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Electronic Components and Semiconductors
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オーテックス

addressTokyo/Shinjuku-ku/5th floor, Yotsuya ISY Building, 2-12-5 Yotsuya
phone03-3226-6321
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last updated:Apr 08, 2024
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Laser Laser
3D printer 3D printer
Camera Camera
Laser goggles Laser goggles
Optics / Coating Optics / Coating
Optomechanics Optomechanics
Piezo/Stage Piezo/Stage
Piezo motor/stage Piezo motor/stage
Linear motor Linear motor
Magnetic Field Control Motor Magnetic Field Control Motor
AO/EO device AO/EO device
Scanning system Scanning system
Detector Detector
Measuring instrument / film thickness gauge Measuring instrument / film thickness gauge
Capillary Capillary
Fiber Fiber
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Terahertz-related Terahertz-related
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Measuring

Measuring instrument / film thickness gauge

Our measuring instruments/thickness gauges are widely used in fields that require high positional accuracy, such as optical system alignment, interferometers, precision machining, precision measurement, and semiconductor-related equipment.

ThetaMetrisis Non-Contact Portable Film Thickness Gauge

Suitable for measuring film thickness. A non-contact portable thickness gauge that can also measure multilayer film thickness simultaneously.

The non-contact portable film thickness gauge is powered via PC (USB port). It can be brought to research and manufacturing sites for instant measurement. This non-contact film thickness gauge from ThetaMetrisis is easy to use not only in laboratories but also in the field. 【Features】 ○ Simultaneous measurement of multi-layer film thickness is possible! → Example: PMMA/poly-Si/Si3N4/SiO2 It can measure thicknesses of up to 10 layers. ○ Real-time monitoring can be used for uncured coatings, curing shrinkage rates, expansion properties, on-site inspections during various manufacturing processes, film formation monitoring, chemical reactions, biochemical reactions, and more. ○ Optical property evaluation, analysis of optical constants (n, k), transmittance, absorbance, reflectance measurements, etc., are also possible. For more details, please contact us or download the catalog.

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High-Speed PSD Signal Processing System "SEEPOS NEW"

Measurement of DCLight sources and pulsed light sources is possible up to nW~mW!

The high-speed PSD signal processing system "SEEPOS NEW" can measure DCLight sources and pulsed light sources ranging from nW to mW. The included software allows for adjustments of Bias, Gain, pulse modulation, etc., and enables setting optimal parameters while viewing the screen. 【Features】 ○ High-performance 16-bit ○ A/D conversion at 1MHz ○ Full-speed data transfer For more details, please contact us or download the catalog.

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Autocorrelator "FROG SCAN"

High measurement dynamic range

It is ideal for pulse width measurement of fiber lasers around 100 femtoseconds for mode-locked femtosecond pulse lasers. 【Features】 ○ LabVIEW-based, source code available ○ Easy setup ○ Fiber coupled mechanism (optional) ○ Compact size (16cm x 30.5cm) For more details, please contact us or download the catalog.

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Detector: "Ultra High Sensitivity Wideband Detector"

Compact, robust, high sensitivity, low noise, and easy to handle.

GreenTEG is a Swiss startup company that has developed high-sensitivity detectors for measuring Heat Flux. Leveraging their high sensitivity and wavelength independence, they have begun manufacturing detectors for laser measurement. With features such as compactness, robustness, high sensitivity, low noise, and ease of handling, they are advancing OEM supply for laser integration applications. 【Features】 ○ Accurately measures laser power up to 50W ○ Wideband, high-sensitivity detector from UV to IR ○ Achieves a fast response time of 200ms with thermal sensors For more details, please contact us or download the catalog.

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Film Thickness Measurement Device

A film thickness measuring device designed not only for research purposes but also for use in production environments.

The "Film Thickness Measurement Device" is a product of THETA METRISIS, handled by Outex. It is a film thickness measurement system that uses white light reflection spectroscopy, capable of measuring from the nano range to the micron range. A variety of models are available to suit different applications, ranging from convenient portable types to large stationary types. We offer numerous modules necessary for measurements in high temperatures, in liquids, microscope attachment types, gas chambers, flow cells, and more. This product is designed not only for research purposes but also with an eye towards use in production environments. 【Features】 ■ Film thickness measurement system from nano range to micron range using white light reflection spectroscopy ■ A wide selection of models available to suit various applications ■ Numerous modules available ■ Usable in both research and production environments *For more details, please refer to the PDF document or feel free to contact us.

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Ultra-high power laser real-time measurement M2 measuring device "HAAS"

Improving the efficiency of laser processing! Numerous devices including measuring instruments, laser heads, and optical systems to prevent focal shift.

The "Laser Analysis System" from HAAS, which we handle, can measure lasers instantly and allows for real-time verification. It is easy to install and contributes to improving the efficiency and accuracy of laser processing. In addition to the analysis system, we offer a variety of products including the "Beam Transmission System," "Processing Laser Head," "TLC Optics" that prevent focal position shifts due to thermal lens effects, optical components such as mirrors and lenses, and water-cooled mounts. 【Features of Each Product in the Laser Analysis System】 ■ "Laser Beam Analyzer System BWA-CAM" ┗ Instantly measures M2. Achieves stable measurements with no moving parts. ■ "Laser Beam Profiler BA-CAM" ┗ Compact and low-cost. Three types of heads selectable by wavelength. ■ "Inline Beam Analyzer/Monitor System BWA-MON" ┗ Immediate monitoring on the processing site. Can be directly mounted on laser transmission equipment. ▼ For more details on other products, please download and view the comprehensive catalog ▼

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Pulse generator "RGG"

It is possible to specify a time to start/stop pulse output! Introduction to the satellite ranging system.

The "RGG" is a pulse generator that differs from commercially available delay generators. It outputs one reference pulse (1ch) and seven delayed pulses from the reference pulse (7ch), with two of the pulses allowing for the delay amount to be specified at one-second intervals, enabling variable delay output. Additionally, the target guidance software controls telescopes and stages to guide a bright point (target position) on a video image to the target location. It can be used for alignment and tracking. 【Features】 ■ Satellite ranging system ■ Ability to specify the start/stop of pulse output at designated times ■ Target guidance software can be utilized for alignment and tracking *For more details, please refer to the PDF document or feel free to contact us.

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Excel Precision High-Precision 6DOF Laser Interferometer

NIST/ISO compliant laser interferometer (displacement meter) capable of easy and precise measurement of up to 6 axes simultaneously.

In this laser interferometer system, a combination of optical modules allows for simultaneous high-precision measurement of up to 6 degrees of freedom (X, Y, Z, pitch, yaw, roll) from a single axis. The installation and alignment of the system are very simple. Additionally, it is possible to further improve accuracy by correcting the wavelength of the measurement laser using optional environmental sensors and refractometers. With over 5,000 installations, it has become the de facto standard worldwide in fields such as semiconductor manufacturing equipment like wafer and FPD steppers, CNC machines, and displacement measurement in motion systems, as well as research institutions in various countries.

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Sound&Bright Non-destructive Testing Laser Ultrasonic Receiver Device

It is possible to perform non-contact and non-invasive defect and foreign object inspections on internal defects such as surface shapes, cracks, and voids, as well as on moving objects and high-temperature targets.

Non-contact measurement of high-temperature objects, which is difficult with conventional contact ultrasonic testing, is possible. By generating ultrasonic vibrations using pulsed lasers or piezo actuators on materials such as steel, laser-welded parts, carbon fiber, resin, biological tissues, and food, and visualizing them by receiving reflected light, it allows for non-contact, non-destructive measurement of internal defects, voids, foreign objects, and thickness. It can also measure with high sensitivity even when the object is vibrating, has a rough surface, has a complex shape, is at high temperature, or is in motion, enabling real-time monitoring and inline measurement on-site.

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