equipped with a high-resolution top-view optical camera *We are currently distributing a catalog summarizing the scanning probe microscopes we handle. Detailed information can be viewed via "PDF Download."

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Compact AFM "NaioAFM" *Demo now available

Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

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Active Vibration Isolation Table "IsoStage300"

Improve measurement efficiency and data quality with Spike-Guard! Compatible with other manufacturers' AFMs as well.

AFM and STM are highly sensitive, which means they can pick up vibrations below a nanometer as noise. For measurements where such vibrations are problematic, an active vibration isolation table is necessary. The "IsoStage300" detects vibrations transmitted to the device using piezo sensors and drives the top plate with actuators in six degrees of freedom (three axes) to cancel the motion and provide vibration control. It can reduce low-frequency vibrations starting from 1 Hz, canceling 93% (23 dB) at 5 Hz and 99.0% (40 dB) at 15 Hz. Additionally, it effectively reduces noise in low-frequency bands, which is difficult to achieve with passive vibration isolation tables. 【Features】 ■ Highest level of vibration isolation performance ■ Spike-Guard function enhances measurement efficiency and quality ■ Compatible with compact products from NanoSurf (Can also be used with other manufacturers' AFMs if they meet size and weight requirements) *For more details, please visit our website or feel free to contact us.

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NanoParticle Analysis Device NanoSight Pro

Rapid, easy, and accurate evaluation of the properties of biomaterials and nanomaterials!

The NanoSight Pro, newly released in September 2023, allows for the visualization of the Brownian motion of nanoparticles in liquid on a PC screen through "Nanoparticle Tracking Analysis (NTA) technology," enabling real-time observation. The renewed software 'NS Xproler' enhances usability while incorporating a wealth of user assistance features, reducing the time from preparation to measurement and contributing to efficient analysis. By analyzing the Brownian motion of each particle, it is possible to obtain high-resolution particle size and concentration distribution graphs.

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[Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist

We will propose solutions in the semiconductor field, which we specialize in, tailored to our customers' needs!

In addition to our expertise in nano-order surface analysis equipment, we also propose resist solutions and maskless exposure devices for semiconductor processes.

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